Spectroscopy Instruments
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Showing 91–120 of 2603 results
| Brand | Amplitude |
|---|---|
| Origin | France |
| Model | Dazzler Ultrafast Laser Pulse Shaper |
| Spectral Range | UV to SWIR |
| Core Technology | Acousto-Optic Programmable Dispersive Filter (AOPDF) |
| Integration | Fully Integrated, Turnkey System |
| Repetition Rate Compatibility | Up to 30 kHz |
| Control | Independent, Simultaneous Spectral Phase & Amplitude Modulation |
| Form Factor | Ultra-Compact Benchtop Unit |
| Compliance | Designed for GLP/GMP-adjacent research environments |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Instrument Type | Flame and Graphite Furnace AAS |
| Optical System | Dual-Beam |
| Monochromator | Echelle Grating with Quartz Prism Cross-Disperser |
| Detector | Solid-State CCD Array |
| Background Correction | Real-Time, Multi-Wavelength Simultaneous Correction |
| Wavelength Resolution | 0.002 nm |
| Light Source | High-Intensity Short-Arc Xenon Lamp (Continuum Source) |
| Measurement Mode | Sequential Multi-Element & Full-Spectrum Acquisition |
| Dynamic Linear Range | 5 Orders of Magnitude |
| Software Compliance | FDA 21 CFR Part 11 Ready, GLP/GMP Audit Trail Enabled |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Model | contrAA 800 |
| Instrument Type | Flame and Graphite Furnace AAS |
| Wavelength Range | 185–900 nm |
| Light Source | High-Intensity Short-Arc Xenon Lamp |
| Detection Principle | High-Resolution Continuum Source AAS (HR-CS AAS) |
| Detector | CCD Array |
| Background Correction | Automatic Background Correction (ABC) and Concurrent Spectrum Interference Correction (CSI) |
| Detection Limit | Sub-ppb for most elements |
| Elemental Coverage | Simultaneous multi-element analysis across full UV-VIS-NIR range |
| Atomization Modes | Integrated flame and electrothermal (graphite furnace) atomization |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Flame and Graphite Furnace AAS |
| Monochromator | Plane Grating |
| Optical System | Dual-Beam with Automatic Switching to Single-Beam |
| Detector | CCD Array (185–900 nm) |
| Background Correction | Automatic Deuterium/Halogen Lamp or Zeeman (software-selectable) |
| Spectral Resolution | ≤ 0.1 nm |
| Sensitivity | ≥ 0.9 A for 5 mg/L Cu solution (279.5 nm, air-acetylene flame) |
| Precision (RSD) | < 0.5% (n = 10, typical aqueous standards) |
| Detection Limit (Flame Mode) | < 0.005 mg/L Cu |
| Detection Limit (Graphite Furnace Mode) | Sub-pg range for Cd/Pb (e.g., < 3 pg for Cd) |
| Baseline Stability | < 0.002 A/h (typical, 24 h drift monitoring) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Model | novAA 800F |
| Atomization Type | Flame |
| Detector | SiOSens solid-state semiconductor detector |
| Lamp Holder | Integrated 8-position auto-rotating turret with coded lamp recognition |
| Background Correction | Deuterium arc lamp |
| Optical System | Switchable single-beam / double-beam / emission modes |
| Automation Level | Fully automated dual atomizer switching (flame/graphite/hydride), auto-optimization, programmable dilution & autosampling |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Type | Full-Spectrum Simultaneous ICP-OES |
| Detection Limit (Zn at 213.856 nm) | 0.06 ppb |
| Precision (RSD) | ≤0.5% |
| Long-Term Stability (RSD, 4h) | ≤1.5% |
| Wavelength Range | 160–900 nm |
