Electron Microscope
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| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Max Infinity ∞ |
| Quotation | Upon Request |
| Detector Mounting | Tilting (Side-Entry) |
| Energy Resolution | C Ka < 46 eV @ 50,000 cps |
| Elemental Detection Range | Be (Z=4) to Cf (Z=98) |
| Detector Active Area Options | 40 mm², 65 mm², 100 mm², 170 mm² |
| Window Type | SuperATW (Atmospheric Thin Window) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Ultim Max |
| Detector Type | Tilting Insertion Mount |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | 1,500,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 40–170 mm² |
| Window Type | Super-Atmospheric Thin Window (SATW) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Max TLE |
| Instrument Type | Side-Insertion EDS Detector |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | >200,000 cps (Xplore TEM), up to 400,000 cps (Ultim Max TLE, quantitative mode) |
| Elemental Detection Range | Beryllium (Be) to Californium (Cf) |
| Active Detector Area | 80 mm² (Xplore TEM), 100 mm² (Ultim Max TLE) |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | UltimMax TEM |
| Instrument Type | Side-entry (tilt-compatible) |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | 400,000 cps |
| Elemental Detection Range | Be to Cf |
| Detector Active Area | 80 mm² |
| Window Type | Windowless |
| Solid Angle | 0.2–0.6 srad |
| Low-Energy X-ray Sensitivity Gain | Up to 8× vs. conventional windowed detectors |
| In Situ Operation Temperature | Up to 1000 °C |
| Compatible Accelerating Voltages | Up to 200 kV |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | UltimMax TLE |
| Detector Type | Tilting Insertion Geometry |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Input Count Rate | 400,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 100 mm² |
| Window Type | Windowless |
| Solid Angle | 0.5–1.1 srad |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Unity |
| Mounting Type | Side-entry (inclined insertion) |
| Detector Architecture | Integrated Backscattered Electron (BSE) and Energy-Dispersive X-ray (EDS) Sensor Assembly |
| Positioning | Mounted directly beneath the objective lens pole piece |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore 30 |
| Detector Type | Tilting (Side-Entry) |
| Energy Resolution | 129 eV at Mn Kα |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 1,000,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 300 mm² |
| Window Type | Beryllium Window |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore TEM |
| Instrument Type | Side-entry (tilt-compatible) EDS system for TEM |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Input Count Rate | 200,000 cps |
| Elemental Detection Range | Beryllium (Be) to Californium (Cf) |
| Detector Active Area | 80 mm² |
| Window Type | Windowless (ultra-thin polymer support) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore15 / Xplore30 |
| Detector Geometry | Tilting (Side-entry) |
| Energy Resolution | 129 eV @ 100,000 cps |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 1,000,000 cps |
| Elemental Detection Range | Boron (B) to Californium (Cf) |
| Active Crystal Area | 15 mm² or 30 mm² |
| Window Type | Super-Atmospheric Thin Window (SATW) |
| Brand | Park SYSTEMS |
|---|---|
| Origin | South Korea |
| Model | NX-TSH |
| Instrument Type | Industrial AFM |
| Sample Stage Travel Range | 625 mm × 525 mm |
| Maximum Sample Dimensions | 520 mm × 520 mm × 10 mm (10 kg) |
| Acoustic Noise Attenuation | >20 dB with Integrated Acoustic Enclosure |
| XY Scanning Range (Closed-Loop) | 100 µm × 100 µm |
| Z Scanning Range | 15 µm |
