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| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SteREO Discovery |
| Pricing | Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | SteREO Discovery.V12 |
| Price | Upon Request |
| Total Magnification Range | 12×–375× |
| Working Distance | 81 mm |
| Vertical Travel | 340 mm |
| Maximum Field Diameter (at lowest magnification) | 25 mm |
| Focusing Resolution | 350 nm |
| Field of View (Actual) | 2.3–28.8 mm |
| Illumination | 15 V / 150 W Halogen or 24 V / 250 W Halogen Cold Light Source |
| Expandability | Compatible with digital cameras, CCD/CMOS imaging modules, and quantitative image analysis software suites |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | SteREO Discovery.V20 |
| Total Magnification Range | 4.7×–1312.5× |
| Zoom Ratio | 20:1 |
| Working Distance | 10–253 mm |
| Vertical Travel | 340 mm |
| Focusing Resolution | 350 nm |
| Field of View | 0.18–48.7 mm |
| Illumination | 15 V/150 W or 24 V/250 W Cold Light Source |
| Automation | SyCop System Controller + H.I.P. Human Interface Panel |
| Optical Design | CMO (Common Main Objective) Telecentric Path |
| Anti-Glare Optics | ZEISS Proprietary Technology |
| Structural Architecture | Modular, Open-Frame, Ergonomically Optimized |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | SteREO Discovery.V8 |
| Total Magnification Range | 3×–300× |
| Zoom Ratio | 1:8 |
| Optical Design | Common Main Objective (CMO) |
| Ergonomic Design | Yes |
| Illumination Options | Reflected, Transmitted, Oblique, Ring Light, Polarized |
| Imaging Compatibility | Digital Camera, C-Mount Adapter, Image Analysis Software |
| Working Distance | Up to 110 mm (at lowest magnification) |
| Field of View | Up to 74 mm (at 3×) |
| Compliance | ISO 9001, CE, RoHS |
| Brand | ZEISS |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | ZEISS Visioner 1 |
| Pricing | Available Upon Request |
| 3D Image Comparison Function | Real-time 3D visualization and recording |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Visioner 1 |
| Technology | Micro-Mirror Array Lens System (MALS™) |
| Max. Height Difference Coverage | 69 mm |
| Micro-Mirror Size | ~100 × 100 µm |
| Mirror Actuation | Independent rotation and lateral translation |
| EDoF Enhancement Factor | Up to 100× vs. conventional optical microscopy |
| Imaging Mode | Real-time, focus-free, full-field extended depth of field |
| Compliance | Designed for ISO/IEC 17025-aligned inspection environments, compatible with GLP/GMP documentation workflows |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Volutome |
| Application | Integrated in-chamber ultramicrotome for serial block-face imaging in field-emission scanning electron microscopy (FE-SEM) |
| Detector | Volume BSD (Backscattered Electron Detector optimized for volumetric surface imaging) |
| Charge Compensation | Patented localized charge compensation system |
| Automation | Unattended operation up to 72 hours |
| Workflow Integration | End-to-end solution from sectioning and imaging to 3D reconstruction and visualization |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Xradia 515 Versa |
| Spatial Resolution | ≤500 nm (true native resolution) |
| Imaging Modes | Absorption Contrast, Propagation-Based Phase Contrast |
| Software Platform | Scout-and-Scan Control System with ART 3.0 Advanced Reconstruction Toolbox |
| Compatibility | In Situ Mechanical & Thermal Stages, Automated Sample Handling, Flat-Panel Detector Options |
| Regulatory Compliance | Designed for GLP/GMP-aligned workflows |
