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| Brand | HORIBA |
|---|---|
| Origin | France |
| Manufacturer Type | Manufacturer |
| Import Status | Imported |
| Model | Signature SPM |
| Instrument Category | Atomic Force Microscope |
| Instrument Type | Materials-Focused AFM |
| Spectroscopy Integration | Confocal Raman & Photoluminescence (PL) |
| Core Capability | True Co-Localized Multimodal Imaging (Topography + Nanomechanics + Electrostatics + Magnetism + Chemical Fingerprinting) |
| Scanner Range | 100 × 100 × 15 µm |
| Optical Access | Dual-Path, IR AFM Laser (1310 nm) + Visible/NIR Excitation Lasers (e.g., 532 nm, 638 nm, 785 nm) |
| Spectrometer | Achromatic, >95% Reflectivity, Triple-Grating Support (150–6000 cm⁻¹) |
| Software Feature | “Probe Away” / “Probe Back” Automated Tip Retraction & Re-Registration |
| Compliance | Designed for GLP/GMP-adjacent research environments |
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