Optical Instruments
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| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | COMET5 2.0 |
| Camera Resolution | 1600 × 1200 pixels |
| Measurement Volumes (L×W×H) | 85×65×60 mm³ to 800×600×500 mm³ |
| 3D Point Spacing | 55–500 µm (configurable per field-of-view) |
| Acquisition Time | ≤ 0.6 s per scan |
| Interface | CAN bus + Gigabit Ethernet |
| Software Platform | COMETplus v8.x (64-bit, Windows 10/11) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Crossbeam 330 DualBeam SEM/FIB |
| Configuration | Integrated electron column + gallium liquid metal ion source (LMIS) FIB column |
| Vacuum system | Differential pumping with cold trap and turbomolecular pumps |
| Stage | Motorized 5-axis precision stage with ±90° tilt, 360° rotation, sub-micron repeatability |
| Detector suite | In-lens SE, ETSE, STEM, BSE, EDS-compatible |
| Optional integration | X-ray tomography (XRM) correlation module |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Crossbeam 350 |
| Configuration | Standard Chamber (18 ports) |
| Electron Optics | Gemini I with Tandem Decel |
| FIB Source | Liquid Metal Ga⁺ |
| Max FIB Current | 100 nA |
| SEM Resolution | ≤1.4 nm @ 1 kV (Tandem Decel) |
| Chamber Dimensions | Ø220 mm × H220 mm |
| Stage Travel | X/Y = 100 mm, Z = 40 mm |
| Detector Options | Inlens SE, Inlens EsB, VPSE, Inlens Duo |
| Software Platform | ZEISS Atlas 5 (3D Tomography & EDS Integration) |
| Compliance | Fully compatible with ASTM E1558, ISO/IEC 17025 workflows, GLP/GMP audit-ready data traceability (via Atlas 5 metadata logging) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Crossbeam 550 |
| Configuration | Fully Integrated FIB-SEM Platform with Gemini II Electron Optics and High-Current Ga⁺ Focused Ion Beam |
| Maximum Ion Beam Current | 100 nA |
| Resolution (SE, 1 kV, Tandem Decel) | ≤1.4 nm |
| Sample Chamber Options | Standard (18 ports) or Extended (22 ports) |
| X/Y Stage Travel | 100 mm (standard chamber) or 153 mm (extended chamber) |
| Inlens EsB Detector Depth Sensitivity | <3 nm |
| EDS Integration | Full 3D Tomography-Compatible Energy-Dispersive Spectroscopy Module |
| Software Platform | ZEISS Atlas 5 for Automated 3D FIB-SEM Tomography and Correlative Analysis |
| Compliance | Designed for GLP/GMP environments |
| Brand | ZEISS |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | Crossbeam 550 Samplefab |
| Pricing | Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | Crossbeam |
| Instrument Type | Floor-Standing Dual-Beam System |
| Electron Source | Thermal Field-Emission Gun (TFEG) |
| Ion Source | Liquid Metal Gallium (Ga⁺) Focused Ion Beam (FIB) |
| Optional Add-on | Femtosecond Laser Ablation Module |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Instrument Type | Floor-standing DualBeam System |
| Electron Source | Thermal Field Emission Gun |
| Secondary Electron Resolution | 0.9 nm @ 15 kV (Crossbeam 550), 1.0 nm @ 15 kV (Crossbeam 340) |
| Magnification Range | 12× – 2,000,000× (SEM mode) |
| Acceleration Voltage | 0.02–30 kV (SEM), 0.5–30 kV (FIB) |
| Backscattered Electron Resolution | Not specified |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | ZEISS Cryo-Correlative Workflow Solution |
| Instrument Form Factor | Floor-standing / Conventional Large-scale |
| Electron Source | Cold Field Emission Gun |
| Secondary Electron Resolution | Not Specified |
| Magnification Range | Not Specified |
| Accelerating Voltage | Not Specified |
| Backscattered Electron Resolution | Not Specified |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Elyra 7 |
| Category | Imported Instrument |
| Distribution Type | Authorized Distributor |
| Pricing | Available Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | EVO |
| Quotation | Upon Request |
| Instrument Form Factor | Floor-standing / Conventional Large-scale |
| Electron Source Type | Tungsten Filament |
| SEM Category | Entry-level Tungsten-Filament SEM |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | EVO |
| Pricing | Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | EVO |
| Pricing | Available Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | EVO10 |
| Instrument Type | Floor-Standing SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm at 30 kV |
| Magnification Range | 10× to 1,000,000× |
| Accelerating Voltage | 0.2–30 kV |
| Maximum Sample Dimensions | Ø220 mm × 100 mm (H) |
| Stage Travel | X = 80 mm, Y = 100 mm, Z = 35 mm |
| Standard Detectors | Everhart-Thornley Secondary Electron Detector (SED), Solid-State Backscattered Electron Detector (BSE) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Instrument Type | Floor-standing / Conventional Large-format SEM |
