- All
- Favorite
- Popular
- Most rated
| Brand | HPG |
|---|---|
| Origin | Guangdong, China |
| Model | IPC-650S |
| Voltage Ranges | 1.0–1000 V DC (configurable in 0.01–1.0 V steps) |
| Resistance Range | 1 × 10⁶ – 1 × 10¹³ Ω |
| Resistance Accuracy | ±5.0% (1×10⁶–1×10¹⁰ Ω, at 5 V), ±10% (1×10¹⁰–1×10¹¹ Ω), ±15% (1×10¹¹–1×10¹² Ω), ±20–30% (1×10¹²–1×10¹³ Ω) |
| Current Monitoring | 0.1 µA – 500 µA, up to 10 readings/sec per channel |
| Test Speed | 3.5 s/channel (256-channel full test ≤ 10 min) |
| Bias Voltage Range | –100 V to +1000 V DC with polarity reversal |
| Environmental Groups | 2–4 independent test chambers (64 channels/group) |
| Compliance | IPC-TM-650 2.5.10, 2.6.11, 2.6.3.7, 2.6.14 |
| Software | GLP-compliant, audit-trail enabled, remote monitoring via web interface and mobile app |
| Dimensions | 1800 × 600 × 1000 mm (H × W × D) |
| Weight | ~280–350 kg |
| Input Power | AC 220 V ±10% |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | 3i Plus |
| Price | USD 13,500 (est.) |
| Instrument Type | Portable (not online) |
| Temperature Range | 400–2000 °C / 752–3632 °F and 700–3000 °C / 1292–5432 °F (dual-range configuration) |
| Distance-to-Spot Ratio (D | S): 250:1 |
| Operating Ambient Temperature | 0–50 °C |
| Laser Aiming | Dual-laser + optical viewfinder with integrated red-dot targeting |
| Drop Rating | 1 m (IEC 60068-2-32) |
| Battery Life | Up to 24 h continuous operation (rechargeable Li-ion) |
| Connectivity | USB 2.0 + Bluetooth 4.2 BLE |
| Compliance | CE, RoHS, FDA 21 CFR Part 11 (software-enabled audit trail) |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROLAB S |
| Instrument Type | Floor-Standing |
| Excitation Method | Spark |
| Detector Type | CMOS |
| Focal Length | 750 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–800 nm |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus 400 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Maximum Sample Diameter | 400 mm |
| Maximum Sample Thickness | 50 mm |
| Maximum Sample Mass | 30 kg |
| Measurement Spot Size | 0.5–30 mm (5-step motorized selection) |
| Compliance | SEMI, CE |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ZSX Primus IIInext |
| Instrument Type | Floor-standing |
| Instrument Kind | Scanning-type |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Scan Speed | 2400°/min |
| Detector Linear Count Rate | SC: 1800 kcps |
| FPC | 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | ZEISS Spectrum |
| Configuration | Bridge-type CMM |
| Operation Mode | Fully Automatic |
| Application Class | Shop-floor CMM |
| Measurement Method | Contact-based (Tactile) |
| Measurement Volume Range | 500 × 500 × 600 mm to 1000 × 1600 × 600 mm |
| Maximum Permissible Error (MPE<sub>E</sub>) | 1.9 + L/250 µm |
| Standard Operating Temperature | +17 °C to +35 °C |
| Probe Compatibility | ZEISS XDT direct, ZEISS VAST XXT direct, ZEISS VAST XT gold (Spectrum plus), ZEISS RDS-C5 with CAA, ZEISS RDS-C with CAA |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO CUBE |
| Instrument Type | Polarized ED-XRF |
| Elemental Range | Na to U |
| Detection Range | ppm to 100% |
| Energy Resolution | 130 eV |
| Detector | Silicon Drift Detector (SDD) |
| Form Factor | Benchtop/Floor-standing |
| Application Scope | General-purpose |
| Compliance Support | RoHS, ELV, ASTM D7464, ISO 8258, USP <232>/<233>, EPA Method 6200 |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be–U |
| Scan Speed | 2400°/min |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus IV |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be to U |
| Scan Speed | 2400°/min |
| Detector Linear Range | SC 1800 kcps, FPC 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TV40 |
| Price | USD 13,500 (approx.) |
| Instrument Type | Fixed-Mount |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | WDA-3650 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Detector Configuration | High-sensitivity AD-Boron channel for boron analysis |
| Instrument Architecture | Hybrid scanning + fixed-channel (multi-channel) WD-XRF |
| Sample Compatibility | Up to 200 mm wafers and magnetic/optical disks |
| Automation | Fully automated daily calibration (AutoCal), C-to-C robotic handler compatible (optional), SECS/GEM interface support |
| Vacuum & Thermal Stability | Integrated vacuum stabilization and active cooling systems |
| Footprint | 1.12 m (W) × 1.45 m (H) × 0.89 m (D) |
| Mass | 600 kg |
| Power Supply | 3-phase 200 VAC 50/60 Hz, 30 A or single-phase 220–230 VAC 50/60 Hz, 40 A |
| Regulatory Compliance | Designed for GLP/GMP environments |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | EVO10 |
| Instrument Type | Floor-Standing SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm at 30 kV |
| Magnification Range | 10× to 1,000,000× |
| Accelerating Voltage | 0.2–30 kV |
| Maximum Sample Dimensions | Ø220 mm × 100 mm (H) |
| Stage Travel | X = 80 mm, Y = 100 mm, Z = 35 mm |
| Standard Detectors | Everhart-Thornley Secondary Electron Detector (SED), Solid-State Backscattered Electron Detector (BSE) |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | TEST |
| Instrument Type | Portable / Mobile |
| Excitation Source | Spark |