| Origin | Beijing, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | LensMechanix |
| Price Range | USD 7,000 – 14,000 |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | OpticStudio 2017 |
| Price Range | USD $7,200 – $14,400 (based on perpetual license tiers) |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | 2DTrans-ams-03 |
| Product Type | Motorized Translation Stage |
| Sample Stage | 5-Axis Motorized Platform (X/Y/Z/α/β) |
| Carrier Slide Stage | 5-Axis Motorized Platform (X/Y/Z/α/β) |
| Rotation Precision (R) | ≤ ±0.01° |
| Linear Repeatability (XY) | ≤ ±2 µm |
| Vertical Repeatability (Z) | ≤ 1 µm |
| Tilt Precision (α/β) | ≤ ±0.005° |
| Heating Range | Up to 240 °C |
| Temperature Stability | ±0.1 °C |
| Microscope | Integrated Motorized Optical Microscope with HDMI Camera (8 MP, 30 fps) |
| Vacuum & Magnetic Sample Holding | Dual-mode Adsorption Module |
| Vibration Isolation | Desktop Pneumatic Air-Floating Platform |
| Motion Control Axes | 7-axis (ZT02) or 9-axis (ZT03) Controller |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | Custom-Integrated SEM-EDS Platform |
| Price Range | USD 17,000 – 25,500 |
| Magnification Range | 10× – 360,000× (continuously adjustable, user-definable setpoints) |
| Best Imaging Resolution | 3 nm (at 30 kV, SE mode) |
| EDS Detector | Silicon Drift Detector (SDD), ≥10 eV energy resolution (Mn-Kα) |
| Stage Dimensions | 540 mm × 760 mm |
| Motion Axes | 4-axis (X, Y, U, V) motorized precision stage |
| Minimum Positioning Increment | 0.001 mm |
| EDS Quantification Accuracy | ±2–5 wt% (matrix-dependent, per ISO 16529:2014 and ASTM E1508) |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Domestic |
| Model | LHe-6H-06 |
| Pricing | Upon Request |
| Base Temperature | 6 K |
| Operating Temperature Range | 6 K to 400 K |
| Temperature Stability | ±0.05 K (auto-controlled) |
| Vacuum Base Pressure | <6×10⁻⁴ Pa (pre-cooling), <6×10⁻⁵ Pa (at 6 K) |
| Sample Stage Diameter | 50 mm |
| Stage Temperature Uniformity | ±0.01 K |
| Probe Arm Count | 6 |
| Probe Motion Range | 50 mm × 50 mm × 30 mm |
| Positioning Resolution | <10 µm |
| Microscope Optical Magnification | 1.4×–9× (with optional 2× auxiliary lens) |
| Video Magnification | ~700× |
| Imaging Resolution | <2 µm |
| Camera | Full HD digital with coaxial + annular LED illumination |
| Electrical Leakage | <1 pA (DC) |
| RF Capability | Up to 100 GHz (optional) |
| Vacuum Feedthroughs | 2 × KF40 flanges |
| Cryocooler | Sumitomo F-50 continuous-flow cryocooler |
| Control Interface | Touchscreen HMI + LabVIEW-compatible drivers |
| Included Vacuum System | Imported turbomolecular pump set + full-range vacuum gauge |
| Integrated Triax Cabling | 6 × Triax probe cables + 1 × additional Triax on stage base |
| Optional Fiber Integration | Replaceable electrical probes with single-mode or multimode optical fibers |
| System Power Consumption | 2.5 kW |
| Net Weight | 200 kg |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Model | LN-4H-06 |
| Vacuum Base Pressure | <6×10⁻³ Pa (pre-cooling), <6×10⁻⁴ Pa (at 77 K) |
| Probe Arm Count | 4 standard |
| Probe Positioning Range | 50 mm × 50 mm × 30 mm |
| Probe Positioning Resolution | <10 µm |
| Sample Stage Diameter | 50 mm |
| Temperature Range | 77 K–400 K |
| Temperature Stability | ±0.5 K |
| Microscope Optical Magnification | 0.58×–7× (with 1× objective) |
| Microscope Resolution | <2 µm |
| Camera | Full HD digital with coaxial + annular LED illumination |
| Focus Mechanism | Dual mechanical + optical fine focus |