| Z Sensor Noise Floor | Sub-nanometer (low-noise optical lever detection) |
| Probe Exchange | Automated Tip eXchanger (ATX) with vision-based tip recognition and magnetic probe handling |
| Laser Alignment | Motorized, auto-focused beam positioning |
| Electrostatic Control | Integrated bipolar ionizer for charge neutralization |
| Electrical Characterization Option | Conductive AFM (C-AFM) with micro-probe station and 2D encoder stage |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Pharos STEM |
| Accelerating Voltage | 20 kV |
| Resolution | ≤ 1 nm |
| Sample Holder | Standard 3 mm TEM grid clamp |
| Imaging Modes | Bright-Field (BF), Dark-Field (DF), High-Angle Annular Dark-Field (HAADF), User-Defined Detector Segmentation |
| Vacuum Levels | 0.1, 10, and 60 Pa |
| Imaging Time (Sample-to-Image) | < 40 s |
| Working Distance | Fixed for optimal STEM performance |
| Detector Configuration | 11-segment annular STEM detector with fully configurable quadrant/group selection |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Phenom Pharos-STEM |
| Price | Upon Request |
| Brand | point electronic |
|---|---|
| Origin | Germany |
| Model | 3D Calibration Kit |
| Compliance | VDI/VDE 2656 |
| Software | microCal Calibration Suite |
| Compatibility | SEM, AFM, CLSM, 3D-SEM |
| Calibration Type | Geometric Metrology (X/Y/Z Scale, Shear, Coupling) |
| Traceability | NIST-traceable reference data provided |
| Brand | Quantum Scale |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | Nano Tech 20 AFM |
| Instrument Type | Industrial-Grade |
| SPM Architecture | Modular & Multi-Functional |
| Positioning Noise | XY: 0.2 nm, Z: 0.05 nm |
| Sample Size Compatibility | Up to 300 mm (12-inch) wafers, downward-compatible |
| XY Stage Travel | 200 mm × 200 mm (customizable) |
| Z Scan Range | 10 µm |
| Imaging Modes | Contact, Tapping, Force Spectroscopy, Phase Imaging |
| Optional Upgrades | EFM, MFM, KPFM, PFM, Lateral Force Imaging |
| Optical Microscope | 6.3 MP color CMOS, 7.5×–50× zoom, 34 mm working distance, 1.5 µm optical resolution at 50×, coaxial LED illumination, parfocal design |
| Scan Speed | 0.1–20 Hz |
| Feedback Bandwidth | 500 kHz (dual-channel lock-in), 18-bit amplitude/phase resolution |
| Data Acquisition | 16-bit, 100 kHz multi-channel sampling |
| Environmental Options | Vacuum mode (7.3 Pa base pressure), inert gas enclosure (N₂/Ar), H₂O/O₂ monitoring, temperature-controlled stage (−100 °C to +150 °C, ±0.3 °C stability), active air-sound shielding, pneumatic vibration isolation platform |
| Brand | Quantum Scale |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | NanoTech 10 AFM |
| Instrument Type | Materials-Focused AFM |
| SPM Architecture | Modular & Multi-Functional |
| Closed-Loop Positioning Noise | XY = 0.2 nm, Z = 0.05 nm |
| Sample Dimensions | 25 mm × 10 mm |
| XY Scanner Travel Range | 12 mm × 12 mm |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | SPM-8100FM |
| Instrument Type | Atomic Force Microscope (AFM) |
| Lateral Positioning Noise | 0.1 nm |
| Vertical Positioning Noise | 0.03 nm |
| Sample Diameter × Thickness | Φ24 mm × 8 mm |
| Sample Stage Travel Range | ±5 mm |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | SPM-9700HT |
| Instrument Type | Atomic Force Microscope (AFM) |
| XY Positioning Noise | 0.1–0.2 nm (horizontal) |
| Z Positioning Noise | 0.03–0.05 nm (vertical) |
| Sample Size | Ø24 mm × 8 mm |
| Sample Stage Travel Range | ±6 mm |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer | Shimadzu Corporation |
| Instrument Type | Atomic Force Microscope (AFM) |
| Category | Materials AFM |
| Position Detection Noise | < 0.02 nm RMS |
| Sample Dimensions | Ø50 mm × 8 mm max thickness |
