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MiXran Meg1063 UV-Fused Silica Laser Flat Window

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Brand MiXran
Model Meg1063
Material Synthetic Fused Silica (UV-grade)
Surface Flatness λ/10 @ 633 nm
Surface Quality 10-5 Scratch-Dig
Coating Broadband Anti-Reflection (BBAR) optimized for 266 nm, 355 nm, 532 nm, and 1064 nm
Transmission >99.5% per surface at design wavelengths
Substrate Thickness Tolerance ±0.1 mm
Diameter Options Φ5.0 mm to Φ50.8 mm
Thickness Options 2 mm, 3 mm, 6 mm, 10 mm
Clear Aperture ≥90% of diameter
Damage Threshold >5 J/cm² @ 10 ns, 10 Hz, 1064 nm (tested)

Overview

The MiXran Meg1063 is a precision-engineered UV-grade fused silica laser flat window designed for high-power, multi-wavelength laser systems operating across deep ultraviolet (DUV) to near-infrared (NIR) spectral bands. Constructed from synthetic fused silica with ultra-low OH⁻ content and exceptional homogeneity, the Meg1063 exhibits minimal thermal lensing, negligible birefringence, and outstanding transmission stability under intense irradiation. Its optical performance is defined by λ/10 surface flatness (measured at 633 nm), 10-5 surface quality, and broadband anti-reflection (BBAR) coatings tailored for four critical laser lines: 266 nm (fourth harmonic of Nd:YAG), 355 nm (third harmonic), 532 nm (second harmonic), and 1064 nm (fundamental). Unlike standard optical windows, the Meg1063 undergoes full spectral characterization and batch-certified interferometric verification to ensure compliance with ISO 10110-7 and MIL-PRF-13830B standards for laser-grade optics.

Key Features

  • UV-optimized fused silica substrate with <0.5 ppm metallic impurities and <10 ppb OH⁻ content — enabling transmission down to 185 nm and resistance to solarization under prolonged 266 nm exposure
  • λ/10 surface flatness (RMS) and 10-5 scratch-dig surface finish — minimizing wavefront distortion in interferometric and cavity alignment applications
  • Custom BBAR coatings deposited via ion-assisted e-beam evaporation — achieving R < 0.25% reflectance per surface at 266 nm, 355 nm, 532 nm, and 1064 nm with <±0.5 nm spectral shift over ±10°C temperature range
  • Controlled thickness tolerance (±0.1 mm) and parallelism <3 arcsec — critical for Brewster-angle mounting and low-loss intracavity integration
  • High laser-induced damage threshold (LIDT): >5 J/cm² (10 ns, 10 Hz, 1064 nm), >2 J/cm² (10 ns, 10 Hz, 355 nm), and >1.2 J/cm² (10 ns, 10 Hz, 266 nm) — verified per ISO 21254-1
  • Traceable metrology: Each window ships with individual test report including interferogram, spectral transmittance curve (190–1100 nm), and coating adhesion data (per ASTM F2290)

Sample Compatibility & Compliance

The Meg1063 is compatible with vacuum-compatible mounts (e.g., kinematic, CF-flanged), cryogenic stages (down to 4 K), and ultra-high vacuum (UHV) environments (<1×10⁻⁹ mbar) due to its low outgassing rate (<1×10⁻¹² g/cm²·s, per ASTM E595). It meets RoHS Directive 2011/65/EU and REACH SVHC compliance. For regulated photonic manufacturing, documentation supports traceability to NIST-traceable calibration sources and conforms to ISO 9001:2015 quality system requirements. While not classified as medical or IVD devices, its material certification aligns with USP for optical components used in analytical instrumentation subject to FDA 21 CFR Part 11 data integrity expectations.

Software & Data Management

No embedded firmware or software is included — the Meg1063 is a passive optical component. However, each unit’s spectral performance data (transmittance vs. wavelength), interferometric flatness map, and LIDT validation report are delivered in standardized PDF and CSV formats. These files are structured to integrate into laboratory asset management systems (e.g., LabWare LIMS, Thermo Fisher SampleManager) via metadata tags compliant with ASTM E1469-20 (Standard Practice for Electronic Data Exchange in Analytical Laboratories). Batch-level certificates of conformance include QR-coded links to secure cloud-hosted raw measurement datasets, supporting GLP audit trails and revision-controlled documentation workflows.

Applications

  • Intracavity beam delivery in Q-switched Nd:YAG and Nd:YVO₄ lasers requiring simultaneous harmonics generation
  • UV lithography tool calibration windows where 266 nm transmission stability and low wavefront error are mandatory
  • Ultrafast amplifier front-ends (Ti:sapphire, OPCPA) demanding high group delay dispersion (GDD) uniformity and minimal nonlinear phase accumulation
  • Space-qualified spectrometer fore-optics exposed to proton/radiation environments — validated for total ionizing dose (TID) resilience up to 100 krad(Si)
  • Quantum optics setups involving polarization-sensitive interference (e.g., Mach–Zehnder, Sagnac) where birefringence <5 nm/cm is required
  • Industrial laser processing heads (cutting, drilling, ablation) operating at multi-kW average power in CW or pulsed regimes

FAQ

Is the Meg1063 suitable for use in ultra-high vacuum (UHV) systems?

Yes — all Meg1063 windows undergo vacuum bake-out conditioning and are certified for UHV compatibility per ASTM E595 outgassing specifications.
Can custom diameters or thicknesses be manufactured?

Yes — MiXran offers OEM customization including non-standard dimensions, wedge angles (<5 arcsec), and hybrid coatings (e.g., AR + HR dual-band). Lead time is 6–8 weeks from drawing approval.
What is the warranty and calibration recertification policy?

MiXran provides a 24-month limited warranty against material and workmanship defects. Recertification services (flatness, transmission, LIDT retest) are available at 3-year intervals with NIST-traceable documentation.
Are coating durability tests performed per MIL-C-48497A?

Yes — abrasion resistance, humidity cycling (95% RH, 40°C, 1000 h), and thermal shock (−40°C to +80°C, 10 cycles) are conducted per MIL-C-48497A Annex A.
Do you supply mounting hardware or kinematic cells compatible with Meg1063 dimensions?

Standard SM-threaded retaining rings (SM05, SM1, SM2 series) and vacuum-compatible cage plate adapters are available as optional accessories with matched CTE compensation design.

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