X-Ray Instruments
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| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported |
| Model | L11754-01 |
| Pricing | Upon Request |
| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | L13050 |
| Cooling Method | Forced Air Cooling |
| Output Window Material | Beryllium (Be) |
| Tube Voltage Range | 10–15 kV |
| Tube Current Range | 100–150 µA |
| Maximum Output Power | 1.5 W |
| Maximum Rated Voltage | 26.4 V DC |
| X-Ray Emission Angle | 71° |
| Output Stability (*1) | ±0.5% (after 5 h operation) |
| Supply Voltage | 24 V DC |
| Supply Current | 1 A |
| Remote Control Functions | X-Ray ON/OFF, Lifetime Monitoring, Tube Voltage Control & Monitoring, Tube Current Control & Monitoring, I-PRO Monitoring |
| Weight | 1400 g |
| Operating Temperature | +10 to +40 °C |
| Storage Temperature | 0 to +60 °C |
| Operating Humidity | ≤60% RH |
| Storage Humidity | ≤85% RH |
| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported |
| Model | L12531-01 |
| Voltage Range | 40–110 kV |
| Maximum Output Power | 16 W |
| Minimum Focal Spot Size | 2 µm (at 2 W) |
| Focus-to-Object Distance (FOD) | 1 mm |
| X-ray Beam Cone Angle | 120° |
| Interface | RS-232C |
| Tube Type | Sealed Transmission Target |
| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported |
| Model | L9181-02 |
| Voltage Range | 40–130 kV |
| Maximum Output Power | 39 W |
| Focal Spot Size | 5 µm (at 4 W) |
| Beam Cone Angle | 45° |
| Focus-to-Object Distance (FOD) | 13 mm |
| Control Interface | RS-232C |
| Tube Type | Sealed Transmission Target |
| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported |
| Model | L9181-05 |
| Price | Upon Request |
| Tube Voltage Range | 40–130 kV |
| Maximum Output Power | 39 W |
| Focal Spot Size | 16–50 µm |
| X-ray Beam Cone Angle | 100° |
| Focus-to-Object Distance (FOD) | 13 mm |
| Tube Type | Sealed Transmission Target |
| Control Interface | RS-232C |
| Application | Non-Destructive Testing (NDT), X-ray Computed Tomography (CT) |
| Brand | Hamamatsu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported |
| Model | X-ray Flat Panel Detector |
| Pricing | Available Upon Request |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | DS-21L |
| X-ray Tube Power | 3000 W |
| 2θ Angular Range | 105°–170° (continuously adjustable) |
| ψ Angular Range | −57° to +57° |
| Available Anode Target Materials | Cr, Cu, Mn, Ti, Co, V, Fe |
| Minimum Focal Spot Size | 0.1 mm |
| Detector Configuration | Dual Linear Semiconductor Array Detectors |
| Individual Detector 2θ Coverage | 35° |
| Detector Linear Count Rate | >10⁹ CPS |
| Positioning System | Integrated Laser Displacement Sensor + Motorized Z-axis (600 mm travel) + Manual/Automatic XYZΦ Sample Stage (X: 300 mm, Y: 200 mm, Φ: 0–360°) |
| Measurement Methods | Sin²ψ (both side-inclination and co-inclination modes) |
| Residual Stress Repeatability (Fe powder reference) | < ±5 MPa (n = 5) |
| Radiation Shielding | Fully Enclosed Lead-Glass Enclosure Compliant with ANSI N43.2 |
| Standards Compliance | ASTM E915-2010, EN 15305:2008, GB/T 7704–2016 |
| Optional Target Materials | Cr, Mn, Cu, Co, Fe, V |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | DS-21P |
| X-ray Tube Power | 300 W |
| 2θ Angular Range | 105°–170° (continuously adjustable) |
| ψ Angular Range | −45° to +45° |
| Available Anode Target Materials | Cr, Cu, Mn, Ti, Co, V, Fe |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | DS-23MINI |
| X-ray Tube Power | 50 W |
| 2θ Angular Range | 140°–170° (continuously adjustable) |
| ψ Angular Range | −35° to +35° |
| Target Materials | Cr, Cu, Mn, Ti, Co, V, Fe |
| Detector | Dual semiconductor linear array (256 × 256 pixels), linear count rate > 10⁹ cps |
| Stress Measurement Repeatability (Fe powder) | < ±5 MPa (n = 5) |
| Compliance | ASTM E915-2010, EN 15305-2008, GB/T 7704-2017 |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | DST-17 |
| X-ray Tube Power | 3000 W |
| 2θ Angular Range | 45°–170° (continuously adjustable) |
| ψ Angular Range | −25° to +50° |
| Target Materials | Cr, Cu, Mn, Ti, Co, V, Fe |
| Angular Resolution (2θ) | 0.0001° |
