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Shenzhen Keshida Electronic Technology Co., Ltd.

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BrandAllresist
OriginGermany
ModelAR-P 6200
Product TypePositive-tone e-beam resist
Key VariantsAR-P 6200.09 (standard), AR-P 6200.13 (thick-film), AR-P 6200.18 (ultra-thick), AR-P 6200.04 (low-temperature optimized)
Developer CompatibilityAR 600-546, AR 600-548, AR 600-55, AR 600-50/2
Acceleration Voltage Range1–100 kV
Film Thickness Range50 nm – 1.5 µm
Sensitivity (AR-P 6200.09, 30 kV, AR 600-546)~55 µC/cm² (D₀), ~220 pC/cm² (10 nm trenches)
Contrast (γ)14.2
Resolution≤6 nm (at 6 °C, optimized process)
Plasma Etch ResistanceHigh (CF₄ + O₂), superior to PMMA (AR-P 679.03) and ZEP 520A
Post-Exposure Bake (PEB)Not required
Lift-off Capability≤20 nm metal lines, defined undercut tunable via dose
Two-Layer CompatibilityValidated with AR-P 617 series (e.g., AR-P 617.06)
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BrandAllresist
OriginGermany
ModelSX AR-PC 5000/41
TypeAcid-Resistant, Non-Photosensitive Protective Resist
CompatibilityKOH (40% w/w), HF (50% w/w)
ProcessingSpin-Coatable
Regulatory StatusImport Product for Semiconductor Fabrication
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BrandAllresist
OriginGermany
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelAR-N 4400
PricingAvailable Upon Request
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BrandAllresist
OriginGermany
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelAR-N 4600 (Atlas 46)
PricingAvailable Upon Request
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BrandAllresist
OriginUK
ModelPMMA Electra 92 (AR-PC 50)
FormulationAqueous/isopropanol solution of polyaniline derivative
ApplicationCharge-dissipative topcoat for non-novolac e-beam resists
RemovalPost-exposure aqueous rinse
ComplianceCompatible with standard e-beam lithography workflows (JEOL, Raith, Zeiss systems)
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BrandAllresist
OriginGermany
Manufacturer TypeAuthorized Distributor
Product CategoryImported Semiconductor Process Chemicals
Model RangeAR Series
PricingUpon Request
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BrandAllresist
OriginGermany
Product TypeConductive Spin-Coatable Anticharging Coating for E-beam Lithography & SEM/FIB Imaging
ModelAR-PC 5090.02, AR-PC 5091.02
Film Thickness~40 nm at 4000 rpm
DeveloperDeionized Water
UV/E-beam InsensitivityYes
CompatibilityAR-PC 5090.02 — PMMA, CSAR 62, HSQ
Solubility Post-ExposureAqueous
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BrandAllresist
OriginGermany
ModelAR-N7700
TypeChemically Amplified Negative Tone Resist
Exposure ModalitiesElectron Beam (e-beam), Deep Ultraviolet (248 nm)
UV Transparency Range248–265 nm & 290–330 nm
Etch ResistanceHigh (Compatible with CF₄, CHF₃, O₂-based Plasma Etching)
Packaging100 mL amber glass bottles under nitrogen purge
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BrandAllresist
OriginGermany
Manufacturer TypeAuthorized Distributor
Product OriginImported
ModelAR-P 610 Series
PricingUpon Request
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