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| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | IB-19530CP |
| Price | USD 150,000 |
| Equipment Type | Ion Beam Sample Preparation System for Electron Microscopy |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-120i |
| Acceleration Voltage | Up to 120 kV |
| Magnification Range | 50× – 1,200,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2100Plus |
| Acceleration Voltages | 80, 100, 120, 160, 200 kV |
| Magnification Range | 50× to 1,500,000× |
| Point Resolution | 0.19 nm |
| Line Resolution | 0.14 nm |
| Minimum Probe Size | 0.5 nm |
| Tilt Range | ±25° |
| Condenser System | Three-Stage Lens Design |
| Pole Piece Options | UHR, HR, HT, HC, CRYO |
| Operating System | 64-bit Windows-based Control Interface |
| Integrated Detectors | STEM, EDS, CCD, EELS |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2800 |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.16 nm |
| Secondary Electron Resolution | 0.5 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard Equipment |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ACE200F |
| Price | USD $3,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Maximum Magnification | 2,000,000× |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.136 nm |
| Information Limit | 0.11 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-ARM200F(C)-NEO ARM |
| Acceleration Voltages | 30 kV, 80 kV, 200 kV |
| Magnification Range | 50× to 2,000,000× |
| Point Resolution | 0.078 nm (at 200 kV) |
| Energy Resolution | ≤0.3 eV (with monochromated cold FEG) |
| Configuration | Dual spherical aberration correctors (objective and condenser), integrated STEM/TEM/EELS/EDS platform |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ARM300F2 |
| Price | USD 6.8M (est.) |
| Acceleration Voltage | Up to 300 kV |
| Magnification Range | 100×–2,000,000× |
| Guaranteed HAADF-STEM Resolution | 53 pm (300 kV, with ETA corrector + FHP2 polepiece) |
| EDS Detector | Dual large-area SDD (158 mm² total active area) |
| Solid Angle for EDS | 2.2 sr (with WGP polepiece) |
| Cs Corrector | JEOL 12-Pole Monochromator-Based Spherical Aberration (Cs) Corrector |
| Software | COSMO™ Auto-Aberration Correction Suite |
| Gun Type | Next-Generation Cold Field-Emission Gun (Cold-FEG) |
| Environmental Shielding | Integrated Active Vibration & Acoustic Damping Enclosure |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-F200 |
| Price | USD $2,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Magnification Range | 50× – 2,000,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JIB-4700F |
| Instrument Type | Benchtop Dual-Beam FIB-SEM |
| Electron Source | Cold Field Emission Gun (CFEG) |
| Secondary Electron Resolution | 1.2 nm @ 15 kV, 1.6 nm @ 1 kV |
| Backscattered Electron Resolution | 2.5 nm |
| FIB Resolution | 5 nm @ 30 kV |
| Magnification Range | 25× – 1,000,000× |
| Acceleration Voltage | 0.1–30 kV |
| Maximum FIB Current | 90 nA |
| Maximum SEM Probe Current | 300 nA |
| Gas Injection System | Up to 3 independent channels |
| Sample Stage | 5-axis fully aligned motorized stage |
| Maximum Sample Diameter | 150 mm |
| Sample Loading | Airlock-style exchange |
| Detector Interfaces | EDS, EBSD, STEM, SE/BSE |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JIB-PS500i |
| Electron Beam Resolution | 0.7 nm @ 15 kV, 1.0 nm @ 1 kV |
| Ion Beam Resolution | 3 nm |
| Maximum Ion Beam Current | 100 nA |
