Electron Microscope
Filter
Showing 91–120 of 532 results
| Brand | Delong Instruments |
|---|---|
| Origin | Canada |
| Model | LVEM 25E |
| Acceleration Voltages | 10 kV, 15 kV, 25 kV |
| Imaging Modes | TEM, STEM, SEM (BSE), EDS, Electron Diffraction (ED) |
| Resolution | ≤1.0 nm |
| Footprint | Compact, Single-Phase Power Only |
| Compliance | Designed for GLP-compliant labs |
| Brand | Delong Instruments |
|---|---|
| Origin | Canada |
| Acceleration Voltages | 5, 10, 15, 25 kV |
| Maximum Magnification | ~1,300,000× |
| TEM Resolution (LVEM 5) | 1.5 nm |
| TEM Resolution (LVEM 25 / LVEM 25E) | 1.0 nm |
| Electron Source | Schottky Field-Emission Gun |
| Operating Modes | TEM, STEM, SEM, ED, EDS, Dark-Field TEM/STEM |
| Sample Exchange Time | ≤3 min |
| Cooling Water Required | No |
| Compressed Air Required | No |
| Brand | Delong Instruments |
|---|---|
| Origin | USA |
| Model | LVEM5 |
| Accelerating Voltage | 5 kV |
| Maximum Magnification | 700,000× |
| TEM Resolution | 1.5 nm (with TEM upgrade option) |
| SEM Resolution | 10 nm |
| STEM & ED Capabilities | Integrated |
| Sample Chamber | Ambient-pressure compatible, no external cooling required |
| Dimensions | Compact benchtop footprint (~1/10 volume of conventional TEM) |
| Electron Source | Inverted Schottky field-emission gun (FEG), >2000 h lifetime |
| Brand | Delong Instruments |
|---|---|
| Origin | Canada |
| Model | LVEM5 (Biological) |
| Accelerating Voltage | 5 kV |
| Maximum Magnification | 700,000× |
| Resolution (unstained biological samples) | 1.5 nm |
| Imaging Modes | TEM, SEM, STEM |
| Vacuum Pump-Down Time | ≤3 min |
| Footprint | <1 m² |
| Operating Environment | Standard laboratory (no external cooling, no high-vacuum infrastructure required) |
| Brand | DENSsolutions |
|---|---|
| Origin | Netherlands |
| Model | Climate |
| Temperature Range | RT–1300 °C |
| Displacement Resolution | < 200 nm |
| Tensile Rate | ≤ 0.5 nm/min |
| Gas Environment | Up to 2 bar |
| Compliance | Compatible with Standard TEM/STEM Column Vacuum Interfaces |
| Application Domain | Materials Science, Catalysis, Nanomaterial Synthesis, Corrosion Studies |
| Brand | DENSsolutions |
|---|---|
| Origin | Netherlands |
| Model | Lightning Arctic |
| Temperature Range | ≤ –160 °C to 800 °C (up to 1300 °C with optional chip) |
| Electrical Current Range | 1 pA to 100 mA |
| Application Domain | Semiconductor Materials Research |
| Compliance | Compatible with Standard JEOL & Thermo Fisher TEM Goniometer Interfaces |
| Sample Tilt | Dual-tilt (α/β), 10°–25° depending on pole piece configuration |
| Brand | DENSsolutions |
|---|---|
| Origin | Netherlands |
| Model | Lightning |
| Temperature Range | RT–1300 °C |
| Displacement Resolution | < 200 nm |
| Tensile Rate | ≤ 0.5 nm/min |
| Brand | DENSsolutions |
|---|---|
| Origin | Netherlands |
| Model | Stream |
| Temperature Range | RT–1300 °C |
| Displacement Resolution | < 200 nm |
| Tensile Rate | ≤ 0.5 nm/min |
| Application Field | Materials Science |
| Instrument Category | In Situ Liquid TEM Holder |
| Brand | DENSsolutions |
|---|---|
| Origin | Netherlands |
| Model | Wildfire |
| Temperature Range | RT–1300 °C |
| Displacement Resolution | < 200 nm |
| Tensile Rate | ≤ 0.5 nm/min |
| Brand | DME |
|---|---|
| Origin | Denmark |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | DME DS 95 SPM |
| Price Range | USD 68,000 – 136,000 (est.) |
| Positional Noise | X-Y < 0.15 nm RMS, Z = 35 pm RMS |
| XY Stage Travel Range | 180 nm × 180 nm |
| Scan Volume Options | 50 × 50 × 5 µm (DS95-50) or 200 × 200 × 15 µm (DS95-200) |
| Max. Scan Rate | 30 Hz |
| Z-direction Mechanical Resolution (HOPG) | 0.06 nm RMS |
| Z-direction Electronic Noise Floor | < 0.05 nm RMS |
| Cantilever Insertion | Plug-and-Play |
| SPM Modes | AC Mode (Amplitude & Phase Imaging), LFM, MFM, KPFM, EFM, SCM, STM |
| Integrated Optical Axis | Yes |
| CCD-Based Visual Navigation | Yes |