| XY Stage Travel Range | 5 mm × 5 mm |
| Imaging Resolution | Up to 8192 × 8192 pixels |
| Automation Features | Auto-alignment ("Link On"), Auto-parameter optimization ("NanoAssist"), Fully automated tip exchange and fast 3D mapping |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | SPM-Nanoa |
| Instrument Type | Material-oriented AFM |
| Position Detection Noise | < 0.02 nm (RMS) |
| Sample Diameter | 50 mm |
| Sample Thickness | ≤ 8 mm |
| XY Stage Travel Range | 5 × 5 mm |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Floor-Standing SEM |
| Electron Source | Schottky Field-Emission Gun (FEG) |
| Secondary Electron Resolution | 0.6 nm @ 15 kV |
| Magnification Range | 2× to 2,000,000× |
| Accelerating Voltage | 0.2–30 kV (deceleration mode down to <50 V) |
| Backscattered Electron Resolution | 1.6 nm @ 15 kV |
| Brand | Thermo Fisher |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China-manufactured under Thermo Fisher global quality system) |
| Model | Talos F200S G2 |
| Price | Upon Request |
| Acceleration Voltage | 200 kV |
| HRTEM Line Resolution | 0.10 nm |
| Minimum Detectable Feature Size | 0.16 nm |
| Field Emission Gun (FEG) Total Beam Current | >150 µA |
| EDS System | Dual in-column SDD Super-X detectors, windowless design with shutter protection |
| EDS Energy Resolution | ≤136 eV at Mn-Kα (10 kcps output) |
| EDS Mapping Pixel Dwell Time | Down to 10 µs |
| EDS Solid Angle | 0.45 sr |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | USA |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Thermo Scientific QuasOr |
| Pricing | Upon Request |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Netherlands |
| Model | Tundra |
| Acceleration Voltage | 200 kV (standard configuration) |
| Magnification Range | ×50 to ×1,000,000 |
| Specimen Stage | Single-tilt cryo-transfer holder with automated loading |
| Minimum Information Limit | ≤3.5 Å under optimal conditions (SPA workflow) |
| Footprint | 3.2 m × 2.8 m (including shielding and service clearance) |
| Brand | Thermo Fisher |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Thermo Scientific™ Glacios™ |
| Price Range | USD $2.5M–$3.8M (FOB) |
| Accelerating Voltage | 80–200 kV |
| Magnification | Up to 10,000,000× |
| Electron Source | 200 kV X-FEG (Cold Field Emission Gun) |
| Automation | Integrated Autoloader with cryo-transfer compatibility |
| Software Platform | EPU v3.x for Single-Particle Analysis (SPA) |
| Detector Compatibility | Supports Direct Electron Detectors (e.g., Falcon 4, Gatan K3) and Volta Phase Plate (VPP) |
| Footprint | < 8 m² (including service access) |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Model | alpha300 A |
| Instrument Type | Materials-Focused AFM |
| Position Detection Noise | ≤0.5 nm |
| Maximum Sample Diameter | 120 mm |
| Piezo Scanner Travel Range (X/Y) | ≤100 µm |
| Integrated Microscopy | Research-Grade Optical Microscope with Brightfield, Darkfield, Polarization & Fluorescence Capabilities |
| Scanning Technology | TrueScan™ Capacitive Feedback-Controlled Stage |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | China |
| Model | XSP-1CA |
| Price | Upon Request |
| Total Magnification Range | 40×–1600× |
| Eyepiece | WF10×/Φ18 mm, WF16×/Φ11 mm |
| Objective Lenses | 4×/0.10, 10×/0.25, 40×(S)/0.65, 100×(S) oil/1.25 |
| Nosepiece | Quadruple revolving nosepiece |
| Mechanical Tube Length | 160 mm |
| Stage | Dual-layer mechanical stage (125 × 120 mm), travel range 70 × 30 mm |
| Condenser | N.A. 1.25 Abbe condenser with centering adjustment, iris diaphragm and filter holder |
| Focusing Mechanism | Coaxial coarse/fine focus (15 mm travel), fine focus graduation: 0.002 mm |
