Incoatec
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| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Model | iXmini |
| Anode Material | Fe or Cu |
| X-ray Energy (Kα) | 6.4 keV (Fe) or 8.04 keV (Cu) |
| Max Power | 100 mW (4–10 kV, 2–10 µA) |
| Dimensions | 103 × 120 × 89.5 mm³ |
| Weight | ~1500 g |
| Operating Voltage | DC 24.0 ± 1 V |
| Vacuum Compatibility | down to 10⁻² – 10⁻³ mbar |
| Safety | Dual independent interlock circuits |
| Beam Control | Manual shutter |
| Status Indicators | X-RAY ON and BEAM ON LEDs |
| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Model | IμS High-Brightness (Cu/Ag/Mo) |
| Compliance | Fully compliant with EU Machinery Directive 2006/42/EC |
| Cooling | Air-cooled, maintenance-free operation |
| Lifetime | ≥3 years (warranty) |
| Photon Flux Density (Mo) | >2 × 10⁹ photons/(s·mm²) |
| Optical Integration | Quazar multilayer optics |
| Smart Component ID | DAVINCI embedded memory chips in tube, housing & optics |
| System Compatibility | Optimized for Bruker AXS D8 diffractometers |
| Safety | Radiation-safe enclosure, vacuum-tested, no moving parts |
| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Model | IμS Microfocus Source |
| Cooling | Air-cooled |
| Power Output | >30 W |
| Target Materials | Cr, Cu, Mo, Ag |
| Optical System | Quazar 2D focusing and collimating multilayer optics (Montel-type) |
| Warranty | 3 years |
| Radiation Safety | Fully shielded, vacuum-tested, no radiation hazard during operation |
| Mounting | 19-inch rack-compatible generator unit |
| Maintenance | Zero moving parts, maintenance-free operation |
| Lifetime | Extended operational lifetime (>10,000 h typical) |
| Compliance | CE-marked, conforms to IEC 61000-6-3 (EMC), IEC 61000-6-4, and EN 62471 (photobiological safety) |
| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Model | Incoatec Montel Optics |
| Application | 2D X-ray beam conditioning (focusing, collimation, monochromatization) for laboratory and synchrotron sources |
| Compatible radiation lines | Cu Kα (8.04 keV), Mo Kα (17.48 keV), Co Kα (6.93 keV), Cr Kα (5.41 keV), Fe Kα (6.40 keV), Ag Kα (22.16 keV) |
| Optical architecture | Dual-perpendicular grazing-incidence multilayer mirrors (Montel geometry) |
| Mirror coating | Laterally graded multilayer (e.g., Ni/C, W/Si, Pt/C) |
| Beam symmetry | Isotropic in horizontal and vertical planes |
| Typical focal spot size (FWHM) | ≤0.3 mm (Montel-200, Cu Kα) |
| Reflectivity enhancement | Up to ~2× vs. single-bounce Kirkpatrick-Baez or toroidal mirrors (dual-reflection spectral purification) |
| Mounting | Pre-aligned, rigid kinematic housing for rapid integration |
| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Model | MX Multilayer Optics |
| Application | Protein Crystallography |
| Radiation Source Compatibility | Cu Kα (λ = 1.5418 Å) |
| Focal Spot Size | ≤ 0.11 mm (FWHM) |
| Beam Divergence | ≤ 7.6 mrad |
| Photon Flux Density | Up to 1 × 10¹⁰ photons/s·mm² |
| Coating Architecture | Depth-graded multilayer (e.g., W/Si or Ni/C) |
| Mounting Interface | Standard kinematic flange (CF-63 or CF-100, configurable) |
| Thermal Stability | Engineered for long-term stability under high-flux synchrotron and laboratory microfocus source operation |
| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Model | SCATEX |
| Component Type | X-ray Optical Element |
| Material | High-Purity Germanium (Ge) |
| Diameter Options | 300 µm, 500 µm |
| Compliance | Designed for SAXS/WAXS beamlines and laboratory-scale X-ray scattering systems |
| Application Domain | Synchrotron & Lab-Based Small-Angle X-ray Scattering (SAXS), Wide-Angle X-ray Scattering (WAXS), X-ray Beam Conditioning |
| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Model | Standard Types |
| Crystal Types | LiF(200), LiF(220), LiF(420), PET |
| Component Category | Optical Element |
| Compliance | ISO/IEC 17025-aligned calibration support, compatible with ASTM E1361 & ISO 22085 XRF spectrometer configurations |
| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Product Type | Optical Component |
| Model | Synchrotron Optics |
| Substrate Material | Si (uncoated & coated) |
| Coating Materials | C, Ru/C, W/Si, Mo/B₄C, and custom multilayer systems |
| Coating Thickness Control Accuracy | ±1% |
| Maximum Mirror Length | 150 cm |
| Carbon Mirror Thickness | 35 nm (C), 44.2 nm (C) |
| Multilayer Period | 1.4 nm (Mo/B₄C), 2.0 nm (Ru/C), 1.5 nm (W/Si) |
| Energy Range Coverage | 50 eV – 45 keV |
| Reflectivity (C mirror, 50–250 eV) | >95% |
| Thickness Uniformity (across 150 cm) | <2% PV, <0.1% RMS gradient control |
| Compliance | Designed for ISO/IEC 17025-aligned calibration environments, compatible with GLP/GMP beamline operation frameworks |
| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Product Type | X-ray Diffraction Analyzing Crystal |
| Model | XRF Analyzer Special Crystals |
| Component Category | Optical Instrument Component |
| Crystal Types | LiF(420), Ge, ADP, TlAP, InSb, XS-N (d = 11.0 nm), XS-C (d = 12.0 nm), XS-B (d = 19.0 nm) |
| Primary Applications | Wavelength-Dispersive X-ray Fluorescence (WDXRF) Spectrometry for Light Element Analysis (B, C, N, F, Na, Mg, Si, P, S, Cl) |
| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Model Series | XS-55, XS-N, XS-C, XS-B |
| 2d-spacing (XS-55) | 5.5 nm |
| Target Elements (XS-55) | C–Br (including F, Na, Mg as standard) |
| Crystal Type | Artificial Synthetic Multilayer |
| Substrate Material | Typically Si or glass |
| Reflectivity | High (optimized for soft X-ray range) |
| Resolution | Moderate (vs. natural crystals) |
| Application Domain | Wavelength-Dispersive X-ray Fluorescence (WDXRF) Spectrometry |