| Controller Software | DiProWa, C26ScanTool (optional) |
| Brand | DME |
|---|---|
| Origin | Denmark |
| Model | DS95Navi |
| Positioning Detection Noise | X-Y < 0.15 nm RMS, Z = 35 pm |
| Sample Dimensions | Diameter < 15 mm, Thickness < 5 mm |
| Sample Stage Travel Range | 180 nm × 180 nm |
| Brand | DME |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | High Precision Stage |
| Pricing | Upon Request |
| Brand | DME |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | DME Sample Transfer Shuttle |
| Pricing | Upon Request |
| Brand | DOSAKA |
|---|---|
| Origin | Japan |
| Model | DTK-Zero1N |
| Power Supply | 100/120/220/240 V, 50/60 Hz |
| Blade Vibration Frequency | 0–55 Hz |
| Blade Stroke Amplitude | Fixed 2 mm |
| Sectioning Speed | 0–68 mm/min (approx.) |
| Retraction Speed | 104 mm/min (approx.) |
| Max. Specimen Height | 20 mm |
| Specimen Retraction Function | Yes |
| Max. Specimen Dimensions | 25 × 30 mm |
| Compatible Blade Size | 30 mm standard vibrating blade |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Double Helix |
| Pricing | Upon Request |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | DigiView |
| Pricing | Upon Request |
| CCD Resolution | 1392 × 1040 pixels |
| Readout Speeds | 20 MHz / 40 MHz |
| Angular Resolution | < 0.1° |
| Quantum Efficiency | > 62% @ 500 nm |
| Bit Depth | 12-bit digital output |
| Read Noise | < 8 e⁻ @ 20 MHz |
| Exposure Time Range | Up to 15 minutes |
| Cooling | Single-stage Peltier (fanless) |
| Interface | Gigabit Ethernet |
| Gain Control Range | 0–35 dB (fully adjustable) |
| Vacuum Compatibility | Bellows-mounted for in-chamber operation |
| Optional Feature | Integrated Fore-Scatter Detector (FSD) |
| Software Integration | Fully compatible with EDAX TEAM™ EBSD analysis suite |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Element |
| Quotation | Upon Request |
| Energy Resolution | 129 eV (Mn Kα) |
| Peak-to-Background Ratio | 10,000:1 |
| Maximum Count Rate | 500 kcps |
| Detector Active Area | 30 mm² |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Elite T |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | Not Specified |
| Maximum Count Rate | 850 kcps |
| Detector Active Area | 70 mm² |
| Window Option | Optional Windowless Configuration |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Genesis Apollo X/XL |
| Price Range | USD 68,000 – 136,000 (based on FOB USD conversion) |
| Electron Source Compatibility | Tungsten Filament SEMs |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Hikari XP |
| Angular Resolution | < 0.1° |
| Maximum Pattern Indexing Rate | up to 1400 points/sec |
| Beam Current Compatibility | down to 100 pA |
| Accelerating Voltage Compatibility | down to 5 kV |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Octane Elect |
| Energy Resolution | 127 eV |
| Maximum Count Rate | 400,000 cps |
| Detector Active Area | 30 mm² or 70 mm² |
| Window Material | Silicon Nitride (Si₃N₄) |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Octane Elite |
| Energy Resolution | 125 eV (Mn Kα) / 123 eV (optimized configuration) |
| Peak-to-Background Ratio | Not specified |
| Maximum Output Count Rate | 400,000 cps |
| Detector Active Area | 30 mm² (Octane Elite Plus) or 70 mm² (Octane Elite Super) |
| Window Material | Silicon Nitride (Si₃N₄) |
| Vacuum Compatibility | Fully sealed ultra-high vacuum detector housing |
| Integration | Compatible with SEM, FIB-SEM, and TEM platforms |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Orbis |
| Detector Type | Energy-Dispersive X-ray Fluorescence (EDXRF) |
| Operating Environment | Air or Low Vacuum |
| Elemental Range | Na (11) to Bk (97) |
| Sample Chamber Capacity | Up to 300 mm × 300 mm × 150 mm (W×D×H) |
| Beam Spot Size | Adjustable down to <30 µm |
| Software Platform | Vision™ v5.x |
