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| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | SPM-8100FM |
| Instrument Type | Atomic Force Microscope (AFM) |
| Lateral Positioning Noise | 0.1 nm |
| Vertical Positioning Noise | 0.03 nm |
| Sample Diameter × Thickness | Φ24 mm × 8 mm |
| Sample Stage Travel Range | ±5 mm |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | SPM-9700HT |
| Instrument Type | Atomic Force Microscope (AFM) |
| XY Positioning Noise | 0.1–0.2 nm (horizontal) |
| Z Positioning Noise | 0.03–0.05 nm (vertical) |
| Sample Size | Ø24 mm × 8 mm |
| Sample Stage Travel Range | ±6 mm |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer | Shimadzu Corporation |
| Instrument Type | Atomic Force Microscope (AFM) |
| Category | Materials AFM |
| Position Detection Noise | < 0.02 nm RMS |
| Sample Dimensions | Ø50 mm × 8 mm max thickness |
| XY Stage Travel Range | 5 mm × 5 mm |
| Imaging Resolution | Up to 8192 × 8192 pixels |
| Automation Features | Auto-alignment ("Link On"), Auto-parameter optimization ("NanoAssist"), Fully automated tip exchange and fast 3D mapping |
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