Energy Dispersive X-Ray Fluorescence Spectrometer
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| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | TrueX 800 |
| Application | Handheld / Portable |
| Instrument Type | Conventional EDXRF |
| Industry-Specific Use | Non-Ferrous & Ferrous Alloys |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD for major elements |
| Detector | Si-PIN Semiconductor Detector |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | TrueX 900 |
| Price Range | USD $14,000–$42,000 |
| Application | Handheld/Portable |
| Instrument Type | Conventional EDXRF |
| Industry-Specific Use | Geological & Mineral Exploration |
| Elemental Range | Mg (12) to U (92) |
| Detection Limit | ppm-level quantification |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | TrueX 960 |
| Application | Handheld / Portable |
| Instrument Type | Conventional |
| Industry Use | General-Purpose |
| Elemental Range | Mg to U |
| Quantitative Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV |
| Repeatability | 0.1% |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | TrueX800 |
| Application | Handheld / Portable |
| Instrument Type | Standard EDXRF |
| Industry Use | General-Purpose |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV |
| Repeatability | ±0.1% RSD |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Total Reflection XRF (TXRF) |
| Configuration | Portable / Field-Deployable |
| Sample Forms | Liquids, Suspensions, Solid Thin Films, Particulates |
| Primary Application Domains | Environmental Monitoring (Soil & Atmospheric Aerosols), Regulatory Compliance Screening, Trace Element Analysis |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | TX3000 |
| Application | Field-Portable |
| Instrument Type | Total Reflection X-Ray Fluorescence (TXRF) |
| Industry-Specific Use | Soil & Atmospheric Analysis |
| Sample Forms | Liquid, Suspension, Solid, Particulate Deposits |
| Detection Principle | Grazing-Incidence Excitation with Multilayer Monochromator |
| Key Elements | Cr, Pb, As, Cd, Hg, Ni, Cu, Zn (expandable to ~30 elements) |
| Minimum Sample Volume | <10 µL (liquid) or <100 ng (solid deposit) |
| Detection Limits | Sub-pg to low-pg range for most metals (e.g., 0.1–5 pg for transition metals under optimized conditions) |
| Radiation Safety | Compliant with GBZ 126–2011 and IEC 62495 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | TX3000 |
| Application | Field-Portable |
| Instrument Type | Total-Reflection X-Ray Fluorescence (TXRF) |
| Industry-Specific Use | Soil & Atmospheric Environmental Monitoring |
| Sample Form Compatibility | Liquid, Suspension, Solid, Filter-Collected Particulates |
| Detection Principle | Grazing-Incidence Excitation with Multilayer Monochromator and Silicon Drift Detector (SDD) |
| Key Performance | Sub-pg Absolute Detection Limits for Heavy Metals (e.g., Cr, Pb, As, Cd, Hg, Ni, Cu, Zn), Simultaneous Multi-Element Quantification (up to 30 elements), Minimal Sample Requirement (<10 µL liquid or <1 mg solid) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | PeDX OIL+ / PeDX OIL C3 |
| Form Factor | Handheld / Portable |
| Instrument Type | Benchtop-Portable Hybrid EDXRF Spectrometer |
| Industry-Specific Design | Petroleum & Lubricants Quality Control |
| Compliance | ASTM D4294–22, ISO 8754:2003, IP 561, EN ISO 20884:2020 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | ScopeX 800 |
| Configuration | Benchtop (non-vacuum) |
| Detector | High-resolution silicon drift detector (SDD), Peltier-cooled |
| Software | LANScientific XRF Analysis Suite v3.2 |
| Compliance | GB18871-2002, GBZ115-2002 |
| Sample Chamber | Sealed metal enclosure with interlocked safety shutter |
| Analysis Modes | Fundamental Parameters (FP), Calibration Curve, Empirical Matrix Correction |
| Report Export | PDF, Excel, CSV, XML |
| User Management | Role-based access control (Admin, Operator, Viewer) |
| Data Audit Trail | GLP-compliant timestamped logs |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | ScopeX 980 |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Detector | High-Resolution Silicon Drift Detector (SDD), Peltier-cooled, <125 eV Mn-Kα resolution |
| Excitation Source | Rhodium-target micro-focus X-ray tube, adjustable voltage (up to 50 kV) and current (up to 1 mA) |
| Safety Compliance | GB18871-2002, GBZ115-2002 |
| Software | LANScientific XRF Analysis Suite v4.2 with FP + Calibration Curve quantification engines |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX G59 |
| Form Factor | Benchtop / Floor-Standing |
| Instrument Type | Conventional ED-XRF Spectrometer |
| Industry-Specific Use | Non-Ferrous Metals & Precious Metals |
| Elemental Range | Na (11) – U (92) |
| Detection Limit for Ag/Cu | ≤10 ppm |
| Quantitative Accuracy | ±0.001% for Au (i.e., 99.999 wt% Au with 10 ppm total impurities) |
| Analysis Time | 5–120 s per measurement |
| Detector | Large-Area Silicon Drift Detector (SDD) |
| Excitation Source | Rhodium (Rh) anode X-ray tube |
