X-Ray Instruments
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| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-7200WR |
| Detection Principle | Energy Dispersive X-Ray Fluorescence (ED-XRF) |
| Spot Size Range | 10 µm to 1.2 mm |
| Detector Type | Silicon Drift Detector (SDD), Liquid-Nitrogen-Free |
| Maximum Scan Area | 10 cm × 10 cm |
| Optical-Element Image Co-Registration | Yes |
| Elemental Mapping Resolution | ≤10 µm |
| Compliance | ASTM E1621, ISO 8256, IEC 62321-5 (RoHS), USP <232>/<233>, GLP/GMP-ready data audit trail |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | XGT-9000 |
| Excitation Mode | Single-Wavelength Excitation |
| X-ray Tube Power | 50 W |
| Voltage Range | Up to 50 kV |
| Current Range | Up to 1000 µA |
| Elemental Coverage | Na (11) to U (92) |
| Minimum Spot Size | ≥10 µm |
| Optional Capillary Probes | 15 µm and 100 µm |
| Detector Configuration | Dual-mode — Energy-Dispersive XRF + Transmission X-ray Imaging |
| Sample Chamber Flexibility | Up to 4 configurable measurement atmospheres (air, He, vacuum, N₂) |
| Software Platform | HORIBA X-RAY LAB |
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | hiXAS |
| X-ray Energy Range | 5–12 keV |
| Minimum Detectable Element Concentration | Low to several wt% |
| XAFS Acquisition Time | 3–8 min (depending on sample concentration and normalization requirements) |
| Spectral Resolution (E/ΔE) | Constant 4000 across full energy range |
| Detector | Photon-counting pixelated X-ray detector |
| Monochromator | HAPG-based von Hamos geometry spectrometer |
| Footprint | 2.0 m × 1.0 m |
| Sample Handling | Motorized sample wheel with multi-position mounting |
| Brand | I-CHEQ |
|---|---|
| Origin | USA |
| Model | F2-9000 |
| Application | Handheld/Field-Portable |
| Element Range | Mg–Pu |
| Detection Range | 1 ppm – 99.99% |
| Energy Resolution | 120–140 eV |
| Repeatability | 0.1% |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Excitation Source | Variable-Voltage (up to 50 kV) Microfocus X-ray Tube with Selectable Anode Materials (Au, Ag, W, Ta, Pd) |
| Cooling | Peltier Semiconductor |
| Operating System | Windows CE |
| Display | Industrial-Grade TFT Color Touchscreen |
| Dimensions (L×W×H) | 233 × 84 × 261 mm |
| Weight (with battery) | 1.46 kg |
| Compliance | Meets IEC 61000-6-3 (EMC), IEC 61000-6-2, ANSI N43.3, and FDA 21 CFR Part 1020.40 for X-ray safety |
| Brand | Innov-X |
|---|---|
| Origin | USA |
| Model | DELTA Series |
| Portability | Handheld |
| Elemental Range | Mg to U |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <165 eV |
| Repeatability | ≥95% |
| Excitation Source | Micro-focus X-ray Tube (10–40 kV) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Weight | <1.5 kg |
| Operating System | Microsoft Windows Embedded CE |
| Battery Life | >4 hours continuous operation |
| Hot-Swap Battery Support | Yes |
| Display | 32-bit color touchscreen |
| Sample Targeting | Integrated camera + collimated beam optics |
| Trigger Options | Mechanical trigger, Deadman safety trigger, or external PC control |
| Brand | Innov-X |
|---|---|
| Origin | USA |
| Model | XDD-5000 Series |
| Elemental Range | Mg to U |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | <165 eV |
| Repeatability | 95% |
| Weight | <12 kg |
| Excitation Source | 10 W Microfocus X-ray Tube |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Operating System | Windows XP |
| Configuration | Benchtop or Floor-Standing |
