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| Brand | PerfectLight |
|---|---|
| Model | PLS-SXE300UV |
| Light Source Type | Xenon Arc Lamp-Based Solar Simulator |
| Optical Architecture | Single-Beam |
| Detector | Photodiode Array |
| Spectral Range | 320–780 nm (extendable to 2500 nm with optional filters) |
| Wavelength Control | Motorized Auto-Scanning |
| Total Output Power | 50 W |
| Beam Divergence | Avg. 6° |
| Illuminated Spot Diameter | 30–60 mm (distance-dependent) |
| Long-Term Irradiance Stability | ≤ ±3% over 8 h |
| Lamp Power Rating | 300 W (adjustable 150–300 W) |
| Lamp Lifetime | >1000 h (under standard photocatalytic operating conditions) |
| Trigger System | Integrated High-Voltage Ignition (dual-stage, no external HV cabling) |
| Current Limit | 21 A |
| Thermal Management | Passive Heatsink (large-area aluminum fin array) |
| EMI Shielding | Enclosed metal lamp housing |
| Control Interface | Microprocessor-based digital power management with programmable operation mode |
| Brand | PerfectLight |
|---|---|
| Model | DT-Series (e.g., DT 350, DT 405, DT 550, etc.) |
| Substrate Material | Fused Silica |
| Diameter | 63 mm |
| Clear Aperture | >57 mm |
| Center Wavelength Range | 320–700 nm (UV-Vis) |
| Full Width at Half Maximum (FWHM) | 20 nm ±3 nm |
| Blocking Range | OD ≥4 from 200–1200 nm (typical) |
| Surface Quality | 20–10 scratch-dig |
| Parallelism | <3 arcsec |
| Transmission Peak | >85% (typical) |
| Operating Temperature | –20 °C to +70 °C |
| Compliance | ISO 9001-manufactured, RoHS-compliant |
| Brand | PerfectLight |
|---|---|
| Origin | Beijing, China |
| Model | UVref |
| Filter Type | Cut-On / Cut-Off, Bandpass, and Narrowband |
| Substrate Material | Fused Silica (Quartz) |
| Diameter | 63 mm |
| Clear Aperture | >57 mm |
| Spectral Range | 320–2500 nm |
| Optical Density (OD) @ Blocking Region | ≥4.0 (typ.) |
| Surface Quality | 20–10 scratch-dig |
| Parallelism | <3 arcsec |
| Coating Type | Hard Dielectric Multilayer |
| Incident Angle | 0° ± 2° (for specified spectral performance) |
| Compliance | ISO 9001-manufactured optical components |
| Application Domain | Laboratory-based NIR, UV-Vis, and FT-NIR spectroscopy systems |
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