| Model | Gemini |
| Key Features | High-efficiency in-lens detection |
| Sample compatibility | Conductive & non-conductive, magnetic & non-magnetic, bulk & coated specimens |
| Compliance | Designed for ISO/IEC 17025-compliant labs |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Instrument Type | Floor-standing SEM |
| Electron Gun | Cold Field Emission (CFEG) |
| Secondary Electron Resolution | 0.5 nm @ 15 kV, 0.8 nm @ 1 kV (with Tandem Decel) |
| Magnification Range | 50× – 2,000,000× |
| Accelerating Voltage | 0.02 – 30 kV |
| Backscattered Electron Resolution | 1.0 nm @ 1 kV (ESB detector) |
| Detector Configuration | In-lens SE, ET-SE, optional ESB, aSTEM-4, EDS, EBSD, CL |
| Brand | ZEISS |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | GeminiSEM |
| Instrument Form Factor | Floor-standing |
| Electron Source | Thermal Field Emission Gun (TFEG) |
| Pricing | Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | In Situ Liquid Electrochemistry Solution |
| Application | Real-time, high-resolution SEM imaging and multimodal analysis of electrochemical cells under operational conditions |
| Key Components | MEMS-based liquid cell chip, custom in situ battery stage, integrated electrical feedthroughs, 10 nm electron-transparent SiN window |
| Compatibility | Standard ZEISS GeminiSEM and SIGMA SEM platforms |
| Compliance | Designed for GLP-compliant workflows |
| Key | Brand: ZEISS |
|---|---|
| Origin | Germany |
| Model | Axio Imager (Polarized Light Configuration) + Evico EM-800 Electromagnetic Stage |
| Max Magnetic Field | 800 kA/m (DC/AC) |
| Illumination | Colibri LED |
| Polarization Optics | Rotatable 360° polarizer with adjustable λ/4 plate and analyzer |
| Objective Compatibility | High-NA polarizing objectives including oil immersion and conoscopy-capable objectives |
| Sample Stage | Motorized X-Y translation with lockable precision platform |
| Software | ZEN Core with magnetooptic domain acquisition & time-resolved analysis module |
| Compliance | Designed for ISO/IEC 17025-compliant labs |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | L3D 2 5M |
| Light Source | Blue-light LED-based structured illumination (not free-electron laser) |
| Detection Principle | Fringe projection photogrammetry with stereo camera triangulation |
| System Type | Contactless, markerless 3D optical coordinate measurement system |
| Compliance | Designed for industrial metrology applications aligned with VDI/VDE 2634 Part 2 and ISO 10360-8 standards |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Lattice Lightsheet 7 |
| Import Status | Imported Instrument |
| Distribution Type | Authorized Distributor |
| Brand | Zeiss |
|---|---|
| Origin | Germany |
| Model | Lattice SIM 3 |
| Type | Structured Illumination Microscopy (SIM) System |
| Optical Principle | Lattice Light-Sheet Illumination Combined with High-Frequency Patterned SIM |
| Max. Resolution (XY) | ~120 nm |
| Max. Resolution (Z) | ~300 nm |
| Imaging Speed | Up to 500 frames/sec (full-frame, region-of-interest dependent) |
| Penetration Depth | Up to 100–200 µm in cleared tissue |
| Objective Compatibility | 25×/1.0 NA water-dipping, 40×/1.1 NA water-immersion, 63×/1.2 NA water-immersion |
| Laser Lines | 405, 488, 561, 640 nm (standard) |
| Detection Channels | 4-channel simultaneous spectral detection with GaAsP PMTs or sCMOS cameras |
| Software Platform | ZEN Imaging (with Lattice SIM module), supports 3D deconvolution, drift correction, and multi-color registration |
| Compliance | CE-marked, compliant with ISO 13485 (for IVD-relevant configurations), supports FDA 21 CFR Part 11 audit trail (in validated ZEN Blue environment) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Lattice SIM 5 |
| Resolution | ≤60 nm (lateral, live-cell compatible) |
| Imaging Modality | 3D super-resolution structured illumination microscopy (3D-SIM) |
| Objective Compatibility | Oil-immersion objectives up to 1.4 NA (e.g., Plan-Apochromat 63×/1.4 Oil) |
| Live-cell Capability | Yes, with low phototoxicity and high temporal resolution |
| Fluorescence Channels | Up to 4-color simultaneous acquisition |
| Software Platform | ZEN Imaging Software (Blue Edition), supports GLP-compliant metadata logging and audit trail (21 CFR Part 11 ready) |
| [Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Lattice-SIM 3 / Lattice-SIM 5 |
| Imaging Principle | Structured Illumination Microscopy (SIM) with Lattice Light Sheet Integration |
| Resolution (XY) | down to 60 nm (with SIM² reconstruction and Plan-Apochromat 63×/1.40 oil DIC) |
| Optical Sectioning | Yes, via SIM-based optical slicing and TIRF |