| Distribution Type | Imported Instrument via Authorized Distributor |
| Origin | Japan |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Imported |
| Model | IPX-LC |
| Pricing | Upon Request |
| Brand | COX Analytical Systems |
|---|---|
| Origin | Sweden |
| Model | Itrax XRF FleXRay |
| Form Factor | Benchtop/Floor-Standing |
| Application Domain | Geological & Mining Core Analysis |
| Elemental Range | Na–U |
| Detection Principle | Energy-Dispersive X-Ray Fluorescence (ED-XRF) |
| Optical Resolution | High-Resolution RGB Imaging System |
| Surface Topography Compensation | Integrated Laser Distance Sensor (8 mm Fixed Working Distance) |
| Data Acquisition Speed | 0.2 s per measurement point |
| Sensitivity | Sub-ppm for heavy and transition metals |
| Calibration Approach | Pre-loaded Standard Reference Material Libraries |
| Compliance Context | Designed for GLP-compliant sediment core laboratories |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSX-1000S |
| Elemental Analysis Range | Mg–U (Na–U optional) |
| Quantitative Range | 0.1–99.9 wt% |
| Energy Resolution | <170 eV at Mn Kα |
| Repeatability | ±0.1% RSD |
| X-ray Tube | 5–50 kV, 1 mA, Rh anode |
| Filter Options | Standard — OPEN, ND, Cr, Pb, Cd |
| Detector | Silicon Drift Detector (SDD) |
| Sample Chamber | Ø300 mm × 80 mm H |
| Atmosphere Mode | Air (standard) |
| Imaging System | Integrated color camera |
| Software Suite | Qualitative & Quantitative Analysis, RoHS Compliance Module (Cd, Pb, Hg, Br, Cr), Quick-Analysis Mode, Report Generator, Daily Verification Tool |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JXA-8230 |
| Accelerating Voltage | 0.2–30 kV (0.1 kV step) |
| Beam Current Range | 1×10⁻¹² – 1×10⁻⁵ A |
| Beam Current Stability | ±5% / h, ±0.3% / 12 h |
| Secondary Electron Resolution | 6 nm (W filament, WD = 11 mm, 30 kV) |
| Magnification | ×40 – ×300,000 |
| Max. Sample Size | 100 mm × 100 mm × 50 mm (H) |
| WDS Elemental Range | Be*¹–U (Be requires optional crystal) |
| EDS Elemental Range | B–U |
| WDS Wavelength Range | 0.087–9.3 nm |
| EDS Energy Range | 0–20 keV |
| WDS Spectrometers | 1–5 channels (configurable) |
| EDS Detector | 1 SDD (optional fanless digital pulse processor) |
| Display | Dual LCDs (1280×1024), dedicated for EPMA analysis and SEM/EDS operation |
| Origin | Beijing, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | Portable 350 |
| Application | Field-Portable |
| Industry-Specific Use | Electronics, Petrochemical, Power, Aerospace, Scrap Recycling |
| Elemental Range | Mg (Z=12) to U (Z=92) |
| Quantitative Range | 1 ppm to 99.99 wt% |
| Energy Resolution | 149 ± 5 eV (at Mn Kα) |
| Repeatability | RSD ≤ 0.05% |
| Origin | Beijing, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China-made) |
| Model | Portable 450 |
| Application | Field-deployable handheld analysis |
| Industry-Specific Use | Electronics, Petrochemical, Aerospace, Power Generation, Scrap Recycling |
| Elemental Range | Mg (Z=12) to U (Z=92) |
| Quantification Range | 1 ppm to 99.99 wt% |
| Energy Resolution | 149 ± 5 eV at Mn Kα |
| Repeatability | RSD ≤ 0.05% for major alloying elements |
| Brand | Ju Chuang Environmental |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | JC-350X |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional EDXRF |
| Application Scope | General-Purpose |
