Spectroscopy Instruments
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Showing 631–660 of 2349 results
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Model | ICP-5500 |
| Detector | High-resolution overflow-resistant CCD |
| RF Source | All-solid-state self-excited 27.12 MHz generator |
| Optical System | Precision thermostatically controlled Czerny–Turner monochromator with holographic grating |
| Gas Control | Integrated automatic argon flow management module |
| Standby Mode | iStandby (reduces Ar consumption by >50%) |
| Calibration | Real-time full-spectrum calibration using interference-free Ne emission lines |
| Sample Introduction | Multi-channel high-precision peristaltic pump with integrated nebulizer and spray chamber |
| Compliance | Designed to support ISO/IEC 17025, ASTM D1976, EPA Method 200.7, USP <232>/<233>, and GLP/GMP data integrity requirements |
| Software | FPI-SpectraSuite v4.x with 21 CFR Part 11-compliant audit trail, electronic signatures, and raw data archiving |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark Discharge |
| Detector | Charge-Coupled Device (CCD) |
| Optical Configuration | Paschen-Runge Mount |
| Wavelength Range | Configurable (Typical Range: 130–800 nm) |
| Number of Simultaneous Channels | Multi-channel (CCD-based full-spectrum acquisition) |
| Argon Purge System | Sealed argon recirculation with four-way purging |
| Operating Environment | Industrial floor and laboratory settings |
| Compliance | Designed to support ISO/IEC 17025 workflows, ASTM E415, ASTM E1086, and GB/T 4336 standards |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | CCD (Charge-Coupled Device) |
| Wavelength Range | Configurable |
| Optical Configuration | Paschen–Runge Mount |
| Environmental Operation | Argon-purged Sealed Optical Chamber |
| Sample Interface | Open-type Spark Stand with Quadruple Argon Purge |
| Temperature Control | Thermostatically Stabilized Optics Chamber |
| Software Features | Real-time Drift Correction, Intelligent Calibration Curve Matching, Grade Identification, CE/CRE Calculation, QC Limit Enforcement, System Self-Diagnosis |
| Compliance Context | Designed for GLP-compliant metal analysis workflows |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | CMOS-based CCD array |
| Optical Configuration | Paschen-Runge mount |
| Wavelength Range | Configurable (typically 130–800 nm) |
| Number of Simultaneous Channels | Up to 60 (software-defined) |
| Argon Purge System | Sealed argon-circulation optical chamber with four-way purge |
| Operating Environment | Industrial workshop / QC lab (IP54-rated spark stand) |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | CMOS-based Multi-Channel Array |
| Optical Configuration | Paschen-Runge Mount |
| Wavelength Range | Configurable (Typically 130–800 nm) |
| Number of Simultaneous Channels | Up to 60 (Software-Defined) |
| Argon Purge System | Sealed Argon-Circulating Optical Chamber with Four-Point Purge |
| Operating Environment | Industrial Lab / Foundry Floor |
| Compliance | Designed to Support ISO/IEC 17025, ASTM E415, ASTM E1086, and GB/T 4336 |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | CMOS |
| Wavelength Range | Configurable (Typical Range: 130–800 nm) |
| Number of Spectral Channels | Not Fixed (Multi-Channel CCD/CMOS Array-Based Detection) |
| Optical System | Paschen-Runge Mount |
| Purge Medium | Sealed Argon Circulation System |
| Operating Environment | Industrial Lab / Foundry Floor |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | CCD (Charge-Coupled Device) |
| Wavelength Range | Configurable |
| Sample Compatibility | Fe-, Al-, Cu-based alloys |
| Optical Design | Paschen-Runge mount |
| Environmental Operation | Factory-floor compatible |
| Gas Purge | Sealed argon-circulation optical chamber with quad-channel argon purge |
| Software Features | Real-time drift correction, intelligent curve selection, grade identification, CE/CRE calculation, QC limit enforcement, automated system diagnostics |
| Compliance Context | Designed for GLP-compliant metal analysis workflows |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | CCD (Charge-Coupled Device) |
| Wavelength Range | Configurable (130–800 nm typical for spark OES) |
| Optical Configuration | Paschen-Runge mount with dual vacuum-UV/visible chambers |
| Number of Simultaneously Acquired Spectral Lines | >10,000 |
| Analytical Elements | Up to 72 metallic and non-metallic elements (e.g., C, P, S, N, Si, Mn, Cr, Ni, Cu, Al, Ti, Mo, V, Co, Nb, B, Ca, Mg, Zn, Pb, Sn, As, Bi, rare earths) |
| Calibration Flexibility | On-site matrix and element expansion without hardware modification |
| Compliance | Designed to support ISO/IEC 17025, ASTM E415, ASTM E1086, ASTM E3061, and GB/T 4336 workflows |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | Charge-Coupled Device (CCD) |