| Compliance | ASTM E1621, ISO 8256, USP <232>/<233>, GLP/GMP-ready audit trail support |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Orion |
| Angular Resolution | < 0.1° |
| Maximum Pattern Acquisition Rate | 1500 pts/s (Orion Plus) or 3000 pts/s (Orion Super) |
| Sensor Type | High-Sensitivity CMOS |
| Standard Pattern Size for High-Speed Calibration | 120 × 120 pixels |
| Confidence-Based Indexing Algorithm | Tri-Band Confidence Index (CI) |
| EDS-EBSD Synchronization | Fully Supported with EDAX EDS Detectors |
| Compliance | Designed for ASTM E112, ISO 11947, and USP <1086>–aligned microstructural characterization workflows |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SystemSIX |
| Pricing | Available Upon Request |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | TEAM™ Pegasus (EDS-EBSD) |
| Detector Type | Integrated Energy Dispersive Spectrometer (EDS) and Electron Backscatter Diffraction (EBSD) System |
| EDS Detector Options | Octane Elect or Octane Elite Silicon Drift Detector (SDD) |
| EBSD Camera Options | Velocity™ Super, Orion™, Hikari Super, DigiView |
| Energy Resolution | <127 eV at Mn Kα (typical for Octane Elite SDD) |
| Peak-to-Background Ratio | >3,500:1 (at 5 kcps, Mn Kα) |
| Maximum Input Count Rate | Up to 2.5 Mcps (Octane Elite) |
| Active Detector Area | 100 mm² (Octane Elite) |
| EBSD Camera Frame Rate | Up to 3,000 fps (Velocity™ Super, full-frame) |
| Spatial Resolution (EBSD) | ≤0.05° angular resolution (confidence index ≥0.1) |
| Software Platform | TEAM™ v5.x with real-time indexing, EXpert ID, and automated background subtraction |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | TEAM™ Trident (EDS-EBSD-WDS) |
| Detector Type | Octane Elite SDD (EDS), Velocity™ Super / Orion™ / Hikari Super / DigiView (EBSD), TEXS (WDS) |
| Energy Resolution | ≤123 eV at Mn Kα (typical, 100k cps) |
| Peak-to-Background Ratio | >20,000:1 (Mn Kα, 10 kV) |
| Maximum Input Count Rate | ≥1,000,000 cps (EDS) |
| Active Detector Area | 100 mm² (Octane Elite SDD) |
| EBSD Camera Frame Rate | Up to 3,000 fps (Velocity™ Super, 1×1 binning) |
| WDS Spectral Resolution | <10 eV (full width at half maximum) |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | TEM Octane |
| Energy Resolution | 129 eV (Mn Kα) |
| Maximum Count Rate | 250 kcps |
| Detector Active Area | 30–100 mm² |
| Window Options | Ultrathin Window (SUTW) and Windowless Configurations |
| Solid Angle | Up to 1.1 sr |
| Light Element Performance | Optimized for C, N, O, F with >500% sensitivity gain vs. SUTW in windowless mode |
| Resolution Stability | <1 eV up to 100 kcps |
| Pulse Processing Time | Adjustable from 120 ns to 7.65 µs |
| Interface | Gigabit Ethernet |
| Safety | Motorized retraction upon BSE overload detection |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | TEXS |
| Quotation | Available Upon Request |
| Energy Resolution | Optimized for 150 eV – 10 keV Range |
| Peak-to-Background Ratio | High, typical of high-efficiency PBS architecture |
| Maximum Count Rate | Compatible with standard SEM/WDS-compatible electron column currents (e.g., 1–10 nA) |
| Detector Area | Integrated Bragg crystal diffraction system with five standard analyzing crystals |
| Optical Design | Capillary-based Parallel Beam Spectrometer (PBS) |
| Mass | 20.5 kg (45 lbs) |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Velocity Super |
| Maximum Acquisition Speed | 4500 points/sec |
| Orientation Resolution | < 0.1° |
| Image Resolution (during high-speed acquisition) | 120 × 120 pixels |
| Detector Type | High-sensitivity, low-noise CMOS |
| Calibration Algorithm | Triplet-band confidence-based indexing |
| EDS-EBSD Synchronization | Yes, with compatible EDAX EDS detectors |
| Compliance | Designed for ASTM E112, ISO 11937, and ASTM E2627-compliant microstructural quantification workflows |
| Software Integration | OIM Analysis™ v9+ with GLP-compliant audit trail and 21 CFR Part 11-ready data handling |