| Detection Range | 0.07 ppm – 99.9% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements, 100 s counting) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Measurement Range | 1–45 keV |
| High Voltage | 5–50 kV |
| Tube Current | 5–1000 µA |
| Vacuum Level | ≤10⁻² Pa within 10 s (operational range: 10⁻¹–10⁻⁵ Pa) |
| Sample Imaging | 5 MP CCD camera with real-time positioning |
| Power Consumption | 50 W (main unit), 550 W (vacuum pump) |
| Dimensions | 720 × 440 × 435 mm (W×D×H) |
| Weight | 65 kg |
| Brand | JWGB |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| X-ray Source | Sealed Mo-target Tube |
| Maximum Power | 1600 W |
| Angular Accuracy | ±0.01° |
| Angular Resolution | 0.1° |
| Goniometer Geometry | Vertical θ–2θ |
| Goniometer Radius | 144 mm |
| Angular Range | 0°–150° |
| Detector | Photon-counting 2D Array Detector |
| Sample Stage | Temperature-Controlled Pouch-Cell Holder (−30 °C to 300 °C) |
| Dimensions | 900 mm × 680 mm × 550 mm |
| Weight | 100 kg |
| Brand | JWGB |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | Lattice Series |
| Instrument Type | Powder X-ray Diffractometer |
| Instrument Configuration | Benchtop |
| X-ray Power | 1200 W |
| Angular Accuracy | ±0.01° |
| Angular Resolution | 0.1° |
| Detector | 256 × 256 Pixel Photon-Counting 2D Array Detector |
| Goniometer Geometry | θ–2θ (Lattice Basic) or θ–θ (Lattice Pro) |
| X-ray Tube Anode Material | Cu or Co (sealed tube) |
| Angular Range | –3° to 156° (Z-axis tilt ≤ –20°), 0° to 160° (Z-axis tilt > –20°) |
| Goniometer Radius | 150–228 mm (adjustable) |
| Detector Energy Resolution | 0.2 keV |
| Dimensions | 900 mm × 680 mm × 550 mm |
| Weight | 100 kg |
| Brand | KA Imaging |
|---|---|
| Origin | Canada |
| Model | Reveal 35C |
| Compliance | ASTM F792222-17 |
| Detector Architecture | Triple-layer stacked scintillator design |
| Imaging Modes | Single-exposure spectral DR (conventional DR, low-density image, high-density image) |
| Connectivity | Wireless (Wi-Fi 5/6), USB-C interface |
| Form Factor | Portable, battery-operated (optional), ruggedized enclosure for field NDT use |
| Software | SpectralDR® acquisition and material-separation suite with color-coded density mapping |
| Brand | KA Imaging |
|---|---|
| Origin | Canada |
| Model | REVEAL R 35C |
| Detection Principle | Spectral Digital Radiography (SpectralDR®) |
| Energy Discrimination | Triple-energy single-exposure acquisition |
| Connectivity | Wireless (Wi-Fi 6) |
| Compliance | ASTM F792–22 (formerly F792222-17) |
| Portability | Integrated battery-powered operation, ruggedized IP54 enclosure |
| Software Platform | Reveal™ Acquisition & Analysis Suite v4.2 |
| Brand | KETEK |
|---|---|
| Origin | Germany |
| Model | AXAS-A |
| Detector Type | Integrated SDD with Pulse Reset Preamp |
| Power Supply | ±12 V DC |
| FWHM (Mn Kα) | ≤133 eV (Premium Class) / ≤149 eV (Standard Class) |
| Finger Length Options | 50, 100 (standard), 160, 200, 300 mm |
| Upper Energy Limit | 20 keV (H7, H20, H30) or 30 keV (H50) |
| Low-Energy Window Options | H7LE*, H15LE* (with FWHM ≤136 eV & ≤144 eV) |
| Cooling | Integrated thermoelectric (Peltier) control |
| High-Count-Rate Capability | Enabled via pulse reset front-end architecture |
| Compliance | Designed for ASTM E1301, ISO 21389, and IEC 62596-compliant XRF and EPMA systems |
| Brand | KETEK |
|---|---|
| Origin | Germany |
| Model | AXAS-D |
| Detector Type | Integrated Digital Pulse Processing SDD System |
| Active Area Options | 7–50 mm² |