| Maximum Electron Beam Current | 500 nA |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT210 |
| Instrument Type | Floor-standing |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV |
| Magnification Range | 5× – 300,000× |
| Accelerating Voltage | 0.5–30 kV |
| Backscattered Electron Resolution | 4 nm (Low Vacuum Mode) |
| Maximum Sample Dimensions | Ø150 mm × 53 mm height |
| Specimen Chamber Expansion Ports | Multiple |
| Stage Type | Motorized 5-Axis Stage |
| Standard Detectors | Everhart-Thornley SE Detector, Solid-State BSE Detector |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT510 |
| Instrument Type | Floor-standing SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV, 15 nm @ 1 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV |
| Accelerating Voltage Range | 0.3–30 kV |
| Magnification Range | 14×–800,000× (on display) |
| Vacuum Mode | Low-vacuum compatible with LHSED detector |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT710HR |
| Instrument Type | Benchtop SEM |
| Electron Source | Thermal Field Emission Gun (TFEG) |
| Secondary Electron Resolution | 1 nm @ 30 kV |
| Backscattered Electron Resolution | 2 nm @ 30 kV |
| Accelerating Voltage | 0.1–30 kV |
| Maximum Magnification | 1,000,000× |
| Probe Current | Up to 300 nA |
| Sample Chamber | Large-volume, front-loading with wide-access door |
| Operating Modes | High Vacuum / Low Vacuum (LV/LA variants available) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT800 |
| Instrument Type | Floor-Standing SEM |
| Electron Source | Thermal Field-Emission Gun (TFEG) |
| Secondary Electron Resolution | 0.6 nm @ 15 kV, 0.7 nm @ 1 kV |
| Backscattered Electron Resolution | 1.5 nm |
| Accelerating Voltage Range | 0.01–30 kV |
| Maximum Magnification | 2,000,000× (real) |
| Specimen Diameter Capacity | 150 mm |
| Stage Type | 5-Axis Motorized Precision Stage |
| Detector Configuration | In-lens SE detector, upper-stage BSE detector, optional EDS/WDS integration |
| Beam Current | ≥300 nA @ 15 kV |
| Objective Lens Design | Super Hybrid Objective Lens (Magnetic-Field-Free) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT810 |
| Instrument Type | Floor-standing SEM |
| Electron Gun | Thermal Field Emission (TFE) |
| Secondary Electron (SE) Resolution | 0.5 nm at 15 kV |
| Backscattered Electron (BSE) Resolution | 1.5 nm at 15 kV |
| Accelerating Voltage Range | 0.01–30 kV |
| Magnification Range | ×27 to ×5,480,000 (at 1280 × 960 pixels) |
| Beam Current | Up to 500 nA |
| Detector Configuration | Standard In-lens SE, Through-the-lens BSE, and Optional EDS/EBSD Integration |
| Sample Chamber | Expandable with Multiple Ports for In-situ & Analytical Add-ons |
| Stage | Motorized, High-Precision 5-Axis Tilt/Rotation/Translation Stage |
| Brand | JEOL (Japan Electron Optics Laboratory) |
|---|---|
| Origin | Japan |
| Model | JXA-iHP100 |
| Acceleration Voltage | 0–30 kV (0.1 kV step) |
| Beam Current Range | 10⁻¹² – 10⁻⁵ A |
| Beam Current Stability | ±5% / h, ±0.3% / 12 h (W) |
| Secondary Electron Resolution | 6 nm (W), 5 nm (LaB₆) at WD = 11 mm, 30 kV |
| Scan Magnification | ×40 – ×300,000 (WD = 11 mm) |
| Max. Image Resolution | 5,120 × 3,840 pixels |
| Display | Dual LCDs (1,280 × 1,024 each) for EPMA and SEM/EDS operation |
| Optical Microscope Resolution | ~1 µm |
| Depth of Field | ~1 µm |
| Vacuum System | Mechanical pump + turbomolecular pump + ion pump |
| Chamber Vacuum | <8.0 × 10⁻⁴ Pa |
| Gun Vacuum | <9.0 × 10⁻⁵ Pa |
