ZEISS METROTOM 1500 Industrial Micro-CT System

Overview

The ZEISS METROTOM 1500 is a high-performance industrial micro-computed tomography (micro-CT) system engineered for non-destructive, metrology-grade 3D inspection and dimensional analysis of complex manufactured components. Operating on the physical principle of X-ray absorption contrast tomography, the system acquires hundreds of 2D radiographic projections as the sample rotates and translates along a precision linear stage—enabling reconstruction of isotropic 3D volumetric datasets with true sub-micron spatial fidelity. Designed and manufactured in Oberkochen, Germany, the METROTOM 1500 integrates ZEISS’s proprietary high-stability X-ray source, a third-generation 3k flat-panel detector, and kinematically optimized TR (translation-rotation) scanning geometry. This architecture delivers traceable, NIST-aligned dimensional measurements compliant with ISO 15530-3 and VDI/VDE 2630 Part 1.1 standards—making it suitable for first-article inspection, GD&T validation, internal defect characterization (e.g., porosity, inclusions, cracks), and reverse engineering workflows in aerospace, automotive, medical device, and additive manufacturing industries.

Key Features

• Third-generation 3k flat-panel detector enabling higher voxel density and improved signal-to-noise ratio without compromising scan speed
• Translation-rotation (TR) scanning mode with motorized linear stage and high-precision air-bearing rotation table—minimizing mechanical runout and ensuring geometric stability across full measurement volume
• Micron-level volumetric accuracy certified per ISO 10360-9 and validated using ZEISS-certified reference artifacts (e.g., sphere plates, step gauges)
• Maximum steel-equivalent penetration depth of 50 mm—supporting dense alloy inspection including titanium, Inconel, and cast aluminum
• Isotropic spatial resolution down to 4 µm—achievable through geometric magnification, focal spot optimization, and iterative reconstruction algorithms
• Traceable dimensional uncertainty of (4.5 + L/50) µm (L in mm), fully documented per ISO/IEC 17025 requirements for accredited metrology labs
• Integrated thermal management and vibration-damped granite base to maintain long-term repeatability under factory-floor conditions

Sample Compatibility & Compliance

The METROTOM 1500 accommodates samples up to Ø770 mm × H1350 mm and 50 kg, supporting both small high-resolution scans (e.g., turbine blade cooling channels) and large-assembly inspections (e.g., gearbox housings). Its open gantry design allows flexible fixturing—including custom jigs, temperature-controlled stages, and in-situ loading rigs—for dynamic or environmental testing. The system complies with IEC 61000-6-2 (EMC immunity), IEC 61000-6-4 (EMC emissions), and EN 62471 (photobiological safety). For regulated environments, optional audit-trail-enabled software modules support 21 CFR Part 11 compliance, including electronic signatures, user access control, and immutable data logging—fully aligned with GLP and GMP quality systems.

Software & Data Management

Controlled via ZEISS INSPECT CT software, the platform provides end-to-end workflow integration—from acquisition parameterization and beam-hardening correction to automated segmentation, GD&T evaluation (per ASME Y14.5 and ISO 1101), and statistical process control (SPC) reporting. Raw projection data is stored in DICOM-compliant format; reconstructed volumes are exportable as standard STL, PLY, or VTK files for CAE simulation or CAD comparison. All processing steps—including filter selection, thresholding, and mesh generation—are fully scriptable and reproducible. Data integrity is enforced through SHA-256 hashing, versioned project archives, and optional integration with enterprise PLM or MES systems via RESTful API.

Applications

• Dimensional metrology of internal and external geometries without part disassembly or CMM probing limitations
• Porosity and inclusion analysis in investment-cast turbine blades and AM-produced structural components (per ASTM E155 and ISO 17873)
• Wall thickness mapping and gap analysis in multi-material assemblies (e.g., battery enclosures, fuel injectors)
• First-article inspection reports compliant with PPAP Level 3 documentation requirements
• Failure analysis of solder joints, wire bonds, and encapsulated electronics (J-STD-001, IPC-A-610)
• Validation of topology-optimized lattice structures and conformal cooling channels in additively manufactured tooling

FAQ

What is the minimum detectable feature size under typical operating conditions?

Under optimal magnification and exposure settings, the system resolves features ≥4 µm in diameter—validated using ZEISS-certified line-pair test objects per ISO 10360-9 Annex D.
Does the METROTOM 1500 support automated batch scanning?

Yes—INSPECT CT includes programmable scan sequences with barcode-triggered job loading, robotic arm interface (via OPC UA), and pass/fail decision logic based on pre-defined tolerance zones.
Can measurement data be integrated into existing SPC or QMS platforms?

All dimensional results, including point clouds, cross-sections, and GD&T reports, are exportable in CSV, XML, or JSON formats—with optional ODBC connectivity for direct database ingestion into Minitab, InfinityQS, or SAP QM modules.
Is on-site calibration and certification available?

ZEISS Metrology Services offers annual traceable calibration using PTB- or NIST-traceable artifacts, with full uncertainty budgets and ISO/IEC 17025-accredited certificates issued upon request.
What safety certifications apply to the system’s X-ray operation?

The METROTOM 1500 carries CE marking per EU Directive 2013/59/Euratom, complies with DIN 6812 and IEC 62494-1 for radiation protection, and includes interlocked shielding, real-time dose monitoring, and emergency stop circuitry meeting SIL2 requirements.