Spectroscopy Instruments
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Showing 211–240 of 2603 results
| Brand | Applied Photophysics |
|---|---|
| Origin | United Kingdom |
| Model | SX20 |
| Instrument Type | Circular Dichroism (CD) Stopped-Flow Spectrometer |
| Detection Options | Diode Array, Dual Fluorescence, Fluorescence Polarization, Quench-Flow, Multi-Channel Sequential Mixing, CD-Stopped-Flow Module |
| Brand | Applied Spectra |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | J200 |
| Price Range | USD 140,000 – 700,000 |
| Instrument Type | Benchtop |
| Integration | Fully Integrated |
| Laser Energy | 25–100 mJ |
| Wavelength Options | 1064 nm, 266 nm, 213 nm, 343 nm (femtosecond), 1030 nm (femtosecond) |
| Spectrometer Options | EN4, EN6, SHP, IHP, RHP (dual-spectrometer configurations supported) |
| Sample Cell Options | Standard Flex Chamber, Cryo Cell, FlexSeal LA, FlexSeal Chamber, THP Cell – Standard Washout, THP Cell – Fast Washout |
| Brand | Aragon Photonics |
|---|---|
| Origin | Spain |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | BOSA-500 |
| Optical Band Coverage | O, S, C, and L bands |
| Optical Resolution | 10 MHz @ 1310 nm or 1550 nm (0.08 pm) |
| Wavelength Accuracy | ±0.5 pm @ C/C+L/S+C+L bands |
| Spurious-Free Dynamic Range (SFDR) | >80 dB |
| Core Technology | Stimulated Brillouin Scattering (SBS)-based tunable optical filtering |
| Integrated Tunable Laser Source (TLS) | Yes |
| Polarization-Resolved Spectral Measurement | Supported |
| Phase-Spectral Characterization Capability | Yes (e.g., chirp, eye diagram, constellation analysis) |
| Brand | ARC |
|---|---|
| Origin | Switzerland |
| Model | FT-NIR Rocket |
| Instrument Type | Portable |
| Spectral Range | 900–2600 nm (11000–3800 cm⁻¹) |
| Resolution | 4 cm⁻¹ (≤0.8 nm @ 1100 nm, ≤2 nm @ 1700 nm, ≤5 nm @ 2600 nm) |
| Wavenumber Accuracy | <1 cm⁻¹ @ 4000 cm⁻¹ (25±5°C) |
| Signal-to-Noise Ratio | >10,000:1 (RMS, full spectrum, single scan) |
| Dynamic Range | >3000:1 |
| Scan Speed | 1 spectrum/sec (averaging mode) |
| A/D Conversion | 24-bit |
| Detector | InGaAs photodiode array |
| Reference Laser | Integrated solid-state 850 nm laser |
| Optical Interface | SMA905, fiber input ≥1 mm core, NA = 0.2 |
| Power Supply | 5 V DC via USB 2.0 |
| Operating Temperature | 10–30 °C |
| Dimensions | 180 × 160 × 80 mm |
| Weight | 850 g |
| Compliance | CE, RoHS, USB-IF certified |
| Brand | Arcoptix |
|---|---|
| Origin | Switzerland |
| Instrument Type | Laboratory FT-IR |
| Spectral Range | 5000–830 cm⁻¹ |
| Resolution | 0.5 cm⁻¹ (standard 4 cm⁻¹, optional down to 0.5 cm⁻¹) |
| Signal-to-Noise Ratio | > 1:40,000 (at 8 cm⁻¹, 60 s acquisition) |
| Detector | Peltier-cooled MCT (4-stage TE), ZnSe beamsplitter |
| Interface | USB 2.0 |
| Dimensions | 180 × 160 × 80 mm |
| Weight | 1.8 kg |
| Operating Temperature | 10–40 °C |
| Brand | Arcoptix |
|---|---|
| Origin | Switzerland |
| Model | FT-IR Rocket |
| Detector | Thermoelectrically Cooled HgCdTe (MCT) |
| Interferometer Type | Permanently Aligned Dual Corner-Cube Design |
| Reference Laser | Solid-State Stabilized Laser (PPM-level wavelength stability) |
| Spectral Range | Mid-Infrared (Typical 2–12 µm, configuration-dependent) |
| Optical Interface | Fiber-Coupled or Free-Space Input |
| Resolution | Up to 0.5 cm⁻¹ (configurable) |
| Scan Rate | Up to 10 scans/sec (typical) |
| Weight | < 1.2 kg |
| Dimensions | 120 × 85 × 65 mm |
| Brand | Arcoptix |
|---|---|
| Origin | Switzerland |
| Model | FT-IR Rocket |
| Detector | Thermoelectrically Cooled MCT (2-stage or 4-stage) |
| Spectral Range | Mid-IR (typically 2.5–12 µm / 4000–833 cm⁻¹, configuration-dependent) |
| Resolution | 4 cm⁻¹ or 8 cm⁻¹ |