| Electrical Leakage | <1 pA (DC) |
| Included Vacuum System | Imported turbomolecular pump set + full-range vacuum gauge |
| Temperature Controller | Intelligent PID-based digital controller |
| Optional Fiber Integration | Yes (replaces electrical probes) |
| RF Capability | Up to 100 GHz (optional probe configurations) |
| Chamber Diameter | 245 mm |
| X-Y Stage Accuracy | ±0.01 mm |
| Probe Shaft Stroke | 110 mm |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Domestic |
| Model Series | PicoFemto In Situ Cryo Sample Holder |
| Instrument Classification | In Situ Cryogenic TEM Holder |
| Application Field | Materials Science |
| Cooling Medium | Liquid Nitrogen |
| Minimum Temperature | ≤ –170 °C (≤ 103 K) |
| Temperature Stability | < ±0.1 K |
| Cool-down Time to Minimum Temperature | ≤ 45 min |
| Dewar Capacity | 180 mL |
| Cryo Hold Time | ≥ 4 h |
| Resolution Compatibility | < 0.3 nm TEM Imaging |
| Dual-Tilt Range (β) | ±25° |
| Vacuum Bake Temperature | 120 °C |
| Base Vacuum (with Pre-pump System) | 6×10⁻⁵ Pa |
| Integrated Plasma Cleaning Power | 5–50 W (ICP mode) |
| Modular Interface Slots | 4 |
| Compatible TEM Platforms | Thermo Fisher Scientific (TFS), JEOL, Hitachi |
| Optional Functional Modules | Heating, Electrical Biasing, Mechanical Actuation (MEMS), STM Integration, High-Angle Tilt, Porous-Sample Support |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | PicoFemto In Situ MEMS Gas/Liquid TEM Sample Holder Series |
| Pricing | Upon Request |
| Instrument Classification | In Situ Gas Holder |
| Application Domain | Materials Science |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | PicoFemto In Situ MEMS Heating & Electrical Sample Holder Series |
| Application Field | Materials Science |
| Instrument Classification | In Situ Heating Holder |
| Pricing | Upon Request |
| Compatibility | Compatible with Standard TEM Goniometer Stages and Specified Pole Pieces |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | PicoFemto In Situ TEM Sample Holder Series |
| Instrument Classification | In Situ Tensile Holder |
| Application Field | Materials Science |
| Electrical Measurement Range | 1 nA – 30 mA |
| Current Resolution | < 100 fA |
| Voltage Output | ±10 V (Standard Mode), ±150 V (High-Voltage Mode) |
| Coarse Positioning Range (XY/Z) | 2.5 mm / 1.5 mm |
| Fine Positioning Range (XY/Z) | 15 µm / 1.5 µm |
| Fine Positioning Resolution (XY/Z) | 0.4 nm / 0.04 nm |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | RF-33A |
| Pricing | Upon Request |
| Type | Motorized Rotary Translation Stage |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic (China-Made) |
| Model | RF-8382A |
| Pricing | Upon Request |
| Product Type | Motorized Translation Stage |
| Drive Principle | Piezoelectric Ceramic Actuation |
| Rotation Range | Continuous 360° |
| Position Holding | Integrated Mechanical Lock |
| Environmental Compatibility | Ambient Air and High Vacuum (≤10⁻⁷ mbar) |
| Control Mode | Open-Loop and Closed-Loop (with Optional Capacitive or Strain-Gauge Feedback Module) |
| Resolution (Open-Loop) | Sub-100 nrad |
| Repeatability | ≤±50 nrad |
| Bidirectional Repeatability | ≤±75 nrad |
| Maximum Load Capacity | 1.2 kg (axial, centered) |
| Thermal Drift (24h, 23°C ±0.5°C) | <200 nrad |
| Vacuum-Compatible Materials | 316L Stainless Steel, Ceramic Insulators, Gold-Plated Electrical Contacts |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Optical Component |
| Model | SMG26 |
| Grating Pitch | 256 µm |
| Absolute Accuracy | ±3 µm @ 20 °C |
