YANRUN XYR Series Trinocular Continuous Zoom Stereo Microscope
| Brand | YANRUN |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | XYR Series Trinocular Continuous Zoom Stereo Microscope |
| Zoom Ratio | 6.5:1 (0.7× to 4.5×) |
| Working Distance | 95 mm |
| Objective Range | 0.7× to 4.5× |
| Illumination | Adjustable-intensity 10 W halogen lamp, dual-voltage input (110–220 V AC / 12 V DC) |
Overview
The YANRUN XYR Series Trinocular Continuous Zoom Stereo Microscope is an optomechanically engineered instrument designed for high-fidelity three-dimensional observation of macro- to meso-scale specimens in industrial quality control, electronics inspection, precision assembly, forensic documentation, and educational laboratories. Built upon a Galilean-type zoom optical architecture with internal inclined light path design, the system delivers parfocal, parcentric, and distortion-minimized stereoscopic imaging across its full 6.5:1 continuous magnification range (0.7× to 4.5×). The fixed 13° and 45° inclined viewing angles support ergonomic operator positioning, while the trinocular port enables simultaneous visual observation and high-resolution digital documentation via C-mount or F-mount camera adapters—critical for traceable inspection workflows compliant with ISO/IEC 17025 and internal QA/QC protocols.
Key Features
- Continuous zoom optics with 6.5:1 magnification ratio (0.7×–4.5×), enabling seamless transition between overview and detailed inspection without mechanical repositioning
- Fixed dual-angle inclined binocular head (13° and 45°) optimized for prolonged operator comfort and reduced musculoskeletal strain during extended use
- Standard widefield eyepieces (WF10×, 20 mm field number) with interpupillary adjustment range of 55–75 mm to accommodate diverse user anthropometry
- 95 mm working distance maintained throughout the entire zoom range—facilitating tool access, probe integration, and non-contact measurement setups
- Dual-voltage halogen illumination system (110–220 V AC / 12 V DC) with analog brightness control; 10 W lamp provides stable, color-accurate (3200 K CCT) coaxial and oblique lighting
- 95 mm diameter circular stage with integrated 40 mm filter holder—compatible with neutral density, polarizing, and contrast-enhancing filters per ASTM E2814 standards
Sample Compatibility & Compliance
The XYR Series accommodates specimens ranging from PCB assemblies and solder joints to botanical samples, mineral fragments, and small mechanical components—without requiring sectioning or coating. Its large depth of field (>50 µm at 4.5×) and long working distance support manipulation under magnification using tweezers, micro-soldering irons, or micromanipulators. The optical train meets ISO 10934-1 (stereomicroscope performance testing) and conforms to CE marking requirements for laboratory equipment (2014/30/EU EMC Directive and 2014/35/EU LVD). All electrical components are rated for continuous duty cycle operation and comply with IEC 61010-1 safety standards for laboratory instruments.
Software & Data Management
While the microscope itself is hardware-native, the trinocular port supports integration with third-party machine vision software platforms—including StreamPix, Olympus cellSens, and open-source solutions such as Micro-Manager—that enable time-lapse capture, measurement annotation (distance, angle, area), and metadata tagging (operator ID, timestamp, magnification, illumination setting). When paired with FDA 21 CFR Part 11–compliant image acquisition systems, audit trails, electronic signatures, and version-controlled reporting can be implemented—making it suitable for GLP/GMP-regulated environments where image-based evidence must satisfy regulatory data integrity requirements.
Applications
- Electronics manufacturing: SMT component placement verification, solder joint defect analysis (bridging, voiding, insufficient wetting), and post-reflow inspection
- Precision machining: Surface finish evaluation, burr detection on micro-milled parts, and thread geometry assessment
- Materials science: Fracture surface characterization, inclusion mapping in metals, and polymer blend morphology screening
- Forensic labs: Toolmark comparison, fiber identification, and document authenticity examination under variable lighting conditions
- Educational institutions: Comparative anatomy dissection support, mineralogy identification, and student-led microscopy projects requiring reproducible imaging parameters
FAQ
What is the maximum total magnification achievable with optional eyepieces and auxiliary lenses?
With WF10× eyepieces and the standard 0.7×–4.5× objective, total magnification ranges from 7× to 45×. Using optional 15× eyepieces and a 2× auxiliary lens, maximum magnification reaches 135×—subject to resolution limits governed by the Abbe diffraction criterion and effective NA at high zoom.
Is the halogen illumination compatible with external power supplies for battery-operated field use?
Yes—the 12 V DC input allows connection to regulated benchtop power supplies or portable lithium-ion battery packs meeting IEC 62133 safety standards, enabling deployment in cleanrooms, mobile labs, or remote inspection sites.
Can the XYR Series be calibrated per ISO/IEC 17025 requirements?
Yes—calibration certificates for magnification accuracy, field diameter, and working distance can be issued by accredited metrology laboratories using NIST-traceable reference standards (e.g., NIST SRM 2800, 2810). Calibration intervals are recommended annually or after 200 operational hours, whichever occurs first.
