- All
- Favorite
- Popular
- Most rated
| Brand | Fastmicro |
|---|---|
| Origin | Netherlands |
| Model | FM-PS-PFS-V02 |
| Measurement Principle | Dark-field Mie scattering |
| Measurement Range | 0.5–150 µm |
| Repeatability | ≥90% |
| Measurement Interval | ≤10 s per scan |
| Field of View (FOV) | Ø25 mm (on 50 mm replaceable substrate) |
| Environmental Operation | Ambient pressure and vacuum-compatible |
| Compliance | ISO 14644-9, ISO 14644-17 |
| Output Formats | KLARF, Excel, PDF (ISO-compliant qualification reports) |
| Software | Integrated real-time analysis with annotated imaging and 3D signal profiling |
Show next