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| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Model | XHS-50S1 |
| Illumination Mode | Steady-State |
| Spectral Range | 300–1800 nm |
| Spectral Mismatch | < ±10% (Factory Standard ≤ ±5%) |
| Spatial Non-Uniformity | < 2% (Class A) |
| Temporal Instability | < 1% (Class A+) |
| Effective Irradiation Area Options | 50 × 50 mm, 80 × 80 mm, 100 × 100 mm, 220 × 220 mm, 300 × 300 mm |
| Spectral Adjustment Capability | Yes |
| AM0 Extension Support | Yes |
| Intensity Tuning Range | ±30% |
| Compliance | IEC 60904-9:2020, JIS C 8912:2005, ASTM E927-05 |
| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Model | XES-50S2 |
| Illumination Mode | Steady-State |
| Spectral Match (AM1.5G) | ≤±12.5% (A+ Class) |
| Temporal Instability | <1% (A+ Class) |
| Spatial Uniformity | <2% (A Class) |
| Effective Irradiance Area | 50 mm × 50 mm |
| Nominal Irradiance | 1000 W/m² (1-sun) |
| Adjustable Irradiance Range | ±30% |
| Light Source | 150 W Xenon Arc Lamp |
| Lamp Lifetime | 2000 h (average) |
| Beam Direction | Adjustable for Glovebox Integration |
| Compliance | ASTM E927-23, IEC 60904-9 Ed. 3, JIS C 8912 |
| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Model | XHS Series |
| Illumination Mode | Steady-State |
| Spectral Range | 300–1800 nm |
| Spectral Mismatch | < ±10% (Factory Standard ≤ ±5%) |
| Spatial Non-Uniformity | < 2% (Class A) |
| Temporal Instability | < 1% (Class A+) |
| Effective Irradiation Area Options | 50×50 mm, 80×80 mm, 100×100 mm, 220×220 mm, 300×300 mm |
| Spectral Tunability | Yes |
| Intensity Adjustment Range | ±30% |
| Compliance | IEC 60904-9:2020, JIS C 8912:2005, ASTM E927-05 |
| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Model | RLES-500S |
| Illumination Mode | Steady-State |
| Effective Irradiation Area | 500 mm × 500 mm |
| Spectral Range | 300–1200 nm |
| Spectral Match (AM1.5G) | < ±12.5% (Class A+) |
| Irradiance Uniformity | < 2% (Class A) |
| Temporal Instability (LTI) | < 1% (Class A+) |
| Initial Irradiance | 1.3 sun |
| LED Lifetime | 20,000 h |
| Working Distance | 510 mm (for Class A uniformity) |
| Cooling Method | Air-cooled |
| Light Chamber Dimensions | W 900 × H 780 × D 1177 mm |
| Power Supply Dimensions | W 652 × H 693 × D 786 mm |
| Optional Window Glass | KG2 / KG5 / BK5 |
| Brand | QYB / Quantum Yield Berlin |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PLQY Pro |
| Measurement Mode | DC |
| Photon Excitation Wavelength | 532 nm |
| Maximum Laser Power | 140 mW |
| Excitation Spot Size Options | 0.1 cm² or 1 cm² |
| Spectral Range | 550–1050 nm |
| Minimum Detectable Quantum Yield | ≥1×10⁻⁶ |
| Integration Time | 1 ms – 35 min |
| Spectral Sampling Interval | 1 nm |
| SNR | 600:1 |
| Voltage Source Range | ±10 V |
| Current Source/Measurement Range | ±150 mA |
| Voltage Accuracy | ±10 mV |
| Voltage Sensing Accuracy | ±50 µV |
| Current Sensing Accuracy (selectable ranges) | ±100 nA, ±1 µA, ±10 µA |
| Sample Holder | Customizable (max. 30 mm × 30 mm × 10 mm) |
| Max. Subcell Capacity | 6 |
| Dimensions | 220 mm × 390 mm × 120 mm |
| Weight | 6.1 kg |
| Brand | k-Space |
|---|---|
| Origin | USA |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | kSA MOS UltraScan |
| Stress Measurement Range | 0.32 MPa – 7.8 GPa |