| Operating Temperature Range | up to 100 °C |
| Subdivision Resolution (with TF15 interface) | 1 nm |
| Material | Low-Thermal-Expansion Glass |
| Installation Tolerance | ±0.1 mm |
| Vacuum Compatibility | UHV (≤10⁻⁹ mbar) |
| Compliance | Designed for UHV-compatible bake-out protocols (≤100 °C) |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Desktop SEM |
| Electron Gun | Single-Crystal LaB₆ Filament |
| SEM Class | Entry-Level Tungsten- or LaB₆-Based SEM (Non-FEG) |
| Secondary Electron Resolution | 3 nm @ 20 kV |
| Maximum Magnification | 360,000× |
| Accelerating Voltage Range | 3–20 kV |
| Backscattered Electron Resolution | 3 nm @ 20 kV |
| Sample Chamber Dimensions (max) | 165 × 122 × 51.5 mm (W × D × H) |
| Stage Movement (standard) | X = 60 mm, Y = 55 mm (2-axis) |
| Optional Deceleration Mode | 0–10 kV landing energy via sample bias |
| Imaging Modes | Video mode (512 × 512), Fast Scan (512 × 512), Slow Scan (2048 × 2048) |
| Image Formats | BMP, TIFF, JPEG, PNG |
| Navigation | Integrated optical camera + chamber-viewing CCD |
| Automation | Auto Contrast/Brightness, Auto Focus, Large-Area Image Stitching |
| Dimensions (main unit) | 650 × 370 × 642 mm (W × D × H) |
| In-situ Compatibility | TEC cooling stage, heating stage, tensile stage (ZEPTOOLS proprietary) |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Model | ZEM Ultra |
| Instrument Type | Desktop SEM |
| Electron Source | Schottky Field Emission Gun |
| SEM Class | High-Resolution Field Emission SEM |
| Maximum Magnification | 1,000,000× |
| Accelerating Voltage | 1–15 kV (continuously adjustable) |
| Backscattered Electron (BSE) Resolution | ≤2.5 nm |
| Maximum Sample Dimensions | 176 mm (W) × 185 mm (L) × 125 mm (H) |
| Stage Options | XY, XYZ, XYT, or 5-Axis Motorized Stage |
| Standard Detectors | BSE, SE, EDS |
| Vacuum Architecture | Triple-Independent Vacuum System |
| Imaging Modes | SE, BSE, Deceleration Mode (optional, 0–10 kV sample bias) |
| Navigation | Integrated Chamber Camera + Optical Navigation System |
| Image Formats | 512×512 (real-time video), 2048×2048 (high-res acquisition) |
| Automation | Auto Focus, Auto Brightness/Contrast, Large-Area Stitching |
| In Situ Capability | Compatible with in situ stages (heating, cooling, tensile, electrical biasing) |
| Detector Expansion | EBSD, CL, STEM-in-SEM |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Desktop SEM |
| Electron Source | Schottky Field Emission Gun |
| Resolution (SE & BSE) | <2.5 nm |
| Max Magnification | 1,000,000× |
| Accelerating Voltage Range | 1–15 kV (continuously adjustable) |
| Stage | Motorized XY (optional XYZ/XYT/5-axis) |
| Detector Options | Secondary Electron (SE), Backscattered Electron (BSE), Energy-Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD) |
| Vacuum System | Triple-stage independent vacuum architecture |
| Imaging Modes | Standard SE/BSE, deceleration mode (0–10 kV sample bias, optional) |
| Image Acquisition | 512×512 (real-time video), 2048×2048 (high-res still capture) |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Model | ZEM15C |
| Instrument Type | Desktop SEM |
| Electron Source | Pre-aligned Tungsten Filament |
| Maximum Accelerating Voltage | 15 kV |
| Backscattered Electron (BSE) Resolution | <10 nm |
| Standard Detectors | BSE, SE |
| Magnification | Up to 150,000× |
| Sample Exchange Time | 90 s |
| Vacuum Mode | High Vacuum |
| Stage Movement | 2-axis Manual |
| Integrated Optical Navigation Camera | Yes |
| Detector Configuration | Dual-detector (Secondary Electron + Backscattered Electron) |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Desktop SEM |