| Software | LANScientific XRF Analysis Suite (FP + Calibration Curve hybrid quantification) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | TrueX 1000 |
| Application | Field-Portable |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Use | Cultural Heritage & Archaeological Science |
| Elemental Range | Mg (12) to U (92) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ARTAX |
| Element Range | Na (11) – U (92) |
| Detection Limit | Down to 11Na with He purge |
| Energy Resolution | ≤165 eV at Mn Kα (100 kcps) |
| Spatial Resolution | ≤70 µm |
| Repeatability | ±10 µm |
| Detector | XFlash® Silicon Drift Detector (SDD), Peltier-cooled |
| Excitation | Low-power microfocus X-ray tube with interchangeable anodes & polycapillary optics |
| Sample Stage | Motorized XYZ positioning system with collision protection |
| Operating Mode | Benchtop / Field-deployable |
| Compliance | CE, IEC 61010-1, EN 62471 (UV/IR/X-ray safety) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | CRONO |
| Application | Portable/Field-Deployable |
| Element Range | Na–U |
| Excitation Source | 50 kV / 100 µA X-ray Tube |
| Spot Size | 2 mm Diameter |
| Scan Speed | 20 mm/s |
| Measurement Distance | 1 cm (non-contact) |
| Detector | Silicon Drift Detector (SDD) |
| Spatial Coverage | Up to 60 cm × 45 cm |
| Energy Resolution | ≤130 eV at Mn Kα |
| Repeatability (RSD) | ≤0.1% for major elements |
| Front-End Electronics | CUBE CMOS preamplifier + DANTE digital pulse processor |
| Software | CRONO Control & Mapping Suite with real-time spectral visualization, pixel-wise spectrum storage, and automated PDF reporting |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CTX |
| Application | Portable/Benchtop |
| Industry Type | General-Purpose |
| Elemental Range | Mg to U |
| Quantification Range | ppm to % |
| Energy Resolution | 145 eV |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | CTX |
| Form Factor | Portable Benchtop |
| Elemental Range | Mg–U (standard), Ti–U (optimized), Cl–U (liquid/powder mode) |
| Energy Resolution | 145 eV (at Mn Kα) |
| Detector | Silicon Drift Detector (SDD) |
| Operating Temperature | –10 °C to +40 °C |
| Safety Features | Dual Interlock System, Visual Status Indicators (Amber/Red LEDs), Sample Presence Sensor, Password Protection, Pre-Start Radiation Alert |
| Power Options | Rechargeable Li-ion battery or 110/220 VAC adapter |
| Compliance | Designed for IEC 61010-1, IEC 62471, and aligned with ALARA principles for radiation safety |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CTX Portable Benchtop XRF Analyzer |
| Application Mode | Benchtop/Portable |
| Industry Type | General-Purpose |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability (RSD) | ≤0.1% |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | CTX |
| Application | Handheld/Portable Elemental Analysis |
| Element Range | Mg–U (standard), Cl–U (optimized for cosmetics), Ti–U (heavy metals focus) |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Silicon Drift Detector (SDD) |
| Operating Temperature | −10 °C to +40 °C |
| Sample Forms | Solids, powders, liquids, pastes, creams, gels, tablets |
| Regulatory Compliance | ASTM E2857, ISO 12885, USP <232>/<233>, FDA 21 CFR Part 11 (software-enabled), GLP/GMP-ready audit trail |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CTX |
| Application | Benchtop Portable ED-XRF |
| Industry Use | General Purpose |
| Elemental Range | Mg–U (standard), Ti–U (optimized), Cl–U (optional) |
| Operating Temperature | –10 °C to +40 °C (14 °F to 104 °F) |
| Energy Resolution | ≤145 eV at Mn Kα |
| Detector | Silicon Drift Detector (SDD) |
| Safety Features | Dual Interlock System, Visual Status Indicators (Amber/Red LEDs), Sample Presence Sensor, Password Protection, Pre-Operation Radiation Alert, Rear-Mounted Power Switch |
| Power Supply | Rechargeable Li-ion Battery or 110/220 VAC Adapter |
| Beam Geometry | SharpBeam™ Optimized Collimation |
| Detector Protection | TITAN DetectorShield™ |
| Sample Handling | Sealed Sample Tray, Compatible with Cups, Bags, and Custom Containers |
| Calibration | Factory-Preloaded Application-Specific Methods (Food Safety, Soil Health, Alloy ID, Fuel Sulfur, Precious Metals, Geochemistry) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ELIO |
| Application | Portable/Field-Deployable |
| Element Range | Na–U |
| Detection Range | ppm to wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Large-Area Silicon Drift Detector (SDD) with CUBE Technology |
| Excitation Source | 50 kV Microfocus X-ray Tube |
| Spot Size | 1 mm (laser-guided) |
| Weight (Measurement Head) | 2.1 kg |
| Compliance | CE, RoHS, IEC 61000-6-3 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ELIO |
| Portability | Handheld/Portable |
| Application Field | Geology & Mining |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Large-Area Silicon Drift Detector (SDD) |
| X-ray Source | 50 kV Microfocus Tube |
| Excitation Geometry | Close-Proximity Non-Contact |