| Coupling Options | Fiber-optic (SMA-905 or FC/PC) and Free-space |
| Light Source | Integrated Broadband IR Emitter |
| Compliance | CE-marked, RoHS-compliant |
| Software Interface | USB 2.0, SDK for LabVIEW, Python, MATLAB |
| Brand | ARCoptix |
|---|---|
| Origin | Switzerland |
| Model | FT-NIR 0.9–2.6 |
| Instrument Type | Laboratory FT-NIR Spectrometer |
| Spectral Range | 900–2600 nm (3800–11,000 cm⁻¹) |
| Resolution | 4 cm⁻¹ |
| SNR | >200,000:1 (at 4 cm⁻¹, 60 s acquisition) |
| Wavelength Stability | <10 ppm long-term repeatability |
| Baseline Intensity Drift | <2% over 10 h (1100–2500 nm) |
| Detector | Extended-range InGaAs PIN photodiode (thermoelectrically cooled option available) |
| Data Acquisition Rate | 1 spectrum/s (continuous mode) |
| Interface | USB 2.0 (Ethernet optional) |
| A/D | 24-bit |
| Power | 7.5–12 V DC, 1–6 W |
| Operating Temperature | 5–40 °C |
| Dimensions | 180 × 160 × 80 mm |
| Weight | 1.7 kg |
| Brand | Arcoptix |
|---|---|
| Origin | Switzerland |
| Model | FTNIR-L1 |
| Instrument Type | Portable |
| Spectral Range | 11000–3850 cm⁻¹ (0.9–2.6 µm) |
| Resolution | 4 or 8 cm⁻¹ |
| Wavenumber Accuracy | < 2% (1100–2500 nm) over 10 hours |
| Detector | Single-element TE-cooled InGaAs photodiode |
| Input | Fiber-coupled |
| Brand | SPL |
|---|---|
| Origin | Switzerland |
| Model | ARCoptix |
| Type | Fourier Transform (FTIR) |
| Configuration | Online/Portable |
| Wavelength Range | 2–12 µm |
| Wavenumber Resolution | 4 cm⁻¹ |
| Wavelength Resolution | <2 nm (at 2 µm), <10 nm (at 4 µm), <12 nm (at 6 µm) |
| Signal-to-Noise Ratio | >1000:1 |
| Scan Rate | 1 spectrum/sec (interferogram averaging mode) |
| IR Source | Miniature blackbody emitter (1150 K) |
| Reference Laser | Solid-state 850 nm diode laser |
| Interference Compensation | Built-in dynamic self-compensation |
| Compliance | CE, RoHS, ISO/IEC 17025-compatible operation |
| Brand | ARC |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | ARCoptix |
| Pricing | Upon Request |
| Spectral Range | 400–1100 nm |
| Spectral Resolution | <5 nm |
| Wavelength Accuracy | <0.5 nm |
| Wavelength Temperature Drift | <0.03 nm/°C |
| Stray Light Suppression | –27 dB (broadband), –35 dB (narrowband) |
| Radiometric Accuracy | <5% |
| Dynamic Range | 5000:1 |
| Integration Time | 0.1–2000 ms |
| Wavelength Repeatability | <0.2 nm |
| Field of View (Relative Radiometry) | 10° |
| Field of View (Absolute Radiometry) | 180° |
| Compliance | IEC 60904-9 (Ed. 2), JIS C 8912, ASTM E927, IEC 60904-3 AM1.5 G spectral classes (50 nm bins) |
| Programmable Trigger Delay | 0–2000 ms (0.1 ms resolution) |
| Brand | ART Photonics |
|---|---|
| Origin | Germany |
| Model | FORO-L-3/5-F10 |
| Spectral Range | 3–5 µm |
| Lens Material | ZnSe |
| Lens Type | Plano-Convex |
| Focal Length | 10 mm |
| Numerical Aperture | 0.35 |
| Outer Diameter | 25 mm |
| Thread | M24×1 |
| Housing | Anodized Aluminum (Black) |
| AR Coating | Optimized for 3–5 µm |
| Compatible Connectors | SMA, FC/PC |
| Weight | ~45 g |
| Brand | ART Photonics |
|---|---|
| Origin | Germany |
| Model | CIR Fiber 1.5–6 µm |
| Spectral Range | 0.18–1.2 µm (UV-VIS) |
| Detector Type | CCD |
| Resolution | 30 |
| Sensitivity | 400 |
| Signal-to-Noise Ratio | 1001 |
| Core Diameter Options | 200–1500 µm |
| Numerical Aperture | 0.22 ± 0.02 (25° full acceptance angle) |
| Operating Temperature | −40 °C to +600 °C (copper-coated variant) |
| Connector Types | HP-SMA, D-80 |
| Cable Lengths | 1.5 m, 3.0 m (custom lengths from 5 cm to 50 m) |
| Cladding Material | Fluorine-doped fused silica |
| Core Material | High-OH⁻ or Low-OH⁻ fused silica |
| Jacketing Options | Nylon, Tefzel, acrylic, aluminum, copper |
| Protective Sheathing | PVC-coated stainless steel coil, silicone-coated stainless steel bend protection |
