X-Ray Instruments
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| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ Reflection |
| Detector | Digital Pulse Processing Counter (DPPC) |
| Count Rate Capacity | ≥1 × 10⁷ counts per second (CPS) |
| Sample Stage | Fixed-center goniometer with integrated Soller slits |
| Power Supply | kW-class microfocus X-ray source (exact rating specified in technical documentation) |
| Compliance | CE-marked for laboratory use |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (integrated sealed X-ray tube) |
| Geometry | Bragg–Brentano reflection (θs–θd) |
| Detector | High-sensitivity scintillation or silicon-strip detector (configurable) |
| Sample Stage | Motorized goniometer with ±0.001° angular resolution |
| Software Platform | CrystalX v3.x (with ICDD PDF-4+ database integration) |
| Compliance | CE, RoHS, IEC 61000-6-3/6-4, EN 62471 (UV/soft X-ray safety) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power | kW-class (rated for continuous operation in desktop configuration) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Geometry | Bragg–Brentano θ–2θ reflection mode |
| Sample Stage | Motorized goniometer with fixed center-of-rotation |
| Slit System | Integrated Soller collimators (no moving adjustment parts) |
| Safety | Interlocked sample chamber with auto-shutdown, door-closed status indicator |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, and EDS-enabled hybrid XRD/EDS data correlation |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | FRINGE EV Pharmaceutical Crystal Diffractometer |
| Instrument Type | Benchtop Powder X-ray Diffractometer |
| Power Rating | kW-class (rated for high-flux operation) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ cps count rate |
| Optical Configuration | Integrated fixed Soller collimator, θs–θd reflection geometry |
| Safety | Interlocked fully enclosed sample chamber with auto-shutdown, real-time door status feedback |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, and EDS-enabled hybrid data acquisition |
| Compliance | Designed to support GLP/GMP-aligned workflows |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (rated for continuous high-intensity operation) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Optical Configuration | Integrated Soller collimator (fixed, no moving parts) |
| Geometry | Bragg–Brentano θ–2θ reflection mode |
| Safety | Interlocked sample chamber with automatic beam shutter, real-time door status feedback in GUI |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, and energy-dispersive spectral overlay |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (air-cooled, sealed-tube source) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ cps |
| Optical Configuration | Integrated Soller slits, fixed divergence geometry |
| Sample Geometry | Bragg–Brentano θ–2θ reflection mode |
| Safety Compliance | Interlocked sample chamber with auto-shutdown, full enclosure when closed |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, EDS-enabled hybrid XRD/EDS data acquisition |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (rated for continuous high-intensity operation) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Optical Configuration | Integrated fixed Soller slits, θ–2θ reflection geometry |
| Safety Compliance | Interlocked sample chamber with automatic beam shutter, full enclosure when closed |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity calculation, and EDS-enabled hybrid data acquisition |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano θ–2θ reflection mode |
| Power Supply | kW-class integrated X-ray source (exact rating per configuration) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1 × 10⁷ counts per second (CPS) |
| Sample Stage | Fixed-height goniometer with air-spring assisted large-window lift door |
| Software | CrystalX™ automated phase identification & quantification suite |
| Compliance | Designed for GLP-compliant labs |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (typical operational range: 1.2–2.4 kW, configurable per application requirements) |
| Detector | DPPC (Digital Pulse Processing Counter Detector), Count Rate ≥ 1 × 10⁷ cps |
| Optical Configuration | Integrated fixed Soller slits, Bragg–Brentano θ–2θ reflection geometry |
| Safety Compliance | Interlocked sample chamber with automatic beam shutdown, real-time door status feedback in GUI |
| Software Platform | CrystalX™ v3.2+ with automated phase identification, Rietveld refinement, quantitative phase analysis (QPA), crystallinity index calculation, and alumina polymorph transformation ratio reporting (α-, γ-, δ-, θ-, κ-, χ-Al₂O₃) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ reflection mode |
