Metash X-6D Dual-Beam UV-Vis Spectrophotometer
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | X-6D |
| Optical System | Dual-beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Automation Level | Automatic Wavelength Scanning |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Accuracy | ±0.5 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Stray Light | ≤0.05%T |
Overview
The Metash X-6D Dual-Beam UV-Vis Spectrophotometer is a precision optical instrument engineered for routine and advanced quantitative and qualitative analysis in chemistry, biochemistry, pharmaceutical, and environmental laboratories. Based on the fundamental principle of Beer–Lambert law absorption spectroscopy, the X-6D employs a stable dual-beam optical architecture to continuously compare sample and reference beam intensities—effectively compensating for source drift, detector instability, and ambient fluctuations. Its 190–1100 nm wavelength coverage spans deep ultraviolet through near-infrared, enabling characterization of organic chromophores, nucleic acids, proteins, transition metal complexes, and colloidal nanoparticles. The instrument’s rigid mechanical foundation—a 10 mm thick milled aluminum baseplate—decouples the optical path from chassis deformation and external vibration, ensuring long-term photometric stability essential for regulatory-compliant workflows.
Key Features
- Dual-beam optical design with real-time reference compensation for enhanced baseline stability and reduced measurement drift over extended acquisition periods.
- 7-inch high-resolution capacitive touch display with intuitive GUI navigation; supports gesture-based zoom, drag, and multi-point calibration without external peripherals.
- Integrated悬架式 optical platform (suspended optical assembly) mounted on a monolithic aluminum base—eliminating coupling between mechanical housing movement and optical alignment.
- High-efficiency light source configuration: imported long-life deuterium lamp (190–350 nm) and tungsten-halogen lamp (350–1100 nm), automatically switched at optimal crossover point.
- Fixed spectral bandwidth of 1.8 nm ensures consistent resolution across the full range, supporting reproducible method transfer per ISO 17025 and USP requirements.
- Onboard data storage capacity equivalent to standard PC-based systems; raw absorbance/transmittance spectra, kinetic time-series, and multi-wavelength tables retained with timestamped metadata.
Sample Compatibility & Compliance
The X-6D accommodates standard 10 mm pathlength quartz, glass, or plastic cuvettes (including semi-micro and ultra-micro variants via optional holders). With available accessories—including automated multicell changers (6/8-position), Peltier-controlled temperature-regulated cells (±0.1 °C), integrating sphere reflectance modules, and rotating solid-sample stages—the system supports liquid, suspension, thin-film, and opaque solid measurements. All firmware and software comply with GLP/GMP documentation standards: user access levels (admin/operator/auditor), full audit trail logging (parameter changes, calibration events, data exports), electronic signature support, and 21 CFR Part 11–ready data integrity controls when used with validated network configurations.
Software & Data Management
The included Metash SpectraScan software provides full remote control and advanced post-processing capabilities beyond standalone operation—including derivative spectroscopy, peak deconvolution, spectral subtraction, concentration mapping, and kinetic curve fitting (zero-/first-/second-order models). Data export formats include CSV, TXT, and XML for LIMS integration; reports are generated in PDF/A-1b format with embedded instrument ID, calibration status, and operator credentials. USB 2.0 host port enables direct U-disk data dump; optional Bluetooth 4.2 module supports wireless connection to certified lab printers (e.g., HP LaserJet Pro MFP series) and mobile diagnostic tools. A4-size thermal or inkjet printing (HP DeskJet 1100/1200 series compatible) is supported natively for immediate hardcopy generation compliant with internal QA protocols.
Applications
- Quantitative assay of pharmaceutical actives (e.g., paracetamol, ibuprofen) per USP monographs using fixed-wavelength or multi-point calibration.
- DNA/RNA purity assessment (A260/A280, A260/A230 ratios) and concentration calculation using built-in nucleic acid extinction coefficients.
- Enzyme kinetics monitoring (e.g., NADH oxidation at 340 nm) with programmable time-scan intervals down to 0.1 s.
- Colorimetric determination of heavy metals (e.g., Fe²⁺ with 1,10-phenanthroline) and nutrient ions (NO₃⁻, PO₄³⁻) in environmental water samples.
- Thin-film thickness estimation via interference fringe analysis in the visible-NIR region.
- Stability-indicating methods development for forced degradation studies under ICH Q1/Q5 guidelines.
FAQ
What is the maximum scan speed supported in spectral scanning mode?
The X-6D achieves up to 3000 nm/min scanning velocity with adjustable data interval (0.1–5.0 nm), optimized for signal-to-noise ratio preservation at high throughput.
Does the instrument support wavelength calibration verification with NIST-traceable standards?
Yes—built-in holmium oxide and didymium filters are recognized during startup; manual calibration verification follows ASTM E275 and ISO 6223 protocols.
Can custom wavelength programs be saved and recalled directly on the device?
Up to 100 user-defined methods—including wavelength sets, slit widths, scan ranges, and auto-zero parameters—can be stored locally with password protection.
Is the touchscreen interface operable with laboratory gloves?
The capacitive display responds reliably to standard nitrile and latex gloves; glove-mode sensitivity adjustment is accessible in system settings.
How is photometric linearity verified across the 0–3.0 Abs range?
Linearity validation uses neutral density filters and serial dilutions of potassium dichromate per ISO 10012; results are logged automatically with pass/fail flags.

