IC Test & Handler Equipment
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Showing 31–49 of 49 results
| Brand | Lake Shore |
|---|---|
| Origin | USA |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | Custom |
| Pricing | Upon Request |
| Brand | Lake Shore |
|---|---|
| Origin | USA |
| Model | EMPX-H2 |
| Temperature Range | 3.2 K to 400 K |
| Magnetic Field | ±0.6 T (horizontal, in-plane) |
| Maximum Sample Diameter | 25.4 mm (1") |
| Magnetic Uniformity | 0.6% over Ø10 mm, 2.6% over Ø25 mm |
| Probe Position Stability | <5 µm across full field sweep |
| Vacuum Base Pressure | <1 × 10⁻⁵ Torr |
| Cooling Method | Continuous-flow cryogen (liquid He or N₂) |
| Sample Rotation | Optional 360° (PS-360-EMPX) |
| Probe Arms | Up to 4 |
| Microwave Frequency Support | DC–67 GHz |
| Electrical Isolation | >100 GΩ |
| Optical Integration | Fiber-coupled electro-optic measurement capability |
| Brand | Lake Shore |
|---|---|
| Origin | USA |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | FWPX |
| Pricing | Upon Request |
| Brand | Lake Shore |
|---|---|
| Origin | USA |
| Model | PS-100 |
| Temperature Range | 4.2 K to 475 K (standard), down to 3.2 K with PS-LT option |
| Sample Diameter | up to 32 mm (1.25 in) |
| Vacuum Base Pressure | <1 × 10⁻⁵ Torr |
| Vibration | <300 nm (standard), <30 nm with PS-PVIS option |
| Probe Arms | up to 4 |
| Cooling Method | Continuous-flow liquid helium or liquid nitrogen |
| Thermal Stability | ±15 mK typical at 4.4–100 K (liquid helium) |
| Electrical Isolation | >100 GΩ |
| RF/Microwave Capability | DC–67 GHz (with optional microwave probes) |
| Optical Access | Fiber-optic probe compatibility for electro-optical measurements |
| Drop-in Area | 25.4 mm diameter circular zone |
| Thermal Sinking | Probe arms actively cooled to <35 K at base temperature |
| Control System | Compatible with Lake Shore Model 336 Temperature Controller |
| Brand | Lake Shore |
|---|---|
| Origin | USA |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | TTPX |
| Pricing | Upon Request |
| Brand | MicroXact |
|---|---|
| Model | MPS-C-300 |
| Category | RF Probe Station |
| Wafer Size Capacity | Up to 200 mm (standard 10–150 mm) |
| Magnetic Field Range | ±6 kOe (±0.6 T) in 3D vector configuration |
| Field Directional Accuracy | ±1.0° |
| Field Uniformity | ±2% over 10 mm diameter |
| Field Stability | <0.1% over 24 h |
| Minimum Field Resolution | 200 mG |
| Frequency Bandwidth | DC to ~67 GHz |
| Motion Range (X-Y) | 100 mm × 100 mm |
| Chuck Type | Isolated / Grounded / Coaxial configurable |
| Control Software | LabVIEW-based, open-source, modular API |
| Brand | MPI |
|---|---|
| Origin | Taiwan |
| Model | TS150 & TS200 & TS300 |
| Probe Station Type | Manual RF Probe Station |
| Wafer Compatibility | 150 mm (6″), 200 mm (8″), 300 mm (12″) |
| Platen Lift Range | 0–300 µm / 3 mm (3-stage) |
| Positioning Repeatability | ±1 µm |
| XY-θ Motion Stage | 25 × 25 mm with micrometer adjustment |
| Z-Axis Fine Adjustment | 25 mm travel with 1 mm engraved scale |
| RF MicroPositioner Capacity | up to 4 four-port RF probes or 10 DC probes |
| Thermal Chuck Compatibility | ERS-series temperature-controlled chucks (–60 °C to +300 °C) |
| Optical Options | MPI SZ10 stereo zoom, MZ12 monocular zoom, 90° tilt standard |
| Vibration Isolation | Integrated damping base |
| EMI Shielding | Optional light-tight, EMI-shielded enclosure |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TS200-SE Probe System |
| Price Range | USD 13,500 – 40,500 (FOB) |
| Product Category | Temperature-Controlled Manual Probe Station |
| Operation Mode | Manual |
| Brand | RTI / Robson Technologies Inc |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | RTI MT Century Automated Curve Tracer |
| Pricing | Available Upon Request |
| Brand | SEMICS |
|---|---|
| Origin | South Korea |
| Model | OPUS-SH / OPUS-SD / OPUS3 / OPUS-SS |
| Wafer Compatibility | 6", 8", and 12" (SEMI-compliant) |
| Dimensions (W×D×H) | OPUS-SH: 1490 × 1680 × 960 mm |
| OPUS-SD | 1530 × 1782 × 960 mm |
| XY Travel Range | ±175 mm (SH), ±185 mm × ±175 mm (SD) |
| XY Positioning Accuracy | ±1.5 µm |
| Maximum Downforce | 500 kgf |
| Temperature Range Options | Ambient to +150 °C, -40 °C to +150 °C, -55 °C to +200 °C, and 25 °C environmental chamber control |
| Structural Architecture | Rigid Z-frame with flat-load configuration |
| Key Functionalities | Real-time configuration validation, smart pin alignment algorithm, intelligent probing path optimization, map-shift prevention, drawer-type (SH) or universal probe card interface (SD/OPUS3), full pogo-pin tester compatibility |
| Brand | SHNTI |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Surface Resistivity Probe Station |
| Operation Mode | Manual |