| Modalities | SIM, SIM², TIRF, 3D-PALM, SMLM, Leap Mode, Burst Mode |
| Compatibility | Live-cell imaging, fixed specimens, organoids, embryonic tissues, 3D cultures, thick sections |
| Software Platform | ZEN Imaging Software (GLP/GMP-compliant audit trail, FDA 21 CFR Part 11-ready configuration available)] |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Lightsheet 7 |
| Type | Light-Sheet Fluorescence Microscope (LSFM) |
| Optical Architecture | Dual-Objective Illumination & Detection |
| Sample Compatibility | Cleared Tissues, Live Organisms, 3D Cultures, Plant Specimens |
| Maximum Imaging Volume | ≥16 mm × 6.6 mm × 16 mm |
| Spatial Resolution | ≤220 nm (lateral), ≤570 nm (axial) |
| Refractive Index Matching Range | 1.38–1.56 |
| Native Pixel Size (configurable) | Down to 222 × 222 × 567 nm |
| Acquisition Speed | Up to 200+ volumes per second (depending on ROI and binning) |
| Detector | sCMOS with >95% quantum efficiency |
| Software Platform | ZEN Connect with Multiview Reconstruction, Deconvolution, and Time-Lapse Registration |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | LSM 5 EXCITER |
| Pricing | Upon Request |
| Brand | Zeiss |
|---|---|
| Origin | Germany |
| Model | LSM 880 with Airyscan |
| Detection Principle | Laser Scanning Confocal Microscopy with Airyscan Detector Array |
| Lateral Resolution | ≤120 nm (xy) |
| Axial Resolution | ≤350 nm (z) |
| Maximum Imaging Speed | 27 fps (480 × 480 pixels) |
| Signal-to-Noise Ratio Enhancement | 4–8× vs. conventional PMT-based confocal |
| Optical Sectioning | True confocal + Airyscan super-resolution mode |
| Compatible Excitation | Single-photon & multiphoton (with optional MP module) |
| Software Platform | ZEN Blue/Black |
| Compliance | Fully compatible with GLP/GMP workflows, FDA 21 CFR Part 11 audit trail support (via ZEN Black), ISO 9001-certified manufacturing |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | LSM 9 Series with Airyscan 2 |
| Detection Principle | Scanning Laser Confocal Microscopy with Pixel-Reassignment Super-Resolution |
| Resolution (XY) | Up to 90 nm |
| SNR Improvement | 4–8× vs. conventional confocal |
| Imaging Modes | Standard Confocal, Airyscan 2 Multiplex, Airyscan 2 Fast, Lambda Spectral Acquisition, Dynamics Profiler |
| Software Platform | ZEN Blue/Black (GLP-compliant workflow support, audit trail, user access control) |
| Compliance | ISO 13485–certified manufacturing, FDA 21 CFR Part 11–ready configuration available |
| Brand | Zeiss |
|---|---|
| Origin | Germany |
| Model | LSM 900 |
| Maximum Image Resolution | 6144 × 6144 pixels |
| Laser Sources | Semiconductor lasers at 405 nm (5 mW), 488 nm (10 mW), 561 nm (10 mW), and 640 nm (5 mW) |
| Fluorescence Detectors | ≥2 GaAsP high-sensitivity detectors + ≥2 PMT detectors |
| Scan Module | Integrated scan head with monolithic aberration- and chromatic-correction |
| Scan Modes | xy, xyz, xyt, xyzt, xz, xt, xzt, spot-t, line, arbitrary curve, shear scanning |
| Optical Zoom | 0.5×–40× continuous zoom in 0.1× steps, maintained at all scan speeds |
| Microscope Host | Research-grade fully automated upright microscope (Axio Imager.Z2m) |
| Illumination | 12 V / 100 W halogen lamp with automatic brightness optimization per objective |
| Software & Workstation | ZEN imaging platform with ConfoMap 3D surface analysis (ISO 25178 & ISO 4287 compliant), 2D/3D metrology (height, roughness, volume, surface area, profile), AI-assisted segmentation, MATLAB interoperability via OAD (Open Application Development), Shuttle & Find correlative microscopy module |
| Vibration Isolation Table | 1200 × 900 mm dedicated optical table |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | LSM 910 |
| Instrument Type | Point-Scanning Confocal Microscope |
| Optical Resolution (XY) | ≤ 80 nm (measured via FWHM of fluorescent beads) |
| Volumetric Imaging Speed | Up to 80 volumes/s |
| System Architecture | Integrated Airyscan Detection |
| Compliance | Designed for GLP/GMP-aligned workflows, compatible with FDA 21 CFR Part 11–enabled software configurations |
| Software Platform | ZEN Intellesis & ZEN Blue with LightField 4D module |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Instrument Type | Point-Scanning Confocal Microscope |
| Model | LSM 990 |
| Detector Technology | GaAsP Hybrid Detectors (HyD) & Airyscan 2 |
| Maximum Lateral Resolution | ≤80 nm (measured via FWHM of fluorescent beads) |
| Volumetric Imaging Speed | Up to 80 volumes/s |
| Excitation Sources | Integrated Multi-Line Lasers (405, 488, 561, 633 nm standard |
| Software Platform | ZEN Intellesis + ZEN Blue |
| Compliance | Designed for GLP/GMP-aligned workflows |