| Optical Resolution | 0.003 nm (at 200 nm) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Product Type | Imported Instrument |
| Model | PlasmaQuant 9100 |
| Detection Principle | Full-Spectrum Direct-Reading ICP-OES |
| Optical Range | 160–900 nm |
| Optical Resolution | ≤3 pm |
| Wavelength Accuracy | <0.0004 nm |
| Observation Modes | Dual-View (Radial + Axial) with Four Simultaneous Viewing Configurations |
| Plasma System | High-Stability, High-Power RF Generator (27.12 MHz) |
| Detector | Back-Illuminated CCD with Deep-UV Sensitivity |
| Startup Time | <5 minutes |
| Gas Efficiency | Integrated Plasma Gas Recycling for Cooling & Purge Streams |
| Software | Aspect PQ with ABC and CSI Background Correction Algorithms |
| Compliance | Designed for GLP/GMP environments |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Product Type | Imported |
| Model | PlasmaQuant 9200 |
| Instrument Category | Full-Spectrum Simultaneous ICP-OES |
| Wavelength Range | 160–900 nm |
| Optical Resolution | 0.002 nm (at 200 nm) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Model | PlasmaQuant MS |
| Instrument Type | Full-Spectrum Direct-Reading ICP-MS |
| Detection Limits | Be ≤ 0.1 ppt, Co ≤ 0.2 ppt, In ≤ 0.05 ppt, Bi ≤ 0.05 ppt, U ≤ 0.01 ppt |
| Precision (RSD) | < 3% |
| Short-Term Stability | < 3%, Long-Term Stability: < 4% |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Model | RXN |
| Instrument Type | In-line Raman Spectrometer |
| Probe Compatibility | PhAT and non-PhAT probes |
| Sample Phase Support | Solid and liquid (dual-channel configuration) |
| Optical Spot Size Range | 1 µm to 6 mm |
| Application Environment | Certified for hazardous / classified areas (ATEX/IECEx compliant) |
| Spectral Resolution | High (typical < 4 cm⁻¹ FWHM) |
| Architecture | Modular, rack-mountable industrial platform |
| Software Compliance | Supports 21 CFR Part 11 audit trail, electronic signatures, and GLP/GMP data integrity requirements |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Type | Imported Instrument |
| Model | SPECORD 200 PLUS |
| Optical Design | Double-Beam |
| Detector | Photodiode Array (PDA) |
| Wavelength Range | 190–1100 nm |
| Automation | Motorized Wavelength Scanning |
| Spectral Bandwidth | 1.4 nm |
| Wavelength Accuracy | < ±0.1 nm (full range) |
| Wavelength Repeatability | < ±0.01 nm |
| Stray Light | < 0.005% @ 340 nm (NaNO₂) |
| Baseline Stability | ≤ 0.0001 A (RMS) |
| Photometric Range | –5 to +5 A |
| Scan Speed | 12,000 nm/min |
| Light Sources | Deuterium Lamp + Tungsten-Halogen Lamp (automatically switched) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Instrument Type | Double-Beam |
| Model | SPECORD 200 PLUS |
| Optical Design | Holographic Grating Monochromator |
| Detector | Dual-Thermostatted Photodiode Array |
| Wavelength Range | 190–1100 nm |
| Spectral Resolution | ≤1.2 nm (FWHM) |
| Photometric Accuracy | ±0.002 A (at 0.5 A, 1.0 A) |
| Stray Light | <0.0005% T at 220 nm |
| Beam Geometry | True Simultaneous Double-Beam |
| Wavelength Calibration | Pre-aligned Holmium Oxide Filter |
| Compliance | USP <857>, Ph. Eur. 2.2.25, FDA 21 CFR Part 11 (Audit Trail, Electronic Signatures, User Access Control) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Type | Imported Instrument |
| Model | SPECORD 210 PLUS |
| Optical Design | Double-Beam |
| Detector | Peltier-Cooled CCD Array |
| Wavelength Range | 185–1100 nm |
| Spectral Bandwidth | 0.2, 0.5, 1, 2, and 4 nm (5-step adjustable) |
