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Malvern Panalytical

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BrandMalvern Panalytical
OriginNetherlands
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
ModelEpsilon Xflow
Form FactorBenchtop or Floor-Standing
Industry-Specific ApplicationEnergy & Chemical Processing
Elemental RangeNa (Z=11) to Am (Z=95)
Quantification Range1 ppm to 100% w/w
Energy Resolution<145 eV at 5.9 keV (1000 cps)
RepeatabilityConcentration-dependent
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BrandMalvern PANalytical
OriginNetherlands
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported
ModelRevontium
Form FactorBenchtop/Floor-standing
Instrument TypeConventional ED-XRF
Application ScopeGeneral-purpose
Elemental RangeNa to Am (Z = 11 to Z = 95)
Energy Resolution<145 eV at Mn Kα
DetectorsFour simultaneous silicon drift detectors (SDDs)
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BrandMalvern Panalytical
OriginNetherlands
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Product CategoryImported Instrument
ModelOmega/Theta
Instrument TypeSingle-Crystal X-ray Diffractometer
Orientation Accuracy (1σ)<0.003° (rocking angle), <0.03° (in-plane direction)
Measurement Time≤10 s per orientation determination
Maximum Sample Weight30 kg
Maximum Sample Length450 mm
Goniometer ConfigurationOmega/Theta (θ–2θ coupled or independent scanning)
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BrandMalvern Panalytical
OriginNetherlands
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
ModelEpsilon 1 ISO 13032
ConfigurationBenchtop
Industry ApplicationEnergy & Petrochemicals
Elemental RangeNa to Am
Quantification Rangeppm to %
Energy Resolution135 eV
RepeatabilityHigh
DetectorHigh-Resolution Silicon Drift Detector (SDD)
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BrandMalvern Panalytical
OriginNetherlands
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Product CategoryImported Instrument
ModelCrystal Orientation
Instrument TypeSingle-Crystal X-ray Diffractometer
Orientation Speed≤10 s per measurement
Angular Accuracy±0.003° (Wafer XRD 200/300), ±0.01° (DDCOM/SDCOM)
Sample Diameter Range1–225 mm
Cooling RequirementAir-cooled (no water cooling required)
ComplianceASTM E975, ISO 18755, IEC 61000-6-3, CE, RoHS
Interface OptionsEthernet/IP, Profibus, Modbus TCP, SECS/GEM
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BrandMalvern PANalytical
OriginUnited Kingdom
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Instrument TypeLaboratory Laser Diffraction Particle Size Analyzer
Measurement Range0.1–1000 µm
Repeatability<1% RSD
Measurement Time<10 seconds per analysis
Dispersion MethodDry and Wet Dispersion
Data Acquisition Rate10 kHz
Laser SourceStabilized He-Ne Laser (632.8 nm)
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BrandMalvern Panalytical
OriginUSA
ManufacturerMicromeritics Instrument Corp.
ModelASAP 2460 Series
Analysis Stations2–6 (modular expansion)
Measurement PrincipleStatic gas adsorption (volumetric method)
Pore Size Range0.35–500 nm
Pressure Range0–1000 mmHg (absolute)
Theoretical BasisBET, t-plot, Langmuir, DFT, NLDFT, BJH, HK, SF
Optional ConfigurationsLow-surface-area (Kr adsorption, 10 mmHg transducer) and micropore (1 mmHg transducer, N₂/Ar/CO₂/H₂ capability)
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BrandMalvern Panalytical
OriginUSA
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported Instrument
ModelMicroCal PEAQ-DSC
Sample ThroughputMultiple samples per run (manual loading)
Instrument TypeDifferential Scanning Calorimeter (DSC)
Temperature Range–10 °C to 130 °C (expandable)
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BrandMalvern Panalytical
OriginUSA
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
ModelHydro Insight
Instrument TypeDynamic Imaging System
Measurement Range (Standard Magnification)1–300 µm
Measurement Range (Low Magnification)10–800 µm
Dispersion MethodWet Dispersion
Camera Resolution5 MP (2592 × 1944 pixels, 2.2 µm pixel size)
Measured ParametersParticle Images, Shape Metrics (31 shape descriptors), Width, Elongation, Aspect Ratio, Circularity, Convexity, Solidity, etc.
