Aolong AL-Y3500 High-Resolution X-ray Diffractometer
| Brand | Aolong |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | AL-Y3500 |
| Price Range | USD 28,000 – 70,000 |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Configuration | Floor-Standing |
| Angular Resolution | Better than 0.0001° (2θ) |
Overview
The Aolong AL-Y3500 is a floor-standing, high-resolution X-ray diffractometer engineered for rigorous crystallographic characterization in academic research laboratories, industrial R&D centers, and quality control environments. Based on Bragg’s law (nλ = 2d sinθ), the system utilizes monochromatic Cu Kα radiation (λ = 1.5418 Å) generated by a sealed-tube X-ray source to probe atomic-scale periodicity in crystalline and semi-crystalline materials. Its core architecture integrates a precision goniometer with sub-arcminute angular reproducibility, enabling reliable measurement of diffraction peak positions, intensities, and line profiles—critical parameters for phase identification, quantitative phase analysis, lattice parameter refinement, and microstructural assessment. Designed for long-term operational stability, the AL-Y3500 features an actively temperature-stabilized X-ray generator control system and rigid mechanical construction to minimize thermal drift and mechanical hysteresis during extended scan sequences.
Key Features
- High-angular-resolution goniometer with <0.0001° (2θ) step resolution and <±0.001° absolute accuracy over full 2θ range (typically 0–160°)
- Floor-standing configuration with integrated shielding cabinet compliant with IEC 61000-6-3 and GB/T 18801–2015 radiation safety standards
- Stable sealed-tube X-ray source with real-time tube voltage/current regulation and automatic filament aging compensation
- Modular optical path design supporting interchangeable incident-beam optics: divergence slits, soller collimators, monochromators, and Göbel mirrors
- Motorized sample stage with XYZ translation and tilt adjustment (±5°), compatible with ambient, heating (RT–1200°C), and cooling (100–400 K) stages
- Integrated detector options including scintillation counter (for high-intensity routine scans) and silicon strip detector (for rapid acquisition and low-background measurements)
Sample Compatibility & Compliance
The AL-Y3500 accommodates a broad spectrum of solid-state samples: powders (bulk or micro-volume), bulk metals and ceramics, thin films (single-layer and multilayer stacks), textured polycrystals, and micro-region specimens via optional motorized micro-diffraction stage. Sample holders support standard 25 mm and 50 mm diameter flat plates, capillary tubes, and custom fixtures. All measurement protocols adhere to internationally recognized analytical standards, including ASTM E975 (phase identification), ISO 17892-12 (quantitative phase analysis), and USP (crystallinity assessment in pharmaceuticals). Data acquisition and reporting workflows are structured to support GLP and GMP audit readiness, with configurable user access levels and electronic signature capability in optional software packages.
Software & Data Management
The instrument is operated via Aolong’s proprietary XRD Analysis Suite v4.x—a Windows-based platform supporting automated alignment, scan scheduling, real-time data visualization, and batch processing. Core modules include: (1) AutoSearch/Match for ICDD PDF-4+ database querying with confidence index scoring; (2) Rietveld full-pattern refinement engine (based on GSAS-II algorithms) for structural solution and quantitative phase analysis; (3) Thin-film analysis toolkit featuring ω/2θ coupled scans, rocking curve analysis, and XRR modeling for thickness, roughness, and density extraction; (4) Stress and texture calculation module compliant with ASTM E977 and E1426. Raw data are stored in industry-standard binary formats (.raw, .udf) with embedded metadata (instrument parameters, calibration history, operator ID), ensuring traceability and interoperability with third-party analysis tools such as TOPAS, FullProf, and DIFFRAC.SUITE.
Applications
- Qualitative and quantitative phase analysis in geological, metallurgical, and ceramic samples
- Rietveld-based crystal structure determination and refinement of novel inorganic compounds
- In-situ and operando studies of structural evolution under thermal cycling, mechanical loading, or gas exposure
- Thin-film metrology: layer thickness, interfacial roughness, strain state, and crystallinity grading
- Residual stress mapping in welds, coatings, and additive-manufactured components using sin²ψ method
- Preferred orientation (texture) analysis in rolled metals, drawn wires, and extruded polymers
- Crystallinity quantification in pharmaceuticals, polymers, and battery electrode materials
FAQ
What is the minimum detectable crystallite size using the AL-Y3500?
Scherrer analysis sensitivity depends on instrumental broadening and scan parameters; typical lower limit is ~3–5 nm for well-defined peaks under optimized conditions.
Does the system support automated sample changers?
Yes—optional 16-position autosampler compatible with standard powder holders and pre-aligned sample trays is available.
Is the software compliant with FDA 21 CFR Part 11 requirements?
The optional Audit Trail & e-Signature add-on module provides electronic record integrity, role-based permissions, and audit log generation meeting Part 11 criteria.
Can the AL-Y3500 perform grazing-incidence XRD (GIXRD)?
Yes—when equipped with a motorized incident-angle stage and appropriate optics, it supports GIXRD configurations down to 0.1° incidence angle.
What maintenance intervals are recommended for the X-ray tube?
Under standard usage (≤8 h/day), the sealed tube requires no scheduled replacement for ≥2 years; annual calibration and alignment verification are advised.
