Bruker
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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 QUEST |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Power | 200 W (0.0002 MW) |
| Detector | PHOTON III MMPAD Hybrid Photon Counting Detector |
| Source Options | Microfocus Rotating Anode (Cu/Mo), Liquid Metal Jet (Ga/In), Dual-Target Auto-Switching |
| Software | APEX3 / PROTEUM3 |
| Compliance | ISO 17025-ready, GLP/GMP-supportive data audit trails, FDA 21 CFR Part 11 compliant modules available |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 VENTURE |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Power | 200 W (0.0002 MW) |
| Detector | PHOTON III MMPAD Hybrid Photon-Counting Detector |
| X-ray Source Options | microfocus sealed-tube (Incoatec IμS 3.0), liquid-metal-jet (MetalJet), dual-target auto-switching |
| Software | APEX4 (successor to APEX3/PROTEUM3) |
| Compliance | Fully compatible with CIF deposition standards, supports IUCr-compliant data reduction and structure refinement workflows |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dektak Pro |
| Type | Contact Stylus Profilometer |
| Operating Principle | Mechanical Stylus Scanning (Tactile Profilometry) |
| Category | Precision Geometric Measurement Instrument |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Dektak Pro |
| Measurement Repeatability | 4 Å |
| Accuracy | ±1% |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.03–15 mg |
| Scan Length | 55 mm |
| Step Height Repeatability | 4 Å |
| Vertical Resolution | 1 Å |
| Maximum Sample Size | 200 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak XT |
| Measurement Principle | Capacitive Transduction |
| Vertical Repeatability | ≤ 5 Å |
| Vertical Resolution | 1 Å |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN |
| Scan Length | 55 mm (2-inch) |
| Maximum Sample Size | 50 mm |
| Operating Temperature | 10–30 °C |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | DEKTAK XT |
| Measurement Principle | Contact Stylus Profilometry |
| Vertical Resolution | 1 Å |
| Step Height Repeatability | <4 Å |
| Vertical Measurement Range | Up to 1 mm |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN (adjustable) |
| Scan Length | 55 mm (2-inch stage travel) |
| Maximum Sample Size | 50 mm diameter |
| Accuracy | ±1% of measured value |
| Horizontal Positioning Resolution | 10 nm |
| Data Acquisition Speed | 40% faster than previous generation |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Dektak XT |
| Price Range | USD 55,000–68,000 (FOB Hamburg) |
| Vertical Measurement Repeatability | <5 Å |
| Vertical Resolution | 1 Å |
| Accuracy | ±1% of measured step height |
| Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.3–15 mg (adjustable in 0.1 mg increments) |
| Maximum Scan Length | 55 mm (2-inch stage travel) |
| Maximum Sample Diameter | 50 mm |
| Vertical Measurement Range | Up to 1 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Dektak XT-10th |
| Measurement Principle | Capacitive Probe Sensing |
| Measurement Capability | 2D Surface Topography Profiling |
| Vertical Accuracy | ±1 Å |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN |
| Scan Length | 55 mm (2 in) |
| Step Height Repeatability | < 5 Å |
| Vertical Resolution | 1 Å |
| Maximum Sample Size | 50 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak XTL |
| Price Range | USD 95,000 – 135,000 (FOB Hamburg) |
| Measurement Principle | Capacitive Transduction |
| Measurement Capability | 2D Surface Profiling (Optional 3D Reconstruction) |
| Accuracy | ±0.5% of measured step height |
| Probe Tip Radius | 50 nm – 25 µm (interchangeable stylus options) |
| Normal Force Range | 0.3 – 15 mg (motorized force control) |
| Maximum Scan Length | 55 µm (standard) |
| Step Height Repeatability | 5 Å (1σ) on 1 µm step |
| Vertical Resolution | ≤1 Å (at full 6.55 µm vertical range) |
| Maximum Sample Size | Ø300 mm (flat wafers or rectangular substrates up to 300 × 300 mm) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak XTL |
| Pricing | Available Upon Request |
| Measurement Principle | Capacitive Transduction |
| Measurement Capability | 2D Surface Topography (Optional 3D Reconstruction) |
| Accuracy | ±0.5% of measured step height |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.3–15 mg |
| Maximum Scan Length | 55 µm |
| Step Height Repeatability | 5 Å (1σ, on 1 µm step) |
