YANRUN 102XB Upright Metallurgical Microscope with Brightfield, Darkfield and Polarization Capabilities

Overview

The YANRUN 102XB is an upright metallurgical microscope engineered for high-precision microstructural analysis of opaque, polished metallic and ceramic specimens. Designed around an infinity-corrected optical path, it supports simultaneous brightfield (BF), darkfield (DF), and polarized light (POL) observation modes—enabling comprehensive characterization of grain structure, phase distribution, inclusion morphology, and crystallographic orientation in industrial quality control and failure analysis laboratories. Its rigid mechanical design features a 30° inclined trinocular head with interpupillary adjustment (50–75 mm), coaxial coarse/fine focusing mechanism (2 µm fine focus graduation), and precision-machined mechanical stage (190 × 140 mm platform, 50 × 40 mm travel range). The system complies with fundamental optical metrology standards for metallurgical microscopy, including ISO 80000-7 (quantities and units — optics) and ASTM E3-22 (Standard Guide for Preparation of Metallographic Specimens), ensuring traceable, repeatable imaging performance across routine inspection workflows.

Key Features

• Trinocular observation head with 30° inclination and adjustable interpupillary distance (50–75 mm) for ergonomic long-duration use
• Infinity-corrected long working distance (LWD) plan achromatic objectives: 5×/0.15 (WD 35 mm), 10×/0.28 (WD 35 mm), 20×/0.40 (WD 20 mm), 50×/0.55 (WD 13 mm)
• Four-position objective turret with centering adjustment capability for precise parfocality alignment
• Dual-field illumination system featuring independently adjustable aperture and field diaphragms, 12 V / 50 W halogen lamp (AC 85–230 V input), and plug-in green, blue, and neutral density filters
• Full polarization module: rotatable analyzer (0–360° calibrated scale), removable polarizer and analyzer, enabling quantitative birefringence assessment
• Mechanical stage with vernier-calibrated X–Y motion (50 × 40 mm range), integrated 0.01 mm stage micrometer for spatial calibration
• Coaxial coarse/fine focusing assembly with gear-rack transmission and 2 µm fine-focus graduation for reproducible Z-axis positioning

Sample Compatibility & Compliance

The 102XB accommodates standard metallographic specimens up to 30 mm in height and 75 mm in diameter, compatible with polished cross-sections prepared per ASTM E3-22 and ISO 643:2019 (steel microstructure classification). Its long working distance objectives allow safe observation of rough or coated samples without risk of objective collision. The optical train meets essential requirements for GLP-compliant documentation workflows when paired with optional digital imaging accessories. While the base configuration does not include FDA 21 CFR Part 11–compliant software, its modular design permits integration with third-party image acquisition platforms validated under ISO/IEC 17025 and GMP-aligned QA/QC protocols.

Software & Data Management

The 102XB operates as a hardware-only platform—no proprietary image analysis software is bundled. However, its trinocular port supports standardized C-mount adapters (optional), enabling seamless coupling with USB3.0 or HDMI-compatible industrial cameras (e.g., Basler ace, FLIR BFS-U3). Users may deploy open-source (ImageJ/Fiji) or commercial (NIS-Elements, Olympus cellSens) software packages for measurement, annotation, and report generation. Calibration data—including objective magnification factors, stage micrometer ratios, and pixel-to-micron conversion coefficients—can be embedded into metadata via EXIF or TIFF tags, supporting audit-ready documentation per ISO 15189 and CAP laboratory accreditation criteria.

Applications

• Microstructural evaluation of ferrous and non-ferrous alloys in foundry, heat treatment, and aerospace component manufacturing
• Phase identification and grain size measurement (ASTM E112, ISO 643) on etched steel, aluminum, titanium, and nickel-based superalloys
• Assessment of inclusion content and morphology (ASTM E45, ISO 4967) in bearing steels and structural grades
• Polarized light analysis of anisotropic phases (e.g., graphite in cast iron, martensite laths, ceramic grain boundaries)
• Failure analysis of fracture surfaces, weld zones, and coating delamination interfaces
• Quality assurance in powder metallurgy, additive manufacturing (AM) post-processing, and semiconductor packaging substrates

FAQ

Does the 102XB support digital imaging out of the box?
No—the system ships without a camera or image analysis software. Digital imaging requires optional C-mount adapters and external cameras.
Can the microscope be upgraded for automated stage control or motorized focus?
Yes—mechanical stage and focusing mechanisms are designed for retrofitting with OEM-compatible stepper motor kits and controller modules.
What is the maximum specimen height clearance under the 50× objective?
With the 50×/0.55 objective (WD = 13 mm), usable specimen height is approximately 10–11 mm after accounting for cover slip or mounting medium thickness.
Is the polarization module suitable for quantitative retardation measurements?
The rotatable analyzer enables qualitative birefringence assessment; quantitative retardation requires additional λ/4 plates and calibrated compensators (sold separately).
Are replacement halogen lamps and fuses included in the standard package?
One 12 V / 50 W halogen lamp is supplied; spare lamps and fuses are available as consumable SKUs but not included in base configuration.