Other Optical Measurement Instruments
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| Brand | Asphericon |
|---|---|
| Origin | Germany |
| Model | ALL12-25-P-U |
| Numerical Aperture (NA) | 0.25 |
| Wavelength Optimization | 780 nm |
| Substrate Material | N-BK7 |
| Diameter | 12.5 mm |
| Effective Focal Length Tolerance | ≤ ±0.1 % |
| Surface Form Error (RMSi) | ≤ 0.1 µm |
| Surface Quality | 60–40 scratch-dig |
| Clear Aperture | ≥ 90 % |
| Coating Options | Standard AR Coatings A (400–600 nm), B (600–1050 nm), C (1000–1600 nm) |
| Laser Induced Damage Threshold (LIDT) | 12 J/cm² @ 100 Hz, 6 ns, 532 nm |
| Mounting | Unmounted (U) |
| Brand | ATAGO |
|---|---|
| Origin | Japan |
| Model | CM-780 |
| Measurement Range | 0.0–78.0% Brix |
| Resolution | 0.1% Brix |
| Accuracy | ±0.2% Brix |
| Temperature Compensation | Automatic, 5–60 °C |
| Prism Material | Sapphire |
| Wetted Parts | SUS316 Stainless Steel |
| Output Interfaces | RS-232C, 4–20 mA analog (DC) |
| Power Supply | DC 24 V |
| Compliance | Designed for continuous industrial process monitoring in food, beverage, and chemical manufacturing environments |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM/ODM Manufacturer |
| Regional Category | Domestic (China) |
| Model | AF-T050 |
| Pricing | Available Upon Request |
| Brand | Atometrics |
|---|---|
| Model | AP-5005 |
| Origin | Guangdong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Pricing | Upon Request |
| Brand | ATSEVA |
|---|---|
| Origin | Russia |
| Model | IRA-0.45-3 |
| Wavelength Range | 450 nm – 11 µm |
| Pulse Duration Range | 50 fs – 250 ps |
| Input Pulse Energy (typ.) | >1 nJ (50 fs–1 ps, thin NL crystal) / >3 nJ (1–250 ps, thick NL crystal) |
| Max. Avg. Input Power | 1 W |
| Repetition Rate | 10 Hz – 100 MHz |
| Polarization | Linear, horizontal |
| Delay Line Time Resolution | 8.3 fs |
| Full Scan Range | 850 ps |
| Interface | USB |
| Software | Windows-based acquisition & analysis suite |
| Dimensions (Optical Unit) | 450 × 250 × 210 mm |
| Dimensions (Control Unit) | 250 × 180 × 90 mm |
| Power Supply | 110/220 V, 50/60 Hz ±10% |
| Brand | ATSEVA |
|---|---|
| Model | OCV-6300F |
| Type | Optical Mechanical Chopper |
| Frequency Range | 7–6300 Hz (dependent on chopper blade configuration) |
| Blade Options | 2-, 10-, 30-, 60-, and 100-slot |
| Sync Output | +5 V, 50 Ω TTL-compatible |
| Frequency Accuracy | ±1 Hz |
| Power Supply | AC 100–230 V, 50/60 Hz → DC 12 V, 0.35 A adapter |
| Power Consumption | 4 W |
| Dimensions (OCV-6300F) | 87 × 104 × 148 mm (W × L × H) |
| Integrated Frequency Counter | Yes |
| Compliance | CE-marked, RoHS-compliant |
| Operating Environment | 15–35 °C, <80% RH non-condensing |
| Brand | ATSEVA |
|---|---|
| Model | SP |
| Type | Spectral Phase Interferometry for Direct Electric-field Reconstruction Instrument |
| Origin | Russia |
| Import Status | Imported |
| Interface | USB 2.0 |
| Operating Mode | Single-shot & Real-time |
| Input Polarization | Linear, Horizontal |
| Dimensions (w×d×h) | 361 × 210 × 145 mm (SP-800-5), 385 × 295 × 125 mm (SP-800-10 & SP-1000-20) |
| Spectral Range Options | 550–1050 nm |
| Transform-Limited Pulse Width Coverage | 5–12 fs to 80–320 fs (model-dependent) |
| Sensitivity | ≥1 µJ per pulse (single-shot mode) |
| Detection | Dual-channel CCD spectrometer integrated |
| Data Processing | Linear, non-iterative Fourier-domain reconstruction algorithm |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Model | Entanglement Source |
