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Analytik Jena (Beijing) Co., Ltd.

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BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
TypeImported Instrument
ModelSPECORD 210 PLUS
Optical DesignDouble-Beam
DetectorPeltier-Cooled CCD Array
Wavelength Range185–1100 nm
Spectral Bandwidth0.2, 0.5, 1, 2, and 4 nm (5-step adjustable)
Wavelength Accuracy< ±0.1 nm (entire range)
Stray Light< 0.005% at 340 nm (NaNO₂)
Photometric Range–5 to +5 A
Baseline Stability≤ 0.0001 A (RMS)
Long-Term Drift≤ 0.0005 A/h
Scan SpeedUp to 12,000 nm/min
Wavelength Reproducibility< ±0.01 nm
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BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
TypeImported Instrument
ModelSPECORD 200 PLUS
Optical DesignDouble-Beam
DetectorPhotodiode Array (PDA)
Wavelength Range190–1100 nm
AutomationMotorized Wavelength Scanning
Spectral Bandwidth1.4 nm
Wavelength Accuracy< ±0.1 nm (full range)
Wavelength Repeatability< ±0.01 nm
Stray Light< 0.005% @ 340 nm (NaNO₂)
Baseline Stability≤ 0.0001 A (RMS)
Photometric Range–5 to +5 A
Scan Speed12,000 nm/min
Light SourcesDeuterium Lamp + Tungsten-Halogen Lamp (automatically switched)
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BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
Instrument TypeDouble-beam
DetectorCCD array
Wavelength Range190–1100 nm
Wavelength Accuracy< ±0.1 nm (full range)
Wavelength Repeatability≤ 0.02 nm
Spectral Bandwidth0.2, 0.5, 1, 2, and 4 nm (motorized selection)
Stray Light< 0.0002% at 340 nm (NaNO₂)
Scan Speedup to 12,000 nm/min
Automatic Wavelength Calibration内置 Ho-glass reference filter
Light SourcesDeuterium lamp (190–350 nm) and tungsten-halogen lamp (350–1100 nm)
SoftwareSCIENCE™ v3.x with GLP-compliant audit trail, method library, and instrument self-check (SCS)
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