Electron Microscope
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| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | PicoFemto In Situ MEMS Gas/Liquid TEM Sample Holder Series |
| Pricing | Upon Request |
| Instrument Classification | In Situ Gas Holder |
| Application Domain | Materials Science |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | PicoFemto In Situ MEMS Heating & Electrical Sample Holder Series |
| Application Field | Materials Science |
| Instrument Classification | In Situ Heating Holder |
| Pricing | Upon Request |
| Compatibility | Compatible with Standard TEM Goniometer Stages and Specified Pole Pieces |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | PicoFemto In Situ TEM Sample Holder Series |
| Instrument Classification | In Situ Tensile Holder |
| Application Field | Materials Science |
| Electrical Measurement Range | 1 nA – 30 mA |
| Current Resolution | < 100 fA |
| Voltage Output | ±10 V (Standard Mode), ±150 V (High-Voltage Mode) |
| Coarse Positioning Range (XY/Z) | 2.5 mm / 1.5 mm |
| Fine Positioning Range (XY/Z) | 15 µm / 1.5 µm |
| Fine Positioning Resolution (XY/Z) | 0.4 nm / 0.04 nm |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Desktop SEM |
| Electron Gun | Single-Crystal LaB₆ Filament |
| SEM Class | Entry-Level Tungsten- or LaB₆-Based SEM (Non-FEG) |
| Secondary Electron Resolution | 3 nm @ 20 kV |
| Maximum Magnification | 360,000× |
| Accelerating Voltage Range | 3–20 kV |
| Backscattered Electron Resolution | 3 nm @ 20 kV |
| Sample Chamber Dimensions (max) | 165 × 122 × 51.5 mm (W × D × H) |
| Stage Movement (standard) | X = 60 mm, Y = 55 mm (2-axis) |
| Optional Deceleration Mode | 0–10 kV landing energy via sample bias |
| Imaging Modes | Video mode (512 × 512), Fast Scan (512 × 512), Slow Scan (2048 × 2048) |
| Image Formats | BMP, TIFF, JPEG, PNG |
| Navigation | Integrated optical camera + chamber-viewing CCD |
| Automation | Auto Contrast/Brightness, Auto Focus, Large-Area Image Stitching |
| Dimensions (main unit) | 650 × 370 × 642 mm (W × D × H) |
| In-situ Compatibility | TEC cooling stage, heating stage, tensile stage (ZEPTOOLS proprietary) |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Desktop SEM |
| Electron Source | Schottky Field Emission Gun |
| Resolution (SE & BSE) | <2.5 nm |
| Max Magnification | 1,000,000× |
| Accelerating Voltage Range | 1–15 kV (continuously adjustable) |
| Stage | Motorized XY (optional XYZ/XYT/5-axis) |
| Detector Options | Secondary Electron (SE), Backscattered Electron (BSE), Energy-Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD) |
| Vacuum System | Triple-stage independent vacuum architecture |
| Imaging Modes | Standard SE/BSE, deceleration mode (0–10 kV sample bias, optional) |
| Image Acquisition | 512×512 (real-time video), 2048×2048 (high-res still capture) |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Desktop SEM |
| Electron Source | Pre-aligned Tungsten Filament |
| Acceleration Voltages | 5 kV / 10 kV / 15 kV |
| Secondary Electron (SE) Resolution | <10 nm |
| Backscattered Electron (BSE) Resolution | <10 nm |
| Maximum Magnification | 150,000× |
| Stage Type | Motorized 2-Axis Sample Stage (X/Y: 25 mm × 25 mm) |
| Vacuum Pumping Time to High Vacuum | ≤2 min |
| Max Sample Dimensions | Ø50 mm × H35 mm |
| Integrated Optics | Monolithic Condenser Lens System |
| Operating Environment | Standard Lab/Office Floor with Vibration Damping Base |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | ZEM18 |
| Instrument Type | Desktop SEM |
| Electron Source | Pre-aligned Tungsten Filament |
| SEM Class | Entry-level Tungsten-Filament SEM |
| Secondary Electron (SE) Resolution | <6 nm |
| Backscattered Electron (BSE) Resolution | <6 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | 3–18 kV |
