- All
- Favorite
- Popular
- Most rated
| Brand | BATOP |
|---|---|
| Origin | Germany |
| Model | PCA- |
| Wavelength Options | 800 nm / 1064 nm / 1550 nm |
| Antenna Types | Bow-tie, Parallel-line, Butterfly, Interdigital Array, Finger-gap, Logarithmic Spiral |
| Lens Options | Aspheric Silicon Lenses (Collimating or Focusing) |
| Compliance | RoHS-compliant semiconductor fabrication |
| Packaging | Hermetically sealed, anti-reflection coated Si substrate housing |
| Brand | BATOP |
|---|---|
| Origin | Germany |
| Model | PCA Series |
| Excitation Wavelengths | 800 nm, 1064 nm, 1550 nm |
| Antenna Types | Bow-tie, Parallel-line, Butterfly, Interdigital Array, Finger-gap, Logarithmic Spiral |
| Lens Options | Aspheric Silicon Lenses (Collimating or Focusing) |
| Compliance | ISO 9001-certified Manufacturing |
| Application Domain | Time-Domain Terahertz Spectroscopy (THz-TDS), Pump-Probe Metrology, Ultrafast Carrier Dynamics |
| Brand | Rayscience |
|---|---|
| Origin | South Korea |
| Model | PL Mapping |
| Optical Range | 350–2200 nm (UV-VIS-NIR) |
| Spatial Resolution | 10 µm (1 µm optional) |
| XY Stage | Motorized, 1 µm step resolution, max speed 30 mm/s |
| Spectrometers | EPP2000-VIS (350–1150 nm, 2048-pixel CCD, 1.6 nm res.) & IG512-NIR (900–1700 nm, 512-pixel InGaAs array, 14-bit ADC, 2.5 MHz digitizer) |
| Excitation Flexibility | Interchangeable laser sources (355/405/450/532/635/785 nm typical) |
| Sample Compatibility | 2″ & 4″ epitaxial wafers |
| Film Thickness Measurement | Via white-light reflectance spectroscopy |
| Software | Windows-based acquisition & offline analysis suite with statistical mapping, outlier removal, edge masking, cross-section profiling, and spectral parameter extraction (integrated intensity, peak wavelength, dominant wavelength, FWHM, spectral centroid) |
Show next