| Measurement Technology | Multi-Beam Optical Sensor (MOS) Laser Array |
| Operating Temperature | Ambient or Variable-Temperature Mode |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Model | PK-Pyro600 |
| Temperature Range | −184 °C to >300 °C (with liquid nitrogen cooling) |
| Current Measurement Resolution | pA-level (10⁻¹² A) |
| Sample Diameter | up to 8 cm |
| Electric Field Capability | >100 V/µm in air |
| High-Voltage Source | ±10 kV (SRS PS350 or Trek 10 kV) |
| Electrometer | Keithley 6517B (or equivalent) with coaxial shielded cabling |
| Shielding | Fully Faraday-shielded test chamber with insulated interior door mount |
| Electrode Configuration | Spring-loaded spherical electrodes for non-damaging contact on soft polymer films (<10 µm thick) |
| Compliance | ASTM D257, ISO 3001-1, IEC 60243-1, GLP/GMP-ready data logging architecture |
| Brand | ProOpto |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | EUV |
| Pricing | Upon Request |
| Standards Compliance | ISO 11551, ISO 11254, ISO 13696, ISO 11146, ISO 13694, ISO 11670, ISO 15367 |
| Radiation Sources Supported | Excimer lasers (351 nm, 308 nm, 248 nm, 193 nm, 157 nm) |
| Measurement Capabilities | Absorptance (thermal lensing in fused silica @193 nm), LIDT, wavefront distortion (thermal lensing & mechanical stress), transmission, reflection, bidirectional scatter distribution (@248 nm), color center formation, fluorescence/luminescence emission |
| Imaging Support | 2D scatter mapping, LIDT site micrography, compatibility with ~20 camera types |
| Brand | ProOpto |
|---|---|
| Origin | Germany |
| Distributor Type | Authorized Distributor |
| Import Status | Imported |
| Model | Astronomical Telescope Dedicated |
| Pricing | Upon Request |
| Brand | Fluxim |
|---|---|
| Origin | Switzerland |
| Model | OPV/PSC |
| Sampling Rate | 60 MS/s |
| Time Resolution | 16 ns |
| Frequency Range | 10 mHz – 10 MHz |
| Current Resolution | < 100 pA |
| LED Rise Time | 100 ns |
| Current Range | ±100 mA |
| Voltage Range | ±12 V |
| Optional Modules | Multi-LED Source (360–1100 nm), Cryogenic Stage (−120 °C to +150 °C), Spectrometer Integration, SMU Extension (±60 V, 1 pA resolution) |
| Brand | NILT |
|---|---|
| Origin | Denmark |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | BEAM |
| Exposure Mode | Proximity-style Direct Write |
| Resolution | ≤500 nm (line width) |
| Light Source | UV Diode Lasers |
| Wavelengths | 365 nm, 385 nm, 405 nm |
| Illumination Uniformity | Optimized via Dynamic Beam Shaping & Real-time Power Calibration |
| Exposure Field | 106 mm × 106 mm or 150 mm × 150 mm (tileable) |
| Autofocus Speed | <1 s (piezo-driven closed-loop Z-control) |
| Pattern Writing Speed | <2 s per 10 mm × 10 mm field (at 500 nm resolution, AZ5214E resist) |
| Maximum Substrate Size | 6-inch (150 mm) wafers or square substrates up to 150 mm × 150 mm |
| Alignment Accuracy | <±200 nm (multi-layer, vision-based auto-alignment) |
| Software Interface | GDSII-native workflow with real-time pattern preview, tile stitching, and wafer-level navigation |
| Brand | Fluxim |
|---|---|
| Origin | Switzerland |
| Model | IMVS/IMPS |
| Sampling Rate | 60 MS/s |
| Time Resolution | 16 ns |
| Frequency Range | 10 mHz – 10 MHz |
| Current Resolution | <100 pA |
| LED Rise Time | 100 ns |
| Current Range | ±100 mA |