| 2θ Repeatability | < 0.003° |
| Stress Measurement Accuracy | ±5 MPa |
| Detector | High-resolution Silicon Drift Detector (SDD), linear array configuration |
| Sample Positioning | Laser displacement sensor with < 3 µm repeatability |
| Motion System | 4-axis motorized sample stage + 360° precision rotation stage |
| Radiation Shielding | Fully enclosed lead-glass enclosure compliant with ANSI N43.2 |
| Standards Compliance | ASTM E915-2010, EN 15305-2008, GB/T 7704-2016, ISO 9001 |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | DX-2700BH |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW |
| Angular Accuracy | ±0.0001° |
| Resolution (FWHM) | SiO₂ ≤ 60% |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | DX-27mini |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| Power Rating | 600 W (40 kV / 15 mA) or 1200 W (40 kV / 30 mA) |
| Angular Accuracy | 0.0001° |
| Resolution (FWHM) | SiO₂ ≤ 60% |
| X-ray Source | Metal-ceramic Cu-target tube, focal spot 1 × 10 mm |
| Goniometer Geometry | Horizontal θ–θ (sample-and-detector movement) |
| Radius of Diffraction Circle | 150 mm |
| Scan Modes | Continuous and Step Scanning |
| Angular Range (θs/θd coupled) | –3° to 150° |
| Minimum Step Size | 0.0001° |
| Angular Reproducibility | ±0.0005° |
| Angular Positioning Speed | 1500°/min |
| Detector Options | Sealed proportional counter or high-speed 1D semiconductor array |
| Energy Resolution | <25% (at Mn Kα) |
| Linear Count Rate | ≥5 × 10⁵ cps (proportional), ≥9 × 10⁷ cps (1D semiconductor) |
| Radiation Shielding | Lead + lead-glass enclosure |
| Overall System Stability | ≤1% RSD over 8 h |
| Sample Capacity | 6-position automated sample changer |
| Dimensions (W × D × H) | 600 × 410 × 670 mm |
| Cooling | Air or water (≥2.5 L/min) |
| Software Platform | Windows 7-based instrument control and data analysis suite |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| Angular Resolution | 0.001° |
| Angular Accuracy | ±0.0001° |
| Peak Resolution (FWHM) | SiO₂ ≤ 60% |
| Detector | High-Performance Semiconductor Array Detector |
| X-ray Source | Stabilized Cu Kα Sealed-Tube Source |
| Calibration Standard Compliance | NIST-traceable Si & α-Al₂O₃ reference materials (full-pattern angular deviation ≤ ±0.01°) |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | DX-2900 |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power | 50 W |
| X-ray Source | Cu or Mo anode (50 kV / 1 mA) |
| Capillary Optics | Collimation ≤ 0.25°, Focal Spot Diameter: 0.5 mm, Photon Flux > 1×10⁸ ph/s |
| Goniometer | Two-Axis Thin-Film Stage (ω: –10° to +10°, resolution 0.002° |
| Z | 0–15 mm, resolution 0.002 mm) |
| Detector | 2D Array (512 × 512 pixels, pixel size 75 µm) |
| Optional Accessories | Transmission stage, in-situ heating stage (up to 600 °C), inert-atmosphere chamber, solvent vapor chamber, XY translation stage (150 mm × 150 mm), upgradeable to 3–5-axis thin-film goniometer or Pilatus200K/Eiger500K detectors |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Model | XAFS2300 |
| X-ray Source Power (XAFS mode) | 3 kW |
| X-ray Source Power (XES mode) | 50 W |
| Monochromatic Photon Flux | ≥2×10⁶ photons/sec @ 7–9 keV |
| Detectable Elemental Concentration Limit | 0.1 wt% |
| Tunable X-ray Energy Range | 4.5–25 keV |
| XAFS Scan Speed | 0.1–2.0 eV/s |
| Energy Resolution | 0.5–3 eV |
| Energy Drift Stability | < 50 meV per 8-hour operation |
| Dual-Mode Operation | XAFS & XES |
| Monochromator Type | Spherically Bent Crystal (Rolan Circle Geometry) |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Brand | Hefei Kejing |
|---|---|
| Model | DX-100 |
| Origin | Anhui, China |
| Power Supply | 220 V AC, 50 Hz, 0.5 kW |
| X-ray Tube | Cu anode, air-cooled, grounded anode |
| Max. Operating Voltage/Current | 30 kV / 5 mA (continuously adjustable) |
| Detector | Geiger-Müller counter |
| Detector Bias Voltage | up to 1050 V |
| Time Constant Settings | Fast (1 s) and Slow (2 s) |
| Angular Readout | Mechanical scale (2θ/θ resolution: 1°), digital display in degrees-minutes-seconds (minimum digital resolution: 10″) |
| Angular Range | 2θ = –10° to +140° |
| Collimator Slits | 4′, 5′, 6′ |
