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| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Epsilon Xflow |
| Form Factor | Benchtop or Floor-Standing |
| Industry-Specific Application | Energy & Chemical Processing |
| Elemental Range | Na (Z=11) to Am (Z=95) |
| Quantification Range | 1 ppm to 100% w/w |
| Energy Resolution | <145 eV at 5.9 keV (1000 cps) |
| Repeatability | Concentration-dependent |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Revontium |
| Form Factor | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na to Am (Z = 11 to Z = 95) |
| Energy Resolution | <145 eV at Mn Kα |
| Detectors | Four simultaneous silicon drift detectors (SDDs) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Omega/Theta |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Orientation Accuracy (1σ) | <0.003° (rocking angle), <0.03° (in-plane direction) |
| Measurement Time | ≤10 s per orientation determination |
| Maximum Sample Weight | 30 kg |
| Maximum Sample Length | 450 mm |
| Goniometer Configuration | Omega/Theta (θ–2θ coupled or independent scanning) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Epsilon 1 ISO 13032 |
| Configuration | Benchtop |
| Industry Application | Energy & Petrochemicals |
| Elemental Range | Na to Am |
| Quantification Range | ppm to % |
| Energy Resolution | 135 eV |
| Repeatability | High |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Crystal Orientation |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Orientation Speed | ≤10 s per measurement |
| Angular Accuracy | ±0.003° (Wafer XRD 200/300), ±0.01° (DDCOM/SDCOM) |
| Sample Diameter Range | 1–225 mm |
| Cooling Requirement | Air-cooled (no water cooling required) |
| Compliance | ASTM E975, ISO 18755, IEC 61000-6-3, CE, RoHS |
| Interface Options | Ethernet/IP, Profibus, Modbus TCP, SECS/GEM |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Wafer XRD |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Sample Size Compatibility | 3-inch to 8-inch wafers (custom FOUPs, carriers, or single-wafer stages available) |
| Measurement Speed | <10 seconds per wafer |
| Typical Standard Deviation (Tilt Angle) | <0.003° for Si(100) |
| X-ray Source Options | Air-cooled microfocus Cu-target tube (30 W) or water-cooled fine-focus Cu-target tube (1.5 kW) |
| Safety Compliance | Fully CE-compliant with integrated interlock and three-color tower light status indication |
| Interface Protocols | SEMI-compliant MES and SECS/GEM |
| Optional Modules | Resistivity measurement (0.01–0.020 Ω·cm), automated matrix/QR/barcode recognition, unpolished & mirror-surface distance metrology |
| Material Support | Si, SiC, GaAs, GaN, Sapphire (Al₂O₃), Ge, AlN, Quartz, InP, and >100 additional crystalline semiconductor substrates |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Epsilon1 |
| Form Factor | Benchtop |
| Industry Application | Energy & Chemicals |
| Elemental Range | Na (Z=11) to Am (Z=95) |
| Quantification Range | 1 ppm to 100% w/w |
| Energy Resolution | <145 eV at Mn Kα (5.9 keV, 1000 cps) |
| Repeatability | Concentration-dependent, compliant with ISO 8258 and ASTM E1621 for precision validation |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | Aeris |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Power Stability | < 0.0001 (unitless relative stability, typical for high-stability X-ray tube voltage/current regulation) |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | X’Pert3 MRD (XL) |
| Instrument Type | Powder X-ray Diffractometer |
| Power Supply | Not Specified |
| Brand | Malvern Panalytical |
|---|---|
| Country of Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Empyrean |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Consumption | 0.0001 kW |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | SDCOM |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| X-ray Source | 30 W air-cooled Cu-anode microfocus X-ray tube |
| Measurement Speed | Full orientation determination in ≤10 s per sample rotation |
| Sample Diameter Range | 1–200 mm |
| Angular Precision (Si 100) | Tilt magnitude < 0.01°, tilt direction < 0.03° |
| Uptime | >99% |
| Theta Scan Capability | Yes |
| Multi-crystal Transfer | Up to 6 oriented crystals per collimated beam |
| MES Integration | Compatible with SECS/GEM-compliant manufacturing execution systems |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | DDCOM |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| X-ray Source | 30 W Air-Cooled Cu Anode Tube |
| Scan Speed | Up to 200× Faster Than Conventional θ-Scanning |
| Orientation Measurement Time | Full 3D Lattice Orientation Determined in ≤10 s |
| Angular Resolution | ≤0.01° (0.01 degree) |
| Sample Capacity | Wafers 2–12 inches |
| Compliance | Designed for ISO/IEC 17025-aligned QC environments, compatible with GLP/GMP documentation workflows |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | Epsilon 4 |
| Form Factor | Benchtop / Floor-standing Configurable |
| Application Scope | Universal |
| Elemental Range | F–Am (C–Am with optional configuration) |
| Quantification Range | 0.01 ppm – 100 wt% |
| Energy Resolution | ~135 eV (at Mn Kα, 5.9 keV) |
| Repeatability | As low as 0.02% RSD (relative standard deviation) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Zetium |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 2.4–4 kW |
| Elemental Range | 4Be to 95Am |
| Instrument Class | Scanning-type WDXRF |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Axios FAST |
| Instrument Type | Floor-standing |
| Instrument Configuration | Simultaneous Multi-Channel WDXRF |
| X-ray Tube | SST-mAX with 160 mA high-power capability |
| Analyzable Elements | Up to 28 elements (Na to U) |
| Detection Range | ppm to 100 wt% |
| Sample Throughput | Up to 168 samples unattended |
| Minimum Measurement Time per Sample | 2 seconds |
| Optional Configurations | Up to 4 goniometers, HiPer channel for light elements (Na–F), anode materials (Rh, Cr, Mo, Au) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Aeris HCSC |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | 2830 ZT |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Detector Configuration | Sequential Multi-channel |
| Analyzable Elements | B, C, N, O, F, Mg, TiSiₓ, CoSiₓ, WSiₓ |
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