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BrandHORIBA
OriginJapan
ModelXGT-7200WR
Detection PrincipleEnergy Dispersive X-Ray Fluorescence (ED-XRF)
Spot Size Range10 µm to 1.2 mm
Detector TypeSilicon Drift Detector (SDD), Liquid-Nitrogen-Free
Maximum Scan Area10 cm × 10 cm
Optical-Element Image Co-RegistrationYes
Elemental Mapping Resolution≤10 µm
ComplianceASTM E1621, ISO 8256, IEC 62321-5 (RoHS), USP <232>/<233>, GLP/GMP-ready data audit trail
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BrandHORIBA
OriginJapan
ModelXGT-5200WR
Sample EnvironmentAir (Atmospheric)
Elemental RangeNa to U
Quantification Range1 ppm – 99.99%
Operating Conditions50 kV / 1 mA
Repeatability±0.1% RSD
Spot SizeStandard 400 µm, Optional 10 µm
DetectorSilicon Drift Detector (SDD), LN2-free
GeometryCoaxial Optical Microscope Integration
Analysis ModeNon-destructive, No Vacuum Required, No Sample Preparation
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BrandHORIBA
OriginJapan
ModelMESA-50
Detector TypeSilicon Drift Detector (SDD)
Excitation SourceMicro-focus X-ray Tube
Analytical Spot Sizes0.1 mm, 0.3 mm, and 1.2 mm
Minimum Detection Limit (MDL)≤2 ppm for Pb, Cd, Hg, Cr, Br
Measurement TimeTypically 60–300 s per point
Sample ViewingIntegrated High-Resolution CCD Camera with 30× Optical Zoom
Operating EnvironmentAmbient air (no vacuum or helium required)
Software InterfaceMultilingual (English/Chinese), Excel-compatible data export
Compliance SupportRoHS Directive 2011/65/EU, WEEE Directive 2012/19/EU, ELV Directive 2000/53/EC, China RoHS II (SJ/T 11364-2014), JEITA EG0201, ASTM F2617-23
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