| Wavelength Coverage | Configurable (130–800 nm typical for metal analysis) |
| Spectral Resolution | ≤ 10 pm (typical at 200 nm) |
| Optical System | Paschen-Runge mount with dual vacuum-UV/visible chambers |
| Number of Simultaneous Detection Pixels | > 30,000 per CCD |
| Calibration Flexibility | Multi-matrix, on-site element/basis expansion supported |
| Compliance | Designed to support ISO 17025-compliant workflows, ASTM E415, E1086, and GB/T 4336 methodologies |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | Charge-Coupled Device (CCD) |
| Wavelength Coverage | Configurable (typically 130–800 nm) |
| Spectral Resolution | < 10 pm (at 200 nm) |
| Optical System | Pascchen-Runge Mount with Dual Chambers (UV + VIS) |
| Number of Simultaneous Spectral Lines | > 9,000 |
| Calibration Flexibility | Full-Spectrum Multi-Matrix Capability |
| Compliance | Designed to support ISO/IEC 17025 workflows, ASTM E415, E1086, and GB/T 4336 |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Model | M5000 PLUS |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | Scientific-grade CMOS |
| Wavelength Range | Configurable (UV–VIS, typically 130–800 nm) |
| Optical Design | Dual-chamber with dedicated UV optical path |
| UV Optimization | Uncoated high-quantum-efficiency CMOS for N, C, S, P detection |
| Stability Architecture | Cast aluminum vacuum-sealed spectrometer chamber with 4-stage stress-relief annealing and active temperature stabilization (±0.1 °C) |
| Light Source | Fully digital pulsed spark generator with real-time energy optimization (RTMC) |
| Software Capability | Full-spectrum acquisition, model-free analysis via intelligent calibration curves, remote firmware update & health monitoring |
| Compliance Framework | Designed to support GLP/GMP workflows, ASTM E415, ISO 11573, and GB/T 4336 analytical protocols |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Model | M5000 PLUS F |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | Scientific-grade CMOS |
| Focal Length | 400 mm |
| Grating Line Density | 2400 l/mm (Visible), 3600 l/mm (UV) |
| Wavelength Range | 140–680 nm |
| Spectral Acquisition Mode | Full-Spectrum Direct Reading |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | Scientific-grade CMOS |
| Wavelength Range | Configurable (130–800 nm) |
| Optical System | Dual-chamber with dedicated vacuum UV optical path for N, C, S, P |
| Spectral Resolution | ≤ 10 pm at 200 nm |
| Effective Pixel Count | ≥ 4.2 MP (full-frame CMOS) |
| Analysis Speed | < 30 s per sample (including flushing, sparking, and quantification) |
| Calibration Stability | ±0.5% RSD over 8 hours (under controlled lab conditions) |
| Compliance | Meets ISO 11577:2022, ASTM E415-22, GB/T 4333.1–2022 |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | Scientific-grade CMOS |
| Wavelength Coverage | Configurable (130–800 nm typical) |
| Optical Configuration | Dual-chamber (Vacuum UV + Visible/NIR) |
| UV Optimization | Dedicated uncoated UV optical path for N, C, S, P analysis |
| Spectral Resolution | ≤ 10 pm at 200 nm (typical) |
| Channel Flexibility | Full-spectrum acquisition — no fixed channels |
| Software Compliance | Supports ASTM E415, E1086, ISO 11577, and GLP/GMP audit trails per FDA 21 CFR Part 11 requirements |
| Thermal Stability | Thermostatically controlled optical chamber (±0.1 °C) |
| Mechanical Construction | Stress-relieved die-cast aluminum optical housing (4-stage annealing) |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | Charge-Coupled Device (CCD) |
| Wavelength Coverage | Configurable (typically 130–800 nm) |
| Spectral Resolution | ≤ 10 pm (typical at 200 nm) |
| Optical System | Paschen-Runge Mount with Dual Chambers (UV + VIS) |
| Number of Simultaneously Acquired Spectral Lines | > 9,000 |
| Calibration Flexibility | Full-spectrum recalibration without hardware modification |
| Compliance | Designed to support ISO/IEC 17025 workflows, ASTM E415, E1086, and GB/T 4336 methodologies |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | SP-3800 Series |
| Pricing | Upon Request |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Authorized Distributor |
| Instrument Type | Laboratory |
| Principle | Grating Scanning |
| Wavelength Range | 1000–2500 nm |
| Scan Speed | 0.2 s per spectrum |
| Spectral Sampling Interval | 1 nm |
| Measurement Mode | Diffuse Reflectance |
| Chemometrics Software | RIMP |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | SupNIR-1000 |
| Instrument Type | Portable |
| Operating Principle | Grating Scanning |
| Wavelength Range | 600–1100 nm & 1000–1800 nm |
| Analysis Time | <30 s |
| Wavelength Repeatability | ±0.05 nm |
| Sampling Modes | Diffuse Reflectance & Transmission |
| Chemometrics Software | RIMP |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Model | SupNIR-1200 |
| Instrument Type | Portable |
