EDAX
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| Brand | EDAX |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | DigiView |
| Pricing | Upon Request |
| CCD Resolution | 1392 × 1040 pixels |
| Readout Speeds | 20 MHz / 40 MHz |
| Angular Resolution | < 0.1° |
| Quantum Efficiency | > 62% @ 500 nm |
| Bit Depth | 12-bit digital output |
| Read Noise | < 8 e⁻ @ 20 MHz |
| Exposure Time Range | Up to 15 minutes |
| Cooling | Single-stage Peltier (fanless) |
| Interface | Gigabit Ethernet |
| Gain Control Range | 0–35 dB (fully adjustable) |
| Vacuum Compatibility | Bellows-mounted for in-chamber operation |
| Optional Feature | Integrated Fore-Scatter Detector (FSD) |
| Software Integration | Fully compatible with EDAX TEAM™ EBSD analysis suite |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Element |
| Quotation | Upon Request |
| Energy Resolution | 129 eV (Mn Kα) |
| Peak-to-Background Ratio | 10,000:1 |
| Maximum Count Rate | 500 kcps |
| Detector Active Area | 30 mm² |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Elite T |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | Not Specified |
| Maximum Count Rate | 850 kcps |
| Detector Active Area | 70 mm² |
| Window Option | Optional Windowless Configuration |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Hikari XP |
| Angular Resolution | < 0.1° |
| Maximum Pattern Indexing Rate | up to 1400 points/sec |
| Beam Current Compatibility | down to 100 pA |
| Accelerating Voltage Compatibility | down to 5 kV |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Octane Elect |
| Energy Resolution | 127 eV |
| Maximum Count Rate | 400,000 cps |
| Detector Active Area | 30 mm² or 70 mm² |
| Window Material | Silicon Nitride (Si₃N₄) |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Octane Elite |
| Energy Resolution | 125 eV (Mn Kα) / 123 eV (optimized configuration) |
| Peak-to-Background Ratio | Not specified |
| Maximum Output Count Rate | 400,000 cps |
| Detector Active Area | 30 mm² (Octane Elite Plus) or 70 mm² (Octane Elite Super) |
| Window Material | Silicon Nitride (Si₃N₄) |
| Vacuum Compatibility | Fully sealed ultra-high vacuum detector housing |
| Integration | Compatible with SEM, FIB-SEM, and TEM platforms |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Orbis |
| Detector Type | Energy-Dispersive X-ray Fluorescence (EDXRF) |
| Operating Environment | Air or Low Vacuum |
| Elemental Range | Na (11) to Bk (97) |
| Sample Chamber Capacity | Up to 300 mm × 300 mm × 150 mm (W×D×H) |
| Beam Spot Size | Adjustable down to <30 µm |
| Software Platform | Vision™ v5.x |
| Compliance | ASTM E1621, ISO 8256, USP <232>/<233>, GLP/GMP-ready audit trail support |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Orion |
| Angular Resolution | < 0.1° |
| Maximum Pattern Acquisition Rate | 1500 pts/s (Orion Plus) or 3000 pts/s (Orion Super) |
| Sensor Type | High-Sensitivity CMOS |
| Standard Pattern Size for High-Speed Calibration | 120 × 120 pixels |
| Confidence-Based Indexing Algorithm | Tri-Band Confidence Index (CI) |
| EDS-EBSD Synchronization | Fully Supported with EDAX EDS Detectors |
| Compliance | Designed for ASTM E112, ISO 11947, and USP <1086>–aligned microstructural characterization workflows |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | TEAM™ Pegasus (EDS-EBSD) |
| Detector Type | Integrated Energy Dispersive Spectrometer (EDS) and Electron Backscatter Diffraction (EBSD) System |
| EDS Detector Options | Octane Elect or Octane Elite Silicon Drift Detector (SDD) |
| EBSD Camera Options | Velocity™ Super, Orion™, Hikari Super, DigiView |
| Energy Resolution | <127 eV at Mn Kα (typical for Octane Elite SDD) |
| Peak-to-Background Ratio | >3,500:1 (at 5 kcps, Mn Kα) |
| Maximum Input Count Rate | Up to 2.5 Mcps (Octane Elite) |
| Active Detector Area | 100 mm² (Octane Elite) |
| EBSD Camera Frame Rate | Up to 3,000 fps (Velocity™ Super, full-frame) |
| Spatial Resolution (EBSD) | ≤0.05° angular resolution (confidence index ≥0.1) |
| Software Platform | TEAM™ v5.x with real-time indexing, EXpert ID, and automated background subtraction |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | TEAM™ Trident (EDS-EBSD-WDS) |
| Detector Type | Octane Elite SDD (EDS), Velocity™ Super / Orion™ / Hikari Super / DigiView (EBSD), TEXS (WDS) |
| Energy Resolution | ≤123 eV at Mn Kα (typical, 100k cps) |
| Peak-to-Background Ratio | >20,000:1 (Mn Kα, 10 kV) |
| Maximum Input Count Rate | ≥1,000,000 cps (EDS) |
| Active Detector Area | 100 mm² (Octane Elite SDD) |
| EBSD Camera Frame Rate | Up to 3,000 fps (Velocity™ Super, 1×1 binning) |
| WDS Spectral Resolution | <10 eV (full width at half maximum) |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | TEM Octane |
| Energy Resolution | 129 eV (Mn Kα) |
| Maximum Count Rate | 250 kcps |
| Detector Active Area | 30–100 mm² |
| Window Options | Ultrathin Window (SUTW) and Windowless Configurations |
| Solid Angle | Up to 1.1 sr |
| Light Element Performance | Optimized for C, N, O, F with >500% sensitivity gain vs. SUTW in windowless mode |
| Resolution Stability | <1 eV up to 100 kcps |
| Pulse Processing Time | Adjustable from 120 ns to 7.65 µs |
| Interface | Gigabit Ethernet |
| Safety | Motorized retraction upon BSE overload detection |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | TEXS |
| Quotation | Available Upon Request |
| Energy Resolution | Optimized for 150 eV – 10 keV Range |
| Peak-to-Background Ratio | High, typical of high-efficiency PBS architecture |
| Maximum Count Rate | Compatible with standard SEM/WDS-compatible electron column currents (e.g., 1–10 nA) |
| Detector Area | Integrated Bragg crystal diffraction system with five standard analyzing crystals |
| Optical Design | Capillary-based Parallel Beam Spectrometer (PBS) |
| Mass | 20.5 kg (45 lbs) |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Velocity Super |
| Maximum Acquisition Speed | 4500 points/sec |
| Orientation Resolution | < 0.1° |
| Image Resolution (during high-speed acquisition) | 120 × 120 pixels |
| Detector Type | High-sensitivity, low-noise CMOS |
| Calibration Algorithm | Triplet-band confidence-based indexing |
| EDS-EBSD Synchronization | Yes, with compatible EDAX EDS detectors |
| Compliance | Designed for ASTM E112, ISO 11937, and ASTM E2627-compliant microstructural quantification workflows |
| Software Integration | OIM Analysis™ v9+ with GLP-compliant audit trail and 21 CFR Part 11-ready data handling |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XLNCE SMX-BEN |
| Quotation | Upon Request |
| Energy Resolution | See Technical Datasheet |
| Peak-to-Background Ratio | See Technical Datasheet |
| Maximum Count Rate | See Technical Datasheet |
| Detector Active Area | See Technical Datasheet |