Bruker
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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | High-Field NMR Spectrometer Software Module |
| Sample Compatibility | Solid and Liquid Samples (Unified Workflow) |
| Sensitivity | Signal-to-Noise Ratio (SNR)-Driven Analysis Validation |
| Resolution | Linewidth-Based Spectral Fidelity Assessment |
| Deployment | Native Integration with Bruker TopSpin™ and IconNMR™ Platforms |
| Regulatory Alignment | Supports GLP/GMP Documentation Requirements, FDA 21 CFR Part 11 Compliant Audit Trail (Optional Configuration) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | compact |
| Instrument Type | Quadrupole-Time-of-Flight (QTOF) |
| Application Scope | Universal LC-MS/MS Platform |
| Key Specifications | 50 GBit/sec acquisition rate |
| Resolution | Ultra-High Resolution TOF (UHR-TOF) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Contour Elite |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White-light Interferometry (WLI) based on proprietary Wyko® technology |
| Software Platform | Vision64® |
| Configuration Options | Contour Elite K (benchtop, enhanced stability), Contour Elite I (fully automated benchtop with integrated vibration isolation), Contour Elite X (floor-standing configuration with active or passive vibration isolation platform) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-I |
| Pricing | Available Upon Request |
| Type | Non-Contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-X |
| Pricing | Upon Request |
| Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Interface | VisionXpress™ and Vision64® software platforms |
| Vibration Isolation | Integrated passive damping architecture |
| Z-axis Resolution | Sub-nanometer (independent of magnification) |
| Field of View | Maximum standard FOV among benchtop WLI systems |
| Surface Reflectivity Range | 0.05% to 100% |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Field of View | Standard large FOV |
| Z-Axis Resolution | Magnification-independent |
| Vibration Isolation | Integrated high-stability passive isolation |
| Software Interface | Intuitive graphical user interface with pre-configured filters and analysis modules |
| Measurement Mode | Full-field 2D/3D topographic mapping |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-1000 |
| Type | Non-contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Principle | White Light Interferometry (WLI) |
| Optical Head | Motorized Tilt & Pitch Adjustment |
| Illumination | Dual-source (broadband white light) |
| Automation | Auto-focus, Auto-surface detection (Advanced Find Surface™), Adaptive USI mode |
| Calibration | Integrated self-calibrating laser reference |
| Vibration Isolation | Built-in active/passive vibration isolation platform |
| Software | VisionXpress™ with guided workflows and ISO-compliant analysis modules |
| Compliance | Fully supports ISO 25178 (areal surface texture), ISO 4287/4288 (profile roughness), ASTM E2926, and GLP/GMP data integrity requirements |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Measurement Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| XY Stage | Motorized |
| Z-Axis Resolution | Sub-nanometer |
| Field of View | Large, Magnification-Independent |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Software Platform | VisionXpress™ and Vision64 |
| Surface Reflectivity Range | 0.05% – 100% |
| Sensor Array | 1200 × 1000 pixels |
| Measurement Mode | Universal Scanning Interferometry (USI) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-200 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Field of View | Standard Large FOV |
| Z-Axis Resolution | Sub-nanometer |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Software Platform | Vision64® and VisionXpress™ |
| Motion Control | Motorized XY Stage |
| Surface Reflectivity Range | 0.05% – 100% |
| Application Scope | Precision Machined Surfaces, Thin Films, Semiconductors, Ophthalmic Lenses, Medical Devices, MEMS, Tribology |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White Light Interferometry (WLI) |
| Vertical Resolution | Sub-nanometer (typical < 0.1 nm RMS noise) |
| Lateral Resolution | Diffraction-limited, dependent on objective magnification (e.g., 0.49 µm at 50×) |
| Camera | 5 MP high-speed CMOS sensor |
| Stage | Motorized XY stage with 100 mm × 100 mm travel |
| Field of View | Up to 4.8 mm × 3.6 mm (with 2.5× objective), scalable via 5×–100× objectives |