| Brand | ART Photonics |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PIR Fiber |
| Spectral Range | 3–17 µm |
| Brand | Artemis |
|---|---|
| Model | MARS-IRIS |
| Spectral Range | 400–1700 nm |
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Regional Classification | Domestic (PRC) |
| Pricing | Upon Request |
| Origin | Finland |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | ArtScanner |
| Pricing | Available Upon Request |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | High-Resolution CCD Array |
| Spectral Range | 130–700 nm |
| Optical Design | Paschen–Runge Mount with Dual Optical Chambers |
| Cooling | Thermostatically Controlled Enclosure (±0.1 °C) |
| Purge Medium | Argon |
| Compliance | ISO/IEC 17025-ready architecture, GLP/GMP-supporting data integrity features |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Method | Spark Discharge |
| Detector Type | Scientific-grade CMOS Sensor with Active Cooling |
| Wavelength Range | 130–700 nm |
| Element Analysis Time | ≤10 s per measurement |
| Detection Limit | ≤1 ppm for key metallic elements |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories, supports GLP/GMP audit trails and ASTM E415, E1086, E1479 methodologies |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark Discharge |
| Detector | Cooled Scientific-Grade A-CMOS Array |
| Wavelength Range | 130–700 nm |
| Optical Configuration | Dual-Optical-Path System |
| Element Coverage | ≥40 elements across Fe, Al, Cu, Ni, Zn, Mg, Co, Ti, Sn, Pb matrices |
| Detection Limit | ≤1 ppm (C, P, S, N with cryogenic cooling) |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Calibus 3 |
| Instrument Type | Handheld |
| Integration | Fully Integrated |
| Laser Pulse Energy | Not Specified (Nanosecond-Pulsed Solid-State Laser) |
| Wavelength Coverage | 190–700 nm |
| Detector | CMOS Array |
| Optical Stabilization | Active Temperature Control (PID) |
| Gas Purge | Argon (Recirculating System) |
| Quantification Method | Empirical Calibration Curve (Intensity-to-Concentration Mapping) |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Calibus 3S |
| Instrument Type | Handheld |
| Integration | Fully Integrated |
| Laser Pulse Energy | Not Specified (Nanosecond-Pulsed Solid-State Laser) |
| Wavelength Range | 190–700 nm |
| Detector | CMOS Array |
| Optical Architecture | Triple Spectrometer Chambers |
| Cooling | Active PID-Controlled Thermal Stabilization |
| Gas Purge | Recirculating Argon Flush System |
| Operating Temperature Range | −10 °C to +40 °C |
| Analysis Speed | <1 Second per Measurement |
| Safety Certification | Class 1 Laser Product (IEC 60825-1), No X-ray Emission |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Calibus 3S PLUS |
| Instrument Type | Handheld |
| Integration | Fully Integrated |
| Laser Pulse Energy | Not Specified (Nanosecond-Pulsed Solid-State Laser) |
| Wavelength Range | 190–700 nm |
| Detector | CMOS Array |
| Optical Architecture | Triple-Chamber Spectrograph |
| Cooling | Active PID-Controlled Thermal Stabilization (±0.1 °C) |
| Gas Purge | Recirculating Argon Flush System |
| Analysis Speed | <1 Second per Measurement |
| Operating Temperature Range | −10 °C to +40 °C |
| Imaging | Integrated HD Camera with Micro-Region Targeting and Image Logging |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Calibus 5 |
| Instrument Type | Handheld |
| Integration | Fully Integrated |
| Laser Energy | 1 mJ (typical, single-pulse) |
| Wavelength Range | 190–700 nm |
| Detector | CMOS Array |
| Laser Pulse Width | Nanosecond-scale |
| Operating Temperature Range | −10 °C to +40 °C |
| Argon Consumption | ~200 analyses per fill |