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BrandMalvern Panalytical
OriginNetherlands
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
ModelWafer XRD
Instrument TypeSingle-Crystal X-ray Diffractometer
Sample Size Compatibility3-inch to 8-inch wafers (custom FOUPs, carriers, or single-wafer stages available)
Measurement Speed<10 seconds per wafer
Typical Standard Deviation (Tilt Angle)<0.003° for Si(100)
X-ray Source OptionsAir-cooled microfocus Cu-target tube (30 W) or water-cooled fine-focus Cu-target tube (1.5 kW)
Safety ComplianceFully CE-compliant with integrated interlock and three-color tower light status indication
Interface ProtocolsSEMI-compliant MES and SECS/GEM
Optional ModulesResistivity measurement (0.01–0.020 Ω·cm), automated matrix/QR/barcode recognition, unpolished & mirror-surface distance metrology
Material SupportSi, SiC, GaAs, GaN, Sapphire (Al₂O₃), Ge, AlN, Quartz, InP, and >100 additional crystalline semiconductor substrates
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BrandMalvern Panalytical
OriginNetherlands
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
ModelEpsilon1
Form FactorBenchtop
Industry ApplicationEnergy & Chemicals
Elemental RangeNa (Z=11) to Am (Z=95)
Quantification Range1 ppm to 100% w/w
Energy Resolution<145 eV at Mn Kα (5.9 keV, 1000 cps)
RepeatabilityConcentration-dependent, compliant with ISO 8258 and ASTM E1621 for precision validation
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BrandMalvern PANalytical
OriginUnited Kingdom
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
Model OptionsBlue Label and Red Label configurations
Particle Size Range0.3 nm – 15 µm
Size Measurement Repeatability±2%
Temperature Control Range10–35 °C
Temperature Stability±0.1 °C
Detection Angle90° (Classical Dynamic Light Scattering)
Minimum Sample Volume3 µL
Sample Concentration Range0.1 mg/mL – 40% w/v
Zeta Potential RangeNo practical lower or upper limit
Typical Measurement Time3–5 minutes per analysis
Molecular Weight Range980 Da – 20 MDa
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BrandMalvern Panalytical
OriginNetherlands
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Product OriginImported
ModelAeris
Instrument TypePowder X-ray Diffractometer
Form FactorBenchtop
Power Stability< 0.0001 (unitless relative stability, typical for high-stability X-ray tube voltage/current regulation)
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BrandMalvern Panalytical
OriginUnited Kingdom
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
Model OptionsBlue Label and Red Label configurations
Particle Size Range0.3 nm – 10 µm
Size Measurement Repeatability±2%
Temperature Control Range10–35 °C
Temperature Stability±0.1 °C
Detection PrincipleNon-Invasive Back Scatter (NIBS) Dynamic Light Scattering (DLS)
Minimum Sample Volume12 µL
Sample Concentration Range0.1 mg/mL – 40% w/v
Zeta Potential RangeNo practical lower or upper limit under standard operational conditions
Typical Measurement Time3–5 minutes per analysis
Molecular Weight Range980 Da – 20 MDa
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BrandMalvern Panalytical
OriginCanada
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported
ModelFORJ
Sample CapacityUp to 12 samples per run (dual crucible & mold carrier configuration)
Maximum Operating Temperature1250 °C
Temperature Control Accuracy±2.5 °C at 1050 °C
Dimensions (L×W×D)71 cm × 102 cm × 72 cm
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BrandMalvern Panalytical
OriginUSA
ManufacturerMicromeritics Instrument Corp.
TypeSpecific Surface Area and Pore Size Analyzer
PrincipleStatic and Dynamic Gas Sorption
Number of Analysis Stations3
Micropore Range< 2 nm
Steam Adsorption CapabilityStandard
Chemisorption OptionsStatic, Dynamic (TPR/TPO/TPD/TPSR), Pulse
Temperature Control RangeUp to 1100 °C (±1 °C)
Pressure SensingUltra-low-range 0.1 Torr sensor for micropore analysis
Vacuum PerformanceMetal-sealed manifold with ultra-low outgassing rate
SoftwareMicroActive™ Data Reduction Suite
ComplianceASTM D3663, ISO 9277, ISO 15901, USP <846>, IUPAC Recommendations
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BrandMalvern PANalytical
OriginUnited Kingdom
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
Model VariantsBlue Label and Red Label
Particle Size Range0.3 nm – 15 µm
Size Measurement Repeatability±2%
Temperature Control Range10–35 °C
Temperature Stability±0.1 °C
Detection MethodNon-Invasive Back Scatter (NIBS) DLS and Multi-Angle Dynamic Light Scattering (MADLS®)
Minimum Sample Volume3 µL
Sample Concentration Range0.1 mg/mL – 40% w/v
Zeta Potential RangeNo practical lower or upper limit
Typical Measurement Time3–5 minutes
Molecular Weight Range980 Da – 20 MDa
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BrandMalvern Panalytical
OriginUnited Kingdom
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
ModelMastersizer 3000
Dispersion MethodDry & Wet Dispersion
Instrument TypeLaboratory Laser Diffraction Analyzer
Measurement Range0.01–3500 µm
Repeatability<1% RSD
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BrandMalvern PANalytical
OriginUSA
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported
ModelMicroCal PEAQ-DSC Automated
Sample ThroughputUp to 50 samples per unattended run
Instrument TypeDifferential Scanning Calorimeter (DSC)
Temperature Range–10 °C to 130 °C (expandable)
Sample FormatStandard 96-well microplate compatibility
Regulatory ComplianceDesigned for 21 CFR Part 11 and EU GMP Annex 11 compliance support
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BrandMalvern Panalytical
OriginUnited Kingdom
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
ModelNS300
PricingAvailable upon Request
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BrandMalvern PANalytical
OriginUnited Kingdom
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
ModelMastersizer 3000+
Dispersion MethodDry and Wet Dispersion
Instrument TypeLaboratory Laser Diffraction Particle Size Analyzer
Measurement Range0.01–3500 µm
Repeatability<1% RSD
Measurement Time<10 s
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BrandMalvern PANalytical
OriginNetherlands
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported
ModelX’Pert3 MRD (XL)
Instrument TypePowder X-ray Diffractometer
Power SupplyNot Specified
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BrandMalvern PANalytical
OriginUnited Kingdom
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Import StatusImported
ModelMorphologi 4
Instrument TypeStatic Image-Based Particle Analyzer
Lens Count5
Measurement Range0.5 µm – 1300 µm
Sample Dispersion MethodsDry Powder Dispersion and Wet Dispersion
Image Resolution18 MP
Measured Morphological ParametersAspect Ratio, Circularity, Convexity, Extent, Hardness
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BrandMalvern Panalytical
OriginUSA
ManufacturerMicromeritics Instrument Corp.
ModelAutoChem III
Gas Inlet Ports18
Temperature RangeAmbient to 1200 °C
Ramp RateUp to 100 °C/min from –100 °C to 800 °C
Core FunctionsPulse Chemisorption, Temperature-Programmed Reduction (TPR), Single-Point BET Surface Area Analysis
ComplianceDesigned for GLP/GMP environments with audit-trail-ready software architecture
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