| Detector | CCD (Charge-Coupled Device) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 185–520 nm |
| Spectral Coverage | Full-Spectrum |
| Compliance | CE, RoHS, ISO/IEC 17025-compatible operation |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Sigma 360 |
| Instrument Type | Floor-standing High-Resolution FE-SEM |
| Electron Source | Thermal Field Emission Gun (TFEG) |
| Secondary Electron Resolution | 0.9 nm @ 15 kV, 1.3 nm @ 1 kV |
| Magnification Range | 10× – 1,000,000× |
| Accelerating Voltage | 0.02 – 30 kV |
| Maximum Sample Diameter | ≤ 179 mm |
| Stage | 5-Axis Motorized Eucentric Stage |
| Standard Detectors | In-Lens SE Detector, Everhart-Thornley SE Detector, Solid-State Backscattered Electron (BSE) Detector |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Crossbeam 550 |
| Configuration | Fully Integrated FIB-SEM Platform with Gemini II Electron Optics and High-Current Ga⁺ Focused Ion Beam |
| Maximum Ion Beam Current | 100 nA |
| Resolution (SE, 1 kV, Tandem Decel) | ≤1.4 nm |
| Sample Chamber Options | Standard (18 ports) or Extended (22 ports) |
| X/Y Stage Travel | 100 mm (standard chamber) or 153 mm (extended chamber) |
| Inlens EsB Detector Depth Sensitivity | <3 nm |
| EDS Integration | Full 3D Tomography-Compatible Energy-Dispersive Spectroscopy Module |
| Software Platform | ZEISS Atlas 5 for Automated 3D FIB-SEM Tomography and Correlative Analysis |
| Compliance | Designed for GLP/GMP environments |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | GENESIS |
| Instrument Type | Full-Spectrum Simultaneous ICP-OES |
| Detection Limit | ppb–ppm |
| Repeatability | ≤0.2% |
| Stability | ≤0.2% |
| Wavelength Range | 130–770 nm |
| Optical Resolution | 1 pm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | GREEN |
| Instrument Type | Full-Spectrum Direct-Reading ICP-OES |
| Detection Limit | sub-ppb |
| Precision (RSD) | <1.5% |
| Stability (RSD) | <1.5% |
| Wavelength Range | 165–770 nm |
| Optical Resolution | <0.008 nm across full spectrum |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini 200 |
| Instrument Type | Benchtop |
| X-ray Tube Power | 200 W |
| Elemental Range | Oxygen (O, Z=8) to Uranium (U, Z=92) |
| Instrument Class | Scanning-type WDXRF |
| Compliance | CE certified |
| Cooling | Air-cooled tube |
| Gas Consumption | Low-flow P-10 gas (Ar/CH₄) |
| Sample Handling | 12-position automatic sampler |
| Operating Environment | Vacuum or He-purged |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | ARCOS |
| Instrument Type | Full-Spectrum Direct-Reading ICP-OES |
| Detection Limit | Sub-ppb to ppm |
| Precision (RSD) | ≤1% |
| Long-Term Stability (Drift) | ≤0.1% |
| Wavelength Range | 130–770 nm |
| Optical Resolution | ≤0.008 nm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO MAXx (LMX10) |
| Instrument Type | Floor-standing |
| Excitation Method | Spark |
| Detector Type | CMOS |
| Focal Length | 750 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–670 nm |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Smartproof 5 |
| Wavelength | 405 nm |
| Lateral Resolution (XY) | 120 nm |
| Z-Axis Minimum Step Size | 1 nm |
| Imaging Speed | >50 fps (2048 × 2048 resolution) |
| Objective Magnification Range | 2.5×–100× |
| Maximum Height Scan Range | 5 mm |
| Stage Travel | 150 mm × 150 mm |
| Software | Smartproof 5 Application Suite |
| Surface Roughness Standards Compliance | ISO 4287 (2D), ISO 25178 (3D) |
| Illumination | Tri-color LED (RGB) for True-Color Surface Rendering |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | PORT |
| Instrument Type | Portable / Mobile |
| Excitation Source | Spark |
| Detector Type | Dual Detector (PMT + CCD) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 178–530 nm |
| Spectral Coverage | Full-Spectrum Acquisition |
| Compliance | Designed for ISO/IEC 17025-compliant metal analysis workflows, supports ASTM E415, E1086, and EN 10315 traceability requirements |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model Series | SIGMA |
| Instrument Type | Desktop SEM |
| Electron Gun Type | Cold Field Emission |
| Microscope Class | High-Resolution Field Emission SEM |
| Secondary Electron (SE) Image Resolution | 1.0 nm @ 1 kV, 0.8 nm @ 3 kV |
| Maximum Magnification | 1,000,000× |
| Accelerating Voltage Range | 0.02–30 kV |
| Backscattered Electron (BSE) Image Resolution | 3.0 nm @ 30 kV |
| Working Distance for Analysis | 8.5 mm |
| Tilt Angle for EDS Collection | 35° |
| Variable Pressure Mode | Yes (C2D & VP-SE Detectors) |
| In-Lens SE/BSE Dual Detection | Yes |
| STEM-in-SEM Capability | Yes (aSTEM Detector Optional) |
| EDS Integration | SmartEDX (Si(Li)/SDD, Nitride Window Optimized for Light Elements) |
| RISE Integration | Yes (Fully Integrated Confocal Raman Imaging) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix 15 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Analytical Element Range | Be (4) to U (92) |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Detector Configuration | Simultaneous Multi-channel (Standard 30 channels, upgradable to 40) |
| Optional Features | XRD Channel, Curved Crystal Optics, Automatic Pressure Control (APC), Background Measurement (BG), Compton Scattering Ratio Calibration, Unattended Operation with 48-position ASC |
Show next