| Power | kW-class sealed-tube X-ray source (rated output ≥ 1.8 kW) |
| Detector | Digital Pulse Processing Counter (DPPC), count rate capacity ≥ 1×10⁷ cps |
| Sample Stage | Motorized goniometer with integrated Soller slits, fixed divergence slit, anti-scatter slit, and receiving slit |
| Compliance | CE-marked, IEC 61010-1 safety certified, radiation-shielded enclosure with interlocked safety door and real-time chamber status feedback |
| Software | CrystalX™ v3.x — automated phase identification (ICDD PDF-4+ database), quantitative Rietveld refinement, crystallinity index calculation (e.g., Lc, La, graphitization degree via (002) peak FWHM & d-spacing), energy-dispersive spectroscopy (EDS) co-acquisition support |
| Sample Forms | Powders, solid blocks, thin films, coatings |
| Dimensions | 620 × 540 × 480 mm (W × D × H) |
| weight | ~95 kg |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ reflection mode |
| Power | kW-class microfocus X-ray source (rated output ≥ 1.2 kW) |
| Detector | Digital Pulse Processing Counter (DPPC) with throughput ≥ 1×10⁷ counts per second (CPS) |
| Slit System | Integrated fixed Soller slits (no moving adjustable components) |
| Sample Stage | Motorized goniometer with ±0.001° angular reproducibility |
| Safety | Interlocked full-enclosure sample chamber with real-time door status monitoring and automatic beam shutdown |
| Software | CrystalX™ automated phase identification & quantification suite with Rietveld refinement, crystallinity index calculation, and ASTM E1426-compliant data reporting |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano reflection (θs–θd) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ cps |
| Power | kW-class (integrated high-power microfocus X-ray source) |
| Compliance | CE-marked, IEC 61000-6-3/6-4, EN 62471 (UV/X-ray safety) |
| Sample Stage | Motorized goniometer with air-spring assisted large-window lift door |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ reflection mode |
| Power Supply | kW-class integrated X-ray source (rated output ≥ 1.2 kW) |
| Detector | Digital Pulse Processing Counter (DPPC), count rate ≥ 1×10⁷ cps |
| Sample Stage | Precision goniometer with fixed θs–θd alignment |
| Optical Path | Integrated Soller slits (no moving adjustment parts), anti-scatter slit, receiving slit |
| Software | CrystalX™ v3.2 — automated phase identification, Rietveld quantitative analysis, crystallinity index calculation, PDF-4+ database integration |
| Compliance | Designed to meet ISO 17025 laboratory requirements |
| Safety | Interlocked full-enclosure sample chamber with auto-shutdown on door opening, real-time status feedback on HMI |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | FRINGE Series |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (Integrated High-Intensity X-ray Source) |
| Detector | DPPC (Digital Pulse Processing Counter Detector), ≥1×10⁷ cps |
| Optical Configuration | Fixed integrated Soller slits, θ–2θ reflection geometry (Bragg–Brentano), air-spring assisted large-window safety door |
| Software | CrystalX™ — automated phase identification, quantitative Rietveld refinement, crystallinity calculation, and EDXRF co-acquisition capability |
| Compliance | Designed to meet ISO 17025 laboratory requirements |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Applicable Standard | SH/T 1827–2019 |
| Measurement Principle | X-ray Diffraction (XRD) with Whole-Pattern Fitting |
| Sample Form | Granular or Powdered Polyolefins (PE, PP), Injection-Molded or Compression-Molded Specimens (α- and β+α-phase) |
| Detector | High-Resolution Scintillation Detector |
| Goniometer Architecture | θ–2θ Coupled Drive System (Single-Axis Motorized) |
| Cooling | Integrated Water-Circulation Cooling (Real-Time Monitoring of Temperature, Flow Rate & Velocity) |
| Software | CrystalX — Automated Crystallinity Quantification (DOC Calculation), ASTM/ISO-Compatible Data Export, Audit Trail & User Access Control |
| Safety | Interlocked Sample Chamber, Automatic X-ray Shutoff, Visual Closure Confirmation |
| Optical Component | Monolithic Soller Slit (Fixed, No Moving Parts) |
| Mobility | Designed for Benchtop and Mobile Lab Integration |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | In-flowX |
| Form Factor | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF Spectrometer |
| Measurement Principle | Energy Dispersive X-Ray Fluorescence (ED-XRF) |
| Detection Range | ppm to wt% |
| Compliance Framework | Designed for GLP/GMP-aligned process monitoring environments |
| Communication Protocols | RS485, TCP/IP |
| Enclosure Rating | IP65 |
| Sample Interface | Flow-through liquid cell with automated sampling loop |
