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| Brand | KEM (Kyoto Electronics Manufacturing) |
|---|---|
| Origin | Japan |
| Manufacturer | Yes |
| Import Status | Imported |
| Model | BX-1 |
| Instrument Type | Destructive Sampling Refractometer |
| Measurement Principle | Abbe Refraction |
| Brix Range | 0.0–85.0% |
| Accuracy | ±0.2% Brix |
| Resolution | 0.1% Brix |
| Temperature Compensation | Automatic, 10–75°C |
| Display | LCD |
| Sample Volume | ~0.1 mL |
| Response Time | ≤2 s |
| Power | 2 × AAA batteries |
| Battery Life | ~30,000 measurements |
| IP Rating | IP65 |
| Dimensions | 45(W) × 32(D) × 153(H) mm |
| Weight | ~100 g |
| Brand | KEM (Kyoto Electronics Manufacturing) |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Destructive Sampling Refractometer |
| Model | RA-620 / RA-600 |
| Measurement Principle | Sodium D-line (589.3 nm) Refractive Index at 20 °C |
| RI Range (RA-620) | 1.32000–1.58000 nD |
| RI Range (RA-600) | 1.3200–1.7000 nD |
| Brix Range | 0–100 % |
| RI Accuracy (RA-620) | ±0.00002 nD |
| RI Accuracy (RA-600) | ±0.0001 nD |
| Brix Accuracy (RA-620) | ±0.014 % |
| Brix Accuracy (RA-600) | ±0.1 % |
| RI Repeatability (RA-620) | ±0.00001 nD |
| RI Repeatability (RA-600) | ±0.0001 nD |
| Temperature Control Range | 5–75 °C (RA-600 optional up to 100 °C) |
| Temp. Resolution (RA-620) | 0.01 °C |
| Temp. Resolution (RA-600) | 0.1 °C |
| Minimum Sample Volume | 0.2 mL |
| Prism Material | Sapphire |
| Sample Stage Material | Stainless Steel SUS316 |
| Display | Full-color TFT touchscreen (Chinese/English/Japanese UI) |
| Data Storage | 100 methods, 300 results, 20 calibration logs |
| Interface | Ethernet (LAN), USB, RS-232C |
| Power | AC 100–240 V, 50/60 Hz, 20 W |
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