| Voltage Range | ±12 V (optional ±60 V with SMU module) |
| Spectral Coverage (Multi-LED) | 360–1100 nm |
| Temperature Range (optional cryo-thermo stage) | −120 °C to +150 °C |
| Brand | QYB / Quantum Yield Berlin |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LuQY Pro |
| Measurement Mode | DC |
| Photon Excitation Wavelength | 532 nm |
| Max Laser Power | 140 mW |
| Tunable Excitation Intensity | 4 µA – 40 mA (equivalent to 0.001–10 “suns”) |
| Excitation Spot Size Options | 0.1 cm² / 1 cm² |
| Spectral Range | 550–1050 nm |
| Minimum Detectable Quantum Yield | 1×10⁻⁶ |
| Integration Time | 1 ms – 35 min |
| Spectral Sampling Interval | 1 nm |
| SNR | 600:1 |
| Voltage Source Range | ±10 V |
| Current Source/Measurement Range | ±150 mA |
| Voltage Accuracy | ±10 mV |
| Voltage Sensing Accuracy | ±50 µV |
| Current Sensing Accuracy | ±100 nA / ±1 µA / ±10 µA |
| Sample Holder Max Dimensions | 30 mm × 30 mm × 10 mm |
| Max Subcell Count | 6 |
| Dimensions | 220 mm × 390 mm × 120 mm |
| Weight | 6.1 kg |
| Brand | SAN-EI (San-Ei Electric Mfg. Co., Ltd.) |
|---|---|
| Origin | Japan |
| Model | XES-40S3 |
| Illumination Area | 40 mm × 40 mm to 300 mm × 300 mm |
| Spectral Match (AM1.5G) | Class A+ |
| Irradiance Instability | <1% (Class A+) |
| Spatial Uniformity | <2% (Class A) |
| Initial Output | 1.0 sun |
| Beam Direction Options | Vertical down / vertical up / horizontal left / horizontal right |
| Compliance | JIS C 8912, ASTM E927-05, IEC 60904-9:2007 Ed2 |
| Safety Features | Integrated lamp overheat protection & lamp usage hour counter |
| Control Mode | Steady-state operation |
| Optional Functions | Spectral bandpass filtering, neutral density attenuation |
| Brand | Fluxim |
|---|---|
| Origin | Switzerland |
| Model | TPC/TPV |
| Sampling Rate | 60 MS/s |
| Time Resolution | 18 ns |
| Frequency Range | 10 mHz – 10 MHz |
| Current Resolution | <100 pA |
| LED Rise Time | 100 ns |
| Current Range | ±100 mA |
| Voltage Range | ±12 V (optional ±60 V with SMU module) |
| Spectral Coverage (Multi-LED) | 360–1100 nm |
| Temperature Range (optional cryo/heating stage) | −120 °C to +150 °C |
| Brand | NILT |
|---|---|
| Origin | Denmark |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CN1 |
| Price Range | USD 7,000 – 14,000 (FOB Copenhagen) |
| Minimum Feature Size | 20 nm |
| Thermal Imprint Temperature | 200 °C (upgradable to 240 °C) |
| UV Wavelength | 365 nm |
| Pressure Range | 0.3–11 bar |
| Vacuum Level | down to 0.1 mbar |
| Substrate/Template Max Diameter | 100 mm (4-inch), upgradable to 200 mm (8-inch) |
| Control | Fully computer-programmed, GUI-driven operation |
| Brand | Piezotest |
|---|---|
| Origin | Singapore |
| Model | PM200 |
| Price Range | USD 30,000–50,000 |
| d₃₃ Measurement Range | 0–10,000 pC/N |
| Resolution | 0.01 pC/N (lowest range) |
| Test Frequencies | 30–300 Hz (1 Hz step, calibrated at 110 Hz) |
| Static Force Range | 0–10 N |
| Dynamic Force Range | 0.05–0.5 N |
| Capacitance Range | 10 pF–0.1 µF |
| Loss Tangent (tanδ) Range | 0.0000–0.2000 |
| Max Sample Diameter | 136 mm |
| Max Sample Thickness (Polarization Direction) | 50 mm |
| Max Sample Mass | 1 kg |
| Compliance | ASTM D790, IEC 62047-18, ISO 20482 (referenced for piezoelectric characterization) |
| Brand | NILT |
|---|---|
| Origin | Imported |
| Manufacturer Type | Authorized Distributor |