| Peak Position Accuracy | ±30″ |
| Primary Beam Shutter | Motorized |
| Dimensions (Main Unit) | 628 × 512 × 428 mm |
| Dimensions (Control Box) | 520 × 520 × 468 mm |
| Net Weight | 45 kg |
| Brand | Hefei Kejing |
|---|---|
| Model | X-3 / X-4 / X-4A |
| Type | Double-Crystal Diffractometer-Based Orienting System |
| Angular Accuracy | ±15 arcseconds |
| Minimum Readout Resolution | 15″ (X-3), 10″ (X-4), 1″ (X-4A) |
| Angular Range | 2θ = 10°–120°, θ = −10°–60° |
| X-ray Source | Cu-target, air-cooled tube |
| Max. Operating Voltage/Current | 30 kV / 1 mA |
| Time Constants | 0.4 s / 0.8 s |
| Power Supply | AC 220 V, 50 Hz, 0.5 kW |
| Monochromator | Built-in graphite monochromator |
| Compliance | JB/T 5482–2004 |
| Dimensions (L×W×H) | 1140 × 650 × 1100 mm |
| Weight | 300 kg |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | EA1280 |
| Configuration | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <150 eV (Mn Kα) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Model | EA8000 |
| Detection Limit | ≥20 µm metallic particles |
| Imaging Mode | Transmission + Energy-Dispersive X-ray Fluorescence (ED-XRF) Mapping |
| Sample Format | Powder, Foil, Separator, Electrode Sheet (up to 250 × 200 mm) |
| Automation | Full workflow automation (acquisition → detection → elemental mapping → report generation) |
| Compliance | Designed for ISO/IEC 17025-aligned QA/QC labs |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | MESA-50 |
| Detector Type | Silicon Drift Detector (SDD) |
| Excitation Source | Micro-focus X-ray Tube |
| Analytical Spot Sizes | 0.1 mm, 0.3 mm, and 1.2 mm |
| Minimum Detection Limit (MDL) | ≤2 ppm for Pb, Cd, Hg, Cr, Br |
| Measurement Time | Typically 60–300 s per point |
| Sample Viewing | Integrated High-Resolution CCD Camera with 30× Optical Zoom |
| Operating Environment | Ambient air (no vacuum or helium required) |
| Software Interface | Multilingual (English/Chinese), Excel-compatible data export |
| Compliance Support | RoHS Directive 2011/65/EU, WEEE Directive 2012/19/EU, ELV Directive 2000/53/EC, China RoHS II (SJ/T 11364-2014), JEITA EG0201, ASTM F2617-23 |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | MESA-50 |
| Configuration | Benchtop/Free-standing |
| Industry Application | Electronics Manufacturing & Compliance Testing |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Quantitative Detection Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Relative Standard Deviation (RSD) | ≤0.05% for repeated measurements under standardized conditions |
| Detector | Silicon Drift Detector (SDD) |
| Signal Processing | HORIBA Digital Pulse Processor (DPP) |
| Collimator Options | Three fixed apertures (Ø0.1 mm, Ø0.3 mm, Ø1.0 mm) |
| Dimensions | 225 × 210 × 40 mm (L×W×H) |
| Weight | 12 kg |
| Battery Life | Up to 6 hours continuous operation (integrated rechargeable Li-ion) |
| Vacuum/Atmosphere | Ambient air analysis (no vacuum pump or cryogenic cooling required) |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | MESA-50 |
| Form Factor | Benchtop/Portable |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | ppm-level |
| Energy Resolution | 131 eV (at Mn Kα) |
| Repeatability | <1% RSD |
| Dimensions | 294 × 208 × 205 mm |
| Weight | 12 kg |
| Battery Life | Up to 6 hours |
| Sample Imaging | Coaxial CCD camera |
| Detector | Silicon Drift Detector (SDD) |
| Signal Processing | HORIBA Digital Pulse Processor (DPP) |
| Vacuum/Nitrogen Requirement | None (ambient air operation, including Cl analysis) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MESA-50 |
| Price Range | USD 42,000–70,000 |
| Instrument Type | Scanning |
| X-ray Tube Power | 10 W (50 kV, 0.2 mA) |
| Elemental Range | Al (13) to U (92) |
| Detector | Silicon Drift Detector (SDD) |
| Beam Spot Sizes | 1.2 mm, 3 mm, 7 mm (motorized auto-switching) |
| Primary Beam Filters | 4-position automatic filter wheel |
| Sample Environment | Ambient air (no vacuum required) |
| Dimensions | 294 × 208 × 205 mm |
| Weight | 12 kg |
| Battery Life | Up to 6 hours (integrated Li-ion) |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | MESA-7220V2 |