| Compliance | Fully supports ISO 25178-2, ISO 4287, ASME B46.1, and NIST-traceable calibration protocols |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | ContourX-500 |
| Pricing | Upon Request |
| Instrument Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Key Features | Encoder-equipped XY stage, motorized auto-tilting optical head, auto-brightness adjustment, USI universal scanning mode, pneumatic vibration isolation base, magnification-independent Z-resolution |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-500 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Automation Features | Motorized XY Stage with Encoders, Programmable Auto-Tilt Optical Head, Auto-Brightness Control, Pneumatic Vibration Isolation Base |
| Software Platform | VisionXpress™ and Vision64® |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | CRONO |
| Application | Portable/Field-Deployable |
| Element Range | Na–U |
| Excitation Source | 50 kV / 100 µA X-ray Tube |
| Spot Size | 2 mm Diameter |
| Scan Speed | 20 mm/s |
| Measurement Distance | 1 cm (non-contact) |
| Detector | Silicon Drift Detector (SDD) |
| Spatial Coverage | Up to 60 cm × 45 cm |
| Energy Resolution | ≤130 eV at Mn Kα |
| Repeatability (RSD) | ≤0.1% for major elements |
| Front-End Electronics | CUBE CMOS preamplifier + DANTE digital pulse processor |
| Software | CRONO Control & Mapping Suite with real-time spectral visualization, pixel-wise spectrum storage, and automated PDF reporting |
| Brand | Bruker |
|---|---|
| Model | CryoProbe |
| Origin | Imported |
| Cooling Principle | Closed-cycle helium refrigeration (Gifford-McMahon cryocooler) |
| Operating Temperature | ~20 K (probe coil), ~25 K (preamp) |
| Signal-to-Noise (S/N) Gain | Up to 4× vs. room-temperature probes |
| Compatible Systems | Bruker AVANCE III/IV NMR platforms |
| Probe Configurations | Dual-tuned (e.g., ¹H/¹³C), triple-resonance (e.g., ¹H/¹³C/¹⁵N), with ²H lock and Z-gradient capability |
| Compliance | Designed for GLP/GMP-compliant labs |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CryoSAS |
| Instrument Type | Laboratory FTIR Spectrometer |
| Wavenumber Range | 280–1500 cm⁻¹ |
| Cooling Method | Closed-Cycle Cryocooler (No Liquid Helium Required) |
| Detection Temperature | <15 K |
| Compliance | ASTM/SEMI MF1630 (B, P), ASTM/SEMI MF1391 (C, O) |
| Sensitivity | Boron/Phosphorus down to ppta |
| Vacuum System | Dual-Stage (Mechanical + Turbo Molecular Pump) |
| Sample Capacity | 9-Position Precision Stepper Motor Stage |
| Sample Holder | Gold-Plated OFHC Copper for Thermal Uniformity |
| Software | Dedicated Industrial QC Interface with Touchscreen Control & Automated Reporting |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CTX |
| Application | Portable/Benchtop |
| Industry Type | General-Purpose |
| Elemental Range | Mg to U |
| Quantification Range | ppm to % |
| Energy Resolution | 145 eV |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | CTX |
| Form Factor | Portable Benchtop |
| Elemental Range | Mg–U (standard), Ti–U (optimized), Cl–U (liquid/powder mode) |
| Energy Resolution | 145 eV (at Mn Kα) |
| Detector | Silicon Drift Detector (SDD) |
| Operating Temperature | –10 °C to +40 °C |
| Safety Features | Dual Interlock System, Visual Status Indicators (Amber/Red LEDs), Sample Presence Sensor, Password Protection, Pre-Start Radiation Alert |
| Power Options | Rechargeable Li-ion battery or 110/220 VAC adapter |
| Compliance | Designed for IEC 61010-1, IEC 62471, and aligned with ALARA principles for radiation safety |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CTX Portable Benchtop XRF Analyzer |
| Application Mode | Benchtop/Portable |
| Industry Type | General-Purpose |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability (RSD) | ≤0.1% |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | CTX |
| Application | Handheld/Portable Elemental Analysis |
| Element Range | Mg–U (standard), Cl–U (optimized for cosmetics), Ti–U (heavy metals focus) |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Silicon Drift Detector (SDD) |
| Operating Temperature | −10 °C to +40 °C |
| Sample Forms | Solids, powders, liquids, pastes, creams, gels, tablets |
| Regulatory Compliance | ASTM E2857, ISO 12885, USP <232>/<233>, FDA 21 CFR Part 11 (software-enabled), GLP/GMP-ready audit trail |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CTX |
| Application | Benchtop Portable ED-XRF |
