Aolong YX-2H8 X-Ray Crystal Orientation Instrument
| Brand | Aolong |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | YX-2H8 |
| Price | Upon Request |
| Input Power | 220 V AC, 50 Hz, 0.3 kW |
| X-ray Tube | Cu anode, air-cooled, 30 kV, 0–5 mA |
| Detector | Geiger-Müller counter |
| Time Constants | 0.1 s, 0.4 s, 3 s |
| Angular Range | θ = −10° to +50°, 2θ = −10° to +100° |
| Angular Resolution (digital display) | 10 arcseconds |
| Angular Accuracy | ±30 arcseconds |
| Slit Apertures | 4′, 5′, 6′ |
| Optical Shutter | Manual |
| Display | Digital angle readout |
| Dimensions (L×W×H) | 1150 mm × 665 mm × 1100 mm |
| Weight | 170 kg |
| Sample Capacity | 1–30 kg, diameter up to 8 inches (203 mm), compatible with sapphire, silicon, and other single-crystal materials |
| Goniometer Options | YA, YB, YD, YE interchangeable sample stages |
Overview
The Aolong YX-2H8 X-Ray Crystal Orientation Instrument is a precision Bragg-angle diffractometer engineered for rapid, non-destructive crystallographic orientation determination of bulk single-crystal ingots and wafers. Based on the fundamental principle of Bragg’s law (nλ = 2d sinθ), the instrument utilizes Cu-Kα radiation (λ = 1.5418 Å) to excite characteristic diffraction peaks from crystalline lattices. By precisely scanning the incident (θ) and diffracted (2θ) angles while monitoring intensity via a Geiger-Müller counter, the system identifies lattice plane orientations—most commonly (0001) for sapphire, (111) or (100) for silicon—and determines angular deviation relative to reference crystallographic axes. Designed for industrial metrology environments, the YX-2H8 integrates a reinforced linear bearing rail and upgraded goniometric stage architecture to support high-mass samples (up to 30 kg) and large-diameter substrates (2–8 inches), making it suitable for pre-slicing quality control in LED, power electronics, and semiconductor substrate manufacturing.
Key Features
- High-load-capacity goniometer system with precision linear bearing rails, enabling stable positioning and repeatable measurements on heavy, irregularly shaped crystals.
- Digital angular readout with 10 arcsecond resolution and ±30 arcsecond overall angular accuracy—traceable to mechanical encoder calibration and optical alignment verification protocols.
- Modular goniometer compatibility: supports four interchangeable sample stage configurations (YA, YB, YD, YE) optimized for different crystal geometries, mounting methods, and orientation conventions (e.g., azimuthal rotation, tilt-compensated alignment).
- Adjustable collimation system with selectable slit apertures (4′, 5′, 6′) to balance intensity throughput and angular resolution based on crystal quality and mosaic spread.
- Three-step time constant selection (0.1 s, 0.4 s, 3 s) for adaptive signal integration, accommodating both highly ordered monocrystals and materials with broader rocking curves.
- Manual optical shutter and air-cooled Cu-target X-ray tube (30 kV / 0–5 mA) provide operational simplicity, low maintenance, and compliance with Class I radiation safety requirements when installed per local regulatory guidelines.
Sample Compatibility & Compliance
The YX-2H8 is validated for orientation analysis of industrially relevant single-crystal materials including sapphire (Al₂O₃), silicon (Si), silicon carbide (SiC), gallium arsenide (GaAs), and lithium niobate (LiNbO₃). Its mechanical design accommodates cylindrical boules (2–8 inch diameter), rectangular slabs, and irregularly cut blanks weighing between 1 kg and 30 kg. The instrument meets general electrical safety standards (IEC 61010-1) and electromagnetic compatibility (EMC) requirements for laboratory equipment. While not certified to ISO/IEC 17025 as a standalone testing laboratory, its measurement repeatability and documented angular calibration procedures support internal GLP-aligned workflows. Users are responsible for implementing site-specific radiation shielding, interlock verification, and operator training in accordance with national regulations (e.g., NRC 10 CFR Part 20 or equivalent).
Software & Data Management
The YX-2H8 operates in manual and semi-automated modes via front-panel digital controls; no proprietary PC software is bundled. All angular data—including θ/2θ positions, count rates, and time-constant settings—are displayed in real time on a dedicated digital angle readout. For traceability, users may manually log readings into LIMS or Excel-based templates aligned with ISO 9001 documentation practices. Optional third-party DAQ interfaces (e.g., USB-to-RS232 adapters) enable ASCII data streaming for integration with custom LabVIEW or Python-based acquisition scripts. Audit trails, electronic signatures, and 21 CFR Part 11 compliance are not natively supported but can be implemented at the facility level through procedural controls and external validation.
Applications
- Pre-slicing verification of sapphire boules for LED substrate production, ensuring (0001) c-plane alignment within specification limits prior to wafering.
- Orientation screening of silicon ingots used in photovoltaic and power device fabrication to confirm (100) or (111) growth direction consistency across batches.
- Quality assurance of SiC crystal bars for high-voltage Schottky diodes and MOSFETs, where off-axis orientation affects epitaxial layer uniformity.
- R&D support for novel oxide and nitride crystal growth, enabling rapid feedback on crystallographic homogeneity and twinning behavior.
- Calibration reference setup for secondary standard crystals in metrology labs performing inter-instrument angular verification.
FAQ
What crystallographic planes can the YX-2H8 measure?
The instrument measures any Bragg-reflexive plane accessible within its angular range (θ = −10° to +50°, 2θ = −10° to +100°), including but not limited to (0001) in sapphire, (111), (100), and (110) in silicon, and (0001), (101̅0), and (112̅0) in SiC.
Is radiation shielding included with the system?
No. The YX-2H8 is supplied without integrated lead shielding. Users must install compliant fixed or movable shielding per local radiation safety authority requirements and conduct initial and periodic leakage surveys.
Can the YX-2H8 be upgraded with motorized goniometers or automated sample handling?
Not natively. The platform is mechanically optimized for manual operation. Motorization would require substantial redesign of the goniometer base and is not supported by Aolong under current product specifications.
Does the instrument support quantitative rocking curve analysis?
Yes—by manually stepping the θ angle in fine increments (e.g., 0.01°) and recording counts per step, users can construct full-width-at-half-maximum (FWHM) rocking curves to assess mosaic spread and crystalline perfection.
What maintenance is required for the X-ray tube?
The air-cooled Cu tube requires no routine replacement under normal usage (≤4 h/day). Annual visual inspection of cooling fins, voltage regulation stability, and filament emission consistency is recommended.