| Core Functionalities | Automated sampling, real-time spectral acquisition, multi-element quantification, auto-calibration, self-cleaning cycle, threshold-based alarm triggering |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Domestic/Imported | Domestic |
| Model | IP68 |
| Application | Handheld / Submersible |
| Instrument Type | Conventional Energy Dispersive X-Ray Fluorescence (ED-XRF) Spectrometer |
| Ingress Protection Rating | IP68 |
| Operational Depth | Up to 10 m underwater |
| Measurement Mode | In-situ, non-destructive elemental analysis |
| Data Transmission | Real-time wireless telemetry to surface control unit |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | LabStation-5 |
| Instrument Type | Powder X-ray Diffractometer |
| Instrument Configuration | Floor-standing |
| Detector | High-Performance Photon-Counting (HPC) Pixelated Detector |
| Goniometer | θ/θ Closed-Loop Drive System |
| Optical Geometry | Switchable Bragg-Brentano & Parallel-Beam Configurations |
| Sample Stage | Modular, Tool-Free Quick-Release Sample Holder System |
| Diffractometer Radius | ≥300 mm |
| Beam Path Architecture | Non-Coplanar Arm Design |
| Slit System | Motorized Variable Aperture |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | PeDX 980 / 980S / 980CS |
| Application Form Factor | Handheld / Portable |
| Instrument Type | General-Purpose ED-XRF |
| Elemental Analysis Range | Br, Cr, Pb, Hg, Cd, Cl |
| Quantitative Detection Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under standardized conditions) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | Domestic (China) |
| Model | PeDX RAMAN |
| Application | Handheld / Portable |
| Instrument Type | Conventional |
| Industry Use | General Purpose |
| Elemental Analysis Range | Mg–U |
| Quantitative Range | 1 ppm – 99.99% |
| Energy Resolution | 145 eV |
| Repeatability | 0.1% |
| Detector | High-Performance Silicon Drift Detector (SDD) with Peltier cooling |
| Dual-Mode Capability | Simultaneous Raman Spectroscopy & Energy-Dispersive X-ray Fluorescence (ED-XRF) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | ROCKSY |
| Configuration | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Geological & Mineralogical Analysis |
| Elemental Range | Na (11) – U (92) |
| Quantitative Range | 0.1 ppm – 99.99 wt% |
| Detection Geometry | Top-View (Vertical Illumination) |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Vacuum Capability | Integrated Intelligent Vacuum System |
| Portability | Field-Deployable with Onboard Battery |
| Software | ROCKSY Smart Analysis Suite (Real-Time Visualization, Report Automation, GLP-Compliant Data Logging) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX 860CS |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose with Copper Alloy Optimization |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (for typical matrix elements under optimized conditions) |
| Detector | High-Resolution Silicon Drift Detector (SDD), Peltier-cooled, ≥140 eV Mn-Kα resolution |
| Vacuum System | Integrated Automatic Vacuum Pump |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX 980Quartz |
| Configuration | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose with Quartz Sand Optimization |
| Elemental Analysis Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (for matrix-matched standards) |
| Energy Resolution | <125 eV at Mn Kα |
| Repeatability | ≤0.1% RSD (for major oxides at ≥1 wt%) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX CSA 600 |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose Regulatory Compliance Analysis |
| Elemental Range | Mg to U (Z = 12–92) |
| Detection Limit | 1 ppm (for Cd, Pb, Hg, Cr, Br, Cl under optimized conditions) |
| Energy Resolution | <125 eV at Mn Kα (5.89 keV) |
| Repeatability | ≤0.1% RSD (for homogeneous reference materials, n=10) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX CSA 660 |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF Spectrometer |
| Application Scope | General-Purpose Regulatory Screening |
| Elemental Range | Mg to U |
| Detection Limit | 1 ppm (for Cd, Pb, Hg, Cr, Br, Cl in polymer matrices) |
| Energy Resolution | <125 eV at Mn Kα |
| Repeatability | ≤0.1% RSD (for 100 s counting time on homogeneous standards) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX CSA 660F |
| Configuration | Benchtop / Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose Elemental Analysis |
| Elemental Range | Mg (12) to U (92) |
| Detection Limit | 1 ppm (for typical matrixes) |
| Energy Resolution | <125 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for homogeneous standards) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Industrial Silicon Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | ScopeX |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Al₂O₃ Powder Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |