Optical Measurement Instruments
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| Brand | ZOLIX |
|---|---|
| Model | MAMOS Series |
| Origin | Beijing, China |
| Manufacturer | ZOLIX Optics Co., Ltd. |
| Type | Modular Magneto-Optical Kerr & Reflective Magnetic Circular Dichroism (RMCD) Measurement System |
| Core Capabilities | Micro-area MOKE imaging, RMCD spectroscopy, polarization-resolved mapping, time-resolved magnetization dynamics |
| Laser Source | 532 nm narrow-linewidth laser (Δλ < 0.00001 nm, M² < 1.2, power stability ±2% RMS over 4 h) |
| Spatial Resolution | ≤300 nm (at 532 nm) |
| Kerr Angle Resolution | ~0.5 mdeg (~8.7 µrad) |
| Polarization Control | Motorized polarizer/analyzer with 0.0144° angular resolution |
| Imaging Sensor | Sony 1-inch CMOS, 20 MP, 15 fps @ 5K, 50 fps @ 1.8K |
| Precision Stage | XYZ motorized stage (120 × 120 × 40 mm travel), XY step resolution 40 nm, Z step resolution 10 nm, load capacity >10 kg |
| Optical Architecture | All-reflective, non-magnetic objective or aspheric lens design |
| Software | Modular GUI supporting automated MOKE/RMCD/Raman/PL/SHG scanning, polarization sweeps, script-based sequencing (Python-compatible), GLP-compliant data logging with timestamped metadata and audit trail |
| Brand | ZOLIX |
|---|---|
| Model | Multi-Channel Calibration & Inspection System |
| Origin | Beijing, China |
| Type | Integrated Optical Calibration Platform |
| Core Components | Integrating Sphere + Light-Tight Enclosure + Fiber-Optic Spectrometer + Precision Linear Motion Stage + Industrial Control Computer + Custom Calibration Software |
| Measurement Parameters | Luminance (cd/m²), Chromaticity (CIE x,y / u'v'), Luminous Flux (lm), CCT (K), CRI (Ra), Dominant Wavelength (nm) |
| Positioning Accuracy | ±0.01 mm |
| Operation Modes | In-line and Off-line |
| Compliance | ISO/CIE Standard Illumination Geometry (4π/2π), ASTM E308, CIE 15:2018, IEC 62471 (Photobiological Safety) |
| Data Traceability | Full audit trail with timestamped measurement records, sample ID linkage, and user-access logging |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | PS-Series Probe Station |
| Pricing | Available Upon Request |
| Maximum Sample Size | 32-inch (813 mm) |
| Sample Stage Options | 8-inch / 12-inch / 32-inch diameter |
| Horizontal Rotation | 360° continuous, motorized or manual |
| Sample Fixation | Vacuum chuck with center-only, multi-zone, or full-surface suction |
| Compatible Microscopes | Monocular, stereo, and metallurgical microscopes |
| Optional Accessories | Optical vibration isolation table, EMI/RF shielding enclosure, precision probe holders (XYZ micrometer-driven), coaxial/active probe clamps, vacuum pump (≤5 Pa base pressure) |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | SCS10-Film |
| Pricing | Upon Request |
| Spectral Range | 300–1700 nm |
| Wavelength Accuracy | ±0.2 nm (@ 1200 g/mm grating, 500 nm) |
| Scan Interval | 0.1–10 nm (default 10 nm) |
| Bandwidth | 0.1–10 nm (default 5 nm) |
| Light Source | 150 W stabilized xenon lamp (optical stability ≤0.4%) |
| Modulation Frequency | 4–400 Hz |
| Detector | Calibrated Si photodiode |
| DC Sensitivity | 100 nA |
| AC Sensitivity | 2 nV |
| Repeatability | <0.6% (<0.3% from 400–1000 nm) |
| Scan Speed | <1 min per spectral response curve |
| Sample Stage | 156 mm × 156 mm probe station (customizable) |
| max sample area | 300 mm × 300 mm |
| Mapping Resolution | 0.5 mm |
| Mapping Speed | 20 points/s (@ 0.5 mm step) |
| Instrument Dimensions | Host unit: unspecified |
| Sample chamber | unspecified |
| Control cabinet | 800 mm × 600 mm × 1300 mm |
| Software | Windows 7-based proprietary control & analysis suite with calibration traceability |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | China |
| Model | SGM100 |
| Pricing | Upon Request |
| Focal Length | 100 mm |
| f-number | f/3 |
| Optical Layout | Crossed Czerny–Turner |
| Spectral Range | 200–1100 nm |
| Stray Light | <0.1% |
| Detector | 3648-pixel linear CCD array |
| Spectral Resolution (FWHM) | 0.05–18.8 nm (configurable via grating and slit selection) |
| Sensitivity | 20,000 counts/µW·ms |
| Signal-to-Noise Ratio | 300:1 |
| A/D Resolution | 16-bit |
| Integration Time | 7 ms – 65,535 ms |
| Interface | USB 2.0 (8 Mbps), DB-15 I/O (4-in / 4-out) |
| Power Supply | USB 5 V DC or external adapter with buck-boost regulation |
| EMI Shielding | Integrated RF/EMI-optimized enclosure |
| Mechanical Construction | Monolithic aluminum housing |
| Internal Calibration Storage | High-capacity flash memory for wavelength calibration, radiometric correction, and colorimetric coefficients |
| Onboard Processing | High-performance embedded CPU for real-time spectral preprocessing and color space conversion |
| Brand | ZOLIX |
|---|---|
| Model | SPM300 |
| Measurement Principle | Confocal Raman Spectroscopy |
| Spatial Resolution | < 800 nm (typical) |
| Laser Source | Standard 532 nm, 100 mW |
| Spectrometer | 320 mm focal length, imaging-corrected, spectral range 90–9000 cm⁻¹, resolution 2 cm⁻¹ |
| Sample Stage | Motorized XYZ stage, 75 × 50 mm travel, 1 µm positioning accuracy |
| Microscope | Upright research-grade metallurgical microscope with epi-illuminated brightfield/darkfield, standard 10×/50×/100× objectives |
| Detector | Back-illuminated deep-depletion CCD, 200–1100 nm, peak QE > 90% |
| Software | Integrated Raman data acquisition, multi-peak fitting, carrier concentration (10¹⁷–10²⁰ cm⁻³), stress mapping (±0.002 cm⁻¹), crystallinity quantification, and spatial uniformity analysis |
| Brand | ZOLIX |
|---|---|
| Model | SPM600 |
| Origin | Beijing, China |
| Instrument Type | Semiconductor Photoelectrical Characterization System |
| Light Source Options | EQ Lamp (190–1700 nm), Xenon Lamp (250–1700 nm), Xenon–Halogen Composite Lamp (250–2500 nm) |
| Spectral Resolution | Adjustable via monochromator (typical <1 nm FWHM) |
| Spot Size | 40 µm (diffraction-limited at visible/NIR) |
| Temporal Resolution | Down to 200 ms for irradiance-dependent I–t sweeps |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments |
| Brand | ZOLIX |
|---|---|
| Model | SPM900 |
| Origin | Beijing, China |
| Instrument Type | Time-Resolved Photoluminescence (TRPL) Microscope-Based Lifetime Imager |
| Excitation Wavelengths | 375–670 nm (ps-pulsed lasers) |
| Spectral Range | 200–900 nm |
| Minimum Temporal Resolution | 16 ps |
| Lifetime Measurement Range | 500 ps – 1 ms |
| Spatial Resolution | ≤ 1 µm (with 100× objective, 405 nm excitation) |
| Scan Area | Up to 200 × 250 mm (for 8-inch wafers) |
| TCSPC Dead Time | < 10 ns |
| Maximum Count Rate | 100 Mcps |
| Cooling | -60 °C (CCD), Peltier-cooled PMT |
| Software | OmniFluo-FM (GLP-compliant data logging, audit trail, multi-exponential decay fitting ≤ 4 components) |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | T-lab Series |
| Spectral Response Range | 200–900 nm (UV-VIS-NIR) |
| Time Resolution (Streak Tube) | ≤2 ps |
| Spatial Resolution | >50 lp/mm |
| Scan Modes | Single-shot & High-frequency (up to >200 MHz) |
| Image Intensifier | Dual-MCP optional |
| Readout Sensor | Cooled scientific CMOS, 16-bit output, dynamic range >10,000:1 |
| Software | Integrated control & analysis suite with 3D visualization, time-decay fitting, spectral slicing, and fluorescence lifetime extraction |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | Thomson Scattering Spectroscopic Diagnostic System |
