SAN-EI XEF-150 Fiber-Coupled Steady-State Solar Simulator
| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Model | XEF-150 |
| Illumination Mode | Steady-State |
| Spectral Class | AM1.5G A+ (per ASTM E927, IEC 60904-9, JIS C 8912) |
| Spatial Non-Uniformity | <2% (Class A) |
| Temporal Instability | <1% (Class A+) |
| Spectral Mismatch | <±12.5% (AM1.5G, Class A+) |
| Effective Irradiation Area | 2"×2" (standard), customizable up to 500 mm × 500 mm |
| Light Source | 150 W–300 W short-arc xenon lamp |
| Output Flexibility | Multi-directional fiber-coupled delivery |
| Intensity Control | Continuously adjustable (0–1.5+ suns) |
| Compliance | ASTM E927-23, IEC 60904-9 Ed.3, JIS C 8912:2021 |
Overview
The SAN-EI XEF-150 Fiber-Coupled Steady-State Solar Simulator is an engineered optical platform designed for high-fidelity photovoltaic and photoresponsive material characterization under controlled, repeatable illumination conditions. It employs a stabilized short-arc xenon lamp coupled via high-transmission optical fiber to deliver spectrally accurate, spatially uniform, and temporally stable irradiance—meeting the stringent A+A+A classification requirements defined in ASTM E927-23, IEC 60904-9 Ed.3, and JIS C 8912:2021. Unlike free-space collimated simulators, the XEF-150’s fiber-optic architecture decouples the light source from the sample chamber, enabling flexible integration into gloveboxes, vacuum enclosures, environmental chambers, or custom optical benches without thermal or electromagnetic interference. Its core function is to replicate the spectral power distribution (SPD) of terrestrial sunlight (AM1.5G) or extraterrestrial sunlight (AM0), with verified spectral mismatch <±12.5%, spatial non-uniformity <2%, and temporal instability <1% over 30 minutes—ensuring metrological traceability for quantitative performance evaluation of organic photovoltaics (OPV), perovskite solar cells (PSC), dye-sensitized solar cells (DSSC), photoelectrochemical systems, and photobiological samples.
Key Features
- Fiber-coupled illumination design enables arbitrary beam orientation and physical separation of lamp housing from test zone—critical for inert-atmosphere device testing (e.g., inside N2 or Ar gloveboxes)
- A+A+A spectral, spatial, and temporal classification certified per international photovoltaic standards (ASTM E927, IEC 60904-9, JIS C 8912)
- Continuously adjustable irradiance intensity (0–1.5+ suns), calibrated against reference silicon or KG5-filtered thermopile sensors
- Modular lamp system supporting 150 W to 300 W short-arc xenon sources; integrated lamp-hour counter for predictive maintenance and lifetime tracking
- Standard 2″ × 2″ (50.8 mm × 50.8 mm) uniform irradiation area; optional custom apertures up to 500 mm × 500 mm with validated homogeneity mapping
- No moving parts in optical path—eliminates mechanical drift and ensures long-term repeatability across daily calibration cycles
Sample Compatibility & Compliance
The XEF-150 accommodates planar, rigid, and flexible substrates—including glass/ITO/PEDOT:PSS/active-layer/metal stacks, biofilm-coated quartz slides, and microfluidic photoreactor chips. Its fiber output permits direct coupling to integrating spheres, monochromators, or collimating optics for extended functionality (e.g., spectral responsivity or IPCE measurement). All optical components comply with RoHS Directive 2011/65/EU and are CE-marked for laboratory use. The system supports GLP-compliant operation when paired with audit-trail-enabled data acquisition software (e.g., SAN-EI’s optional IVPro Suite), satisfying documentation requirements for ISO/IEC 17025-accredited PV testing labs and FDA-regulated photobiomodulation studies under 21 CFR Part 11 when configured with electronic signature and user access control.
Software & Data Management
The XEF-150 integrates seamlessly with industry-standard source measure units (SMUs), including Keithley 2400/2600 Series, via GPIB, USB-TMC, or Ethernet interfaces. Optional SAN-EI IVPro software provides full I-V/P-V characterization with dual-scan direction (forward/reverse), dark/light comparative analysis, time-resolved I-t/V-t acquisition, steady-state bias hold for degradation monitoring, maximum power point tracking (MPPT), and automated repeatability assessment (n ≥ 5 sequential sweeps). Raw data exports in CSV and HDF5 formats include metadata headers (timestamp, irradiance value, lamp hours, SMU settings), ensuring FAIR (Findable, Accessible, Interoperable, Reusable) data principles. Software validation documentation—including IQ/OQ protocols and uncertainty budgets—is available upon request for regulated environments.
Applications
- Quantitative efficiency benchmarking of perovskite, organic, quantum-dot, and tandem solar cells per IEC 61215 and IEC 60904-1
- Spectral response (SR) and incident photon-to-current efficiency (IPCE) mapping using synchronized monochromator control
- Photo-stability and operational lifetime assessment under continuous 1-sun illumination with real-time MPPT logging
- Photocatalytic reaction kinetics studies under standardized solar flux (e.g., TiO2-mediated water splitting)
- Photobiological dose-response assays for UV-A/visible/blue-light effects on cell cultures or microbial systems
- Calibration of reference solar cells and pyranometers traceable to NIST or NIM standards
FAQ
Does the XEF-150 support AM0 spectrum simulation?
Yes—the optical train can be reconfigured with appropriate filters and recalibrated to meet AM0 spectral match criteria (<±25% mismatch) for space photovoltaics qualification.
Can the fiber output be split to illuminate multiple samples simultaneously?
Yes, using OEM-certified fused-fiber splitters (e.g., 1×2 or 1×4); however, irradiance scales inversely with split ratio and requires re-calibration at each port.
Is spectral recalibration required after lamp replacement?
Yes—each new xenon lamp exhibits unique aging and spectral drift characteristics; SAN-EI recommends full spectral recalibration using a NIST-traceable spectroradiometer prior to Class A+ certification renewal.
What safety interlocks are included?
Integrated hardware interlocks disable lamp ignition if fiber disconnect is detected or enclosure door is open; optional external E-stop integration complies with IEC 61508 SIL2.
How is irradiance uniformity validated across custom aperture sizes?
SAN-EI provides ISO 17025-accredited uniformity maps (200-point grid) generated using a calibrated photodiode array scanner, delivered with each system shipment.