| Pump Wavelength | 1550 nm ±10 nm |
| Photon Pair Generation | Type-II SPDC in PPLN waveguide |
| Spectral Brightness | >250,000 pairs/s |
| Heralded Collection Efficiency | ≥35% |
| Coincidence-to-Accidental Ratio (CAR) | ≥10,000 |
| Two-Photon Interference Visibility | >99% (polarization & frequency) |
| Center Wavelength Tunability | ±2 nm |
| Wavelength Stability | ≤20 pm |
| Pump Input | FC/APC, PM-HI780 fiber |
| Signal/Idler Output | FC/APC, PM-1550 fiber |
| Pump Power | ≤5 mW |
| Power Consumption | <40 W |
| Dimensions (L×W×H) | 250 × 280 × 70 mm³ |
| Weight | 4.5 kg |
| Operating Temperature | 0–30 °C |
| Control Interface | USB + proprietary GUI + DLL for LabVIEW/C++/VB |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Model | 6332C |
| Light Source | Stable Single-Mode & Multimode (1310 nm / 1550 nm) |
| Output Modes | CW, Modulated (270 Hz / 1 kHz / 2 kHz), External Modulation |
| Power Meter Range | –70 dBm to +10 dBm |
| Wavelength Accuracy | ±0.5 nm |
| Interface Types | FC, SC, ST, LC, 2.5 mm Universal, 1.25 mm Universal |
| Data Storage | Onboard Parameter & Result Logging |
| Compliance | Designed for IEC 61300-3-4 (IL), IEC 61300-3-6 (RL), Telcordia GR-910-CORE |
| Brand | Auniontech |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | COSMO Optical Frequency Comb CEO Measurement Module |
| Price | Upon Request |
| Input Pulse Wavelength | ~1560 nm |
| Input Pulse Energy | > 200 pJ |
| Input Fiber | PM1550 |
| Input Optical Interface | FC/APC |
| Output Electrical Interface | SMA |
| Module Dimensions | ~50 × 35 × 22 mm |
| Input Average Power | 400 mW |
| Operating Temperature | 0–40 °C |
| f<sub>CEO</sub> Peak SNR | > 35 dB |
| Brand | Auniontech |
|---|---|
| Model | DLD-120 |
| Active Diameter | 120 mm |
| Lateral Resolution | ≤ 50 µm |
| Permanent Random Imaging Count Rate | > 5 × 10⁶ counts/s |
| Special Layout Imaging Count Rate | > 20 × 10⁶ counts/s |
| Max. Burst Rate | up to 100 × 10⁶ counts/s |
| Multi-Hit Capability | ≥ 4 simultaneous hits |
| High-Voltage Floating | up to 10 kV |
| Time Bin Resolution | 6.8 ps |
| Position-Integrated Time Resolution | < 200 ps |
| Maximum Start Repetition Rate | 9 MHz |
| Interface | USB 3.0 & Gigabit Ethernet |
| Compliance | Designed for vacuum-integrated TOF and ultrafast photon/particle imaging systems |
| Brand | Auniontech |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | FROG Scan |
| Price | Upon Request |
| Brand | Auniontech |
|---|---|
| Origin | Germany |
| Distributor Type | Authorized Distributor |
| Import Status | Imported |
| Price Range | USD 7,000 – 14,000 |
| Wavelength Range | 350–2500 nm |
| Groove Density | 150–6000 lines/mm |
| Peak Diffraction Efficiency | Up to 99% (Bragg condition) |
| Polarization Sensitivity | <±2% efficiency variation (s- vs p-polarized) |
| Thermal Stability | <0.5% efficiency drift over 0–100°C cycling |
| Substrate Material | Fused silica (low CTE) |
| Surface Quality | 60–40 scratch-dig |
| Wavefront Distortion | Standard <λ/8 RMS @ 632.8 nm |
| AR Coating | Standard R <1.0% |
| Cleaning Compatibility | Compatible with acetone or isopropanol wipe cleaning |
| Brand | Auniontech |
|---|---|
| Origin | Imported (Non-Chinese) |
| Manufacturer Type | Authorized Distributor |
| Model | LSM-9000LE |
| Price Range | USD 42,000 – 70,000 (FOB) |
| Brand | Auniontech |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Mid-IR FROG Pulse Analyzer |
| Price | Upon Request |