| Elemental Detection Range | WDS: Be (optional) to U |
| EDS | B to U |
| WDS Wavelength Range | 0.087–9.3 nm |
| EDS Energy Range | 0–20 keV |
| WDS Spectrometer Channels | 1–5 (configurable) |
| EDS Detector | One SDD (Silicon Drift Detector), fanless option available |
| Max. Sample Size | 100 mm × 100 mm × 50 mm (H) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JXA-iHP200F |
| Instrument Type | Floor-standing, High-Performance EPMA |
| Electron Source | Thermal Field-Emission Gun (TFEG) |
| Secondary Electron Resolution | 2.5 nm at 15 kV |
| Magnification Range | 40× to 300,000× |
| Accelerating Voltage | 1–30 kV |
| Backscattered Electron Imaging | High-Contrast Mode |
| Maximum Sample Dimensions | 100 mm × 100 mm × 50 mm (H) |
| Motorized Stage | 5-Axis Precision Drive |
| Standard Detectors | Solid-State Backscatter Detector, Wavelength-Dispersive Spectrometer (WDS), Energy-Dispersive Spectrometer (EDS) |
| Vacuum System | Ultra-High Vacuum (UHV) Compatible |
| Interface Expansion | Multiple Dedicated Ports for Optional Analyzers (e.g., EBSD, CL, STEM-in-SEM) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SXES |
| Price | USD 700,000 |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | SXES |
| Energy Resolution | 0.3 eV (at Al-L edge, 73 eV) |
| Detection Energy Range | 50–170 eV (JS50XL grating) / 70–210 eV (JS50XL grating) |
| Mounting Interface | EPMA WDS Port #2 (front right) or FE-SEM WDS port (front left-rear) |
| Dimensions (W×D×H) | 168 mm × 348 mm × 683 mm (including CCD distance from interface) |
| Weight | 25 kg |
| Compatible Instruments | EPMA — JXA-8530F, JXA-8230, JXA-8500F, JXA-8200 |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model Series | specbos 1211 |
| Price Range | USD 13,500 – 27,000 (FOB Hamburg) |
| Spectral Range | 350–1000 nm (standard), optional 250–1000 nm (UV variant) |
| Spot Diameter | 4 mm (default), down to 0.5 mm with optional focusing lenses |
| Measurement Modes | Radiance, Luminance, Illuminance, Irradiance |
| Interface Options | USB 2.0, Bluetooth 4.2, Ethernet, RS-232 |
| Power Supply | Bus-powered via USB |
| Compliance | CE, RoHS, ISO/IEC 17025 traceable calibration available |
| Brand | AOE Tech |
|---|---|
| Model | JF-H410B |
| Wavelength | 650 nm |
| Output Power | 5 mW |
| Spectral Width | ±5 nm @ 20°C |
| Fiber Compatibility | SM & MM |
| Operating Mode | CW / 2 Hz Modulated |
| Connector Interface | 2.5 mm Universal Ferrule |
| Power Supply | 2 × AAA batteries |
| Continuous Operation Time | 20–30 h |
| Operating Temperature | −10°C to +60°C |
| Storage Temperature | −25°C to +70°C |
| Dimensions | 17.5 × 2.6 × 2.6 cm |
| Weight | 200 g |
| Brand | AOE Tech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Model | JF-H430 |
| Price Range | USD 0–7,200 |
| Origin | Shanghai |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Domestic (China) |
| Model | JFB-IB |
| Pricing | Upon Request |
| Brand | JHX |
|---|---|
| Origin | Germany |
| Model | BRAUMEISTER |
| Measurement Principle | Multi-wavelength UV-Vis Spectrophotometry + Density/Refractometry Hybrid Analysis |
| Sample Throughput | ≤45 seconds per analysis |
| Parameter Coverage | Apparent Extract, Alcohol by Volume (ABV), Original/Real Extract, IBU, EBC Color, pH, FAN, Total Acidity, SO₂, Dissolved CO₂, Sugars (Glucose, Fructose, Total), Nitrogen Content, Caloric Value |
| Compliance | Designed for ISO 8587, ISO 1042, ASTM D8192, and EU Regulation (EC) No 1107/2009 (food contact compliance) |
