Empowering Scientific Discovery

Analytik Jena (Beijing) Co., Ltd.

Categories
  • All
  • Favorite
  • Popular
  • Most rated
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Product CategoryImported Instrument
ModelPQ LC–PlasmaQuant MS
Instrument TypeTriple Quadrupole ICP-MS Coupled with Liquid Chromatography
Application ScopeUniversal Elemental Speciation
Interface ConfigurationIntegrated LC–ICP-MS Coupling Kit
Software PlatformClarity Chromatography Software (DataApex) + ASpect MS
Regulatory ComplianceFDA 21 CFR Part 11–Ready, GLP/GMP-Compatible Data Handling
Automation LevelFully Automated Unattended Operation Support
Column CompatibilityReversed-Phase HPLC, Ion Chromatography (IC), Size-Exclusion Chromatography (SEC)
Detection CapabilitySub-ng/kg LODs for As/Cr species
Dynamic Range11 orders of magnitude (ADD11 digital detector)
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Product CategoryImported Instrument
ModelPlasmaQuant MS
Instrument TypeQuadrupole ICP-MS
Application EnvironmentLaboratory
Mass Range (amu)Not Specified
Mass Resolution (Unit Mass Resolution, amu)Not Specified
Detection Limit (ng·L⁻¹)Not Specified
Sensitivity (Mcps/mg·L⁻¹)Not Specified
Short-Term Stability (RSD)Not Specified
Long-Term Stability (RSD)Not Specified
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported
ModelICprep
Measurement ElementsF, Cl, Br, I, S
Analysis Time3–4 min per sample
Sample IntroductionUp to 100 µL for liquids, up to 110 mg for solids
Combustion TemperatureUp to 1100 °C
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
TypeImported Instrument
ModelSPECORD 210 PLUS
Optical DesignDouble-Beam
DetectorPeltier-Cooled CCD Array
Wavelength Range185–1100 nm
Spectral Bandwidth0.2, 0.5, 1, 2, and 4 nm (5-step adjustable)
Wavelength Accuracy< ±0.1 nm (entire range)
Stray Light< 0.005% at 340 nm (NaNO₂)
Photometric Range–5 to +5 A
Baseline Stability≤ 0.0001 A (RMS)
Long-Term Drift≤ 0.0005 A/h
Scan SpeedUp to 12,000 nm/min
Wavelength Reproducibility< ±0.01 nm
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
TypeFull-Spectrum Simultaneous ICP-OES
Detection Limit (Zn at 213.856 nm)0.06 ppb
Precision (RSD)≤0.5%
Long-Term Stability (RSD, 4h)≤1.5%
Wavelength Range160–900 nm
Optical Resolution0.003 nm (at 200 nm)
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Instrument TypeFlame and Graphite Furnace AAS
MonochromatorPlane Grating
Optical SystemDual-Beam with Automatic Switching to Single-Beam
DetectorCCD Array (185–900 nm)
Background CorrectionAutomatic Deuterium/Halogen Lamp or Zeeman (software-selectable)
Spectral Resolution≤ 0.1 nm
Sensitivity≥ 0.9 A for 5 mg/L Cu solution (279.5 nm, air-acetylene flame)
Precision (RSD)< 0.5% (n = 10, typical aqueous standards)
Detection Limit (Flame Mode)< 0.005 mg/L Cu
Detection Limit (Graphite Furnace Mode)Sub-pg range for Cd/Pb (e.g., < 3 pg for Cd)
Baseline Stability< 0.002 A/h (typical, 24 h drift monitoring)
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena GmbH & Co. KG
Instrument TypeFlame–Graphite Furnace AAS
MonochromatorConcave Grating
Optical SystemDual-Beam
DetectorPhotomultiplier Tube (PMT)
Background CorrectionDeuterium Lamp + Triple-Field Zeeman
Grating Density1800 lines/mm
Lamp HolderAutomated 8-Lamp Turret with Auto-Alignment
Magnetic Field Range0.1–1.0 T (Switchable Between 2-Field and 3-Field Zeeman Modes)
Graphite FurnaceTransversely Heated, Temperature Range: Room Temp to 3000 °C, Max. Ramp Rate: 3000 °C/s
Autosampler CapacityUp to 108 Positions
Dimensions1200 × 480 × 600 mm
Added to wishlistRemoved from wishlist 0
Add to compare
BrandEndress+Hauser
OriginUSA
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelRAMAN RXN HYBRID
Instrument TypeGrating-Based Raman Spectrometer
Excitation Wavelength785 nm