| Pricing | Upon Request |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | OEM Manufacturer |
| Regional Category | Domestic (China) |
| Model | TIMART |
| Price Range | USD 110,000 – 138,000 |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Type | Domestic Metrological Standard System |
| Model | UV-Vis Spectrophotometer Calibration Standard System |
| Pricing | Upon Request |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China-made) |
| Model | VR |
| Price | USD 28,000 (approx.) |
| Brand | ZOLIX |
|---|---|
| Model | ZAMP |
| Type | Transimpedance (Current-to-Voltage) Amplifier |
| Input Impedance Range | 1 mΩ to 100 GΩ (8 decades) |
| Gain Range | 10³–10¹⁰ V/A |
| Output Noise Voltage | ≤ 0.5 mV (RMS, DC–10 kHz) |
| Input Current Range | ±5 mA |
| Output Voltage Range | ±5 V |
| Gain Accuracy | ±2% (10³–10⁸), ±5% (10⁹–10¹⁰) |
| Power Supply | Dedicated AC adapter (ZAMP-A) |
| Dimensions | 195 × 121 × 88 mm |
| Compliance | CE-marked, RoHS-compliant, designed for laboratory-grade optical signal conditioning in accordance with IEC 61326-1 (EMC for measurement equipment) |
| Brand | ZOLIX |
|---|---|
| Model | ZL-OPA |
| Type | Optical Parametric Amplifier (OPA) |
| Pump Compatibility | Yb-based ultrafast solid-state or fiber lasers |
| Pump Energy Range | 10 µJ – 2 mJ |
| Pump Pulse Duration | 35 fs – 1.5 ps |
| Tuning Range (Signal/Idler) | 630–1030 nm / 1030–2500 nm (ZL-OPA-HP) |
| Output Pulse Width | <500 fs (ZL-OPA-HP), <100 fs (ZL-OPA-HE) |
| Long-Term Power Stability | <1% RMS @ 750 nm over 8 h |
| Peak Output Energy | >15 µJ @ 750 nm (ZL-OPA-HP), >10 µJ @ 750 nm (ZL-OPA-HE) |
| Polarization | Linear |
| Optional UV Extension | 325–515 nm (via SHG/SFG), Green Extension: 515–650 nm (ZL-OPA-HP) |
| Origin | Beijing, China |
| Manufacturer | ZOLIX (Zhongli Han Guang Co., Ltd.) |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Line | ZLX-AS Series |
| Optical Configuration | Dual-beam and single-beam configurable |
| Spectral Range | 200–2500 nm (model-dependent) |
| Stray Light | <5×10⁻⁹ (UV-Vis high-accuracy configuration) |
| Wavelength Accuracy | ±0.05 nm (UV-Vis), ±1 nm (NIR) |
| Photometric Accuracy | ±0.05%T (UV-Vis standard mode), ±2% (NIR & field-deployable configurations) |
| Spectral Resolution | ≤5 nm (adjustable scan step: 0.1–10 nm) |
| Beam Parallelism | ≤±5° |
| Sample Positioning | Motorized XYZ + θy/θz angular adjustment (±45°/±90°) |
| Compliance | ASTM E903, ISO 9050, GB/T 2680, EN 410, ANSI Z87.1, USP <857>, FDA 21 CFR Part 11 (software audit trail enabled) |
| Brand | ZOLIX |
|---|---|
| Model | ZLX-ES Series |
| Origin | Beijing, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Domestic (China) |
| Pricing | Upon Request |
| Origin | Switzerland |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ZRP 6030 |
| Price | Upon Request |
| Brand | Zurich Instruments |
|---|---|
| Origin | Switzerland |
| Model | UHF-AWG |
| Output Channels | 2 |
| DAC Resolution | 14 bit |
| Max Sample Rate | 1.8 GSa/s |
| Waveform Memory | 128 MSa per channel |
| Output Frequency Range | DC – 600 MHz |
| Output Amplitude | ±150 mV / ±1.5 V (DC-coupled, 50 Ω) |
| Phase Noise | −120 dBc/Hz @ 10 MHz (100 Hz offset), −130 dBc/Hz @ 10 MHz (1 kHz offset) |
| Sequencer Instructions | 1024 core + dynamic expansion |
| Feedback Latency | <1 µs |
| Trigger Delay | <150 ns |
| Trigger Jitter | 2.2–4.4 ns |
| Built-in Oscillators | 2 (expandable to 8 with UHF-MF option) |
| Modulation Modes | Direct output & AM mode with internal oscillator reference |
| Digital Outputs | 32-bit parallel, 2 markers per channel, 4 AUX outputs |
| Input Triggers | Lock-in, scope, counter, external, internal |
| Optional Modules | UHF-DIG (digitizer), UHF-MF (multi-frequency), UHF-RUB (rubidium clock), UHF-CNT (pulse counter) |