| Wavelength Accuracy | < ±0.1 nm (entire range) |
| Stray Light | < 0.005% at 340 nm (NaNO₂) |
| Photometric Range | –5 to +5 A |
| Baseline Stability | ≤ 0.0001 A (RMS) |
| Long-Term Drift | ≤ 0.0005 A/h |
| Scan Speed | Up to 12,000 nm/min |
| Wavelength Reproducibility | < ±0.01 nm |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena AG |
| Instrument Type | Double-beam |
| Detector | CCD array |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | < ±0.1 nm (full range) |
| Wavelength Repeatability | ≤ 0.02 nm |
| Spectral Bandwidth | 0.2, 0.5, 1, 2, and 4 nm (motorized selection) |
| Stray Light | < 0.0002% at 340 nm (NaNO₂) |
| Scan Speed | up to 12,000 nm/min |
| Automatic Wavelength Calibration | 内置 Ho-glass reference filter |
| Light Sources | Deuterium lamp (190–350 nm) and tungsten-halogen lamp (350–1100 nm) |
| Software | SCIENCE™ v3.x with GLP-compliant audit trail, method library, and instrument self-check (SCS) |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Model | ZEEnit 650P |
| Instrument Type | Graphite Furnace AAS |
| Background Correction | Dual-mode Zeeman (2-field / 3-field / dynamic field) + D₂ lamp |
| Furnace Design | Transversely Heated Graphite Atomizer (THGA) |
| Automation Level | Fully Automated with Integrated Autosampler, 8-Lamp Turret, RFID-enabled Lamp Recognition |
| Sample Introduction | Liquid & Solid (Direct Solid Sampling compatible) |
| Compliance Framework | Designed for GLP/GMP environments |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer | Analytik Jena GmbH & Co. KG |
| Instrument Type | Flame–Graphite Furnace AAS |
| Monochromator | Concave Grating |
| Optical System | Dual-Beam |
| Detector | Photomultiplier Tube (PMT) |
| Background Correction | Deuterium Lamp + Triple-Field Zeeman |
| Grating Density | 1800 lines/mm |
| Lamp Holder | Automated 8-Lamp Turret with Auto-Alignment |
| Magnetic Field Range | 0.1–1.0 T (Switchable Between 2-Field and 3-Field Zeeman Modes) |
| Graphite Furnace | Transversely Heated, Temperature Range: Room Temp to 3000 °C, Max. Ramp Rate: 3000 °C/s |
| Autosampler Capacity | Up to 108 Positions |
| Dimensions | 1200 × 480 × 600 mm |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Model | ZEEnit 700P |
| Instrument Type | Flame and Graphite Furnace AAS |
| Monochromator | Concave holographic grating (1800 grooves/mm) |
| Optical System | Dual-beam with automatic single/dual-beam switching |
| Detector | Photomultiplier tube (PMT) |
| Background Correction | Deuterium lamp + Triple-magnetic-field Zeeman effect |
| Graphite Furnace | Transversely heated, temperature range: room temp to 3000 °C, max heating rate: 3000 °C/s |
| Autosampler | 108-position, programmable |
| Dimensions | 1200 × 480 × 600 mm |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported Instrument |
| Model | ZEEnit 700Q |
| Pricing | Available upon Request |
| Brand | Analytik Jena |
|---|---|
| Origin | Germany |
| Model | ZEEnit 700Q |
| Instrument Type | Flame and Graphite Furnace AAS |
| Background Correction | Zeeman-effect with tunable magnetic field (2-field / 3-field / dynamic mode) + D₂ lamp |
| Automation Level | Fully automated flame and GF-AAS operation |
| Sample Introduction | Auto-sampler with intelligent dilution, 8-position encoded lamp turret with RFID support |
| Solid Sampling Option | Optional direct solid analysis module |
| Brand | Anasys |
|---|---|
| Origin | USA |
| Model | nanoIR2-FS |