| Wavelength Range | 2000–3400 nm |
| Minimum Measurable Pulse Duration | 12 fs |
| Dynamic Range | 75 dB |
| Detection Method | Second-Harmonic Generation (SHG) Frequency-Resolved Optical Gating |
| Compatible Spectrometers | Ocean Insight USB4000 / USB2000+ |
| Data Acquisition | 16-bit ADC |
| Reconstruction Algorithm | PCGP (Principal Component Generalized Projections) |
| Brand | Auniontech |
|---|---|
| Model | Mprobe 20 |
| Measurement Principle | Spectral Reflectometry |
| Thickness Range | 1 nm – 1 mm (configuration-dependent) |
| Accuracy | < 0.01 nm or 0.01% (on 200 nm SiO₂, n=100) |
| Stability | < 0.02 nm or 0.2% (20-day drift) |
| Spot Size | < 1 mm |
| Minimum Sample Size | ≥ 10 mm |
| Wavelength Options | VIS (400–1100 nm), UV-VIS (200–1100 nm), VIS-HR (700–1700 nm), NIR (900–1700 nm), UV-VIS-NIR (200–1700 nm), NIR-HR (200–1100 nm w/ InGaAs) |
| Detector Types | CMOS, back-thinned CCD, InGaAs |
| Light Sources | Tungsten-halogen, deuterium, xenon flash, SLD |
| Software | TFCompanion-RA |
| Compliance | ASTM E1936, ISO 15630-3, supports GLP/GMP audit trails via optional configuration |
| Brand | Auniontech |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NEO |
| Pricing | Upon Request |
| Spectral Range | 250–1100 nm (configurable broadband or tunable variants) |
| Detector | Thermoelectrically Cooled CCD (–10 °C) |
| Optical Resolution | Up to ~0.1 nm (dependent on grating and slit configuration) |
| Stray Light | < 0.01% |
| Linearity Error | < 1% (internally compensated) |
| Dark Current Compensation | Near-zero across full integration time range |
| Interface | USB 3.0 (USBTMC/SCPI), RS232, Ethernet, TTL trigger I/O |
| Active Accessory Control | Up to 3 devices (e.g., LED sources, filter wheels) |
| Fiber Coupling | Industrial-grade FC/PC or SMA (via adapter) |
| Housing | IP54-rated ruggedized enclosure for industrial deployment |
| Compliance | CE, RoHS, ISO/IEC 17025-compatible calibration traceability |
| Brand | Auniontech |
|---|---|
| Origin | Germany |
| Model | QE85% SNSPD |
| Quantum Efficiency | ≥85% @ 600–2300 nm |
| Dark Count Rate | ≤10 cps (0.01 cps optional) |
| Timing Jitter | ≤45 ps (20 ps optional) |
| Maximum Count Rate | >20 MHz |
| Spectral Range | 0.6–2.3 µm |
| Channel Count | 1–8 channels |
| Fiber Coupling | SMF-28e |
| Output Signal | TTL / ECL / LVDS |
| Interface | USB, LabVIEW-compatible |
| Operating Mode | Continuous |
| Afterpulsing | None |
| Output Amplitude | ≤150 mV |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Model | QOQ-048-0550-075 |
| Aperture | 48 mm |
| Integrated Source | LED (IEC 62471 RG1, 550 nm) |
| Mask Pitch | 500 µm |
| Mask Clear Aperture | 250 µm |
| Effective Mask Diameter | 68 mm |
| EFL | 75 mm |
| Minimum Beam Diameter | 5 mm |
| Spectral Range | 400–750 nm |
| Sensor Resolution | 5472 × 3648 px |
| Pixel Pitch | 2.4 µm |
| Bit Depth | 8-bit |
| Max. Tilt | >6° |
| Tilt Accuracy | <1 arcsec |
| Tilt Resolution | <0.5 arcsec |
| Wavefront RMS Accuracy | 30 nm |
| Wavefront RMS Sensitivity | 15 nm |
| Wavefront Dynamic Range | >1.5 mm |
| Software Compatibility | Windows & macOS |
| API Support | gRPC (Python/C++/MATLAB) |
| Compliance | IEC 62471:2006 |
| Brand | Auniontech |
|---|---|
| Model | QZFM (Zero-Field Magnetometer) / QTFM (Total-Field Magnetometer) |
| Atomic Species | Rubidium |
| Zero-Field Sensitivity | <15 fT/√Hz (3–100 Hz, typical 7–10 fT/√Hz) |
| Total-Field Sensitivity | <1 pT/√Hz (0.1–100 Hz) |
