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| Brand | Angstrom |
|---|---|
| Origin | USA |
| Model | ELS5000 |
| Energy Resolution | 0.7 meV |
| Angular Resolution | 0.08° (momentum resolution ≈ 0.002 Å⁻¹ at 7.4 eV incident energy) |
| Optical Architecture | 4-grid tungsten electron optics, UHV-compatible, no polymer-coated or fiberglass-insulated wiring |
| Field of View | 103° |
| Electron Gun Diameter | 1.59 cm |
| Retractable Optics | Standard 2-inch to optional 4-inch retraction |
| Compatibility | AES-compatible, ARPES-integrated capable |
| Detection Modes | pA–nA current range with integrated lock-in amplifier and MCP detector |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Netherlands |
| Model | Tundra |
| Acceleration Voltage | 200 kV (standard configuration) |
| Magnification Range | ×50 to ×1,000,000 |
| Specimen Stage | Single-tilt cryo-transfer holder with automated loading |
| Minimum Information Limit | ≤3.5 Å under optimal conditions (SPA workflow) |
| Footprint | 3.2 m × 2.8 m (including shielding and service clearance) |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | KAMAKIRI |
| Wavelength | 520 nm |
| Birefringence Range | 0–130 nm (standard), 0–260 nm (optional) |
| Fast Axis Orientation Range | 0–180° |
| Repeatability | <1 nm (σ) |
| Measurement Width | 350 mm |
| Spatial Resolution (Width Direction) | 2560 points |
| Output Parameters | Retardation [nm], Fast Axis Angle [°] |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | AIM-9000 |
| Detection Principle | Fourier Transform Infrared (FTIR) Spectroscopy with Reflectance/Transmission Microscopy |
| Optical Magnification Range | 330× continuous (macro to micro, 10 mm × 13 mm to 30 μm × 40 μm) |
| Automated Stage | Motorized XYZ stage with sub-micron positioning repeatability |
| Detector | Liquid Nitrogen-Cooled MCT (Mercury Cadmium Telluride) |
| Spectral Resolution | ≤ 4 cm⁻¹ (user-selectable down to 1 cm⁻¹) |
| Spectral Range | 7800–600 cm⁻¹ (mid-IR) |
| Imaging Mode | Point Mapping, Linear Mapping, Area Mapping (chemical imaging) |
| Software Platform | IRsolution with AI-assisted particle identification and multivariate spectral analysis |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2800 |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.16 nm |
| Secondary Electron Resolution | 0.5 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard Equipment |
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