| Instrument Type | Laboratory Benchtop System |
| Core Principle | Photothermal Induced Resonance (PTIR) Coupled with Atomic Force Microscopy (AFM-IR) |
| Spectral Range | 1000–4000 cm⁻¹ (Standard Tunable Quantum Cascade Laser Source) |
| Spatial Resolution | <10 nm |
| Spectral Acquisition Speed | <3 s per spectrum |
| Data Sampling Interval | Adjustable down to 0.25 cm⁻¹ (FT-based spectral reconstruction) |
| Sample Mode | Ambient or Controlled Environment (N₂-purged optional) |
| Compatible Chemometrics Software | Anasys IR-Spectra™ (with NIST-compatible spectral libraries, ASTM E1421-22 compliant preprocessing) |
| Brand | Anchor Wisdom |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Alioth-π |
| Price Range | USD 4,200 – 5,600 (FOB) |
| Detection Limit (Pb in aqueous matrix) | <0.3 mg/L |
| Detection Limit (Cd in aqueous matrix) | <0.5 mg/L |
| Measurement Time | 60 s per analysis |
| Detector Resolution | ≤145 eV (Mn Kα) |
| X-ray Tube | Transmission-target microfocus tube |
| Optical Path | Optimized 3D ultra-short path (sample–tube–detector) with multilayer scatter suppression coating |
| Camera | Integrated 1-MP visible-light imager with real-time video capture |
| Enclosure Rating | IP67-equivalent dual-layer liquid ingress protection |
| Housing Material | Aerospace-grade Al-Mg alloy |
| Software Algorithm | Holographic Fundamental Parameters (FP) quantification engine |
| Operating Mode | PC-controlled or standalone tablet interface |
| Warm-up Time | <3 s |
| Power Supply | Rechargeable Li-ion battery (8+ hrs continuous operation) |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model Series | Kymera 193i, Kymera 328i, Shamrock 500i, Shamrock 750, Mechelle 5000 |
| Spectral Resolution | 0.02 nm (Shamrock 750) |
| Imaging Resolution | 6000 (Mechelle 5000) |
| Optical Design | Czerny-Turner or Echelle |
| Configuration | Filter-based spectroscopy |
| Platform Compatibility | Ground- and airborne deployment |
| Detector Interface | Dual-input/dual-output architecture |
| Focal Length Range | 193 mm to 750 mm |
| Aperture Range | f/3.6 to f/9.7 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Mechelle 5000 |
| Wavelength Range | 200–975 nm |
| Optical Configuration | Fixed-grating, pre-aligned echelle spectrograph |
| Detector Integration | Integrated CCD/CMOS detector option |
| Cooling | Thermoelectric (TE) cooled detector |
| Purge Environment | N₂-purged optical path |
| Temperature Stabilization | Auto-temperature correction system |
| Mechanical Design | Compact, rigid monolithic housing |
| Moving Parts | None |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | Mechelle 5000 |
| Spectral Range | 200–975 nm |
| Optical Architecture | Fixed, pre-aligned echelle spectrograph with no moving parts |
| Detector Format | Integrated CCD or sCMOS detector (user-selectable) |
| Resolution | High-resolution echelle dispersion (R ≈ 20,000–40,000 depending on slit and detector configuration) |
| Wavelength Coverage | Simultaneous full-range acquisition without scanning |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | Shamrock 163i |
| Focal Length | 163 mm |
| f-number | f/3.6 |
| Optical Design | Czerny-Turner |
| Grating Compatibility | Interchangeable ruled and holographic gratings |
| Input Options | Adjustable slit (10–200 µm), fiber optic coupling (SMA905, FC/PC), free-space input |
| Detector Interface | Standard Andor camera mounting (C-mount, F-mount, or direct sensor integration) |