| Dynamic Range (QZFM) | ±5 nT |
| Dynamic Range (QTFM) | 1000–100,000 nT |
| Measurement Axes (QZFM) | Single-axis (Z or Y) or dual-axis (Z & Y simultaneous) |
| Standoff Distance | 6.5 mm |
| Calibration | Internal automated reference |
| Signal Outputs | Analog voltage + USB digital interface |
| Sensor Dimensions | 12.4 × 16.6 × 24.4 mm |
| Electronics Dimensions | 31 × 110 × 165 mm |
| Total Power Consumption | 5 W (sensor head: 0.7 W) |
| Operating Temperature | −30 °C to +60 °C |
| Slew Rate (QTFM) | 10,000 nT/s |
| Max Spatial Gradient Tolerance (QTFM) | 1000 nT/cm |
| Max Sampling Rate (QTFM) | 400 Hz |
| Deadzone (QTFM) | ±7° equatorial plane |
| Heading Error (QTFM) | <3 nT (uncompensated) |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Model | SC-1560-780 (Standard) / SC-Custom (Customizable) |
| Input Wavelength | ~1560 nm (SC-1560-780) / 1000–2000 nm (SC-Custom) |
| Input Pulse Width | <200 fs (SC-1560-780) / <350 fs (SC-Custom) |
| Input Pulse Energy | 150 pJ (SC-1560-780) / >150 pJ (SC-Custom) |
| Output Spectrum Range | ~750–1300 nm (SC-1560-780) / Customizable (SC-Custom) |
| Average Output Power | 400 mW (SC-1560-780) / Up to 4 W with TEC cooling (SC-Custom) |
| Dispersion-Wave Power | >40 µW (SC-1560-780) / >100 µW (SC-Custom) |
| Output Coupling | FC/APC fiber or free-space lens option |
| Module Dimensions | ~57 × 13 × 9 mm (SC-1560-780) / Customizable (SC-Custom) |
| Operating Temperature | 15–30 °C (SC-1560-780) / –10 to +60 °C (SC-Custom) |
| Compliance | RoHS-compliant packaging, fiber-pigtailed for OEM integration |
| Brand | Auniontech |
|---|---|
| Model | SiPM |
| Detector Type | Silicon Photomultiplier (Geiger-Mode APD Array) |
| Active Area | 3 mm × 3 mm |
| Pixel Pitch | 15 µm |
| Total Microcell Count | 38,800 |
| Peak Photon Detection Efficiency (PDE) | 31% @ 430 nm (V<sub>ctrl</sub> = 0.7 V) |
| Dark Count Rate (DCR) | 125 kHz/mm² |
| Optical Crosstalk Probability | 18% |
| Afterpulsing Probability | 5% |
| Recovery Time | 15 ns |
| Transimpedance Gain | 150 V/A |
| Output Bandwidth | 12.5 MHz |
| Bias Voltage Range | 0–1 V |
| Supply Voltage | 5 VDC |
| Typical Power Consumption | 350 mW |
| Dimensions | 40 mm × 50 mm × 19.8 mm |
| Operating Temperature | 0–60 °C |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | SKYSPEC Series |
| Pricing | Available Upon Request |
| Brand | Auniontech |
|---|---|
| Origin | Imported |
| Manufacturer Type | Authorized Distributor |
| Model | STZL-Photoelastic Coefficient System |
| Price Range | USD 14,000 – 28,000 |
| Measurement Principle | Optical Heterodyne Interferometry with Dual-Frequency Orthogonal Polarization |
| Light Source | Stabilized He–Ne Laser (2 mW, 632.8 nm) |
| Sample Deformation Mode | Tensile & Compressive Loading |
| Max Load Capacity | 50 N (standard), upgradable to 200 N / 1000 N |
| Temperature Control Range | Ambient to 200 °C |
| Temp. Stability | ±1 °C |
| Sample Dimensions (Tension) | 10 × 80 mm |
| Sample Dimensions (Compression) | Ø20 mm × 15 mm max thickness |
| Thickness Range | 0.3 – 15 mm |
| Actuation | Dual-synchronized stepper-motor-driven lead screws |
| Stroke | 100 mm |
| Measured Outputs | Photoelastic Coefficient (C, nm/MPa), Retardation (δ, nm), Principal Axis Orientation (θ, deg), Young’s Modulus, Fracture Strength |
| Optical Resolution | Sub-nm retardation resolution (via Fourier-domain phase demodulation) |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model Functionality | Frequency Reference & PID Loop Control |
