Empowering Scientific Discovery

Weina (Hong Kong) Technology Co., Ltd.

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BrandFastmicro
Country of OriginNetherlands
ModelFM-PS-PRS-V01
Detection PrincipleMie Scattering
Minimum Detectable Particle Size0.5 µm (PSL)
Measurement SpeedFull-surface imaging in seconds
Position Accuracy80 µm
Position Repeatability30 µm
Size Accuracy (PSL)<20% error
Surface Roughness RequirementRa < 50 nm
Output FormatsKLARF, Excel
InterfaceUSB, Ethernet
Contactless OperationYes
ComplianceDesigned for ISO 14644-1 cleanroom environments and SEMI S2/S8 safety standards
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