YANRUN 6XB-PC Upright Metallurgical Microscope with PC Imaging Interface

Overview

The YANRUN 6XB-PC is an upright metallurgical microscope engineered for high-fidelity microstructural analysis of polished, uncoated metallic and ceramic specimens. Unlike inverted configurations optimized for bulk samples or large parts, the 6XB-PC’s upright optical architecture enables direct access to the specimen surface during observation and manipulation—critical for routine metallographic quality control, failure analysis, and phase identification in foundries, heat treatment facilities, and academic materials science laboratories. Its optical path supports both brightfield and polarized light contrast modes via a built-in rotatable analyzer housed within the 30° inclined binocular tube. The system employs a finite-conjugate, plan achromatic objective series specifically corrected for use without cover slips—ensuring minimal spherical and chromatic aberration across the full field of view at magnifications from 5× to 60×. All objectives feature long working distances (up to 18.3 mm at 5×), facilitating safe, unobstructed manipulation of coarse or topographically complex specimens under high NA conditions.

Key Features

• Upright configuration with ergonomic 30° inclined binocular head and integrated polarizing optics—enabling rapid switching between brightfield and polarized contrast without external accessories.
• Plan achromatic long-working-distance objectives (5×, 10×, 40×, 60×) optimized for metallurgical applications; all objectives are coverslip-free and corrected for consistent flatness and color fidelity across the 18 mm field number.
• Coaxial coarse/fine focusing system with 2 µm fine-focus graduation, adjustable coarse-tension control, mechanical lock, and upward travel limiter—ensuring repeatable, vibration-resistant positioning during extended observation or image capture sessions.
• Dual-layer mechanical stage (186 mm × 142 mm) with 75 mm × 50 mm travel range and 0.1 mm vernier scale—supporting precise specimen navigation and coordinate-based repositioning for serial section analysis or multi-site reporting.
• Köhler-illuminated epi-illumination system using a 6 V / 20 W halogen lamp, with independent field and aperture diaphragms, continuous brightness control, and built-in polarizer—delivering uniform, glare-free illumination across the entire field at all magnifications.
• Standard PC imaging interface includes a 0.5× C-mount adapter and USB digital camera (specifications vary per order), enabling real-time acquisition and documentation without requiring proprietary software stacks.

Sample Compatibility & Compliance

The 6XB-PC is designed exclusively for opaque, reflective specimens—primarily metallographically prepared alloys, sintered ceramics, composites, and coated substrates. Its long-working-distance objectives accommodate specimens up to 25 mm in height (at 5×), including mounted cross-sections in epoxy or bakelite resin. The absence of a condenser below the stage eliminates interference with thick or irregularly shaped samples. While the instrument itself does not carry CE, UKCA, or FDA certification as a medical device, its optical design and mechanical stability conform to widely adopted metrological practices referenced in ASTM E3-22 (Standard Guide for Preparation of Metallographic Specimens) and ISO 4497:2021 (Metallographic examination of sintered metal materials). The halogen illumination system meets IEC 62471 photobiological safety requirements for Class 1 LED/halogen sources when operated within specified voltage tolerances.

Software & Data Management

The 6XB-PC functions as a hardware platform compatible with third-party imaging software compliant with Windows/Linux-based TWAIN or DirectShow protocols—including open-source tools like ImageJ/Fiji and commercial packages such as Olympus cellSens, Zeiss ZEN Blue, or Media Cybernetics Image-Pro Premier. No proprietary analysis suite is bundled; however, optional research-grade image analysis modules (e.g., grain size quantification per ASTM E112, inclusion rating per ASTM E45, phase fraction mapping) may be licensed separately and deployed on user-supplied computers. Audit trail functionality, electronic signatures, and 21 CFR Part 11 compliance are achievable only when integrated into validated laboratory information management systems (LIMS) or electronic lab notebooks (ELN) meeting GLP/GMP data integrity requirements—not natively supported by the base microscope firmware.

Applications

• Routine metallographic QC in casting, forging, and additive manufacturing facilities—verifying grain structure homogeneity, porosity distribution, and heat-affected zone integrity.
• Failure analysis labs performing fractography, inclusion identification, and intergranular corrosion assessment per ASTM E3022 and ISO 16232.
• Academic materials science instruction—demonstrating phase transformations, precipitate morphology, and deformation mechanisms in Fe-C, Al-Si, Ti-6Al-4V, and Ni-based superalloys.
• Coating thickness estimation and adhesion evaluation on thermally sprayed or PVD-coated components using calibrated reticle measurements.
• Polarized light microscopy of birefringent phases (e.g., martensite variants, graphite flakes in cast iron, oxide scales) without additional polarization kits.

FAQ

Is the 6XB-PC suitable for biological or transparent specimens?

No. It is a dedicated upright metallurgical microscope configured for reflected-light observation only. Transmitted-light applications require a separate condenser assembly and are not supported.
Can I upgrade to 100× oil immersion objective?

Not without optical path modification. The standard 6XB-PC uses dry objectives only. Oil immersion objectives (e.g., 100×/1.25 NA) are incompatible due to fixed tube lens design and lack of immersion oil porting in the nosepiece.
Does the included camera support live measurement or calibration?

The base camera provides video streaming and still capture. Pixel-to-micron calibration requires user-defined stage micrometer verification and is enabled only when paired with compatible third-party software.
What is the maximum specimen height accommodated at 100× magnification?

At 60× (the highest standard objective), working distance is 0.96 mm. With optional 100× long-working-distance dry objectives (sold separately), maximum specimen height is ~0.4 mm—requiring precision polishing to avoid objective collision.
Is service and technical support available outside China?

Yes. YANRUN maintains authorized distributor networks in Southeast Asia, the Middle East, and select EU markets. Localized technical documentation, spare parts logistics, and remote diagnostics are coordinated through regional partners—not direct factory support.