| Pricing | Available Upon Request |
| Brand | Auniontech |
|---|---|
| Substrate Material | Fused Silica |
| Center Wavelengths | 266 nm, 515 nm, 800 nm, 1030 nm, 1450 nm |
| GDD Range | −30 fs² to −500 fs² |
| Reflectance (HR) | >99.0%–99.95% across specified bands |
| Surface Flatness | λ/10 @ 533 nm |
| Surface Quality | 10–5 Scratch-Dig |
| Clear Aperture | >85% |
| Wedge | <5 arcmin |
| Incident Angles | 0°–20° (model-dependent) |
| Available Sizes | Ø1/2″ to 85×35 mm |
| Pairing Options | Yes (for matched dispersion compensation) |
| Brand | Aurea Technology |
|---|---|
| Origin | France |
| Model | SPD_NIR_OEM_120MHz |
| Spectral Range | 900–1700 nm |
| Max. Trigger Rate | 120 MHz |
| Quantum Efficiency | Adjustable 5–30% (5% steps) |
| Timing Jitter | <150 ps @ 30% QE |
| Dark Count Rate | <5.0 × 10⁻⁶ per ns @ 10% QE (SMF) |
| Dead Time | Adjustable 500 ns – 999 µs |
| Cooling | Integrated Thermoelectric Cooler (TEC) |
| Interface | USB 2.0 |
| Fiber Compatibility | SMF or MMF |
| TEC Stabilization Time | <2 min @ 25 °C |
| Brand | AUTOSCAN |
|---|---|
| Model | FastTracks 3 (v.3) |
| Measurement Principle | Optical microscopy-based fission track counting and length analysis on etched mineral surfaces (apatite, zircon) |
| Imaging Resolution | 0.1 µm step resolution, sub-micron feature detection capability |
| Motorized Stage | 75 mm (X) × 50 mm (Y) × 3 mm (Z), repeatability ±2 µm |
| Camera | Monochrome CCD, 768 × 576 pixels, 40 fps full-resolution acquisition |
| Software Suite | TrackWorks 3 + FastTracks 3 v.3, GLP-compliant audit trail support |
| Compliance | Designed for ISO/IEC 17025-accredited thermochronology labs |
| Sample Compatibility | Standard petrographic thin sections (25 × 75 mm), polished grain mounts, apatite/zircon separates on epoxy resin stubs |
| Automation Level | Fully automated grain search, track identification, constrained/unconstrained track counting, 3D semi-track length measurement, Dpar/Dper calculation, c-axis orientation mapping |
| Training Module | Integrated pedagogical overlay with instructor-reference overlay and change-diff annotation |
| Origin | Russia |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AA20-DD |
| Price Range | USD 0–7,200 (FOB) |
| Wavelength Options | 450–700 nm (AA-20DDV), 700–1300 nm (AA-20DD), 1300–2000 nm (AA-20DDR), 450–2000 nm (AA-20DD+R+V) |
| Pulse Duration Range | 20–6000 fs (standard) |
| Repetition Rate Support | >10 kHz (standard) |
| Scan Frequency | 0.1–20 Hz |
| Linearity Error | <1% |
| Optical Architecture | All-reflective, collinear interferometric & intensity autocorrelation |
| Detection Mechanism | Two-photon conductivity in semiconductor detector |
| Input Polarization | Linear, horizontal (vertical on request) |
| Interface | USB 2.0 |
| Compliance | CE-marked |
| Brand | Axetris |
|---|---|
| Origin | Switzerland |
| Model | EMIRS50_AT06V |
| Housing | TO-46 metal can |
| Emission Range | 2–14 µm (blackbody-like spectral profile) |
| Modulation Capability | Electrical (chopper-free, DC–>100 Hz typical) |
| Substrate | Silicon MEMS platform with thin-film resistive element |
| Window Options | Sapphire or Barium Fluoride (BaF₂) |
| Power Consumption | <150 mW (typ. at 5 V, 25 °C ambient) |
| Lifetime | >50,000 hours (L₅₀ at rated drive conditions) |
| Radiation Efficiency | >90% (vs. ideal blackbody in 3–12 µm band) |
| Stability | <0.5% drift over 1,000 h (constant-current operation) |