Probe CompatibilityRxn-20 Solid-Phase Probe + Secondary E+H Raman Probe
Hazardous Area CertificationsATEX, IECEx, North America (Class I Div 1/2, Class II Div 1)
Installation OptionsBenchtop, Mobile Cart, or In-Line Process Skid Mounting
Sample Phase SupportSimultaneous Solid & Liquid Analysis Channels
Spatial Sampling FlexibilityMicron- to Millimeter-Scale Spot Sizes (up to 6 mm diameter)
ComplianceDesigned for GLP/GMP environments
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena GmbH & Co. KG
TypeImported Instrument
Modelmulti EA® 5000
Detection PrinciplesChemiluminescence (N), UV Fluorescence or Microcoulometry (S), Microcoulometry (Cl), NDIR (C)
Furnace ConfigurationDual-mode vertical/horizontal high-temperature combustion furnace (up to 1100 °C)
Sample FormsLiquid (1–100 µL), Gas (up to 100 mL), LPG (1–50 µL), Solid (up to 100 mg)
Detection Range0.0x ppm to % level
Automatic Mode RecognitionYes
Flame Monitoring SensorIntegrated real-time combustion state feedback
Gas Pressure Tolerance0.2–0.6 MPa (O₂), with under/over-pressure alarm
CalibrationSingle calibration curve applicable across full dynamic range
ComplianceDesigned for GLP/GMP environments
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena GmbH
TypeImported Instrument
Modelmulti EA 4000
Measurement PrincipleInfrared Absorption (CO₂, SO₂, HCl detection)
Heating SystemHigh-Temperature Ceramic Furnace (HTC)
Sample FormSolid and viscous samples
Modular ConfigurationIndependent C, S, Cl analysis modules
ComplianceASTM D4293, ASTM D5178, ISO 20565, DIN 51721, EN 15408, EPA Method 9096A (for AOX), USP <281> (for residual chlorine)
SoftwaremultiWin v5.x with 21 CFR Part 11 compliance options
SafetyIntegrated Self-Check System (SCS), automatic gas leak detection, overpressure protection
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
Instrument TypeFlame and Graphite Furnace AAS
Optical SystemDual-Beam
MonochromatorEchelle Grating with Quartz Prism Cross-Disperser
DetectorSolid-State CCD Array
Background CorrectionReal-Time, Multi-Wavelength Simultaneous Correction
Wavelength Resolution0.002 nm
Light SourceHigh-Intensity Short-Arc Xenon Lamp (Continuum Source)
Measurement ModeSequential Multi-Element & Full-Spectrum Acquisition
Dynamic Linear Range5 Orders of Magnitude
Software ComplianceFDA 21 CFR Part 11 Ready, GLP/GMP Audit Trail Enabled
Added to wishlistRemoved from wishlist 0
Add to compare
BrandEndress+Hauser
OriginUSA
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelRAMANRXN2
Instrument TypeGrating-Based Raman Spectrometer
Excitation Wavelength Options532 nm, 785 nm, or 1000 nm
Channel ConfigurationSingle-Channel (Standard), Optional 4-Channel Multiplexing
Probe CompatibilityRxn-10 (with accessory optics), Rxn-30, Rxn-40, Rxn-41, Rxn-45, Rxn-46
Hazardous Area CertificationsATEX, IECEx, North American Class I Div 1/2, Class II Div 1/2
Installation Form FactorBenchtop or Mobile Cart-Mounted
Regulatory ComplianceDesigned for cGMP/GLP environments, supports FDA 21 CFR Part 11–compliant audit trails when integrated with validated software platforms
Software InterfaceEmbedded touchscreen control with optional remote web-based access via Ethernet/Wi-Fi
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
TypeImported Instrument
ModelSPECORD 200 PLUS
Optical DesignDouble-Beam
DetectorPhotodiode Array (PDA)
Wavelength Range190–1100 nm
AutomationMotorized Wavelength Scanning
Spectral Bandwidth1.4 nm
Wavelength Accuracy< ±0.1 nm (full range)
Wavelength Repeatability< ±0.01 nm
Stray Light< 0.005% @ 340 nm (NaNO₂)
Baseline Stability≤ 0.0001 A (RMS)
Photometric Range–5 to +5 A
Scan Speed12,000 nm/min
Light SourcesDeuterium Lamp + Tungsten-Halogen Lamp (automatically switched)
