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| Brand | LEI-TECH |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Domestic |
| Model | LK-ZDJY80R |
| Instrument Class | Optical Patterned Defect Inspection System |
| Primary Applications | Wafer process monitoring, outgoing wafer quality control |
| Compatible Wafer Sizes | 4", 6", 8", 12" |
| Brand | LEI-TECH |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | LK-BY86 |
| Pricing | Upon Request |
| Instrument Type | Optical Patterned Defect Inspection System |
| Primary Applications | Front-end & back-end wafer process monitoring, outgoing wafer quality control, automated wafer handling |
| Compatible Wafer Diameters | 150 mm (6″), 200 mm (8″), 300 mm (12″) |
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