| Power Supply | 100–240 V AC, 50/60 Hz |
| Dimensions | 320 × 280 × 210 mm |
| Weight | 8.2 kg |
| Brand | JHX |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | DAIRY |
| Pricing | Available Upon Request |
| Brand | JHX |
|---|---|
| Origin | Germany |
| Model | FLOUR |
| Measurement Principle | Near-Infrared (NIR) Reflectance Spectroscopy |
| Analysis Time | ≤45 s per sample |
| Parameters Measured | Moisture, Protein, Gluten, Starch, Ash, Color (L*a*b* or CIE XYZ) |
| Sample Handling | Non-destructive, Reagent-free, No Manual Adjustment Required |
| Calibration | Pre-loaded Factory Calibrations + User-Adjustable Multivariate Models |
| Environmental Rating | IP54-rated Enclosure |
| Operating Temperature Range | 10–40 °C |
| Software Compliance | Supports Audit Trail, User Access Levels, Electronic Signatures per FDA 21 CFR Part 11 |
| Data Export | CSV, XML, SQL via Ethernet/USB |
| Regulatory Alignment | Compliant with ISO 712 (moisture), ISO 20483 (protein), ICC Standard No. 169 (gluten), and AACC Method 44-15A (starch) |
| Brand | JHX |
|---|---|
| Origin | Germany |
| Model | MEAT |
| Measurement Principle | Reflectance Near-Infrared Spectroscopy (NIRS) |
| Analysis Time | ≤45 s per sample |
| Parameters Measured | Moisture, Fat, Protein, Collagen (BEFFE), Ash |
| Sample Types | Raw meat, cured sausages & hams, cooked sausages, wet pet food |
| Sample Preparation | None required |
| Compliance | Designed for ISO 17025-compliant QC labs and GMP-aligned production environments |
| Interface | Touchscreen GUI with embedded calibration management |
| Brand | JHX |
|---|---|
| Origin | Germany |
| Model | OLIVE |
| Type | Benchtop Optical Quality Analyzer for Olive Matrixes |
| Measurement Principle | Multi-Wavelength Absorption & Scattering Spectrophotometry |
| Analysis Time | ≤45 s per sample |
| Sample Types | Whole olives, olive paste, virgin olive oil, olive pomace |
| Parameters Measured | Oil yield (% w/w), moisture content (% w/w), free acidity (as oleic acid, %), peroxide value (meq O₂/kg), and auxiliary spectral indices correlated to oxidation state and phenolic profile |
| Calibration | Factory-predefined chemometric models based on reference ASTM D6584, ISO 660, ISO 8534, and IOC/T.20/Doc. No. 29 datasets |
| Compliance | CE-marked |
| Operating Environment | 10–40 °C, 20–80% RH non-condensing, IP54-rated enclosure |
| Interface | 7″ capacitive touchscreen, USB-C, Ethernet, optional RS-232 |
| Software | SpectraAlyzer v4.2 with GLP-compliant audit trail, user role management, and 21 CFR Part 11-ready configuration |
| Brand | JHX |
|---|---|
| Origin | Germany |
| Model | SPIRITS |
| Measurement Principle | Near-Infrared (NIR) Transmission Spectroscopy |
| Analysis Time | ≤45 s per sample |
| Alcohol Range | 0–98% vol |
| Linearity | Excellent up to 98% vol |
| Sugar Interference Resistance | Yes (natural & added sugars) |
| Sample Types | Liquid spirits, distillates, diluted ethanol solutions, grain mashes, slurries, powders |
| Environmental Rating | IP54-rated housing for lab and production-floor use |
| Automation Ready | Compatible with peristaltic pump and robotic autosampler (>60 samples/h) |
| Compliance | Designed for GLP/GMP environments |
| Origin | Taiwan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Regional Origin | Domestic (China Market) |
| Model | MMT40 |
| Price Range | USD 0.15–75.00 (per unit, component-level pricing) |
| Component Category | Precision Motion Component |