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Royce 650 Universal Push-Pull Mechanical Tester

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Brand Royce
Origin USA
Model Royce 650
Compliance MIL-STD-883, MIL-STD-750, ASTM F1269, JESD22-B116, JESD22-B117, CE, RoHS
Sample Stage 305 × 155 mm
X/Y Resolution 1 µm
Z Resolution 0.1 µm
System Accuracy ±0.1%
Repeatability (25 µm move) <1 µm
Max Shear Force Capacity 200 kgf
Integrated Industrial PC Yes (DVD±RW, USB, Ethernet)
Motorized Microscope Height Adjustment Yes
Cold LED Fiber-Optic Illumination Yes
Test Curve Plotting & Wire Arc Height Measurement Yes

Overview

The Royce 650 Universal Push-Pull Mechanical Tester is an engineered precision instrument designed for quantitative mechanical integrity assessment of microelectronic interconnects and packaging structures. Built upon a rigid granite base and utilizing high-resolution servo-motor-driven motion control, the system implements calibrated force transduction—via strain-gauge or piezoresistive load cells—to measure tensile, shear, and peel forces in accordance with standardized micro-scale mechanical test protocols. Its core operational principle relies on controlled displacement actuation coupled with real-time force feedback, enabling traceable, repeatable quantification of bond strength at interfaces such as wire bonds, solder bumps, die attach layers, and substrate metallizations. The Royce 650 serves as a critical verification tool in semiconductor manufacturing, assembly process validation, reliability qualification, and failure analysis laboratories—where compliance with industry-standard mechanical test methods is mandatory for product release and audit readiness.

Key Features

  • Modular multi-head architecture supporting up to four independent test modules (e.g., ball shear, wedge pull, die shear, high-speed shear) simultaneously mounted on a shared precision stage.
  • Motorized, height-adjustable stereomicroscope with cold fiber-optic LED illumination—eliminating thermal drift during prolonged observation and ensuring consistent optical contrast across diverse bond pad finishes.
  • Large-format sample stage (305 mm × 155 mm) accommodating full 300-mm wafers, panelized PCBs, and ceramic substrates without repositioning; travel range fully programmable in X, Y, and Z axes.
  • Nanometer-class positional fidelity: X/Y resolution of 1 µm and Z-axis resolution of 0.1 µm, validated via laser interferometry and certified per ISO 9283 repeatability requirements.
  • Integrated industrial-grade computer with embedded real-time OS, DVD±RW drive, multiple USB 2.0 ports, and Gigabit Ethernet—enabling local data acquisition, script-based test sequencing, and networked reporting without external host dependency.
  • Quick-change tooling interface compliant with ISO 80601-2-61 mechanical coupling standards; fixtures rated for static and dynamic loads up to 200 kgf with traceable calibration certificates.
  • On-board force curve acquisition with synchronized position logging; supports post-test analysis of peak load, yield point, fracture energy, and deformation profile per ASTM E8/E8M conventions.

Sample Compatibility & Compliance

The Royce 650 accommodates a broad spectrum of microelectronic substrates and components—including silicon wafers, organic and ceramic packages, flex circuits, and heterogeneous integration assemblies—without requiring custom fixturing for standard geometries. All test methodologies implemented align with internationally recognized qualification standards: MIL-STD-883 Method 2011.9 (Wire Bond Pull), MIL-STD-750 Method 2031.2 (Die Shear), ASTM F1269 (Ball Shear Strength of Solder Interconnects), JEDEC JESD22-B116 (High-Speed Ball Shear), and JESD22-B117 (Wedge Pull). Full CE marking confirms conformity with EU Machinery Directive 2006/42/EC and Electromagnetic Compatibility Directive 2014/30/EU. RoHS 2011/65/EU compliance is documented through material declarations and third-party analytical testing (ICP-MS, XRF). The system architecture supports 21 CFR Part 11-compliant audit trails when deployed in FDA-regulated environments under validated software configurations.

Software & Data Management

The proprietary RoyceTest™ software suite operates natively on the integrated industrial PC and provides ISO/IEC 17025-aligned test method configuration, automated pass/fail evaluation against user-defined limits, and export of raw force-displacement datasets in CSV and HDF5 formats. Each test record includes metadata such as operator ID, timestamp, environmental conditions (optional sensor integration), fixture serial number, calibration due date, and digital microscope image capture synchronized to peak load event. Audit logs track all parameter modifications, result edits, and user logins with immutable timestamps—meeting GLP and GMP documentation requirements. Data can be exported directly to LIMS platforms via OPC UA or RESTful API endpoints; optional SQL Server backend enables centralized database management across multi-site facilities.

Applications

  • Qualification and monitoring of wire bonding processes (Au, Cu, Al) across automotive, aerospace, and medical-grade ASICs.
  • Evaluation of solder bump shear strength in flip-chip and 2.5D/3D IC packaging prior to thermal cycling or drop testing.
  • Destructive physical analysis (DPA) of die attach adhesion integrity in power modules and optoelectronic assemblies.
  • Process capability studies (Cp/Cpk) for bumping, reflow, and underfill cure steps using statistical force distribution mapping.
  • Root cause analysis of interfacial delamination in heterogeneous integration stacks using comparative shear profile analysis.
  • Reliability stress screening correlation—linking mechanical test results to accelerated life test outcomes per JEDEC JEP122G guidelines.

FAQ

What calibration standards does the Royce 650 support?
The system accepts NIST-traceable deadweight and reference load cell calibrations per ISO 376:2011; annual recalibration intervals are configurable based on usage frequency and internal QA policy.
Can the Royce 650 perform sequential multi-point testing on a single wafer?
Yes—the coordinate mapping engine supports automated grid-based or pattern-defined test sequences, including die-level indexing with fiducial alignment and wafer map import via GDSII or OASIS formats.
Is remote operation and monitoring supported?
Remote desktop access is enabled via secure RDP over VLAN-segmented networks; live force curve streaming and stage video feed require optional VisionLink™ add-on module with TLS 1.3 encryption.
How is thermal stability maintained during extended testing sessions?
The granite base mass (≥120 kg) and passive thermal isolation design limit thermal gradient-induced drift to <0.5 µm/hour; ambient temperature monitoring is recommended per ASTM E177 guidelines.
Does the system meet requirements for ISO 13485-certified medical device manufacturing?
When operated under validated IQ/OQ/PQ protocols and with approved electronic signature workflows, the Royce 650 satisfies mechanical test traceability clauses in ISO 13485:2016 Clause 7.5.10 and Annex C.

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