| Energy Resolution (FWHM @ Mn Kα) | ≤133 eV (Premium Class), ≤139 eV (Standard Class), ≤136/144 eV (H15LE variants) |
| Finger Length Options | 50, 100, 160, 200, 300 mm |
| Upper Energy Limit | 20 keV or 30 keV |
| Cooling | Integrated Thermoelectric Control |
| Signal Processing | Onboard Charge-Sensitive Preamplifier + Digital Pulse Processor (DPP) |
| Compliance | Designed for ASTM E1598, ISO 21397, and IEC 62495-compliant XRF and EPMA systems |
| Software Interface | KETEK DPP Software (shaping time adjustable from 0.5–16 µs) |
| Brand | KETEK |
|---|---|
| Origin | Germany |
| Model | VIAMP |
| Detector Type | Silicon Drift Detector (SDD) Module with Flexible Cable Interface |
| Compatible Probes | VITUS H7–H50 Series |
| Operating Temperature Range | −35 °C (TEC-stabilized) |
| Bias Voltage | −140 V DC |
| Power Supply | +5 V / 25 mA, −5 V / 15 mA, TEC: 1.7 V / 280 mA @ −35 °C |
| Energy Resolution | <125 eV FWHM at Mn Kα (5.9 keV), typical for high-performance SDDs |
| Count Rate Capability | >100 kcps (with pulse pile-up rejection) |
| Signal Polarity | Positive |
| Ramp Threshold | +1.8 V (positive), −1.8 V (negative) |
| Preamp Gain | 3 mV/keV (±10%) |
| TEC ΔT | 70 K @ 20 °C heatsink temperature |
| Temperature Diode Slope | 2.35 mV/K @ 1 µA |
| Brand | KETEK |
|---|---|
| Origin | Germany |
| Model | VITUS Series |
| Energy Resolution (FWHM @ 1 µs peaking time, Cube Class) | 129 eV (H7–H50), 136 eV (H80/R100), 133–136 eV (LE variants) |
| Peak-to-Background Ratio (P/B) | >15,000 (Cube Class H7–H50), >10,000 (H80), >400 (R100), >10,000 (LE variants) |
| Peak-to-Tail Ratio (P/T) | >2,000 (Cube Class), >1,000 (Standard Class) |
| Active Si Thickness | 450 µm |
| Maximum Count Rate | 1,000 kcps |
| Beryllium Window | 8 µm (standard), 12.5 µm (H50), 25 µm (H80/R100), AP3.3 low-energy polymer (H7LE/H18LE) |
| Cooling Performance | ΔT > 75 K (Cube/Premium), ΔT > 55 K (LE variants) |
| Operating Heat Sink Temperature | ≤30 °C |
| Brand | KETEK |
|---|---|
| Origin | Germany |
| Model | VITUS |
| Active Area Options | 7–100 mm² |
| Window Material | 8 µm or 25 µm Beryllium (standard) / AP3.3 polymer (low-energy) |
| Cooling | Peltier, ΔT ≤ 75 °C @ 30 °C heatsink (standard class) / ≤ 55 °C @ 20 °C heatsink (low-energy class) |
| Energy Resolution (FWHM) | ≤133 eV @ Mn-Kα (5.9 keV), 8 µs peaking time |
| Count Rate Capability | >15,000 cps (standard), >10,000 cps (low-energy), dead time <50% at 100 kcps |
| Peak-to-Background Ratio (P/B) | >6,000 (guaranteed) |
| Brand | KY Instruments |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | China |
| Model | KY-3000X |
| Pricing | Available Upon Request |
| Analysis Principle | Energy-Dispersive X-ray Fluorescence (EDXRF) |
| Measurement Range (S) | 0.001–9 wt% |
| Detection Limit | 10 ppm |
| Typical Analysis Time | 60 s |
| Accuracy | Compliant with GB/T 17040, SH/T 0742–2004, ASTM D4294, and GB/T 11140 |
| Operating Temperature | 5–40 °C |
| Relative Humidity | ≤85% at 30 °C |
| Power Supply | 220 V ±20 V, 50 Hz |
| Power Consumption | <150 W |
| Dimensions (L×W×H) | 560 × 470 × 150 mm |
| Weight | 20 kg |
| Radiation Safety | Certified for Exemption under Chinese Environmental Protection Regulations (EPA Exemption Permit Issued) |
| Brand | Kyoyuan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | China |
| Model | KY-3000 |
| Price | Upon Request |
| Analysis Time | 1–999 s (recommended 60 s) |
| Detection Limit | 10 ppm |