| Eyepiece Tube | Monocular, inclined at 45°, rotatable 360° |
| Illumination | Reflected natural light (no built-in lamp) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | EVO |
| Pricing | Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | MultiSEM |
| Electron Beam Configuration | Hexagonal array of 91 beams |
| Landing Energy Range | 1.0–3.0 kV |
| Average Resolution (all beams) | ≤ 3.5 nm @ 1.0 / 1.5 / 3.0 kV |
| Resolution Uniformity | ≤ ±1 nm @ 1.0 / 1.5 / 3.0 kV and 12 µm pitch |
| Beam Pitch Options | 12 µm (standard), 15 µm (optional) |
| Pitch Uniformity | ≤ ±1% |
| Field of View (hexagonal long axis) | 132 µm (12 µm pitch) or 165 µm (15 µm pitch) |
| Per-Beam Current | ≥ 570 pA |
| Total Probe Current | ≥ 52 nA |
| Current Uniformity | ≤ +10% |
| Electron Source | Schottky field-emission gun |
| Filament Current Stability | ≤ 1% per hour |
| Beam Blanking | Electrostatic |
| Working Distance | 1.4 mm |
| Detector System | High-efficiency multi-channel secondary electron detection with projection optics |
| Maximum Scan Rate per Beam | 20 MHz |
| Pixel Size Range | 2–20 nm (12 µm pitch) |
| Image Stitching | Fully automated, 91-subimage hexagonal tiling with adjustable overlap |
| Stage Type | Precision stepper stage |
| Stage Travel (X/Y/Z) | 100 / 100 / 30 mm |
| Stage Repeatability (XY) | ≤ ±3 µm |
| Sample Exchange Time (with exchange chamber) | ≤ 5 min |
| Sample Dimensions (max) | 100 × 100 mm² (XY), ≤ 30 mm height, ≤ 0.2 kg mass, surface flatness ≤ 500 nm P–P over 100 µm |
| Vacuum System | Turbo-molecular pump (>260 L/s) + oil-free scroll pump |
| Control Hardware | ≥4-core 64-bit CPU, ≥32 GB DDR RAM, ≥1 TB HDD, dual 1 Gbit Ethernet |
| OS | Windows 10 (64-bit) |
| Image Acquisition Nodes | 12 rack-mounted computers (≥4-core 64-bit CPU, ≥32 GB DDR3, 1 Gbit + 10 Gbit Ethernet) |
| Software Platform | ZEN core interface with Shuttle & Find, API for custom workflow integration, distributed acquisition database, automated focus/astigmatism/detector balancing, ROI-driven auto-sectioning, continuous serial sectioning workflows, real-time system health monitoring (vacuum, alignment, beam stability) |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | Custom-Integrated SEM-EDS Platform |
| Price Range | USD 17,000 – 25,500 |
| Magnification Range | 10× – 360,000× (continuously adjustable, user-definable setpoints) |
| Best Imaging Resolution | 3 nm (at 30 kV, SE mode) |
| EDS Detector | Silicon Drift Detector (SDD), ≥10 eV energy resolution (Mn-Kα) |
| Stage Dimensions | 540 mm × 760 mm |
| Motion Axes | 4-axis (X, Y, U, V) motorized precision stage |
| Minimum Positioning Increment | 0.001 mm |
| EDS Quantification Accuracy | ±2–5 wt% (matrix-dependent, per ISO 16529:2014 and ASTM E1508) |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Domestic |
| Model Series | PicoFemto In Situ Cryo Sample Holder |
| Instrument Classification | In Situ Cryogenic TEM Holder |
| Application Field | Materials Science |
| Cooling Medium | Liquid Nitrogen |
| Minimum Temperature | ≤ –170 °C (≤ 103 K) |
| Temperature Stability | < ±0.1 K |
| Cool-down Time to Minimum Temperature | ≤ 45 min |
| Dewar Capacity | 180 mL |
| Cryo Hold Time | ≥ 4 h |
| Resolution Compatibility | < 0.3 nm TEM Imaging |
| Dual-Tilt Range (β) | ±25° |
| Vacuum Bake Temperature | 120 °C |
| Base Vacuum (with Pre-pump System) | 6×10⁻⁵ Pa |
| Integrated Plasma Cleaning Power | 5–50 W (ICP mode) |
| Modular Interface Slots | 4 |
| Compatible TEM Platforms | Thermo Fisher Scientific (TFS), JEOL, Hitachi |
| Optional Functional Modules | Heating, Electrical Biasing, Mechanical Actuation (MEMS), STM Integration, High-Angle Tilt, Porous-Sample Support |