| Exposure Mode | Proximity |
| Resolution | 500 nm |
| Light Source | UV Laser |
| Wavelengths | 405 nm, 365 nm, 385 nm |
| Illumination Uniformity | Direct-write scanning mode |
| Maximum Exposure Area | 150 mm × 150 mm |
| Compatible Substrate Sizes | Up to 6-inch wafers |
| Autofocus Speed | <1 s (piezo-driven closed-loop optical focus control) |
| Pattern Writing Speed | <2 s per defined exposure field |
| Alignment Method | Semi-automated multi-layer alignment with real-time image recognition |
| Software Interface | GDSII-compatible, CNC-style navigation (WASD), on-the-fly pattern placement, wafer-level map visualization |
| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Model | XES |
| Light Source | Xenon Arc Lamp (150–3000 W) |
| Illumination Area Options | 40×40 mm to 300×300 mm (customizable) |
| Spectral Match Class | A+A+A per JIS C 8912, IEC 60904-9:2007, and ASTM E927-05 |
| Irradiance Uniformity | <2% (Class A) |
| Temporal Instability | <1% over ≥1 h (Class A+) |
| Spectral Mismatch | ≤±12.5% (AM1.5G or AM0 filter, Class A+) |
| Nominal Irradiance | 1000 W/m² (adjustable ±30%) |
| Lamp Lifetime | 1000–2000 h |
| Shutter Timing Range | 0.1 s – 9990 h |
| Remote Control | Yes |
| Safety Features | Thermal cutoff, interlocked shutter, auto-cooling post-shutdown, lamp hour counter |
| Brand | Open Instruments |
|---|---|
| Origin | Imported |
| Manufacturer Type | Authorized Distributor |
| Model | LUMiKON MINI |
| Trigger Mode | Steady-State |
| Dimensions (W×H×D) | 32.5 × 37 × 20.8 cm |
| Imaging Sensor | 26 MP (upgradable to 61 MP) |
| Uniformity | >95% |
| Illumination Range | 0.01–1.2 suns (AM1.5G equivalent) |
| Core Output Metrics | Quantitative iVoc, iFF, iMPP, and PL intensity maps |
| Environmental Compatibility | Glovebox-integrated (O₂ < 0.1 ppm, H₂O < 0.1 ppm) |
| Calibration | Absolute radiometric PL calibration with NIST-traceable reference source |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Model | PK-HT800 |
| Temperature Range | RT to 800 °C (up to 1000 °C optional) |
| Frequency Range | 20 Hz to 1 MHz (4-terminal shielded) |
| Dielectric Loss Tangent Sensitivity | < 0.1% |
| Sample Capacity | Up to 4 samples per thermal cycle |
| DC Bias Voltage | Up to 4000 V (optional) |
| Includes | High-temperature furnace, ceramic-insulated 4TP test fixture with spring-loaded Pt probes, Agilent/Keysight LCR meter interface (4284A, E4980AL, 4294A compatible), dedicated control software, and thermally rated cabling |
| Brand | SAN-EI |
|---|---|
| Origin | Japan |
| Model | XHS-180/220S1 |
| Illumination Mode | Steady-State |
| Spectral Mismatch | < ±5% (AM0) or < ±10% (AM1.5G), A+ Class |
| Spectral Range | 300–1800 nm |
| Spatial Non-Uniformity | < 2%, Class A |
| Temporal Instability | < 1%, Class A+ |
| Adjustable Irradiance | 30–100% |
| Illuminated Area Options | 50×50 mm, 80×80 mm, 100×100 mm, 220×220 mm, 300×300 mm (customizable) |
| Spectral Tunability | Yes |
| Compliance | ASTM E927-22, IEC 60904-9 Ed. 3 (2020), JIS C 8912 |
| Brand | PolyK Technologies |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | PK-CPR1901 |
| Pricing | Available Upon Request |
| Brand | k-Space |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | kSA ScanningPyro |
| Pricing | Available Upon Request |
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