| Configuration | Benchtop / Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application-Specific Design | Petroleum & Lubricant Compliance Testing |
| Elemental Range | S, Cl |
| Quantification Range | S: 0.7 ppm – 10.0 wt% |
| Cl | 0.6 ppm – 10.0 wt% |
| Mn-Kα Energy Resolution | ≤175 eV |
| Detector | Silicon Drift Detector (SDD) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XGT-1000WR/1700WR |
| Pricing | Available Upon Request |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XGT-1700 |
| Price Range | USD 42,000–70,000 |
| Instrument Type | Scanning |
| X-ray Tube Power | Not Applicable (Rh anode, max 50 kV / 1 mA) |
| Elemental Range | Na to U |
| Detection Limits | Cd ≤ 2 ppm, Pb ≤ 5 ppm, Cl ≤ 50 ppm |
| Sample Chamber Max Size | 460 × 360 × 150 mm |
| X-ray Beam Diameters | Φ1.2 mm and Φ3.0 mm (motorized switching) |
| Detector | High-Purity Silicon XEROPHY Detector |
| Liquid Nitrogen Capacity | 3 L |
| LN₂ Consumption | <1 L/day (only during operation) |
| Optical Magnification | 50× (coaxial with X-ray beam) |
| Software | Automated qualitative/quantitative analysis (fundamental parameters method, calibration curve method, single-point correction) |
| PC Requirements | Pentium IV ≥1.8 GHz, ≥1 GB RAM, ≥120 GB HDD, Windows XP, 17″ monitor, color inkjet printer |
| Ambient Temp | 10–35 °C (optimal), 5–40 °C (operational) |
| Humidity | ≤80% RH at 5–31 °C |
| Power Supply | AC 100/120/220/240 V ±10%, 50/60 Hz |
| Power Consumption | ≤1.3 kVA (system-wide) |
| Weight | ~265 kg (analysis unit only) |
| Dimensions | Analyzer Unit: 610(W) × 750(D) × 500(H) mm |
| Signal Processing Unit | 220(W) × 500(D) × 480(H) mm |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XGT-5200 |
| Price Range | USD 42,000–70,000 (FOB) |
| Instrument Type | Scanning Micro-XRF |
| X-Ray Tube Power | 50 kV / 1 mA |
| Target Material | Rhodium (Rh) |
| Detectable Elements | Na (Z=11) to U (Z=92) |
| Primary Beam Spot Sizes | 10, 50, 100, 400 µm, 1.2 mm, 3 mm |
| Detector | Silicon Drift Detector (SDD) |
| Sample Stage | 100 × 100 mm (standard), up to 200 × 200 mm (optional) |
| Sample Chamber Dimensions | 400 × 350 × 40 mm (customizable) |
| Optical Imaging | Macro-view 100 × 100 mm (400K pixels standard |
| Analysis Modes | Qualitative (auto-identification, ROI color mapping, background subtraction, spectral matching) and Quantitative (Fundamental Parameters Method, calibration curve, Cl/thickness/wire compensation) |
| Data Export | Excel®-compatible reporting module |
| Power Supply | AC 100/120/220/240 V, 50/60 Hz |
| Weight | ~280 kg |
| Dimensions (W×D×H) | 680 × 833 × 670 mm |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-5200WR |
| Sample Environment | Air (Atmospheric) |
| Elemental Range | Na to U |
| Quantification Range | 1 ppm – 99.99% |
| Operating Conditions | 50 kV / 1 mA |
| Repeatability | ±0.1% RSD |
| Spot Size | Standard 400 µm, Optional 10 µm |
| Detector | Silicon Drift Detector (SDD), LN2-free |
| Geometry | Coaxial Optical Microscope Integration |
| Analysis Mode | Non-destructive, No Vacuum Required, No Sample Preparation |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-7000V |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Source | Rh anode, 50 kV / 1 mA |
| Spatial Resolution | Down to 10 µm |
| Measurement Range | Na (11) to U (92) |
| Vacuum Modes | Full vacuum & local vacuum (switchable in <5 s) |
| Optical Imaging | Co-axial CCD with macro/micro view |
| Sample Chamber | 300 mm × 300 mm × 80 mm (full vacuum), XY stage: 100 mm × 100 mm |
| Software | SmartMap™ for hyperspectral mapping, INCA™ pulse processor, GLP-compliant data handling |
| Quantification Methods | Fundamental Parameters (FP), single-standard FP, calibration curve, multilayer thin-film analysis (nm–µm scale) |
| Elemental Mapping | Pixel-resolved full-spectrum acquisition, offline reprocessing, RGB overlay, line scan, ROI masking |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XGT-7200 |
| Price Range | USD 42,000 – 70,000 (FOB) |
| Instrument Type | Scanning Micro-XRF |
| X-ray Tube Power | Not Applicable (Microfocus Rh Target, Fixed Excitation) |
| Elemental Range | Na (11) to U (92) |