| Spot Localization | 1 mm Laser Crosshair + Integrated CMOS Camera |
| Motion Control | Motorized XY Stage (Optional) |
| Form Factor | Compact Tripod-Mounted Measurement Head (2.1 kg) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Configuration | Benchtop/Floor-Standing |
| Application Type | General-Purpose |
| Elemental Range | Mg to U |
| Quantitative Detection Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Silicon Drift Detector (SDD) |
| Excitation | Dual X-ray Tube Option + Up to 6 Automatic Filter Positions |
| Optics | Polycapillary Focusing Lens |
| Sample Stage | Motorized X-Y-Z with Turbo-Drive |
| Imaging | Integrated Zoom Camera for Real-Time Sample Navigation |
| Vacuum Capability | Full Sample Chamber Evacuation |
| Quantification Method | Fundamental Parameters (FP)-Based Calibration-Free Analysis |
| Compliance | Fully Compatible with ISO 17025 Laboratory Practices, Supports Audit-Ready Data Logging per GLP/GMP Requirements |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | M4 TORNADO |
| Form Factor | Benchtop/Floor-Standing |
| Application Sector | Geology & Mining |
| Elemental Range | Na–U |
| Detection Range | ppm to wt% |
| Energy Resolution | ≤130 eV at Mn Kα |
| Excitation | Dual X-ray Tube (Cr & Rh) + 6-Position Filter Wheel |
| Detector | Silicon Drift Detector (XFlash®) |
| Spatial Resolution | <25 µm (spot size) |
| Sample Chamber | Vacuum-Compatible, Motorized XYZ Stage with Zoom Camera Navigation |
| Quantification | Standardless Bulk & Multilayer Analysis |
| Compliance | CE, RoHS, ISO/IEC 17025-ready workflow support |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Configuration | Benchtop/Floor-standing |
| Elemental Range | Na–U |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Silicon Drift Detector (SDD) |
| Compliance | CE, RoHS, IEC 61000-6-3/6-4 |
| Sample Chamber Dimensions | 300 × 300 × 150 mm (W×D×H) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Configuration | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability (RSD) | ≤0.1% |
| Detector | Silicon Drift Detector (SDD) |
| Spot Size | Adjustable down to ~25 µm |
| Excitation Source | Rh anode microfocus X-ray tube |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Configuration | Benchtop/Floor-Standing |
| Element Range | Mg–U |
| Detection Limit | 1 ppm |
| Quantitative Range | 0.0001–99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα |
| Repeatability (RSD) | ≤0.1% |
| Detector | Silicon Drift Detector (SDD) |
| Excitation | Dual X-ray Tube Option with Up to 6 Automatic Filter Positions |
| Optics | Polycapillary Focusing Lens |
| Sample Stage | Motorized X-Y-Z with Turbo Drive |
| Imaging Mode | Real-time Elemental Mapping “On-the-Fly” |
| Vacuum Capability | Integrated Vacuum Chamber |
| Quantification Method | Fundamental Parameters (FP) Algorithm without Standards |
| Compliance | Fully Compatible with ISO 17025, ASTM E1621, and USP <233> for Elemental Impurities |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | M4 TORNADO PLUS |
| Configuration | Benchtop |
| Element Range | C–U (Z = 6–92) |
| Energy Resolution | <140 eV |
| Detector | Dual Large-Area Silicon Drift Detectors (SDD) with Light-Element Windows |
| X-ray Source | Rh-target Microfocus Tube |
| Aperture Management System (AMS) | Integrated |
| Sample Compatibility | Flat & Topographically Irregular Surfaces |
| Compliance | ASTM E1598, ISO 22073, IEC 62471 (LED/X-ray Safety), GLP/GMP-Ready Data Audit Trail |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | M4 TORNADO PLUS |
| Configuration | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | C (Z=6) to Am (Z=95) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Silicon Drift Detector (SDD) |
| Compliance | CE, RoHS, IEC 61000-4 series |
| Safety | IEC 62471 (LED/X-ray emission), EN 61326-1 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | M6 JETSTREAM |
| Configuration | Benchtop/Floor-Standing |
| Application Field | Geological & Mineralogical Analysis |
| Elemental Range | Na (11) – U (92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Silicon Drift Detector (SDD) |
| Sample Orientation | Vertical or Horizontal (motorized stage with collision avoidance) |
| Spot Size Adjustment | 5 discrete steps (25–400 µm) |
| Mobility | Modular disassembly into four transportable units |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | M6 JETSTREAM |
| Configuration | Benchtop/Floor-Standing |
| Application Type | General Purpose |
| Elemental Range | Na–U |
| Quantification Range | ppm to wt% |
| Energy Resolution | <140 eV |
| Detector | XFlash® Silicon Drift Detector (SDD) |
| Sample Orientation | Horizontal & Vertical |
| Spot Size Adjustment | 5-step variable microfocus |
| Safety | Integrated X-ray interlock & ultrasonic collision avoidance |
| Portability | Modular design—disassembles into four transportable components |
| Compliance | Designed per IEC 61000-6-3, IEC 61000-6-4, and EN 62471 for radiation safety and EMC |