Empowering Scientific Discovery

Wiesner Nanosystems GmbH

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BrandJFP
OriginFrance
ModelS100 Semi-Automatic Scribe & Break System
Scribing force range10–80 g (constant-weight mechanism, optional auxiliary weights)
Diamond scribe tipadjustable angle and rotational orientation
Wafer chuck capacityup to 4-inch diameter
Die size compatibility100 µm × 100 µm minimum to 10 mm × 10 mm maximum
Wafer thickness tolerance≥50 µm
XY stage resolution0.23 µm
Optical imaging system22″ TFT display + ultra-HD color camera
Digital zoom×10 electronic
Break modemanual or programmable auto-actuation
Break mechanismtop rubber clamping + bottom linear blade actuation
Control interface7″ capacitive touchscreen
Y-axis scribing speed0.1–20 mm/s
Power supply100/230 VAC, 1 kW
Pneumatic supply70 psi
Vacuum requirementfull vacuum (100%), 15 L/min flow rate
Dimensions (W×D×H)650 × 820 × 1500 mm (25 × 32 × 60 in)
Weight70 kg
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BrandJFP
OriginFrance
Equipment TypeAutomatic Wire Bonder
ModelWB 200-e
Bonding TechnologyThermosonic Ball Bonding with 360° Rotational Capillary Actuation
Max. Z-Travel40 mm
Z-Axis Resolution0.23 µm
XY-Stage Range80 × 80 mm
XY/Z Resolution0.23 µm
Ultrasonic Power Range0–5 W
Frequency62 kHz (standard), optional 40/80 kHz
Bond Force Range10–150 cN
Bond Time Range0–2000 ms
Wire Diameter SupportAu/Al 17–50 µm, Ribbon 40–250 µm (w) × 12–25 µm (t)
Heating Stage Temp. Range60–250 °C (±1% accuracy)
Vision System5 MP industrial camera, 8× optical zoom, programmable coaxial & oblique LED illumination
Footprint640 × 710 × 550 mm
Weight60 kg
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BrandJFP
OriginFrance
TypeImported Semiconductor Assembly & Packaging Equipment
ModelPP Stacker
ApplicationPrecision Pick-and-Place, Stacking & De-stacking of Laser Diode Bars
ComplianceDesigned for ISO Class 5–7 cleanroom environments
SoftwareJFP StackerControl v3.2 with Audit Trail & Event Logging
Power Supply100/230 VAC, 1 kW
Pneumatic RequirementsDry air at 5 bar, vacuum ≥90%
Dimensions (W×D×H)900 × 830 × 1750 mm
Throughput600 units/hour (single bar + single spacer cycle)
Pick-up Force<5 g (non-damaging micro-handling)
XY Stage Resolution1 µm (micrometer-adjustable manual stage)
Vision SystemTriple 5 MP color cameras (vertical orientation), independent digital video control, LED illumination (adjustable intensity), field-of-view up to 20 mm, continuous optical zoom, 11× digital zoom, PIP mode (3 windows), calibrated scale bar (0.6 mm @ 20×)
Sample CompatibilityLaser diode bars (max. 18 mm length
Tooling OptionsManual blue-tape ejection kit
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BrandUniTemp
OriginUSA
Model2Z-HVS-100
Vacuum Level≤1×10⁻⁶ hPa
Max Temperature450 °C
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BrandUniTemp
OriginUSA
Model2Z-HVS-200
Vacuum Level≤1×10⁻⁶ hPa
Max Temperature450 °C
Programmable Steps100 per Recipe, 20 Recipes Stored
Optical Process Monitoring360° Quartz Viewing Cylinder
CoolingActive Water-Cooled Lower Platen + External Closed-Loop Chiller Recommended (Optional Accessory WC-I)
ControllerSiemens SIMATIC® S7-1200 PLC with HMI Interface
Data LoggingReal-Time Temperature, Pressure, Gas Flow, and Time Stamping
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BrandJFP
OriginFrance
TypeManual Pull Testing System for Wire Bond Strength Evaluation
Measurement PrincipleMechanical Force Transduction via Precision Dial Gauge
Test ModesDestructive and Non-Destructive Pull Testing
Vertical Travel Range10–150 mm (Coarse) + Micrometer-Driven Fine Adjustment (0.1 mm resolution)
Hook Tip Diameter15–50 µm
Max Test Wire/Die Bond Diameter200 µm
Z-Axis ControlManual Handwheel
Damping MechanismAdjustable Mechanical Damping to Suppress Vibration Artifacts
Preset Force ThresholdUser-Adjustable for Non-Destructive Mode
ComplianceDesigned to Support ISO/IEC 17025 Traceability Requirements (Manual Recording Pathway)
Optional AccessoriesHigh-Precision XYZ+Theta Stage (25 × 25 mm travel, 1 µm resolution
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BrandJFP
OriginFrance
ModelS200 Semi-Automatic Scriber and Breaker
Power Supply100–230 VAC, 1 kW
Air Pressure80 psi
Vacuum System100% vacuum, 15 L/min
Dimensions (W×D×H)650 × 820 × 1500 mm
Weight70 kg
Wafer Handling2″ to 8″
Minimum Die Size100 µm × 100 µm
Maximum Die Size150 mm × 150 mm
Z-axis Force Range5–80 g (adjustable via calibrated weights)
Diamond Scribe TipAdjustable angle & rotation
XY Stage Resolution1 µm (display), ±5 µm (positioning accuracy)
Y-axis Scribing Speed0.1–100 mm/s
Optical System22″ TFT monitor, ultra-HD color camera, electronic zoom ×10, LED illumination, JFP crosshair reticle
Control Interface7″ touchscreen, programmable step indexing & vertical spacing, scribe count & die ID logging
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