| Industry Use | General Purpose |
| Elemental Range | Mg–U (standard), Ti–U (optimized), Cl–U (optional) |
| Operating Temperature | –10 °C to +40 °C (14 °F to 104 °F) |
| Energy Resolution | ≤145 eV at Mn Kα |
| Detector | Silicon Drift Detector (SDD) |
| Safety Features | Dual Interlock System, Visual Status Indicators (Amber/Red LEDs), Sample Presence Sensor, Password Protection, Pre-Operation Radiation Alert, Rear-Mounted Power Switch |
| Power Supply | Rechargeable Li-ion Battery or 110/220 VAC Adapter |
| Beam Geometry | SharpBeam™ Optimized Collimation |
| Detector Protection | TITAN DetectorShield™ |
| Sample Handling | Sealed Sample Tray, Compatible with Cups, Bags, and Custom Containers |
| Calibration | Factory-Preloaded Application-Specific Methods (Food Safety, Soil Health, Alloy ID, Fuel Sulfur, Precious Metals, Geochemistry) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | CUBE |
| Form Factor | Monolithic ASIC |
| Operating Modes | Pulse-reset and continuous-reset (externally configurable) |
| Input Capacitance Options | Multiple variants available (e.g., 0.1–5 pF range) |
| Power Consumption | 6–60 mW (configurable per variant) |
| Rise Time (detectorless) | 7 ns |
| Die Dimensions | 750 µm × 750 µm × 250 µm |
| Output Drive Capability | Low-impedance, suitable for long interconnects |
| Target Detectors | Silicon Drift Detectors (SDD), PIN diodes, Si(Li), CdTe, CZT, and other solid-state radiation sensors |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D6 PHASER |
| Instrument Type | Powder X-ray Diffractometer |
| Generator Power | 600 W or 1200 W |
| 2θ Calibration Accuracy | ±0.01° |
| Detector | LYNXEYE XE-T Energy-Resolving Detector |
| Beam Optimization | Dynamic Beam Optimization (DBO) |
| Cooling | Air-Cooled (No External Water Chiller Required) |
| Footprint | Compact Benchtop Design |
| Measurement Geometries | Bragg–Brentano Reflection, Transmission, Grazing-Incidence XRD (GIXRD), X-ray Reflectivity (XRR), Residual Stress Analysis, Texture Analysis |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D6 PHASER |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| Power Options | 540 W / 600 W / 1.2 kW |
| Angular Accuracy | ±0.01° (2θ) |
| Angular Resolution | 0.01° |
| Detector | LYNXEYE XE-T Energy-Resolving Detector |
| Beam Geometry | Reflective & Transmission, Grazing Incidence (GID), X-ray Reflectivity (XRR), Stress & Texture Analysis |
| Automation | Motorized Sample Changer, Conveyor Interface, Dynamic Beam Optimization (DBO) |
| Software Suite | DIFFRAC.SUITE (MEASUREMENT CENTER, EVA), COD Database Integration |
| Compliance | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | D8 ADVANCE |
| Instrument Type | Powder X-ray Diffractometer |
| Power | 0.0001° angular resolution |
| 2θ Range | −110° to +168° |
| X-ray Tube Targets | Cr / Co / Cu (standard-size) |
| Detector Options | LYNXEYE Array Detector, LYNXEYE XE-T Energy-Dispersive Detector |
| Dimensions | 1868 × 1300 × 1135 mm |
| Weight | 770 kg |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 ADVANCE |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Options | 1 kW (ECO) or 3 kW |
| Angular Accuracy | ±0.01° (2θ) |
| Angular Resolution | 0.01° (2θ) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 DISCOVER |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Configuration | Floor-Standing |
| X-ray Power | 5.4 kW |
| Angular Accuracy | ±0.01° |
| Angular Resolution | 0.01° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 DISCOVER |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | 0.0001 kW |
| Compliance | Fully Compliant with ISO 17025, ASTM E975, and IEC 61000-6-3 for Electromagnetic Compatibility |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Powder X-ray Diffractometer |
| Model | D8 ENDEAVOR |
| Detector | LYNXEYE XE-T Energy-Resolving Array Detector |
| Sample Handling | 66-position or 72-position automated sample changer (Ø 51.5 mm and Ø 40 mm formats) |
| Automation Modes | Belt-driven or robotic integration |
| Compliance | Designed for GLP/GMP environments with audit-trail-ready software architecture |
| Regulatory Context | Fully compatible with FDA 21 CFR Part 11–compliant data management workflows |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 ENDEAVOR |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Options | 1 kW (ECO) / 3 kW |
| Angular Accuracy | ±0.01° |
| Angular Resolution | 0.01° |