| Electron Source | Pre-aligned Tungsten Filament |
| Acceleration Voltages | 5 kV / 10 kV / 15 kV |
| Secondary Electron (SE) Resolution | <10 nm |
| Backscattered Electron (BSE) Resolution | <10 nm |
| Maximum Magnification | 150,000× |
| Stage Type | Motorized 2-Axis Sample Stage (X/Y: 25 mm × 25 mm) |
| Vacuum Pumping Time to High Vacuum | ≤2 min |
| Max Sample Dimensions | Ø50 mm × H35 mm |
| Integrated Optics | Monolithic Condenser Lens System |
| Operating Environment | Standard Lab/Office Floor with Vibration Damping Base |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Model | ZEM18 |
| Instrument Type | Desktop SEM |
| Electron Source | Pre-aligned Tungsten Filament |
| Acceleration Voltage | 3–18 kV (1 kV step) |
| Max. Magnification | 200,000× |
| Resolution | <6 nm @ 15 kV, high vacuum mode |
| Standard Detectors | Secondary Electron (SE), Backscattered Electron (BSE) |
| Vacuum System | High vacuum (≤5×10⁻³ Pa) |
| Sample Exchange Time | ≤90 s |
| Stage Options | 2-axis mechanical stage (standard) |
| Navigation | Integrated optical navigation camera |
| Optional Add-ons | EDS detector, in-situ heating/cooling stages (TEC), deceleration stage |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | ZEM18 |
| Instrument Type | Desktop SEM |
| Electron Source | Pre-aligned Tungsten Filament |
| SEM Class | Entry-level Tungsten-Filament SEM |
| Secondary Electron (SE) Resolution | <6 nm |
| Backscattered Electron (BSE) Resolution | <6 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | 3–18 kV |
| Maximum Sample Dimensions | Ø50 mm × 35 mm (H) |
| Stage | Motorized 2-Axis Automated Stage |
| Signal Acquisition Bandwidth | 10 MHz |
| Vacuum Mode Options | High Vacuum (<5×10⁻³ Pa), Low Vacuum (optional) |
| Pump-down Time (High Vacuum) | <90 s |
| Imaging Modes | Video Mode, Fast Scan Mode, Slow Scan Mode |
| Auto Functions | Auto Focus, Auto Brightness/Contrast |
| Detector Configurations | SE Detector, BSE Detector, Optional EDS Detector |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | ZEM20 In-situ Tensile Integrated SEM |
| Instrument Type | Desktop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-level Tungsten-Filament SEM |
| Secondary Electron (SE) Resolution | 4 nm @ 20 kV |
| Maximum Magnification | 360,000× |
| Accelerating Voltage Range | 3–20 kV (1 kV step adjustment) |
| Backscattered Electron (BSE) Resolution | 4 nm @ 20 kV |
| In-situ Stage Load Capacity | 0–1000 N |
| Displacement Resolution | 20 nm |
| Optional Heating Module | Yes |
| Mechanical Testing Modes | Tensile, Compression, Three-point Bending |
| Vacuum Architecture | Dual-chamber (separated electron gun & specimen chamber) |
| Sample Chamber Camera | Integrated HD in-chamber camera |
| Chamber Volume | Extra-large for multi-modal in-situ platform integration |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Model | ZEM20 |
| Instrument Type | Desktop SEM |
| Electron Source | Pre-aligned Tungsten Filament |
| Maximum Accelerating Voltage | 20 kV |
| Resolution | <4 nm @ 20 kV |
| Maximum Magnification | 360,000× |
| Stage Options | 3-axis Standard / 5-axis Optional |
| Detector System | Standard BSE & SE Detectors |
| Vacuum Modes | High Vacuum / Low Vacuum (1–60 Pa, optional) |
| Sample Exchange Time | <60 s (typical 30 s) |
| Navigation | Integrated Optical Navigation Camera + In-Chamber HD Camera |
| Optional Add-ons | Beam Deceleration Mode, EDS Integration, In-situ Heating/Cooling/Electrical/Mechanical/Liquid/Gas Stages |