| Sulfur Range | 0.001–9 wt% (petroleum matrix) |
| Accuracy | Compliant with GB/T 17040, SH/T 0742–2004, ASTM D4294, and GB/T 11140 |
| Operating Temperature | 5–40 °C |
| Relative Humidity | ≤85% at 30 °C |
| Power Supply | 220 V ±20 V, 50 Hz |
| Power Consumption | <150 W |
| Dimensions (L×W×H) | 560 × 470 × 150 mm |
| Weight | 20 kg |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Model | FRINGE C1600 |
| Regulatory Classification | Domestic (China) |
| Key Features | θ–2θ coupled goniometer with single-axis drive |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Model | FRINGE CLASS |
| Power Supply | As specified in technical documentation |
| Detector | Proportional Counter (≥500 kcps count rate) |
| Geometry | Bragg–Brentano θ–2θ reflection mode |
| Cooling System | Integrated water recirculation cooling |
| Compliance | CE-marked, compliant with IEC 61000-6-3 (EMC) and IEC 61000-6-4 (emission standards) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | FRINGE D200 |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| Power Rating | kW-class (air-cooled or integrated water-cooling system) |
| Detector | Xeye2D 2D hybrid pixel array detector |
| Goniometer | High-precision vertical θ–θ configuration |
| Software | CrystalX automated phase analysis suite |
| Sample Compatibility | Powders, bulk solids, thin films, liquids |
| Safety | Interlocked sample chamber, automatic beam shutter, real-time door status feedback |
| Optional Accessories | High-temperature stage, cryo-stage, humidity-controlled cell |
| Compliance | Designed to meet IEC 61010-1 (safety), ISO 17025 operational readiness guidelines, and GLP-aligned data integrity practices |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ reflection mode |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Power | kW-class microfocus X-ray source (exact rating per configuration) |
| Compliance | CE-marked, IEC 61000-6-3/6-4, IEC 62471 (LED/X-ray safety) |
| Sample Handling | Motorized sample stage with integrated Soller collimator, air-spring assisted large-window hinged door |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano θ–2θ reflection |
| Detector | Digital Pulse Processing Counter (DPPC) |
| Maximum Count Rate | ≥1 × 10⁷ counts per second (CPS) |
| Sample Forms | Powders, bulk solids, thin films |
| Software | CrystalX™ automated phase identification & quantification suite |
| Compliance | Designed for GLP-compliant workflows |
| Safety | Interlocked sample chamber with auto-shutdown, real-time door status feedback, full enclosure during operation |
| Optical Path | Integrated fixed Soller slits, divergence slit, anti-scatter slit, receiving slit |
| Power Supply | High-voltage generator rated for kW-class operation (exact rating model-specific |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano θ–2θ reflection |
| Power Rating | kW-class (rated for continuous operation) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Optical Configuration | Integrated Soller slits, fixed divergence slit, anti-scatter slit, receiving slit |
| Sample Stage | Motorized goniometer with precision angular encoder |
| Safety Compliance | Interlocked sample chamber, automatic beam shutter activation upon door opening, real-time chamber status feedback on GUI |
| Software Platform | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, PDF-4+ database integration |
| Regulatory Alignment | Designed to support GLP-compliant workflows |