| Maximum Sample Dimensions | Ø50 mm × 35 mm (H) |
| Stage | Motorized 2-Axis Automated Stage |
| Signal Acquisition Bandwidth | 10 MHz |
| Vacuum Mode Options | High Vacuum (<5×10⁻³ Pa), Low Vacuum (optional) |
| Pump-down Time (High Vacuum) | <90 s |
| Imaging Modes | Video Mode, Fast Scan Mode, Slow Scan Mode |
| Auto Functions | Auto Focus, Auto Brightness/Contrast |
| Detector Configurations | SE Detector, BSE Detector, Optional EDS Detector |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | ZEM20 In-situ Tensile Integrated SEM |
| Instrument Type | Desktop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-level Tungsten-Filament SEM |
| Secondary Electron (SE) Resolution | 4 nm @ 20 kV |
| Maximum Magnification | 360,000× |
| Accelerating Voltage Range | 3–20 kV (1 kV step adjustment) |
| Backscattered Electron (BSE) Resolution | 4 nm @ 20 kV |
| In-situ Stage Load Capacity | 0–1000 N |
| Displacement Resolution | 20 nm |
| Optional Heating Module | Yes |
| Mechanical Testing Modes | Tensile, Compression, Three-point Bending |
| Vacuum Architecture | Dual-chamber (separated electron gun & specimen chamber) |
| Sample Chamber Camera | Integrated HD in-chamber camera |
| Chamber Volume | Extra-large for multi-modal in-situ platform integration |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Desktop SEM |
| Electron Source | Pre-aligned Tungsten Filament |
| SEM Class | Entry-level Tungsten-Filament SEM |
| Secondary Electron (SE) Resolution | 4 nm |
| Maximum Magnification | 360,000× |
| Accelerating Voltage Range | 3–20 kV (1 kV step adjustment) |
| Backscattered Electron (BSE) Resolution | 4 nm |
| Stage Option | 5-Axis Motorized Stage (Optional) |
| Chamber Dimensions | 185 mm × 176 mm × 125 mm |
| Vacuum Modes | High Vacuum & Low Vacuum |
| Environmental Suitability | Vibration-isolated design for standard labs/offices/factories |
| Detector Configuration | SE + BSE detectors |
| Optional Upgrades | EDS, Deceleration Mode, In-situ Platforms |
| Filament Upgrade Option | LaB₆ |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | ZEM20 EDS-integrated Desktop SEM |
| Instrument Type | Desktop / Benchtop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-level Tungsten-Filament SEM |
| Secondary Electron Image Resolution | 4 nm |
| Maximum Magnification | 360,000× |
| Accelerating Voltage Range | 3–20 kV (1 kV step adjustment) |
| Backscattered Electron Image Resolution | 4 nm |
| Integrated EDS System | Oxford Instruments Xplore Compact 30 |
| EDS Detector Active Area | 30 mm² (SuperATW window) |
| Energy Resolution | ≤129 eV (Mn Kα) |
| Cooling | Peltier-cooled (LN₂-free) |
| Elemental Detection Range | Boron (B, Z=5) to Californium (Cf, Z=98) |
| Analysis Modes | Point, Line, and Area Mapping |
| Software Interface | Fully Localized Chinese UI with Optional English Toggle |
| Vacuum Architecture | Dual-chamber Separated Vacuum System (Gun Chamber & Sample Chamber) |
| Sample Chamber Camera | Integrated HD In-Chamber Camera |
| Sample Stage Mode | Deceleration Mode for Low-Conductivity Specimens |
| Typical Sample Exchange Time | <60 s |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Model | ZEM20Pro |
| Instrument Type | Desktop SEM |
| Electron Source | LaB₆ (Lanthanum Hexaboride) |
| Secondary Electron Resolution | 3 nm |
| Magnification Range | up to 360,000× |
| Accelerating Voltage | 3–30 kV |
| Backscattered Electron Resolution | 3 nm |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Model | ZEM20Pro |
| Instrument Type | Desktop SEM |
| Electron Source | LaB₆ (Lanthanum Hexaboride) |
| Secondary Electron Resolution | 3 nm @ 30 kV |
| Backscattered Electron Resolution | 3 nm @ 30 kV |
| Magnification Range | 10× – 360,000× |
| Accelerating Voltage | 3–30 kV |