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported Instrument
ModelZEEnit 700Q
PricingAvailable upon Request
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported
ModelPQMS Elite
Instrument TypeQuadrupole ICP-MS
Sensitivity (7Li)>90 Mcps/mg·L⁻¹
Sensitivity (115In)>1500 Mcps/mg·L⁻¹
Sensitivity (232Th)>1000 Mcps/mg·L⁻¹
Vacuum SystemDual 300 L/s Turbo Molecular Pumps + High-Capacity Rotary Vane Pump
Typical Analysis Cycle Time to Operational Vacuum<5 min
Base Pressure1×10⁻⁸–1×10⁻⁹ mbar
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
Product TypeImported
ModelPlasmaQuant 9200
Instrument CategoryFull-Spectrum Simultaneous ICP-OES
Wavelength Range160–900 nm
Optical Resolution0.002 nm (at 200 nm)
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported Instrument
Modelmulti EA H 5000
Price RangeUSD 68,000 – 109,000
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
Product TypeImported Instrument
Modelmulti EA 5100
PricingAvailable Upon Request
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
Instrument TypeDouble-beam
DetectorCCD array
Wavelength Range190–1100 nm
Wavelength Accuracy< ±0.1 nm (full range)
Wavelength Repeatability≤ 0.02 nm
Spectral Bandwidth0.2, 0.5, 1, 2, and 4 nm (motorized selection)
Stray Light< 0.0002% at 340 nm (NaNO₂)
Scan Speedup to 12,000 nm/min
Automatic Wavelength Calibration内置 Ho-glass reference filter
Light SourcesDeuterium lamp (190–350 nm) and tungsten-halogen lamp (350–1100 nm)
SoftwareSCIENCE™ v3.x with GLP-compliant audit trail, method library, and instrument self-check (SCS)
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
Product TypeImported Instrument
Modelmulti EA S 5000
Measurement PrincipleInfrared Absorption (for C), Chemiluminescence (for N), UV Fluorescence or Microcoulometric Detection (for S), Microcoulometric Detection (for Cl)
Furnace SystemDual-mode resistive furnace (vertical/horizontal configuration)
Detection Limitppb-level
Measurement Rangeppb to wt%
Accuracy±0.01 ppm
Analysis Time2–4 minutes
Maximum Furnace Temperature1100 °C
Liquid Sample Volume1–100 µL
Gas Sample Volumeup to 100 mL
Solid Sample Massup to 100 mg
LPG Sample Volume1–50 µL
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported Instrument
Modelmulti EA 5010
PricingAvailable Upon Request
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
Manufacturer TypeOriginal Equipment Manufacturer (OEM)
Origin CategoryImported Instrument
Modelmulti EA 5010
PriceUpon Request
DetectorHiPerSens UV Fluorescence & Chemiluminescence Detector
Measurement Range0.0x ppm to 100% (w/w or v/v)
Sample VolumeLiquids: 50 µL
Gases20 mL
Combustion Furnace TemperatureUp to 1100 °C
ComplianceASTM D5453, D7183, D7039, ISO 20846, ISO 20884, UOP 97, IP 433, IP 541, EN 15486
SoftwaremultiWin v5.x with 21 CFR Part 11 compliance modules
ConnectivityEthernet, LIMS-ready, Remote Web Access via Browser or Mobile App
SafetyAutomated Self-Check, Real-Time Parameter Monitoring, Push Notification Alert System
Added to wishlistRemoved from wishlist 0
Add to compare
BrandAnalytik Jena
OriginGermany
ManufacturerAnalytik Jena AG
Product TypeImported Instrument
ModelPlasmaQuant 9100
Detection PrincipleFull-Spectrum Direct-Reading ICP-OES
Optical Range160–900 nm
Optical Resolution≤3 pm
Wavelength Accuracy<0.0004 nm
Observation ModesDual-View (Radial + Axial) with Four Simultaneous Viewing Configurations
Plasma SystemHigh-Stability, High-Power RF Generator (27.12 MHz)
DetectorBack-Illuminated CCD with Deep-UV Sensitivity
Startup Time<5 minutes
Gas EfficiencyIntegrated Plasma Gas Recycling for Cooling & Purge Streams
SoftwareAspect PQ with ABC and CSI Background Correction Algorithms
ComplianceDesigned for GLP/GMP environments
Show next
InstrumentHive
Logo
Compare items
  • Total (0)
Compare
0