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Taylor-Hobson Limited

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BrandTaylor Hobson
OriginUnited Kingdom
ModelS116 / S128
TypeContact Profilometer & Surface Roughness Tester
Drive MechanismStainless Steel Linear Actuator
Probe Lift Range50 mm
Maximum Measurement Depth70 mm
Display4.3-inch TFT Touchscreen (Rotatable 360°)
BatteryHigh-Capacity Lithium-Polymer (≥2000 measurements per charge
InterfaceUSB-A 2.0 (printer/data export), Micro-USB 2.0 (charging/data transfer)
Environmental DurabilityRubberized Shock-Absorbing Housing, Polyester Touchscreen Overlay, Wear-Resistant Gearing
Mounting FlexibilityV-Groove Feet for Flat or Curved Surfaces, Inverted Probe Capability
Parameter DisplayUp to 7 roughness parameters simultaneously on single screen
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OriginUK
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelForm Talysurf Inductive
Price RangeUSD 27,000 – 41,000 (est.)
Product TypeContact Profilometer / Surface Roughness Tester
Measurement Length0.1 mm – 120 mm
Drive MethodJoystick or Computer-Controlled Motorized Traverse
Vertical ResolutionUp to 0.6 nm
Traverse Options50 mm / 120 mm / 200 mm Carriages
Measurement Modes2D Profile, 3D Areal Topography
AutomationFully Programmable Auto-Operation for Batch Testing
SoftwareMulti-Option Analysis Suite with ISO 4287/4288, ISO 25178, ASME B46.1, and EN ISO 11562 Compliance
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BrandTaylor Hobson
OriginUnited Kingdom
ModelPGI Matrix 1 / PGI Matrix 3 / PGI Matrix 5
TypeContact Profilometer / Surface Roughness Tester
Measurement PrinciplePrecision Stylus-Based Topographic Profiling with PGI (Precision Geometry Interferometry) Signal Processing
Software PlatformForm Talysurf Intra (v6.0+) with Advanced Aspheric Analysis Unit (AAU)
ComplianceISO 25178-2, ISO 4287, ISO 11562, ISO 12780, ASTM E1158, USP <1058> (Analytical Instrument Qualification), FDA 21 CFR Part 11 (Audit Trail & Electronic Signatures Enabled)
Environmental CompensationReal-time X-axis & radius thermal drift compensation algorithm
Key Output MetricsResidual form error (sub-micron), aspheric deviation (nm-level), slope error (µrad), ring zone depth, diffraction step height reconstruction, reverse-coefficient fitting for aspheric/diffractive surfaces
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OriginUK
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelCCI MP-HS
PricingAvailable Upon Request
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OriginUK
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelForm Talysurf PGI
Product TypeContact Profilometer / Surface Roughness Tester
Travel Length200 mm or 120 mm
Measurement PrincipleStylus-based Inductive Displacement Sensing
Aspheric Measurement ModePhase-Grating Interferometric Reconstruction (Reverse Engineering)
Profile Range4 mm (60 mm diamond stylus, simultaneous roughness & form) / 8 mm (120 mm spherical stylus, form-only)
Software Capabilities2D/3D surface topography analysis, aspheric deviation mapping, sag table export compliant with optical design software (e.g., Zemax, Code V)
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OriginUK
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelForm Talysurf Intra
Product TypeContact Profilometer / Surface Roughness Tester
Sensor TypeInductive
Vertical Measurement Range1 mm (standard, with 60 mm stylus) / 2 mm (optional, with 120 mm stylus)
Vertical Resolution16 nm (at 1 mm range), 3.2 nm (at 0.2 mm range)
Range-to-Resolution Ratio65,536:1
Stylus Force0.7–1 mN
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BrandTaylor Hobson
OriginUnited Kingdom
ModelLuphoScan120 / LuphoScan260 / LuphoScan420
Measurement PrincipleMulti-Wavelength Interferometry (MWLI®)
Maximum Workpiece Diameter120 mm / 260 mm / 420 mm
Vertical Resolution< 0.1 nm (sub-nanometer)
Shape Accuracy≤ ±50 nm (traceable to NPL/PTB standards)
Scan SpeedFull 3D topography of 30 mm spherical surface < 2 min
Surface CompatibilityTransparent optics (fused silica, CaF₂, BK7), polished metals, ground surfaces, coated substrates
Software PlatformForm Talysurf® with LuphoScan Module (ISO 10110-5, ISO 14999-1, ISO 25178 compliant)
Regulatory ComplianceSupports GLP/GMP audit trails, 21 CFR Part 11 electronic signature readiness, full measurement traceability per ISO/IEC 17025
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BrandTaylor Hobson
OriginUnited Kingdom
ModelPGI Freeform
TypeContact Profilometer / Surface Roughness Tester
Measurement PrincipleStylus-based Scanning Interferometry with Radial & Grid Scan Modes
Vertical Range28 mm
Vertical Resolution0.8 nm
Tilt Capability±50°
Form Error Accuracy<150 nm PV (as per ISO 5436-1 and ISO 25178-2)
ComplianceASTM E1155, ISO 10360, ISO 25178, ISO 5436-1, USP <1058> for metrological validation
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OriginUK
Manufacturer TypeAuthorized Distributor
Origin CategoryImported Instrument
ModelTalysurf CCI
PricingAvailable Upon Request
Product TypeNon-Contact Profilometer / Surface Roughness Analyzer
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