| Wavelength Range | UV-Vis-NIR (dependent on grating and detector choice) |
| Resolution | <0.1 nm (typical, with 1200 grooves/mm grating and 10 µm slit) |
| Stray Light Rejection | <1×10⁻⁴ |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR-163 |
| Optical Design | Czerny-Turner |
| Focal Length | 163 mm |
| F/# | f/3.6 |
| Wavelength Range | 300–500 nm |
| Spectral Resolution | 0.08 nm @ 2400 grooves/mm, 300 nm |
| Wavelength Accuracy | ±0.25 nm |
| Wavelength Repeatability | ±0.05 nm |
| Stray Light | ≤0.3% T |
| Dispersion | 2.0 nm/mm (with specified grating) |
| Entrance Slit Options | Multiple fixed and adjustable slit widths |
| Grating Mount | Dual-grating turret (standard), up to 3 gratings optional |
| Detector Compatibility | Full integration with Andor CCD, ICCD, and EMCCD cameras |
| Imaging Plane Dimensions | 28 mm × 10 mm |
| Grating Size | 40 mm × 40 mm |
| Coupling Options | SMA fiber port, kinematic flange, motorized shutter, dynamic slit, silver-coated optics (SR-163-SIL variant) |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR-303i |
| Application Systems | Transmission & Reflectance Spectroscopy |
| Grating Turret | Triple-grating (motorized) |
| Spectral Resolution | 0.08 nm @ 2400 g/mm, 300 nm |
| Dispersion | 2.2 nm/mm |
| Wavelength Range | 303–800 nm |
| F-number | F/4 |
| Wavelength Accuracy | ±0.04 nm |
| Stray Light Rejection | ≤0.3% T (typical), <2.2×10⁻⁵ (peak-to-valley) |
| Focal Length | 303 mm |
| Image Plane Dimensions | 28 mm × 14 mm |
| Slit Width Range | Motorized dynamic slit, up to 12 mm |
| Weight | 20 kg |
| Dimensions (L×W×H) | 394 × 238 × 208 mm |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR-500i |
| Spectral Resolution | 0.05 nm |
| Wavelength Range | 180 nm – IR |
| Dispersion | 1.44 nm/mm |
| F/# | f/6.5 |
| Wavelength Accuracy | ±0.04 nm |
| Stray Light | 2.6 × 10⁻⁵ |
| Grating Configuration | Triple-grating turret |
| Focal Length | 500 mm |
| Entrance/Exit Ports | Up to 2 input and 2 output ports |
| Image Plane Dimensions | 28 mm × 14 mm |
| Physical Dimensions | 550 mm × 343 mm × 206.5 mm |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR-750 |
| Focal Length | 500 mm |
| F/# | F/9.7 |
| Wavelength Range | 300–500 nm |
| Spectral Resolution | 0.02 nm @ 2400 grooves/mm, 300 nm |
| Wavelength Accuracy | ±0.03 nm |
| Wavelength Repeatability | ±10 pm |
| Stray Light Suppression | ≤2.6×10⁻⁵ |
| Grating Size | 68 mm × 68 mm |
| Dispersion | 2.6 nm/mm (at 300 nm, 2400 g/mm) |
| Slit Input Options | 1 or 2 |
| Detector Output Ports | 1 or 2 CCD ports + optional slit output |
| 焦平面尺寸 | 28 mm × 14 mm |
| Grating Turret | 3-position, fully documented per unit |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR193i |
| Spectral Range | 200–1100 nm |
| F/# | 3.6 |
| Spectral Resolution | 0.21 nm @ 1200 g/mm, 500 nm |
| Dispersion | 2.6 nm/mm |
| Wavelength Accuracy | ±0.2 nm |
| Stray Light | 1.5 × 10⁻⁴ |
| Grating Configuration | Dual-grating turret with RFID-enabled auto-identification |
| Optical Design | Imaging-corrected with toroidal mirrors |
| Detector Interfaces | Dual-output ports for simultaneous UV–NIR CCD/EMCCD/ICCD and InGaAs array or single-point detectors |
| Optional Coating | Silver-coated optics for enhanced NIR/SWIR throughput |
| Interface | USB 2.0, plug-and-play |
| Software Integration | Micro-Manager SDK-compatible spectral acquisition and analysis suite |