| Safety Certification | Class 4 Laser Product (IEC 60825-1), No X-ray Emission |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Calibus 5/9 |
| Instrument Type | Handheld |
| Integration | Fully Integrated |
| Laser Pulse Energy | Not Specified (Nanosecond-Pulsed Solid-State Laser) |
| Spectral Range | 190–700 nm |
| Detector | CMOS Array |
| Cooling | Active PID-Controlled Thermal Stabilization |
| Gas Purge | Integrated Argon Circulation System |
| Operating Temperature Range | –10 °C to +40 °C |
| Analysis Time | < 1 s per measurement |
| Elemental Coverage | >30 elements including C, Li, Be, B, Si, Fe, Al, Cu, Ni, Zn, Mg, Ti, Co, Pb, Sn, and others |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Model | Calibus M |
| Instrument Type | Portable / Field-Deployable LIBS Analyzer |
| Optical Range | 190–700 nm |
| Detector | CMOS Array |
| Laser | Q-switched Nanosecond Solid-State, <0.1 °C Thermal Stability Control |
| Pulse Width | Nanosecond |
| Argon Purge | Integrated Recirculating System (≥200 analyses per charge) |
| Operating Temperature | –10 °C to +40 °C |
| Safety | Class 4 Laser (IEC 60825-1 compliant), Interlocked Trigger, Zero X-ray Emission |
| Quantification Method | Empirical Calibration with Multi-Parameter Spectral Correction (Background Subtraction, Matrix Correction, Spectral Drift Compensation) |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | CALIBUS Handheld LIBS |
| Instrument Type | Handheld |
| Integration | Fully Integrated |
| Laser Pulse Energy | 400 mJ per pulse (typical, Q-switched Nd:YAG at 1064 nm) |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark Discharge |
| Detector Type | Cooled Scientific-Grade CMOS |
| Wavelength Range | Configurable (UV–Vis, down to ~130 nm) |
| Optical System | Dual-Chamber Paschen–Runge Mount |
| Cooling | Thermoelectric (Peltier) |
| Detection Limit | ≤1 ppm for C, P, S, N, and other metallic/non-metallic elements |
| Stability | Drift-Free Operation (No Recalibration Required Under Normal Conditions) |
| Analysis Time | <10 s per sample |
| Argon Consumption | Reduced by ~67% vs. conventional systems |
| Compliance | Designed for ISO/IEC 17025, ASTM E415, E1086, E3061, and EN 10315 environments |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | Cooled Scientific-Grade A-CMOS |
| Focal Length | UV 300 mm, Visible 450 mm |
| Groove Density | UV 3600 lines/mm, Visible 2400 lines/mm |
| Wavelength Range | 130–700 nm |
| Number of Channels | Full CMOS Array (12–15 cm² active area) |
| Cooling | Thermoelectrically Cooled Detector |
| Optical Configuration | Dual Chamber (UV-Dedicated + Visible) |
| Stability | Drift-Free Operation (No Recalibration Required) |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | Cooled Scientific CMOS (A-CMOS) |
| Wavelength Range | Configurable (UV–Vis, down to ~130 nm) |
| Optical System | Dual Chamber Design |
| Cooling | Thermoelectric (Peltier) |
| Stability | Drift-Free Operation (No Recalibration Required) |
| Detection Limit | ≤1 ppm for key elements (C, P, S, N, Al, Cu, etc.) |
| Analysis Time | <10 s per sample |
| Argon Consumption | Reduced by ~67% vs. conventional systems |
| Compliance | Designed for ISO/IEC 17025, ASTM E415, E1086, E3061, and USP <730> trace metal analysis workflows |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | Cooled Scientific-Grade CMOS |
| Wavelength Range | Configurable (UV–VIS, down to ~130 nm) |
| Optical Design | Dual Chamber |
| Detection Limit | ≤1 ppm for key metallic and non-metallic elements |
| Stability | Drift-Free Operation Without Recalibration |
| Analysis Time | ≤10 s per sample |
| Gas Consumption | Reduced Argon Usage (≈33% of conventional systems) |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |