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| Brand | Micromeritics |
|---|---|
| Origin | USA |
| Model | SediGraph III Plus |
| Measurement Principle | X-ray sedimentation |
| Measurement Range | 0.1–300 µm |
| Repeatability | < 1% RSD |
| Accuracy | < 1% error vs. NIST-traceable standards |
| Analysis Time | 3–15 minutes per sample |
| Sample Volume | 50 mL dispersion |
| Compliance | ISO 13317-3, ASTM B761, ASTM C28 (Advanced Ceramics) |
| Automation | Unattended analysis of up to 18 samples |
| Optional Integration | MasterTech Auto-sampler for process monitoring and cloud data export |
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