| Vertical Resolution | Up to 1 Å (within 6.55 µm vertical range) |
| Maximum Sample Size | 300 mm diameter |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension Edge |
| Instrument Type | Material-Focused AFM |
| Positioning Noise | X-Y ≤ 50 pm RMS, Z ≤ 50 pm RMS |
| Sample Diameter | 150 mm (vacuum chuck), Thickness: ≤ 15 mm |
| Scan Area | 150 mm × 150 mm |
| Imaging Bandwidth | Typical high-speed acquisition capability |
| Category | Scanning Probe Microscope (SPM) / Atomic Force Microscope (AFM) |
| Brand | Bruker |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Dimension Edge |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Positional Noise (X-Y, Closed-Loop) | ≤0.15 nm RMS at standard imaging bandwidth (up to 625 Hz) |
| Z-Noise (Closed-Loop) | 35 pm RMS at standard imaging bandwidth (up to 625 Hz) |
| Sample Diameter Capacity | 210 mm |
| XY Stage Travel Range | 150 mm × 150 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Dimension FastScan |
| Instrument Type | Materials-Focused AFM |
| Position Detection Noise | X-Y ≤ 0.15 nm RMS, Z = 35 pm RMS |
| Typical Imaging Bandwidth | Up to 625 Hz |
| Sample Diameter | 210 mm (vacuum chuck), Max Thickness: ≤ 15 mm |
| Stage Travel Range | 180 mm × 150 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Dimension FastScan |
| Instrument Type | Materials-Focused AFM |
| XY Positioning Noise | ≤0.15 nm |
| Sample Dimensions | Ø ≤ 15 mm, Thickness ≤ 5 mm |
| Stage Travel Range | 180 mm × 180 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Icon |
| Price Range | USD 135,000 – 205,000 (est.) |
| Instrument Type | Atomic Force Microscope |
| Application Class | Materials Science AFM |
| Position Detection Noise | <0.15 nm RMS (at typical imaging bandwidth up to 625 Hz) |
| Sample Diameter | Up to 210 mm |
| Sample Thickness Limit | ≤5 mm |
| XY Stage Travel Range | 180 mm × 150 mm |
| XY Repeatability | 2 µm (unidirectional), 3 µm (bidirectional) |
| Brand | Bruker |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Icon |
| Instrument Type | Atomic Force Microscope |
| X-Y Positioning Noise (Closed-Loop) | ≤0.15 nm RMS (Standard Imaging Bandwidth, up to 625 Hz) |
| Z Positioning Noise (Closed-Loop) | 35 pm RMS (Standard Imaging Bandwidth, up to 625 Hz) |
| Maximum Sample Diameter | 210 mm |
| Sample Stage Travel Range | 150 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension Icon |
| Instrument Type | Atomic Force Microscope (AFM) |
| Vertical Noise Floor (Z-sensor, closed-loop) | <35 pm RMS |
| Typical Imaging Bandwidth | 625 Hz |
| Sample Stage | 210 mm vacuum chuck (Ø210 mm × 15 mm thick) |
| Stage Travel Range (X-Y visual field) | 180 mm × 180 mm |
| X-Y Scan Range (typical) | 90 µm × 90 µm |
| Z Scan Range (typical) | 10 µm |
| X-Y Positioning Noise (closed-loop) | <0.15 nm RMS (625 Hz) |
| Z Sensor Noise (closed-loop) | <35 pm RMS (625 Hz) |
| Overall Linearity Error (X-Y-Z) | 0.5% (typical) |
| Optical System | 5 MP digital camera, 180–1465 µm field of view, digital zoom & auto-focus |
| Controller | NanoScope V |
| Integrated Vibration Isolation | Monolithic pneumatic isolation table |
| Acoustic Enclosure | Rated for continuous ambient noise up to 85 dBC |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension IconIR |
| Type | Modular Scanning Probe Microscope (SPM) with Integrated AFM-IR |
| Measurement Principle | Photothermal Induced Resonance (PTIR) / Nanoscale Fourier Transform Infrared (nano-FTIR) |
| Spatial Resolution | <10 nm |
| Sensitivity | Monolayer-level chemical detection |
| Compatibility | PeakForce Tapping® for nanomechanical & nanoelectrical correlative mapping |
| Software Platform | NanoScope Analysis with IR spectral library integration |
| Compliance | Supports GLP/GMP audit trails, ASTM E2987 (for nanoscale spectroscopic imaging), ISO/IEC 17025 traceability frameworks |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Nexus |
| Instrument Type | Atomic Force Microscope |
| Application Class | Materials Science AFM |
| Architecture | Modular, Multi-Mode Scanning Probe Microscope |
| Controller Platform | NanoScope 6 |
| Core Imaging Modes | PeakForce Tapping®, PeakForce QNM®, PeakForce MFM®, ScanAsyst® Auto-Optimization |
| Environmental Operation | Air, Liquid, Controlled Atmosphere |
| Brand | Bruker |
|---|---|
| Origin | Switzerland |
| Model | DNP-NMR |
| Field Strength Options | 263 GHz / 395 GHz (corresponding to ~9.4 T and ~14.1 T for ¹H, respectively) |