| Operating Principle | Grating Scanning |
| Wavelength Range | 1000–1800 nm |
| Scan Speed | <1 second per spectrum |
| Spectral Sampling Interval | 1 nm |
| Measurement Mode | Diffuse Reflectance |
| Compliance | CE, RoHS (as per manufacturer documentation) |
| Power Supply | Integrated rechargeable lithium-ion battery |
| Connectivity | Bluetooth 4.2 + Android mobile application |
| Brand | FPI |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | SupNIR-1200 |
| Pricing | Available Upon Request |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Model | SupNIR-1500 |
| Instrument Type | Portable |
| Optical Principle | Holographic Grating Scanning |
| Wavelength Range | 1000–1800 nm |
| Scan Speed | >1 spectrum/sec |
| Spectral Resolution | 1 nm sampling interval |
| Measurement Modes | Diffuse Reflectance / Transmission |
| Detector | TE-Cooled InGaAs |
| Chemometrics Software | RIMP |
| Power Supply | Integrated Rechargeable Battery |
| Display | Built-in LCD |
| Data Storage | Onboard Memory |
| Brand | FPI |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | SupNIR-1500 |
| Pricing | Available Upon Request |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | SupNIR-1520TM |
| Instrument Type | Portable |
| Optical Principle | Holographic Gold-Coated Concave Grating Scanning |
| Detection Mode | Diffuse Reflectance |
| Software | RIMP Chemometrics Platform |
| Compliance | Designed for ISO 17025-aligned textile testing workflows |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Laboratory Benchtop NIR Spectrometer |
| Optical Design | Holographic Scanning Grating with TEC-Cooled InGaAs Detector |
| Wavelength Range | 1000–1800 nm |
| Spectral Resolution | ≤ 8 nm (FWHM) |
| Wavelength Accuracy | ±0.2 nm |
| Data Sampling Interval | 1 nm |
| Scan Speed | Full-spectrum acquisition in < 60 s |
| Measurement Mode | Transmission |
| Chemometrics Software | RIMP v4.x (with PLS, PCR, SVM, and model validation modules) |
| Temperature Control | Integrated Peltier-based sample compartment (±0.1 °C stability) |
| Compliance | Meets ISO 12099:2017 for NIR instrument performance verification |
| Connectivity | Ethernet (RJ45), USB 2.0, optional Wi-Fi module |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Authorized Distributor |
| Instrument Type | Laboratory |
| Principle | Grating Scanning |
| Wavelength Range | 1000–2500 nm |
| Scan Speed | 0.2 s per spectrum |
| Spectral Sampling Interval | 1 nm |
| Measurement Mode | Diffuse Reflectance |
| Chemometrics Software | RIMP |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Laboratory Benchtop NIR Spectrometer |
| Optical Principle | Holographic Grating Scanning |
| Wavelength Range | 1000–2500 nm |
| Spectral Acquisition Speed | 0.2 s per spectrum |
| Spectral Resolution | 1 nm data sampling interval |
| Measurement Mode | Diffuse Reflectance |
| Chemometrics Software | RIMP |
| Detector | Thermoelectrically Cooled (TEC) InGaAs Array |
| Sample Handling | Motorized Rotating Sample Tray |
| Built-in Reference Standards | Yes |
| Network Connectivity | Ethernet & USB |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Model | SupNIR-3000 |
| Instrument Type | Laboratory |
| Operating Principle | Grating Scanning |
| Wavelength Range | 1000–1800 nm |
| Scan Speed | >1 scan/s |
| Data Sampling Interval | 1 nm |
| Measurement Mode | Diffuse Reflectance |
| Chemometrics Software | RIMP |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Laboratory Benchtop NIR Spectrometer |
| Optical Design | Holographic Digital Grating + TEC-Cooled InGaAs Detector |
| Wavelength Range | 1000–1800 nm (expandable to 1000–2500 nm) |
| Scanning Mechanism | Grating-Based Wavelength Scanning |
| Software Platform | RIMP Chemometrics Suite (Chinese UI) |
| Connectivity | Ethernet, USB, Remote Management via Web-Based Instrument Control Platform |
| Compliance Support | ASTM E1655, ISO 12099, USP <857>, GLP/GMP-ready audit trail (via RIMP logging) |
| Brand | -- |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Instrument Type | Online FTIR Spectrometer |
| Interferometer Design | Patented "Double Cat’s Eye" Alignment System |
| Detector | High-Sensitivity Sealed DLATGS |
| Spectral Resolution | Standard ≤ 4 cm⁻¹ (configurable to ≤ 0.5 cm⁻¹) |
| Wavenumber Range | 4000–400 cm⁻¹ |
| Signal-to-Noise Ratio | ≥ 30,000:1 (at 4 cm⁻¹, 1 min scan) |
| Environmental Protection | Integrated Desiccant Monitoring & Auto-Alert for Optical Chamber Humidity |
| Software Compliance | GLP-Ready, FDA 21 CFR Part 11–Compliant Audit Trail & Electronic Signature Support |
| Sample Compartment | Extra-Large Bore (≥ 180 mm Ø), Compatible with Pike Technologies ATR, DRIFTS, Gas Cells, Liquid Cells, and Microscope Modules |
| Origin | Shanghai, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | FOFI-3 |
| Pricing | Available Upon Request |