| Compatible Wafer Sizes | 4", 6", 8", 12" |
| Modular Expansion Support | mmWave (mmW), Failure Analysis (FA), MEMS, Wafer-Level Reliability (WLR), Optoelectronics |
| Brand | SHNTI |
|---|---|
| Origin | Shanghai, China |
| Model | M-Series |
| Operation Type | Manual |
| Maximum Wafer Size | 150 mm (6-inch) and 100 mm (4-inch) |
| Probe Compatibility | DC to 67 GHz RF, MEMS, and Surface Resistivity Measurements |
| Target Pad Size | ≥30 µm |
| Application Scope | Academic Teaching, R&D Lab Characterization, Low-Volume IC Device Evaluation |
| Brand | Truth Instruments Company Limited |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MCT 500 |
| Pricing | Available Upon Request |
| Brand | Tianwei (Shandong Tianwei Environmental Technology Co., Ltd.) |
|---|---|
| Model | TW-6481B5+ |
| Origin | Shandong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Application Scope | Length measurement, attenuation profiling, splice/connector loss evaluation, and fault localization in single-mode and multimode optical fiber cables |
| Dynamic Range | 28 dB |
| Maximum Test Distance | 100 km |
| Event Dead Zone | 3 m |
| Sampling Resolution | 2.5 cm |
| Display | 7-inch capacitive touchscreen (800 × 480 TFT LCD) |
| Battery | 3.7 V / 4600 mAh Li-polymer with smart power management |
| Operating Wavelengths | 1310 / 1550 / 1625 / 1650 ±20 nm |
| Compliant File Formats | Bellcore GR-196, SR-4731 |
| Integrated Functions | OTDR, Optical Power Meter (OPM), Visual Fault Locator (VFL, 650 nm), Stable Light Source (LS), Live-fiber detection with automatic optical input warning |
| Interface | USB Type-C, microSD slot |
| Weight | ≤700 g (with battery) |
| Dimensions | ≤200 × 150 × 38 mm |
| Environmental Rating | Operating temperature 0–40 °C |
| Brand | Truth Instruments Company Limited |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Wafer-MOKE |
| Pricing | Available Upon Request |
| Sample Size | Up to 300 mm (12-inch) wafers, downward compatible with fragments |
| Vertical Field Range | ±2.4 T |
| In-Plane Field Range | ±1.3 T |
| Field Resolution | 0.01 mT |
| Field Uniformity | Better than ±1% over Ø1 mm |
| Kerr Rotation Resolution | 0.3 mdeg (RMS) |
| Throughput | 12 WPH (9 sites, 200 mm wafer, ±1.3 T) |
| Sample Repositioning Accuracy | <10 µm |
| Uptime | ≥90% |
| EFEM Integration | Optional |
| Brand | TRY |
|---|---|
| Model | Customized |
| Application Scope | High-power IC packaging (e.g., IGBT modules), semiconductor manufacturing, materials R&D, automotive electronics |
| XY Stage | 150 × 150 mm |
| Max Shear Force Capacity | 1000 kg |
| Compliance | ASTM F468, ISO 13473-2, JEDEC JESD22-B116 (Bond Strength), MIL-STD-883 Method 2011 |
| Sensor Technology | Digital load cell with thermal drift compensation |
| Control Interface | Touchscreen HMI + Ethernet/RS232 for integration into factory MES/LIMS |
| Software | TRY-BondTest Suite v3.2 with audit trail, user role management, and 21 CFR Part 11–compliant electronic signatures |
| Brand | ULTECH |
|---|---|
| Origin | South Korea |
| Model | Micro-110 |
| Product Category | Vacuum Probe Station |
| Operation Type | Manual |
| Wafer Size Compatibility | 1–8 inch |
| Temperature Range Options | (a) –40 °C to 200 °C (Peltier), (b) –40 °C to 170 °C (Peltier), (c) RT to 450 °C (Ceramic Heater), (d) RT to 750 °C (Ceramic Heater), (e) 77 K to 300 K (Liquid Nitrogen Cryostat) |
| Vacuum Chamber | Hermetic Sealed with Optical Viewports |
| Gas Delivery | Mass Flow Controller (MFC)-Equipped Multi-Gas Inlet |
| Electrical Interface | Standard Coaxial & Triaxial Feedthroughs |
| Pricing | USD $150,000–$250,000 |
| Brand | ULTECH |
|---|---|
| Origin | South Korea |
| Model | MPS |
| Category | Vacuum Probe Station |
| Operation | Manual |
| Wafer Size Compatibility | 1″ to 8″ |
| Temperature Range Options | −40 °C to 200 °C (Peltier), −40 °C to 170 °C (Peltier), RT to 450 °C (Ceramic Heater), RT to 750 °C (Ceramic Heater), 77 K to 300 K (Liquid Nitrogen Cooling) |
| Vacuum Chamber | Yes, hermetic sealing |
| Gas Delivery | Mass Flow Controller (MFC)-equipped multi-gas inlet |
| Optical Access | Integrated viewport for microscope coupling |
| Electrical Interface | Standard coaxial and triaxial feedthroughs |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Domestic |
| Model | SEM Nano-Probe Station |
| Pricing | Upon Request |
| XYZ Travel Range | ±10 mm |
| Fine-Adjustment Resolution | 0.5 nm |
| Sample Stage Flatness | 10 µm |
| Total Probe Station Mass | 225 g |
| Max. Translation Speed | 3 mm/s |
| Motion Guidance | Zero-Gap Flexure Hinge System |
| Actuation | Piezoelectric Ceramic Positioning Stages |
| Optional Modules | Cryogenic Stage, High-Temperature Stage, Fiber Optic Feedthrough & Clamp, EBIC Kit |