| Sample Type | Solid-state and semi-solid biological macromolecules |
| Operating Temperature | ~100 K |
| Microwave Power Source | High-power gyrotron |
| Sensitivity Enhancement | 20–80× over conventional ssNMR |
| Probe Type | Cryogenic Magic Angle Spinning (MAS) probe |
| Compliance | Designed for GLP/GMP-aligned workflows with audit-trail-capable data acquisition |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | QUANTAX ED-XS |
| CCD Camera Resolution | 640 × 480 pixels |
| Maximum Stage Speed | 10 mm/s |
| Spatial Resolution | 50 nm |
| Angular Resolution | 0.2° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Continuous-Wave (CW) EPR |
| Magnet System | Permanent Magnet |
| Cooling | Air-Cooled (No Water Required) |
| Form Factor | Benchtop |
| Automation Level | Fully Automated Tuning, Data Acquisition & Analysis |
| Application-Specific Configurations | e-scan A (Radiation Dosimetry), e-scan B (Beer Freshness QC), e-scan F (Food Irradiation Verification), e-scan M (Stable Radical & Spin Adduct Detection, e.g., ROS/RNS) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Time-of-Flight (TOF) |
| Configuration | Dual-Source GC-MS (EI + CI) |
| Ionization Modes | Electron Ionization (EI) and Chemical Ionization (CI) with Helical Resonant Plasma (HRP) source |
| Resolution | >40,000 FWHM (m/z 200) |
| Mass Accuracy | <1 ppm RMS (calibrated) |
| Scan Rate | Up to 50 spectra/sec (full-spectrum, high-res) |
| CI Reagent Gases | N₂H⁺, H₃O⁺, H(H₂O)ₙ⁺, NH₄⁺ (software-switchable, no hardware intervention) |
| Compliance | Fully compatible with GLP/GMP workflows |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | OPTIMUS 2 QUANTAX EBSD eflash FS |
| CCD Camera Resolution | 640 × 480 |
| Maximum Stage Speed | 10 mm/s |
| Spatial Resolution | 1.5 nm |
| Angular Resolution | 0.2° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | ELEXSYS II |
| Pricing | Upon Request |
| Instrument Type | Continuous-Wave (CW) |
| Frequency Range Capability | 1 GHz to 263 GHz (CW and/or FT modes) |
| Optional Modules | DICE-II ENDOR, EPR Imaging, Pulsed FT-EPR, Multi-Frequency Resonators |
| Software Architecture | Open, Network-Enabled Client/Server Platform |
| Compliance Framework | Designed for GLP/GMP-aligned workflows |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ELIO |
| Application | Portable/Field-Deployable |
| Element Range | Na–U |
| Detection Range | ppm to wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Large-Area Silicon Drift Detector (SDD) with CUBE Technology |
| Excitation Source | 50 kV Microfocus X-ray Tube |
| Spot Size | 1 mm (laser-guided) |
| Weight (Measurement Head) | 2.1 kg |
| Compliance | CE, RoHS, IEC 61000-6-3 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ELIO |
| Portability | Handheld/Portable |
| Application Field | Geology & Mining |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Large-Area Silicon Drift Detector (SDD) |
| X-ray Source | 50 kV Microfocus Tube |
| Excitation Geometry | Close-Proximity Non-Contact |
| Spot Localization | 1 mm Laser Crosshair + Integrated CMOS Camera |
| Motion Control | Motorized XY Stage (Optional) |
| Form Factor | Compact Tripod-Mounted Measurement Head (2.1 kg) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | EM27/SUN |
| Spectral Range (NIR) | 5000–14500 cm⁻¹ |
| Spectral Range (MIR) | 750–5200 cm⁻¹ |
| Spectral Resolution (MIR, optional) | 0.2 cm⁻¹ (standard: 0.5 cm⁻¹) |
| Application | Ground-based solar absorption spectroscopy for atmospheric trace gas monitoring |
| Compliance | Designed for field-deployable, long-term unattended operation in remote environments |
| Software Interface | Integrated CAMTracker solar tracking control with real-time alignment feedback |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | EMXplus, EMXmicro |
| Instrument Type | Continuous-Wave (CW) EPR |
| Configuration | Benchtop, Integrated Digital Architecture |
| Control Interface | Ethernet-connected, WinEPR Software Platform |
| Magnetic Field Resolution | 18-bit digital |
| Signal Digitization | 18-bit ADC |
| Microwave Bridge | Next-generation EMXplusX™ |
| Detection Modes | Simultaneous dual-phase (0° & 90° modulation), 1st- and 2nd-harmonic detection |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Product Type | Imported Software for Electron Microscopy |
| Model | ESPRIT 2 |
| Price Range | USD 25,000 – 65,000 |